JP2017535816A5 - - Google Patents

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Publication number
JP2017535816A5
JP2017535816A5 JP2017525546A JP2017525546A JP2017535816A5 JP 2017535816 A5 JP2017535816 A5 JP 2017535816A5 JP 2017525546 A JP2017525546 A JP 2017525546A JP 2017525546 A JP2017525546 A JP 2017525546A JP 2017535816 A5 JP2017535816 A5 JP 2017535816A5
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JP
Japan
Prior art keywords
concave mirror
deflection unit
microscope
beam deflection
unit
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JP2017525546A
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English (en)
Japanese (ja)
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JP2017535816A (ja
JP6637976B2 (ja
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Priority claimed from DE102014017001.2A external-priority patent/DE102014017001A1/de
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Publication of JP2017535816A5 publication Critical patent/JP2017535816A5/ja
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Publication of JP6637976B2 publication Critical patent/JP6637976B2/ja
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JP2017525546A 2014-11-12 2015-11-11 歪曲収差の少ない顕微鏡 Active JP6637976B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102014017001.2A DE102014017001A1 (de) 2014-11-12 2014-11-12 Mikroskop mit geringem Verzeichnungsfehler
DE102014017001.2 2014-11-12
PCT/EP2015/076338 WO2016075195A1 (de) 2014-11-12 2015-11-11 Mikroskop mit geringem verzeichnungsfehler

Publications (3)

Publication Number Publication Date
JP2017535816A JP2017535816A (ja) 2017-11-30
JP2017535816A5 true JP2017535816A5 (enExample) 2018-12-20
JP6637976B2 JP6637976B2 (ja) 2020-01-29

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ID=54540089

Family Applications (1)

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JP2017525546A Active JP6637976B2 (ja) 2014-11-12 2015-11-11 歪曲収差の少ない顕微鏡

Country Status (6)

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US (1) US10254524B2 (enExample)
EP (1) EP3218757B1 (enExample)
JP (1) JP6637976B2 (enExample)
CN (1) CN107003506B (enExample)
DE (1) DE102014017001A1 (enExample)
WO (1) WO2016075195A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102014005880A1 (de) * 2014-04-17 2015-11-05 Carl Zeiss Ag Lichtrastermikroskop mit vereinfachter Optik, insbesondere mit veränderlicher Pupillenlage
DE102016011227C5 (de) * 2016-09-19 2020-04-09 Leica Microsystems Cms Gmbh Mikroskopsystem und Verfahren zur Abbildung einer Probe unter Verwendung eines Mikroskopsystems
US11506877B2 (en) 2016-11-10 2022-11-22 The Trustees Of Columbia University In The City Of New York Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees
DE102017119480A1 (de) 2017-08-25 2019-02-28 Carl Zeiss Microscopy Gmbh Optische Anordnung zum Scannen von Anregungsstrahlung und/oder Manipulationsstrahlung in einem Laser-Scanning-Mikroskop und Laser-Scanning-Mikroskop
DE102017119479A1 (de) 2017-08-25 2019-02-28 Carl Zeiss Microscopy Gmbh Optische Anordnung zum Scannen von Anregungsstrahlung und/oder Manipulationsstrahlung in einem Laser-Scanning-Mikroskop und Laser-Scanning-Mikroskop
DE102017119478A1 (de) 2017-08-25 2019-02-28 Carl Zeiss Microscopy Gmbh Optische Anordnung zum Scannen von Anregungsstrahlung und/oder Manipulationsstrahlung in einem Laser-Scanning-Mikroskop und Laser-Scanning-Mikroskop
US10722977B2 (en) * 2018-05-03 2020-07-28 Thorlabs, Inc. Laser scan head design for three scanning mirrors with optics
US12117600B2 (en) 2019-03-28 2024-10-15 Hamamatsu Photonics K.K. Confocal microscope unit and confocal microscope
WO2020196782A1 (ja) * 2019-03-28 2020-10-01 浜松ホトニクス株式会社 走査型顕微鏡ユニット
DE102020206537A1 (de) 2020-05-26 2021-12-02 Osram Gmbh Lidar-MEMS-Winkel-Anpassung
DE102020006975A1 (de) * 2020-11-11 2022-05-12 Carl Zeiss Microscopy Gmbh Laser-Scanning-Mikroskop und Verfahren zum Justieren eines Laser-Scanning-Mikroskops
CN115844323B (zh) * 2022-12-09 2024-02-27 视微影像(河南)科技有限公司 适用于彩色眼底影像系统的光学镜组、视度补偿方法及驱动方法

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH472037A (de) * 1966-07-13 1969-04-30 Vision Eng Mikroskop zur Tiefenabbildung eines Objektes
DE3033758A1 (de) * 1980-09-08 1982-04-29 Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar Koehlersche auflicht-hellfeld-beleuchtungseinrichtung
WO1990000755A1 (en) 1988-07-06 1990-01-25 Medical Research Council Achromatic scanning system
EP0527043B1 (en) * 1991-08-05 1997-01-22 Nikon Corporation Catadioptric reduction projection optical system
JP3343276B2 (ja) * 1993-04-15 2002-11-11 興和株式会社 レーザー走査型光学顕微鏡
US6888148B2 (en) * 2001-12-10 2005-05-03 Carl Zeiss Jena Gmbh Arrangement for the optical capture of excited and /or back scattered light beam in a sample
DE10227120A1 (de) 2002-06-15 2004-03-04 Carl Zeiss Jena Gmbh Mikroskop, insbesondere Laserscanningmikroskop mit adaptiver optischer Einrichtung
US7295726B1 (en) 2003-12-02 2007-11-13 Adriatic Research Institute Gimbal-less micro-electro-mechanical-system tip-tilt and tip-tilt-piston actuators and a method for forming the same
CN100585449C (zh) * 2005-01-27 2010-01-27 伦斯勒理工学院 可适应性扫描光学显微镜
DE102006045839B4 (de) 2006-09-27 2015-09-24 Carl Zeiss Microscopy Gmbh Laserscanningmikroskop mit Element zur Pupillenmanipulation
DE102007015063B4 (de) 2007-03-29 2019-10-17 Carl Zeiss Microscopy Gmbh Optische Anordnung zum Erzeugen eines Lichtblattes
JP4650526B2 (ja) * 2008-06-25 2011-03-16 富士ゼロックス株式会社 光走査装置
US8274720B2 (en) 2009-02-15 2012-09-25 Kessler Optics and Photonics Solutions, Ltd. Concentric afocal beam relay
JP5554965B2 (ja) * 2009-11-06 2014-07-23 オリンパス株式会社 位相変調型空間光変調器を用いたレーザ顕微鏡
DE102010026571B4 (de) 2010-07-07 2022-05-12 Carl Zeiss Microscopy Gmbh Optische Scan-Einrichtung
DE102011114500B4 (de) * 2011-09-29 2022-05-05 Fei Company Mikroskopvorrichtung
DE102013005927B4 (de) * 2013-03-28 2025-02-20 Friedrich-Schiller-Universität Jena Verfahren zum optisch hochaufgelösten Rasterscanning eines Objekts und Verwendung des Verfahrens
DE102014005880A1 (de) * 2014-04-17 2015-11-05 Carl Zeiss Ag Lichtrastermikroskop mit vereinfachter Optik, insbesondere mit veränderlicher Pupillenlage

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