JP2014222343A5 - - Google Patents
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- JP2014222343A5 JP2014222343A5 JP2014109104A JP2014109104A JP2014222343A5 JP 2014222343 A5 JP2014222343 A5 JP 2014222343A5 JP 2014109104 A JP2014109104 A JP 2014109104A JP 2014109104 A JP2014109104 A JP 2014109104A JP 2014222343 A5 JP2014222343 A5 JP 2014222343A5
- Authority
- JP
- Japan
- Prior art keywords
- sample
- pupil
- plane
- image
- phase
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102007047466A DE102007047466A1 (de) | 2007-09-28 | 2007-09-28 | Verfahren und Anordnung zur optischen Erfassung einer beleuchteten Probe |
| DE102007047466.2 | 2007-09-28 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010526212A Division JP2010540999A (ja) | 2007-09-28 | 2008-09-26 | 照明された試料を光学的に捕捉するための方法および装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014222343A JP2014222343A (ja) | 2014-11-27 |
| JP2014222343A5 true JP2014222343A5 (enExample) | 2015-01-15 |
| JP5878207B2 JP5878207B2 (ja) | 2016-03-08 |
Family
ID=40229782
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010526212A Pending JP2010540999A (ja) | 2007-09-28 | 2008-09-26 | 照明された試料を光学的に捕捉するための方法および装置 |
| JP2014109104A Active JP5878207B2 (ja) | 2007-09-28 | 2014-05-27 | 照明された試料を光学的に捕捉するための方法および装置 |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010526212A Pending JP2010540999A (ja) | 2007-09-28 | 2008-09-26 | 照明された試料を光学的に捕捉するための方法および装置 |
Country Status (4)
| Country | Link |
|---|---|
| EP (2) | EP2195696B1 (enExample) |
| JP (2) | JP2010540999A (enExample) |
| DE (1) | DE102007047466A1 (enExample) |
| WO (1) | WO2009043546A1 (enExample) |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102008022493A1 (de) * | 2008-05-07 | 2009-11-12 | Carl Zeiss Microlmaging Gmbh | Vorrichtung und Verfahren zum evaneszenten Beleuchten einer Probe |
| DE102008049878A1 (de) | 2008-09-30 | 2010-04-01 | Carl Zeiss Microlmaging Gmbh | Verbesserte Verfahren und Vorrichtungen für die Mikroskopie mit strukturierter Beleuchtung |
| DE102009055216A1 (de) | 2009-12-22 | 2011-06-30 | Carl Zeiss Microlmaging GmbH, 07745 | Lumineszenzmikroskopie |
| EP2565697B1 (en) * | 2010-04-26 | 2020-07-01 | Nikon Corporation | Structural illumination microscope device |
| EP2681533B1 (en) * | 2011-03-01 | 2017-08-09 | GE Healthcare Bio-Sciences Corp. | Systems and methods for illumination phase control in fluorescence microscopy |
| WO2012153495A1 (ja) * | 2011-05-06 | 2012-11-15 | 株式会社ニコン | 構造化照明顕微鏡及び構造化照明観察方法 |
| JP5751328B2 (ja) | 2011-06-29 | 2015-07-22 | 株式会社ニコン | 構造化照明光学系および構造化照明顕微鏡装置 |
| WO2013011680A1 (ja) * | 2011-07-15 | 2013-01-24 | 株式会社ニコン | 構造化照明装置、構造化照明顕微鏡、構造化照明方法 |
| DE102011114500B4 (de) | 2011-09-29 | 2022-05-05 | Fei Company | Mikroskopvorrichtung |
| DE102011083847A1 (de) | 2011-09-30 | 2013-04-04 | Carl Zeiss Microscopy Gmbh | Mikroskop für die Weitfeldmikroskopie |
| DE102012020877A1 (de) | 2012-10-17 | 2014-04-17 | Carl Zeiss Microscopy Gmbh | Optikanordnung und Lichtmikroskop |
| US9772484B2 (en) | 2012-11-29 | 2017-09-26 | Citizen Watch Co., Ltd. | Light modulating device |
| JP6191140B2 (ja) * | 2013-01-17 | 2017-09-06 | 株式会社ニコン | 構造化照明装置及び構造化照明顕微鏡装置 |
| EP2913683A1 (en) | 2014-02-26 | 2015-09-02 | Nuomedis AG | Method and apparatus for automated scanning probe microscopy |
| CN108292034B (zh) | 2015-10-09 | 2022-01-04 | 徕卡显微系统复合显微镜有限公司 | 用于利用结构化的光片照射检查试样的方法和设备 |
| DE102015221991A1 (de) | 2015-11-09 | 2017-05-11 | Carl Zeiss Microscopy Gmbh | Mikroskopierverfahren zur Ermittlung eines Kontrastbildes und Mikroskop |
| DE102016108079A1 (de) * | 2016-05-02 | 2017-11-02 | Carl Zeiss Microscopy Gmbh | Artefaktreduktion bei der winkelselektiven beleuchtung |
| DE102016117803A1 (de) | 2016-09-21 | 2018-03-22 | Leica Microsystems Cms Gmbh | Mikroskopbeleuchtungsanordnung zur strukturierten Beleuchtung |
| DE102017109645A1 (de) * | 2017-05-05 | 2018-11-08 | Carl Zeiss Microscopy Gmbh | Lichtmikroskop und Verfahren zum Bereitstellen von strukturiertem Beleuchtungslicht |
| CN108681059B (zh) * | 2018-05-07 | 2023-12-08 | 中国人民解放军陆军工程大学 | 亚微秒级二维光学观测装置 |
| DE102018131217A1 (de) * | 2018-12-06 | 2020-06-10 | Universität Bielefeld | Optisches Modul zur Erzeugung von Beleuchtungsmustern für die strukturierte Beleuchtungsmikroskopie |
| EP4106618A4 (en) * | 2020-02-19 | 2024-04-24 | Thermo Electron Scientific Instruments LLC | PHASE MASK FOR STRUCTURED LIGHTING |
| CN111338070B (zh) * | 2020-03-18 | 2021-04-23 | 中国科学技术大学 | 一种结构光产生装置及结构光照明显微镜 |
| CN116520545B (zh) * | 2023-04-28 | 2025-11-11 | 西安电子科技大学 | 一种基于掩膜相位调制的超分辨显微成像系统 |
| DE102024111213A1 (de) * | 2024-04-22 | 2025-10-23 | Carl Zeiss Microscopy Gmbh | Vorrichtung und Verfahren zum mikroskopischen Beleuchten einer Probe, Mikroskop und Verfahren zur Mikroskopie |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100504261B1 (ko) | 1997-04-04 | 2005-07-27 | 아이시스이노베이션리미티드 | 현미경법 이미징 장치 및 방법 |
| ATE304184T1 (de) * | 1999-12-17 | 2005-09-15 | Digital Optical Imaging Corp | Abbildungsverfahren und -gerät mit lichtleiterbündel und räumlichem lichtmodulator |
| DE10038527A1 (de) | 2000-08-08 | 2002-02-21 | Zeiss Carl Jena Gmbh | Anordnung zur Erhöhung der Tiefendiskriminierung optisch abbildender Systeme |
| JP4844862B2 (ja) * | 2001-09-14 | 2011-12-28 | 株式会社ニコン | 格子照明顕微鏡 |
| US6888148B2 (en) | 2001-12-10 | 2005-05-03 | Carl Zeiss Jena Gmbh | Arrangement for the optical capture of excited and /or back scattered light beam in a sample |
| JP4899408B2 (ja) * | 2005-02-25 | 2012-03-21 | 株式会社ニコン | 顕微鏡装置 |
| JPWO2007043382A1 (ja) * | 2005-10-07 | 2009-04-16 | 株式会社ニコン | 顕微鏡装置及び画像生成方法 |
| EP1936423B1 (en) * | 2005-10-11 | 2019-08-21 | Nikon Corporation | MICROSCOPE Apparatus AND OBSERVING METHOD |
| WO2007043314A1 (ja) * | 2005-10-13 | 2007-04-19 | Nikon Corporation | 顕微鏡装置 |
| US7619732B2 (en) * | 2006-03-01 | 2009-11-17 | Leica Microsystems Cms Gmbh | Method and microscope for high spatial resolution examination of samples |
| JP5206681B2 (ja) * | 2007-09-05 | 2013-06-12 | 株式会社ニコン | 構造化照明顕微鏡装置 |
-
2007
- 2007-09-28 DE DE102007047466A patent/DE102007047466A1/de not_active Ceased
-
2008
- 2008-09-26 EP EP08802656.2A patent/EP2195696B1/de not_active Not-in-force
- 2008-09-26 WO PCT/EP2008/008205 patent/WO2009043546A1/de not_active Ceased
- 2008-09-26 JP JP2010526212A patent/JP2010540999A/ja active Pending
- 2008-09-26 EP EP19182130.5A patent/EP3660571A1/de not_active Withdrawn
-
2014
- 2014-05-27 JP JP2014109104A patent/JP5878207B2/ja active Active
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