CN106796264A8 - 片上系统的老化控制 - Google Patents

片上系统的老化控制 Download PDF

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Publication number
CN106796264A8
CN106796264A8 CN201580044505.0A CN201580044505A CN106796264A8 CN 106796264 A8 CN106796264 A8 CN 106796264A8 CN 201580044505 A CN201580044505 A CN 201580044505A CN 106796264 A8 CN106796264 A8 CN 106796264A8
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CN
China
Prior art keywords
chip system
aging
value
life value
operational mode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201580044505.0A
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English (en)
Other versions
CN106796264A (zh
Inventor
克劳迪奥·法维
马尔科·马凯蒂
卡尔·奥森
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Nagravision SARL
Original Assignee
Nagravision SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nagravision SA filed Critical Nagravision SA
Publication of CN106796264A publication Critical patent/CN106796264A/zh
Publication of CN106796264A8 publication Critical patent/CN106796264A8/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2856—Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3016—Delay or race condition test, e.g. race hazard test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/50—Monitoring users, programs or devices to maintain the integrity of platforms, e.g. of processors, firmware or operating systems
    • G06F21/57—Certifying or maintaining trusted computer platforms, e.g. secure boots or power-downs, version controls, system software checks, secure updates or assessing vulnerabilities
    • G06F21/577—Assessing vulnerabilities and evaluating computer system security
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/60—Protecting data
    • G06F21/602—Providing cryptographic facilities or services
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2221/00—Indexing scheme relating to security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F2221/03—Indexing scheme relating to G06F21/50, monitoring users, programs or devices to maintain the integrity of platforms
    • G06F2221/034—Test or assess a computer or a system

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Computer Security & Cryptography (AREA)
  • Theoretical Computer Science (AREA)
  • Software Systems (AREA)
  • Environmental & Geological Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Bioethics (AREA)
  • Health & Medical Sciences (AREA)
  • Computing Systems (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

一种控制片上系统的老化的方法，片上系统包括一个或多个包含半导体电路部件的器件以及至少一个老化控制器，其监控片上系统内循环的电子信号。该方法包括以下步骤：通过改变与其运行模式相关的硬件参数来对片上系统的至少一个器件施加应力，将与由所述至少一个器件产生的电信号相关联的至少一个参数与参考参数进行比较来确定对应于所述至少一个器件的运行寿命值的差值，如果所述运行寿命值等于或超过阈值寿命值，确定应力状态值，以及根据所述应力状态值修改所述至少一个器件的运行模式。还公开了执行该方法的片上系统。
CN201580044505.0A 2014-08-19 2015-08-18 片上系统的老化控制 Pending CN106796264A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP14181467.3 2014-08-19
EP14181467.3A EP2988141A1 (en) 2014-08-19 2014-08-19 Aging control of a system on chip
PCT/EP2015/068923 WO2016026846A1 (en) 2014-08-19 2015-08-18 Aging control of a system on chip

Publications (2)

Publication Number Publication Date
CN106796264A CN106796264A (zh) 2017-05-31
CN106796264A8 true CN106796264A8 (zh) 2017-07-11

Family

ID=51429028

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201580044505.0A Pending CN106796264A (zh) 2014-08-19 2015-08-18 片上系统的老化控制

Country Status (11)

Country Link
US (1) US20170269151A1 (zh)
EP (2) EP2988141A1 (zh)
JP (1) JP2017527798A (zh)
KR (1) KR20170041748A (zh)
CN (1) CN106796264A (zh)
AU (1) AU2015306222B2 (zh)
BR (1) BR112017003350A2 (zh)
CA (1) CA2956579A1 (zh)
MX (1) MX2017002232A (zh)
SG (1) SG11201700923RA (zh)
WO (1) WO2016026846A1 (zh)

Families Citing this family (14)

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Publication number Priority date Publication date Assignee Title
US10102090B2 (en) * 2016-05-16 2018-10-16 International Business Machines Corporation Non-destructive analysis to determine use history of processor
CN106020170B (zh) * 2016-07-07 2019-03-15 工业和信息化部电子第五研究所 SoC健康监测的方法、装置及系统
FR3054949A1 (fr) 2016-08-03 2018-02-09 Stmicroelectronics (Crolles 2) Sas Procede de reglage d'au moins un point de fonctionnement d'au moins un circuit integre d'un systeme sur puce, et systeme sur puce correspondant
FR3054885B1 (fr) 2016-08-03 2018-09-07 Stmicroelectronics (Crolles 2) Sas Procede d'estimation d'un profil d'exploitation d'un circuit integre d'un systeme sur puce, et systeme sur puce correspondant
CN108254670A (zh) * 2017-12-06 2018-07-06 中国航空工业集团公司西安航空计算技术研究所 用于高速交换SoC的健康监控电路结构
FR3077005B1 (fr) * 2018-01-19 2022-07-15 Rossignol Sa Systeme d'analyse et planche de glisse associee
US11018693B2 (en) * 2018-07-12 2021-05-25 Maxim Integrated Products, Inc. System and method for continuously verifying device state integrity
JP7236231B2 (ja) * 2018-09-07 2023-03-09 ルネサスエレクトロニクス株式会社 半導体装置及び解析システム
CN110672943B (zh) * 2019-09-26 2022-11-08 宁波大学 基于电压比较器的老化检测传感器
CN111030195B (zh) * 2019-12-31 2023-02-07 深圳市科陆电子科技股份有限公司 储能系统参与电网电力调频的控制方法、装置及存储装置
US11528017B1 (en) * 2020-08-27 2022-12-13 Amazon Technologies, Inc. Digital ring oscillator for monitoring aging of silicon devices
CN113238111A (zh) * 2021-05-11 2021-08-10 杭州高裕电子科技有限公司 高低温反偏老化测试系统及其控制方法
US11789064B1 (en) * 2022-06-28 2023-10-17 International Business Machines Corporation Decoupling BTI and HCI mechanism in ring oscillator
CN115166462B (zh) * 2022-07-04 2023-08-22 赖俊生 一种半导体芯片全生命周期持续检测方法、装置和设备

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6903564B1 (en) * 2003-11-12 2005-06-07 Transmeta Corporation Device aging determination circuit
US7205854B2 (en) * 2003-12-23 2007-04-17 Intel Corporation On-chip transistor degradation monitoring
US7495519B2 (en) * 2007-04-30 2009-02-24 International Business Machines Corporation System and method for monitoring reliability of a digital system
WO2011027553A1 (ja) * 2009-09-07 2011-03-10 日本電気株式会社 経年劣化診断装置、経年劣化診断方法
US9535473B2 (en) * 2009-10-30 2017-01-03 Apple Inc. Compensating for aging in integrated circuits
US20110181315A1 (en) * 2010-01-25 2011-07-28 Broadcom Corporation Adaptive Device Aging Monitoring and Compensation
US9714966B2 (en) * 2012-10-05 2017-07-25 Texas Instruments Incorporated Circuit aging sensor

Also Published As

Publication number Publication date
AU2015306222A1 (en) 2017-04-06
WO2016026846A1 (en) 2016-02-25
MX2017002232A (es) 2017-05-12
CN106796264A (zh) 2017-05-31
EP3183588A1 (en) 2017-06-28
CA2956579A1 (en) 2016-02-25
EP2988141A1 (en) 2016-02-24
SG11201700923RA (en) 2017-03-30
AU2015306222B2 (en) 2018-06-14
JP2017527798A (ja) 2017-09-21
US20170269151A1 (en) 2017-09-21
KR20170041748A (ko) 2017-04-17
BR112017003350A2 (pt) 2017-11-28

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Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
CI01 Correction of invention patent gazette
CI01 Correction of invention patent gazette

Correction item: Priority

Correct: 14181467.3 2014.08.19 EP

Number: 22

Volume: 33

CI02 Correction of invention patent application
CI02 Correction of invention patent application

Correction item: Priority

Correct: 14181467.3 2014.08.19 EP

Number: 22

Page: The title page

Volume: 33

WD01 Invention patent application deemed withdrawn after publication
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20170531