JP2014212191A5 - - Google Patents
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- Publication number
- JP2014212191A5 JP2014212191A5 JP2013087211A JP2013087211A JP2014212191A5 JP 2014212191 A5 JP2014212191 A5 JP 2014212191A5 JP 2013087211 A JP2013087211 A JP 2013087211A JP 2013087211 A JP2013087211 A JP 2013087211A JP 2014212191 A5 JP2014212191 A5 JP 2014212191A5
- Authority
- JP
- Japan
- Prior art keywords
- insulating layer
- electrode
- semiconductor device
- disposed
- region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000004065 semiconductor Substances 0.000 claims description 34
- 239000000758 substrate Substances 0.000 claims description 9
- 238000004519 manufacturing process Methods 0.000 claims description 4
- 230000000149 penetrating effect Effects 0.000 claims description 3
- 238000000034 method Methods 0.000 claims 3
- 238000005468 ion implantation Methods 0.000 claims 1
- 150000002500 ions Chemical class 0.000 description 1
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013087211A JP2014212191A (ja) | 2013-04-18 | 2013-04-18 | 半導体装置、電気光学装置、半導体装置の製造方法、電気光学装置の製造方法、及び電子機器 |
| US14/254,427 US9299850B2 (en) | 2013-04-18 | 2014-04-16 | Semiconductor device having insulation layer with concave portion and semiconductor layer formed over concave portion, electro-optical device, method of manufacturing semiconductor device, method of manufacturing electro-optical device, and electronic apparatus |
| US15/046,156 US9543327B2 (en) | 2013-04-18 | 2016-02-17 | Semiconductor device having insulation layer with concave portion and semiconductor layer that includes channel area disposed at concave portion, electro-optical device, method of manufacturing semiconductor device, method of manufacturing electro-optical device, and electronic apparatus |
| US15/363,713 US9865620B2 (en) | 2013-04-18 | 2016-11-29 | Semiconductor device having semiconductor layer that includes channel region formed into concave shape, electro-optical device, method of manufacturing semiconductor device, method of manufacturing electro-optical device, and electronic apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013087211A JP2014212191A (ja) | 2013-04-18 | 2013-04-18 | 半導体装置、電気光学装置、半導体装置の製造方法、電気光学装置の製造方法、及び電子機器 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017218846A Division JP2018050069A (ja) | 2017-11-14 | 2017-11-14 | 半導体装置、電気光学装置、及び電子機器 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2014212191A JP2014212191A (ja) | 2014-11-13 |
| JP2014212191A5 true JP2014212191A5 (enExample) | 2016-05-19 |
Family
ID=51728351
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013087211A Withdrawn JP2014212191A (ja) | 2013-04-18 | 2013-04-18 | 半導体装置、電気光学装置、半導体装置の製造方法、電気光学装置の製造方法、及び電子機器 |
Country Status (2)
| Country | Link |
|---|---|
| US (3) | US9299850B2 (enExample) |
| JP (1) | JP2014212191A (enExample) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9363451B2 (en) * | 2011-12-19 | 2016-06-07 | Sony Corporation | Solid-state imaging device, method of manufacturing solid-state imaging device, and electronic apparatus |
| JP2014212191A (ja) * | 2013-04-18 | 2014-11-13 | セイコーエプソン株式会社 | 半導体装置、電気光学装置、半導体装置の製造方法、電気光学装置の製造方法、及び電子機器 |
| KR102177214B1 (ko) * | 2014-03-17 | 2020-11-11 | 삼성디스플레이 주식회사 | 플렉서블 디스플레이 장치 및 그 제조방법 |
| US9954112B2 (en) | 2015-01-26 | 2018-04-24 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
| CN105655407A (zh) * | 2016-03-11 | 2016-06-08 | 京东方科技集团股份有限公司 | 多晶硅薄膜晶体管及其制备方法、阵列基板、显示装置 |
| JP6536634B2 (ja) * | 2017-07-28 | 2019-07-03 | セイコーエプソン株式会社 | 電気光学装置および電子機器 |
| TWI646691B (zh) * | 2017-11-22 | 2019-01-01 | 友達光電股份有限公司 | 主動元件基板及其製造方法 |
| CN109300990B (zh) * | 2018-09-29 | 2022-04-22 | 合肥鑫晟光电科技有限公司 | 薄膜晶体管及制备方法、阵列基板、显示面板和显示装置 |
| JP7434996B2 (ja) * | 2020-02-14 | 2024-02-21 | セイコーエプソン株式会社 | 電気光学装置、および電子機器 |
| CN114335183B (zh) * | 2021-12-17 | 2024-12-13 | Tcl华星光电技术有限公司 | 阵列基板及显示面板 |
| KR20250039363A (ko) * | 2022-07-20 | 2025-03-20 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
| TW202430996A (zh) * | 2022-09-09 | 2024-08-01 | 日商半導體能源研究所股份有限公司 | 顯示裝置 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5252582A (en) * | 1975-10-25 | 1977-04-27 | Toshiba Corp | Device and production for semiconductor |
| KR100189966B1 (ko) * | 1995-06-13 | 1999-06-01 | 윤종용 | 소이 구조의 모스 트랜지스터 및 그 제조방법 |
| JP3645755B2 (ja) | 1999-09-17 | 2005-05-11 | 日本電気株式会社 | 薄膜トランジスタおよびその製造方法 |
| JP2001318625A (ja) * | 2000-05-08 | 2001-11-16 | Seiko Epson Corp | 電気光学装置、電気光学装置の製造方法及び電子機器 |
| JP3849434B2 (ja) * | 2001-02-14 | 2006-11-22 | セイコーエプソン株式会社 | 電気光学装置及び投射型表示装置 |
| US7419858B2 (en) | 2006-08-31 | 2008-09-02 | Sharp Laboratories Of America, Inc. | Recessed-gate thin-film transistor with self-aligned lightly doped drain |
| JP2009122253A (ja) * | 2007-11-13 | 2009-06-04 | Seiko Epson Corp | 電気光学装置及び電子機器 |
| JP5488136B2 (ja) | 2010-04-05 | 2014-05-14 | セイコーエプソン株式会社 | 電気光学装置及び電子機器並びにトランジスター |
| JP2014212191A (ja) * | 2013-04-18 | 2014-11-13 | セイコーエプソン株式会社 | 半導体装置、電気光学装置、半導体装置の製造方法、電気光学装置の製造方法、及び電子機器 |
-
2013
- 2013-04-18 JP JP2013087211A patent/JP2014212191A/ja not_active Withdrawn
-
2014
- 2014-04-16 US US14/254,427 patent/US9299850B2/en not_active Expired - Fee Related
-
2016
- 2016-02-17 US US15/046,156 patent/US9543327B2/en not_active Expired - Fee Related
- 2016-11-29 US US15/363,713 patent/US9865620B2/en not_active Expired - Fee Related
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