JP2014178264A5 - - Google Patents

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JP2014178264A5
JP2014178264A5 JP2013053530A JP2013053530A JP2014178264A5 JP 2014178264 A5 JP2014178264 A5 JP 2014178264A5 JP 2013053530 A JP2013053530 A JP 2013053530A JP 2013053530 A JP2013053530 A JP 2013053530A JP 2014178264 A5 JP2014178264 A5 JP 2014178264A5
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power module
deterioration
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JP2013053530A
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Japanese (ja)
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JP5959457B2 (ja
JP2014178264A (ja
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JP2013053530A 2013-03-15 2013-03-15 パワーモジュール Active JP5959457B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2013053530A JP5959457B2 (ja) 2013-03-15 2013-03-15 パワーモジュール

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013053530A JP5959457B2 (ja) 2013-03-15 2013-03-15 パワーモジュール

Publications (3)

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JP2014178264A JP2014178264A (ja) 2014-09-25
JP2014178264A5 true JP2014178264A5 (enExample) 2014-12-11
JP5959457B2 JP5959457B2 (ja) 2016-08-02

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JP2013053530A Active JP5959457B2 (ja) 2013-03-15 2013-03-15 パワーモジュール

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Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7018790B2 (ja) * 2018-03-15 2022-02-14 三菱電機株式会社 パワーデバイスの余寿命診断装置および余寿命診断方法
JP7094177B2 (ja) * 2018-08-22 2022-07-01 三菱電機株式会社 電力用半導体素子の寿命推定装置
JP7118019B2 (ja) * 2019-02-05 2022-08-15 三菱電機株式会社 半導体モジュール、および半導体モジュールの寿命予測システム
JP7200822B2 (ja) * 2019-05-14 2023-01-10 株式会社デンソー 電力変換装置の劣化を監視する装置
JP2021125547A (ja) 2020-02-05 2021-08-30 富士電機株式会社 電力用半導体モジュール
JP7619051B2 (ja) * 2021-01-20 2025-01-22 富士電機株式会社 寿命診断装置、半導体装置、寿命診断方法、
JP2023115722A (ja) 2022-02-08 2023-08-21 株式会社東芝 電力変換器の診断装置、診断システム、診断方法、及び、診断プログラム

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3361017B2 (ja) * 1996-09-11 2003-01-07 株式会社東芝 快適性指標ｐｍｖ学習装置
JP5175911B2 (ja) * 2010-09-16 2013-04-03 株式会社東芝 はんだ接合部の寿命予測方法、はんだ接合部の寿命予測装置

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