JP2015026830A5 - - Google Patents

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Publication number
JP2015026830A5
JP2015026830A5 JP2014126434A JP2014126434A JP2015026830A5 JP 2015026830 A5 JP2015026830 A5 JP 2015026830A5 JP 2014126434 A JP2014126434 A JP 2014126434A JP 2014126434 A JP2014126434 A JP 2014126434A JP 2015026830 A5 JP2015026830 A5 JP 2015026830A5
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JP
Japan
Prior art keywords
conductive film
film
oxide semiconductor
forming
manufacturing
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JP2014126434A
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English (en)
Japanese (ja)
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JP2015026830A (ja
JP6426379B2 (ja
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Priority to JP2014126434A priority Critical patent/JP6426379B2/ja
Priority claimed from JP2014126434A external-priority patent/JP6426379B2/ja
Publication of JP2015026830A publication Critical patent/JP2015026830A/ja
Publication of JP2015026830A5 publication Critical patent/JP2015026830A5/ja
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Publication of JP6426379B2 publication Critical patent/JP6426379B2/ja
Expired - Fee Related legal-status Critical Current
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JP2014126434A 2013-06-19 2014-06-19 半導体装置の作製方法 Expired - Fee Related JP6426379B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2014126434A JP6426379B2 (ja) 2013-06-19 2014-06-19 半導体装置の作製方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2013128920 2013-06-19
JP2013128920 2013-06-19
JP2014126434A JP6426379B2 (ja) 2013-06-19 2014-06-19 半導体装置の作製方法

Publications (3)

Publication Number Publication Date
JP2015026830A JP2015026830A (ja) 2015-02-05
JP2015026830A5 true JP2015026830A5 (https=) 2017-06-29
JP6426379B2 JP6426379B2 (ja) 2018-11-21

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Family Applications (1)

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JP2014126434A Expired - Fee Related JP6426379B2 (ja) 2013-06-19 2014-06-19 半導体装置の作製方法

Country Status (1)

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JP (1) JP6426379B2 (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI686870B (zh) * 2015-03-03 2020-03-01 日商半導體能源研究所股份有限公司 半導體裝置、顯示裝置及使用該顯示裝置之電子裝置
JP7023114B2 (ja) 2015-11-20 2022-02-21 株式会社半導体エネルギー研究所 半導体装置、表示装置、表示モジュール、電子機器
US10263114B2 (en) * 2016-03-04 2019-04-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, method for manufacturing the same, or display device including the same
US11302717B2 (en) 2016-04-08 2022-04-12 Semiconductor Energy Laboratory Co., Ltd. Transistor and method for manufacturing the same
US11726376B2 (en) 2016-11-23 2023-08-15 Semiconductor Energy Laboratory Co., Ltd. Display device, display module, and electronic device
TWI778959B (zh) * 2017-03-03 2022-10-01 日商半導體能源硏究所股份有限公司 半導體裝置及半導體裝置的製造方法
JP2022145974A (ja) * 2021-03-22 2022-10-05 株式会社リコー 電界効果型トランジスタ、表示素子、画像表示装置、及びシステム

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100980020B1 (ko) * 2003-08-28 2010-09-03 삼성전자주식회사 박막 트랜지스터 표시판과 그 제조 방법
KR101244895B1 (ko) * 2006-04-06 2013-03-18 삼성디스플레이 주식회사 박막 트랜지스터 표시판의 제조 방법
TWI567829B (zh) * 2008-10-31 2017-01-21 半導體能源研究所股份有限公司 半導體裝置及其製造方法
WO2011043194A1 (en) * 2009-10-09 2011-04-14 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
JP2012094853A (ja) * 2010-09-30 2012-05-17 Kobe Steel Ltd 配線構造
KR101830170B1 (ko) * 2011-05-17 2018-02-21 삼성디스플레이 주식회사 산화물 반도체 소자, 산화물 반도체 소자의 제조 방법, 산화물 반도체소자를 포함하는 표시 장치 및 산화물 반도체 소자를 포함하는 표시 장치의 제조 방법

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