JP2015040795A5 - - Google Patents

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Publication number
JP2015040795A5
JP2015040795A5 JP2013172654A JP2013172654A JP2015040795A5 JP 2015040795 A5 JP2015040795 A5 JP 2015040795A5 JP 2013172654 A JP2013172654 A JP 2013172654A JP 2013172654 A JP2013172654 A JP 2013172654A JP 2015040795 A5 JP2015040795 A5 JP 2015040795A5
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JP
Japan
Prior art keywords
unit
test
measurement
measuring
under test
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2013172654A
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English (en)
Japanese (ja)
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JP2015040795A (ja
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Publication date
Application filed filed Critical
Priority to JP2013172654A priority Critical patent/JP2015040795A/ja
Priority claimed from JP2013172654A external-priority patent/JP2015040795A/ja
Priority to US14/466,719 priority patent/US9279848B2/en
Publication of JP2015040795A publication Critical patent/JP2015040795A/ja
Publication of JP2015040795A5 publication Critical patent/JP2015040795A5/ja
Pending legal-status Critical Current

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JP2013172654A 2013-08-22 2013-08-22 試験装置 Pending JP2015040795A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2013172654A JP2015040795A (ja) 2013-08-22 2013-08-22 試験装置
US14/466,719 US9279848B2 (en) 2013-08-22 2014-08-22 Test apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013172654A JP2015040795A (ja) 2013-08-22 2013-08-22 試験装置

Publications (2)

Publication Number Publication Date
JP2015040795A JP2015040795A (ja) 2015-03-02
JP2015040795A5 true JP2015040795A5 (OSRAM) 2016-10-06

Family

ID=52480090

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013172654A Pending JP2015040795A (ja) 2013-08-22 2013-08-22 試験装置

Country Status (2)

Country Link
US (1) US9279848B2 (OSRAM)
JP (1) JP2015040795A (OSRAM)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9860188B2 (en) 2011-12-22 2018-01-02 International Business Machines Corporation Flexible and scalable enhanced transmission selection method for network fabrics
JP6201233B2 (ja) * 2013-08-30 2017-09-27 住友電工デバイス・イノベーション株式会社 試験装置
US10826630B2 (en) * 2015-01-30 2020-11-03 Rohde & Schwarz Gmbh & Co. Kg Measuring device, system and method for wirelessly measuring radiation patterns
US11061077B2 (en) * 2017-03-09 2021-07-13 Keithley Instruments, Llc Parallel trigger model for test and measurement instruments
JP6966039B2 (ja) * 2017-10-25 2021-11-10 住友電工デバイス・イノベーション株式会社 試験装置
WO2022070520A1 (ja) * 2020-09-29 2022-04-07 住友重機械搬送システム株式会社 遠隔自動ｒｔｇシステム、遠隔自動ｒｔｇシステムの制御方法、及び遠隔自動ｒｔｇシステム制御装置
JP7040671B1 (ja) * 2020-12-03 2022-03-23 三菱電機株式会社 半導体レーザ検査装置及び半導体レーザ検査方法
JP7723332B2 (ja) * 2022-07-27 2025-08-14 Ｎｔｔ株式会社 光伝送システム、及び、光パス設定・輻輳制御方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002040106A (ja) * 2000-07-24 2002-02-06 Seiko Epson Corp 半導体装置
EP1464970A1 (en) * 2003-04-04 2004-10-06 Agilent Technologies Inc Loop-back testing with delay elements
DE10348255A1 (de) * 2003-10-16 2005-05-12 Bosch Gmbh Robert Verfahren und Vorrichtung zur Umstellung eines ersten Modus einer Steuereinrichtung in einen zweiten Modus über einen Daten-Bus
US20050265717A1 (en) * 2004-05-28 2005-12-01 Yu Zhou Opto-electronic device testing apparatus and method
US7633607B2 (en) * 2004-09-01 2009-12-15 Luna Innovations Incorporated Method and apparatus for calibrating measurement equipment
US7522785B2 (en) * 2004-12-01 2009-04-21 General Photonics Corporation Measurements of polarization-dependent loss (PDL) and degree of polarization (DOP) using optical polarization controllers
US9829429B2 (en) * 2005-09-29 2017-11-28 Exfo Inc Determining a polarization-related characteristic of an optical link
JP4571093B2 (ja) * 2006-03-31 2010-10-27 住友電工デバイス・イノベーション株式会社 試験システム
JP4527078B2 (ja) 2006-03-31 2010-08-18 住友電工デバイス・イノベーション株式会社 試験システム
WO2009024173A1 (en) * 2007-08-22 2009-02-26 Verigy (Singapore) Pte. Ltd. Chip tester, method for providing timing information, test fixture set, apparatus for post-processing propagation delay information, method for post-processing delay information, chip test set up and method for testing devices under test
JP5425462B2 (ja) * 2008-12-26 2014-02-26 住友電工デバイス・イノベーション株式会社 試験装置の制御方法
JP2011169606A (ja) * 2010-02-16 2011-09-01 Hitachi Kokusai Electric Inc 試験システム
US20130200915A1 (en) * 2012-02-06 2013-08-08 Peter G. Panagas Test System with Test Trays and Automated Test Tray Handling

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