JP2014194415A5 - - Google Patents
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- Publication number
- JP2014194415A5 JP2014194415A5 JP2014049579A JP2014049579A JP2014194415A5 JP 2014194415 A5 JP2014194415 A5 JP 2014194415A5 JP 2014049579 A JP2014049579 A JP 2014049579A JP 2014049579 A JP2014049579 A JP 2014049579A JP 2014194415 A5 JP2014194415 A5 JP 2014194415A5
- Authority
- JP
- Japan
- Prior art keywords
- temperature control
- control unit
- tcu
- refrigerant
- transmission plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000003507 refrigerant Substances 0.000 claims 13
- 230000005540 biological transmission Effects 0.000 claims 11
- 238000001704 evaporation Methods 0.000 claims 11
- 230000008020 evaporation Effects 0.000 claims 9
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims 6
- 238000001816 cooling Methods 0.000 claims 1
- 239000000463 material Substances 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201361789203P | 2013-03-15 | 2013-03-15 | |
| US61/789,203 | 2013-03-15 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2014194415A JP2014194415A (ja) | 2014-10-09 |
| JP2014194415A5 true JP2014194415A5 (enExample) | 2017-04-13 |
Family
ID=50439133
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014049579A Pending JP2014194415A (ja) | 2013-03-15 | 2014-03-13 | 直接噴射相転移温度制御システム |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US9709622B2 (enExample) |
| EP (1) | EP2778696A3 (enExample) |
| JP (1) | JP2014194415A (enExample) |
| KR (1) | KR20140113881A (enExample) |
| CN (1) | CN104048457A (enExample) |
| SG (1) | SG10201400683QA (enExample) |
| TW (1) | TW201506420A (enExample) |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9921265B2 (en) * | 2015-12-18 | 2018-03-20 | Sensata Technologies, Inc. | Thermal clutch for thermal control unit and methods related thereto |
| US20170248973A1 (en) * | 2016-02-29 | 2017-08-31 | Cascade Microtech, Inc. | Probe systems and methods including active environmental control |
| US20170261547A1 (en) * | 2016-03-08 | 2017-09-14 | Temptronic Corporation | Temperature Forcing System and Method with Conductive Thermal Probes |
| KR102693821B1 (ko) * | 2016-04-12 | 2024-08-12 | (주)테크윙 | 전자부품 테스트용 핸들러 |
| US11061069B2 (en) | 2016-06-02 | 2021-07-13 | Kes Systems, Inc. | Burn-in test apparatus for semiconductor devices |
| WO2018148689A1 (en) * | 2017-02-12 | 2018-08-16 | ClearMotion, Inc. | Hydraulic actuator a frequency dependent relative pressure ratio |
| US10677842B2 (en) * | 2017-05-26 | 2020-06-09 | Advantest Corporation | DUT testing with configurable cooling control using DUT internal temperature data |
| WO2020176999A1 (en) * | 2019-03-06 | 2020-09-10 | Kingtiger Technology (Canada) Inc. | System and method for verifying and analyzing memory for high performance computing systems |
| US11899042B2 (en) | 2020-10-22 | 2024-02-13 | Teradyne, Inc. | Automated test system |
| US11953519B2 (en) | 2020-10-22 | 2024-04-09 | Teradyne, Inc. | Modular automated test system |
| US11867749B2 (en) | 2020-10-22 | 2024-01-09 | Teradyne, Inc. | Vision system for an automated test system |
| US11754596B2 (en) | 2020-10-22 | 2023-09-12 | Teradyne, Inc. | Test site configuration in an automated test system |
| US11754622B2 (en) | 2020-10-22 | 2023-09-12 | Teradyne, Inc. | Thermal control system for an automated test system |
| US11808812B2 (en) | 2020-11-02 | 2023-11-07 | Advantest Test Solutions, Inc. | Passive carrier-based device delivery for slot-based high-volume semiconductor test system |
| US11567119B2 (en) | 2020-12-04 | 2023-01-31 | Advantest Test Solutions, Inc. | Testing system including active thermal interposer device |
| US11573262B2 (en) * | 2020-12-31 | 2023-02-07 | Advantest Test Solutions, Inc. | Multi-input multi-zone thermal control for device testing |
| US12007411B2 (en) | 2021-06-22 | 2024-06-11 | Teradyne, Inc. | Test socket having an automated lid |
| JP2023116051A (ja) * | 2022-02-09 | 2023-08-22 | 株式会社アドバンテスト | 電子部品ハンドリング装置、及び、電子部品試験装置 |
| DE112023004426T5 (de) | 2022-10-21 | 2025-09-11 | Aem Singapore Pte. Ltd. | Thermokopf zur unabhängigen steuerung von zonen |
| US11693051B1 (en) | 2022-10-21 | 2023-07-04 | AEM Holdings Ltd. | Thermal head for independent control of zones |
| US11796589B1 (en) | 2022-10-21 | 2023-10-24 | AEM Holdings Ltd. | Thermal head for independent control of zones |
| US11828795B1 (en) * | 2022-10-21 | 2023-11-28 | AEM Holdings Ltd. | Test system with a thermal head comprising a plurality of adapters for independent thermal control of zones |
| US11656272B1 (en) | 2022-10-21 | 2023-05-23 | AEM Holdings Ltd. | Test system with a thermal head comprising a plurality of adapters and one or more cold plates for independent control of zones |
| CN116520134B (zh) * | 2022-11-09 | 2024-01-09 | 珠海精实测控技术股份有限公司 | 一种温控测试系统 |
| US11828796B1 (en) | 2023-05-02 | 2023-11-28 | AEM Holdings Ltd. | Integrated heater and temperature measurement |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4802370A (en) * | 1986-12-29 | 1989-02-07 | Halliburton Company | Transducer and sensor apparatus and method |
| US5198753A (en) * | 1990-06-29 | 1993-03-30 | Digital Equipment Corporation | Integrated circuit test fixture and method |
| US6668570B2 (en) * | 2001-05-31 | 2003-12-30 | Kryotech, Inc. | Apparatus and method for controlling the temperature of an electronic device under test |
| AU2002253773A1 (en) * | 2002-04-11 | 2003-11-17 | Gintic Institute Of Manufacturing Technology | Systems and methods for deformation measurement |
| US7100389B1 (en) | 2002-07-16 | 2006-09-05 | Delta Design, Inc. | Apparatus and method having mechanical isolation arrangement for controlling the temperature of an electronic device under test |
| CN1759643B (zh) * | 2003-03-12 | 2011-06-08 | 富士通株式会社 | 电子设备的冷却结构 |
| US6975028B1 (en) * | 2003-03-19 | 2005-12-13 | Delta Design, Inc. | Thermal apparatus for engaging electronic device |
| US7199597B2 (en) | 2004-02-16 | 2007-04-03 | Delta Design, Inc. | Dual feedback control system for maintaining the temperature of an IC-chip near a set-point |
| SG145539A1 (en) * | 2004-03-09 | 2008-09-29 | Micron Technology Inc | Integrated circuit (ic) test assembly including phase change material for stabilizing temperature during stress testing of integrated circuits and method thereof |
| US7373967B1 (en) | 2004-06-28 | 2008-05-20 | Delta Design, Inc. | Mechanical assembly, for regulating the temperature of an IC-Chip, having a gimbaled heat-exchanger with coiled springy conduits |
| JP4418772B2 (ja) | 2005-04-28 | 2010-02-24 | 富士通マイクロエレクトロニクス株式会社 | 温度制御装置 |
| KR100903182B1 (ko) * | 2005-09-28 | 2009-06-17 | 주식회사 엘지화학 | 차량용 전지팩의 냉각 시스템 |
| US8151872B2 (en) * | 2007-03-16 | 2012-04-10 | Centipede Systems, Inc. | Method and apparatus for controlling temperature |
| SG148900A1 (en) | 2007-07-06 | 2009-01-29 | Aem Singapore Pte Ltd | A heat transfer device |
| US8274300B2 (en) * | 2008-01-18 | 2012-09-25 | Kes Systems & Service (1993) Pte Ltd. | Thermal control unit for semiconductor testing |
| US9500701B2 (en) * | 2010-03-17 | 2016-11-22 | Delta Design, Inc. | Alignment mechanism |
| JP2012185184A (ja) * | 2012-07-02 | 2012-09-27 | Seiko Epson Corp | 電子部品の温度制御装置並びにハンドラ装置 |
| CN202929508U (zh) * | 2012-11-30 | 2013-05-08 | 河南省电力公司驻马店供电公司 | 无人值班变电站控制室环境智能管理装置 |
| CN104345753A (zh) * | 2013-07-25 | 2015-02-11 | 上海浦北信息科技有限公司 | 一种控温控湿测试台 |
-
2014
- 2014-03-13 US US14/210,084 patent/US9709622B2/en active Active
- 2014-03-13 TW TW103109013A patent/TW201506420A/zh unknown
- 2014-03-13 JP JP2014049579A patent/JP2014194415A/ja active Pending
- 2014-03-14 SG SG10201400683QA patent/SG10201400683QA/en unknown
- 2014-03-14 KR KR1020140030200A patent/KR20140113881A/ko not_active Ceased
- 2014-03-14 EP EP14160006.4A patent/EP2778696A3/en not_active Withdrawn
- 2014-03-14 CN CN201410175361.XA patent/CN104048457A/zh active Pending
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