JP2014222343A5 - - Google Patents

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Publication number
JP2014222343A5
JP2014222343A5 JP2014109104A JP2014109104A JP2014222343A5 JP 2014222343 A5 JP2014222343 A5 JP 2014222343A5 JP 2014109104 A JP2014109104 A JP 2014109104A JP 2014109104 A JP2014109104 A JP 2014109104A JP 2014222343 A5 JP2014222343 A5 JP 2014222343A5
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Japan
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sample
pupil
plane
image
phase
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JP2014109104A
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Japanese (ja)
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JP5878207B2 (ja
JP2014222343A (ja
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Priority claimed from DE102007047466A external-priority patent/DE102007047466A1/de
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JP2014109104A 2007-09-28 2014-05-27 照明された試料を光学的に捕捉するための方法および装置 Active JP5878207B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102007047466A DE102007047466A1 (de) 2007-09-28 2007-09-28 Verfahren und Anordnung zur optischen Erfassung einer beleuchteten Probe
DE102007047466.2 2007-09-28

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2010526212A Division JP2010540999A (ja) 2007-09-28 2008-09-26 照明された試料を光学的に捕捉するための方法および装置

Publications (3)

Publication Number Publication Date
JP2014222343A JP2014222343A (ja) 2014-11-27
JP2014222343A5 true JP2014222343A5 (enExample) 2015-01-15
JP5878207B2 JP5878207B2 (ja) 2016-03-08

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JP2010526212A Pending JP2010540999A (ja) 2007-09-28 2008-09-26 照明された試料を光学的に捕捉するための方法および装置
JP2014109104A Active JP5878207B2 (ja) 2007-09-28 2014-05-27 照明された試料を光学的に捕捉するための方法および装置

Family Applications Before (1)

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JP2010526212A Pending JP2010540999A (ja) 2007-09-28 2008-09-26 照明された試料を光学的に捕捉するための方法および装置

Country Status (4)

Country Link
EP (2) EP2195696B1 (enExample)
JP (2) JP2010540999A (enExample)
DE (1) DE102007047466A1 (enExample)
WO (1) WO2009043546A1 (enExample)

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DE102008022493A1 (de) * 2008-05-07 2009-11-12 Carl Zeiss Microlmaging Gmbh Vorrichtung und Verfahren zum evaneszenten Beleuchten einer Probe
DE102008049878A1 (de) 2008-09-30 2010-04-01 Carl Zeiss Microlmaging Gmbh Verbesserte Verfahren und Vorrichtungen für die Mikroskopie mit strukturierter Beleuchtung
DE102009055216A1 (de) * 2009-12-22 2011-06-30 Carl Zeiss Microlmaging GmbH, 07745 Lumineszenzmikroskopie
EP3726274B1 (en) 2010-04-26 2023-08-23 Nikon Corporation Structured illumination microscope apparatus and an image forming apparatus
EP2681533B1 (en) * 2011-03-01 2017-08-09 GE Healthcare Bio-Sciences Corp. Systems and methods for illumination phase control in fluorescence microscopy
WO2012153495A1 (ja) 2011-05-06 2012-11-15 株式会社ニコン 構造化照明顕微鏡及び構造化照明観察方法
WO2013001805A1 (ja) 2011-06-29 2013-01-03 株式会社ニコン 構造化照明光学系および構造化照明顕微鏡装置
JP5641142B2 (ja) * 2011-07-15 2014-12-17 株式会社ニコン 構造化照明装置、構造化照明顕微鏡、構造化照明方法
DE102011114500B4 (de) 2011-09-29 2022-05-05 Fei Company Mikroskopvorrichtung
DE102011083847A1 (de) * 2011-09-30 2013-04-04 Carl Zeiss Microscopy Gmbh Mikroskop für die Weitfeldmikroskopie
DE102012020877A1 (de) 2012-10-17 2014-04-17 Carl Zeiss Microscopy Gmbh Optikanordnung und Lichtmikroskop
WO2014084007A1 (ja) * 2012-11-29 2014-06-05 シチズンホールディングス株式会社 光変調素子
JP6191140B2 (ja) * 2013-01-17 2017-09-06 株式会社ニコン 構造化照明装置及び構造化照明顕微鏡装置
EP2913683A1 (en) 2014-02-26 2015-09-02 Nuomedis AG Method and apparatus for automated scanning probe microscopy
CN108292034B (zh) 2015-10-09 2022-01-04 徕卡显微系统复合显微镜有限公司 用于利用结构化的光片照射检查试样的方法和设备
DE102015221991A1 (de) 2015-11-09 2017-05-11 Carl Zeiss Microscopy Gmbh Mikroskopierverfahren zur Ermittlung eines Kontrastbildes und Mikroskop
DE102016108079A1 (de) * 2016-05-02 2017-11-02 Carl Zeiss Microscopy Gmbh Artefaktreduktion bei der winkelselektiven beleuchtung
DE102016117803A1 (de) 2016-09-21 2018-03-22 Leica Microsystems Cms Gmbh Mikroskopbeleuchtungsanordnung zur strukturierten Beleuchtung
DE102017109645A1 (de) * 2017-05-05 2018-11-08 Carl Zeiss Microscopy Gmbh Lichtmikroskop und Verfahren zum Bereitstellen von strukturiertem Beleuchtungslicht
CN108681059B (zh) * 2018-05-07 2023-12-08 中国人民解放军陆军工程大学 亚微秒级二维光学观测装置
DE102018131217A1 (de) * 2018-12-06 2020-06-10 Universität Bielefeld Optisches Modul zur Erzeugung von Beleuchtungsmustern für die strukturierte Beleuchtungsmikroskopie
WO2021167896A1 (en) 2020-02-19 2021-08-26 Thermo Electron Scientific Instruments Llc Phase mask for structured illumination
CN111338070B (zh) * 2020-03-18 2021-04-23 中国科学技术大学 一种结构光产生装置及结构光照明显微镜
CN116520545B (zh) * 2023-04-28 2025-11-11 西安电子科技大学 一种基于掩膜相位调制的超分辨显微成像系统
DE102024111213A1 (de) * 2024-04-22 2025-10-23 Carl Zeiss Microscopy Gmbh Vorrichtung und Verfahren zum mikroskopischen Beleuchten einer Probe, Mikroskop und Verfahren zur Mikroskopie

Family Cites Families (11)

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Publication number Priority date Publication date Assignee Title
DE69802514T2 (de) 1997-04-04 2002-06-27 Isis Innovation Abbildungssystem und -verfahren für mikroskopie
WO2001044854A2 (en) * 1999-12-17 2001-06-21 Digital Optical Imaging Corporation Methods and apparatus for imaging using a light guide bundle and a spatial light modulator
DE10038527A1 (de) 2000-08-08 2002-02-21 Zeiss Carl Jena Gmbh Anordnung zur Erhöhung der Tiefendiskriminierung optisch abbildender Systeme
JP4844862B2 (ja) * 2001-09-14 2011-12-28 株式会社ニコン 格子照明顕微鏡
US6888148B2 (en) 2001-12-10 2005-05-03 Carl Zeiss Jena Gmbh Arrangement for the optical capture of excited and /or back scattered light beam in a sample
JP4899408B2 (ja) * 2005-02-25 2012-03-21 株式会社ニコン 顕微鏡装置
EP1933186A1 (en) * 2005-10-07 2008-06-18 Nikon Corporation Microscope and image generation method
US7872798B2 (en) * 2005-10-11 2011-01-18 Nikon Corporation Microscopic apparatus and observing method
US8081378B2 (en) * 2005-10-13 2011-12-20 Nikon Corporation Microscope
US7619732B2 (en) * 2006-03-01 2009-11-17 Leica Microsystems Cms Gmbh Method and microscope for high spatial resolution examination of samples
WO2009031418A1 (ja) * 2007-09-05 2009-03-12 Nikon Corporation 顕微鏡装置

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