JP2011043957A5 - 障害監視回路 - Google Patents
障害監視回路 Download PDFInfo
- Publication number
- JP2011043957A5 JP2011043957A5 JP2009191047A JP2009191047A JP2011043957A5 JP 2011043957 A5 JP2011043957 A5 JP 2011043957A5 JP 2009191047 A JP2009191047 A JP 2009191047A JP 2009191047 A JP2009191047 A JP 2009191047A JP 2011043957 A5 JP2011043957 A5 JP 2011043957A5
- Authority
- JP
- Japan
- Prior art keywords
- fault signal
- monitoring circuit
- circuit
- fault monitoring
- signal output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000012544 monitoring process Methods 0.000 title claims 3
- 230000002093 peripheral effect Effects 0.000 claims 3
- 238000012806 monitoring device Methods 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 claims 1
Claims (1)
- 周辺回路の障害により当該周辺回路を監視する周辺監視回路から出力される障害信号を第1の経路を介して取得し、当該障害信号を外部監視装置へ出力する障害信号出力部と、
前記周辺監視回路から出力される障害信号を前記第1の経路とは異なる第2の経路を介して取得し、当該障害信号に基づいて半導体集積回路の動作制御を行う制御部と、を備える障害監視回路。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009191047A JP2011043957A (ja) | 2009-08-20 | 2009-08-20 | 障害監視回路、半導体集積回路及び故障個所特定方法 |
US12/816,800 US20110043323A1 (en) | 2009-08-20 | 2010-06-16 | Fault monitoring circuit, semiconductor integrated circuit, and faulty part locating method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009191047A JP2011043957A (ja) | 2009-08-20 | 2009-08-20 | 障害監視回路、半導体集積回路及び故障個所特定方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2011043957A JP2011043957A (ja) | 2011-03-03 |
JP2011043957A5 true JP2011043957A5 (ja) | 2012-04-05 |
Family
ID=43604881
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009191047A Withdrawn JP2011043957A (ja) | 2009-08-20 | 2009-08-20 | 障害監視回路、半導体集積回路及び故障個所特定方法 |
Country Status (2)
Country | Link |
---|---|
US (1) | US20110043323A1 (ja) |
JP (1) | JP2011043957A (ja) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014048782A (ja) * | 2012-08-30 | 2014-03-17 | Fujitsu Ltd | 情報処理装置、及び情報処理装置の障害処理方法 |
WO2014041596A1 (ja) * | 2012-09-11 | 2014-03-20 | 三菱電機株式会社 | 安全コントローラ |
JP6540227B2 (ja) * | 2015-05-21 | 2019-07-10 | 株式会社ジェイテクト | 車両用制御装置 |
EP3104242A1 (de) * | 2015-06-12 | 2016-12-14 | Siemens Aktiengesellschaft | Leitsystem und verfahren zur evaluierung der kommunikation in einem technischen prozess |
JP6567923B2 (ja) * | 2015-08-25 | 2019-08-28 | Necプラットフォームズ株式会社 | 障害処理装置、システム、障害管理装置、方法およびプログラム |
JP6531661B2 (ja) * | 2016-02-12 | 2019-06-19 | 株式会社デンソー | 異常監視装置、および、これを用いた電動パワーステアリング装置 |
JP6884206B2 (ja) * | 2017-06-28 | 2021-06-09 | 日立Astemo株式会社 | 車両用ブレーキシステム |
US10902166B2 (en) * | 2017-12-31 | 2021-01-26 | Arteris, Inc. | System and method for isolating faults in a resilient system |
JP7102923B2 (ja) * | 2018-05-15 | 2022-07-20 | 株式会社ジェイテクト | 車両用制御装置 |
CN111145530B (zh) * | 2019-12-31 | 2023-10-13 | 深圳库马克科技有限公司 | 一种高压变频器功率单元的通信方法 |
KR20220014590A (ko) * | 2020-07-29 | 2022-02-07 | 삼성전자주식회사 | 결함 검출 회로를 포함하는 반도체 장치 및 반도체 장치의 결함 검출 방법 |
CN113885306B (zh) * | 2021-09-08 | 2024-06-04 | 中国航空工业集团公司西安航空计算技术研究所 | 一种安全架构下支持互换性的信号输出电路 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6076142A (en) * | 1996-03-15 | 2000-06-13 | Ampex Corporation | User configurable raid system with multiple data bus segments and removable electrical bridges |
US6408406B1 (en) * | 1999-08-31 | 2002-06-18 | Western Digital Technologies, Inc. | Hard disk drive infant mortality test |
US20080140921A1 (en) * | 2004-06-10 | 2008-06-12 | Sehat Sutardja | Externally removable non-volatile semiconductor memory module for hard disk drives |
US7886197B2 (en) * | 2007-06-14 | 2011-02-08 | Xerox Corporation | Systems and methods for protecting device from change due to quality of replaceable components |
WO2009062280A1 (en) * | 2007-11-15 | 2009-05-22 | Mosaid Technologies Incorporated | Methods and systems for failure isolation and data recovery in a configuration of series-connected semiconductor devices |
US7890810B1 (en) * | 2008-02-26 | 2011-02-15 | Network Appliance, Inc. | Method and apparatus for deterministic fault injection of storage shelves in a storage subsystem |
JP4944220B2 (ja) * | 2010-03-12 | 2012-05-30 | 株式会社バッファロー | 記憶装置及びその制御プログラム |
-
2009
- 2009-08-20 JP JP2009191047A patent/JP2011043957A/ja not_active Withdrawn
-
2010
- 2010-06-16 US US12/816,800 patent/US20110043323A1/en not_active Abandoned
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