JP2015040795A - 試験装置 - Google Patents

試験装置 Download PDF

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Publication number
JP2015040795A
JP2015040795A JP2013172654A JP2013172654A JP2015040795A JP 2015040795 A JP2015040795 A JP 2015040795A JP 2013172654 A JP2013172654 A JP 2013172654A JP 2013172654 A JP2013172654 A JP 2013172654A JP 2015040795 A JP2015040795 A JP 2015040795A
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JP
Japan
Prior art keywords
measurement
under test
unit
measuring
controller
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2013172654A
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English (en)
Japanese (ja)
Other versions
JP2015040795A5 (OSRAM
Inventor
小野　晴義
Haruyoshi Ono
晴義 小野
馬場　功
Isao Baba
功 馬場
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Device Innovations Inc
Original Assignee
Sumitomo Electric Device Innovations Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Device Innovations Inc filed Critical Sumitomo Electric Device Innovations Inc
Priority to JP2013172654A priority Critical patent/JP2015040795A/ja
Priority to US14/466,719 priority patent/US9279848B2/en
Publication of JP2015040795A publication Critical patent/JP2015040795A/ja
Publication of JP2015040795A5 publication Critical patent/JP2015040795A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/0014—Measuring characteristics or properties thereof

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Semiconductor Lasers (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP2013172654A 2013-08-22 2013-08-22 試験装置 Pending JP2015040795A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2013172654A JP2015040795A (ja) 2013-08-22 2013-08-22 試験装置
US14/466,719 US9279848B2 (en) 2013-08-22 2014-08-22 Test apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013172654A JP2015040795A (ja) 2013-08-22 2013-08-22 試験装置

Publications (2)

Publication Number Publication Date
JP2015040795A true JP2015040795A (ja) 2015-03-02
JP2015040795A5 JP2015040795A5 (OSRAM) 2016-10-06

Family

ID=52480090

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013172654A Pending JP2015040795A (ja) 2013-08-22 2013-08-22 試験装置

Country Status (2)

Country Link
US (1) US9279848B2 (OSRAM)
JP (1) JP2015040795A (OSRAM)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015049106A (ja) * 2013-08-30 2015-03-16 住友電工デバイス・イノベーション株式会社 試験装置
JP2019078652A (ja) * 2017-10-25 2019-05-23 住友電工デバイス・イノベーション株式会社 試験装置
JP7040671B1 (ja) * 2020-12-03 2022-03-23 三菱電機株式会社 半導体レーザ検査装置及び半導体レーザ検査方法
JPWO2022070520A1 (OSRAM) * 2020-09-29 2022-04-07
JPWO2024023992A1 (OSRAM) * 2022-07-27 2024-02-01

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9860188B2 (en) 2011-12-22 2018-01-02 International Business Machines Corporation Flexible and scalable enhanced transmission selection method for network fabrics
US10826630B2 (en) * 2015-01-30 2020-11-03 Rohde & Schwarz Gmbh & Co. Kg Measuring device, system and method for wirelessly measuring radiation patterns
US11061077B2 (en) * 2017-03-09 2021-07-13 Keithley Instruments, Llc Parallel trigger model for test and measurement instruments

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002040106A (ja) * 2000-07-24 2002-02-06 Seiko Epson Corp 半導体装置
US20050265717A1 (en) * 2004-05-28 2005-12-01 Yu Zhou Opto-electronic device testing apparatus and method
JP2007271590A (ja) * 2006-03-31 2007-10-18 Eudyna Devices Inc 試験システムおよびその制御方法
JP2010156553A (ja) * 2008-12-26 2010-07-15 Sumitomo Electric Device Innovations Inc 試験装置の制御方法
JP2011169606A (ja) * 2010-02-16 2011-09-01 Hitachi Kokusai Electric Inc 試験システム

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1464970A1 (en) * 2003-04-04 2004-10-06 Agilent Technologies Inc Loop-back testing with delay elements
DE10348255A1 (de) * 2003-10-16 2005-05-12 Bosch Gmbh Robert Verfahren und Vorrichtung zur Umstellung eines ersten Modus einer Steuereinrichtung in einen zweiten Modus über einen Daten-Bus
US7633607B2 (en) * 2004-09-01 2009-12-15 Luna Innovations Incorporated Method and apparatus for calibrating measurement equipment
US7522785B2 (en) * 2004-12-01 2009-04-21 General Photonics Corporation Measurements of polarization-dependent loss (PDL) and degree of polarization (DOP) using optical polarization controllers
US9829429B2 (en) * 2005-09-29 2017-11-28 Exfo Inc Determining a polarization-related characteristic of an optical link
JP4527078B2 (ja) 2006-03-31 2010-08-18 住友電工デバイス・イノベーション株式会社 試験システム
WO2009024173A1 (en) * 2007-08-22 2009-02-26 Verigy (Singapore) Pte. Ltd. Chip tester, method for providing timing information, test fixture set, apparatus for post-processing propagation delay information, method for post-processing delay information, chip test set up and method for testing devices under test
US20130200915A1 (en) * 2012-02-06 2013-08-08 Peter G. Panagas Test System with Test Trays and Automated Test Tray Handling

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002040106A (ja) * 2000-07-24 2002-02-06 Seiko Epson Corp 半導体装置
US20050265717A1 (en) * 2004-05-28 2005-12-01 Yu Zhou Opto-electronic device testing apparatus and method
JP2007271590A (ja) * 2006-03-31 2007-10-18 Eudyna Devices Inc 試験システムおよびその制御方法
JP2010156553A (ja) * 2008-12-26 2010-07-15 Sumitomo Electric Device Innovations Inc 試験装置の制御方法
JP2011169606A (ja) * 2010-02-16 2011-09-01 Hitachi Kokusai Electric Inc 試験システム

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015049106A (ja) * 2013-08-30 2015-03-16 住友電工デバイス・イノベーション株式会社 試験装置
JP2019078652A (ja) * 2017-10-25 2019-05-23 住友電工デバイス・イノベーション株式会社 試験装置
JPWO2022070520A1 (OSRAM) * 2020-09-29 2022-04-07
JP7633267B2 (ja) 2020-09-29 2025-02-19 住友重機械搬送システム株式会社 遠隔自動ｒｔｇシステム、遠隔自動ｒｔｇシステムの制御方法、及び遠隔自動ｒｔｇシステム制御装置
JP7040671B1 (ja) * 2020-12-03 2022-03-23 三菱電機株式会社 半導体レーザ検査装置及び半導体レーザ検査方法
JPWO2024023992A1 (OSRAM) * 2022-07-27 2024-02-01
WO2024023992A1 (ja) * 2022-07-27 2024-02-01 日本電信電話株式会社 光伝送システム、及び、光パス設定・輻輳制御方法

Also Published As

Publication number Publication date
US20150055131A1 (en) 2015-02-26
US9279848B2 (en) 2016-03-08

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