MX2017002232A - Control de envejecimiento de un sistema en chip. - Google Patents
Control de envejecimiento de un sistema en chip.Info
- Publication number
- MX2017002232A MX2017002232A MX2017002232A MX2017002232A MX2017002232A MX 2017002232 A MX2017002232 A MX 2017002232A MX 2017002232 A MX2017002232 A MX 2017002232A MX 2017002232 A MX2017002232 A MX 2017002232A MX 2017002232 A MX2017002232 A MX 2017002232A
- Authority
- MX
- Mexico
- Prior art keywords
- chip
- operating
- age value
- stress state
- value
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2856—Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3016—Delay or race condition test, e.g. race hazard test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/50—Monitoring users, programs or devices to maintain the integrity of platforms, e.g. of processors, firmware or operating systems
- G06F21/57—Certifying or maintaining trusted computer platforms, e.g. secure boots or power-downs, version controls, system software checks, secure updates or assessing vulnerabilities
- G06F21/577—Assessing vulnerabilities and evaluating computer system security
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/60—Protecting data
- G06F21/602—Providing cryptographic facilities or services
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2221/00—Indexing scheme relating to security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F2221/03—Indexing scheme relating to G06F21/50, monitoring users, programs or devices to maintain the integrity of platforms
- G06F2221/034—Test or assess a computer or a system
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Computer Security & Cryptography (AREA)
- Theoretical Computer Science (AREA)
- Software Systems (AREA)
- Environmental & Geological Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Health & Medical Sciences (AREA)
- Bioethics (AREA)
- Health & Medical Sciences (AREA)
- Computing Systems (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Un metodo para controlar el envejecimiento de un sistema en chip que comprende uno o mas dispositivos que incluyen componentes de circuitos semiconductores y al menos un controlador de envejecimiento que monitorea las senales electricas que circulan dentro del sistema en chip. Comprendiendo el metodo las etapas de someter a tension al menos un dispositivo del sistema en chip al variar los parametros de hardware relacionados con su modo de operacion, comparar al menos un parametro asociado con una senal electrica producida por el al menos un dispositivo con un parametro de referencia para determinar la diferencia que corresponde al valor de envejecimiento de operacion del al menos un dispositivo, si el valor de envejecimiento de operacion iguala o excede el valor de envejecimiento de umbral, determinar el valor de estado de tension y modificar el modo de operacion del al menos un dispositivo de acuerdo con el valor de estado de tension. Tambien se describe un sistema en chip que lleva a cabo el metodo.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP14181467.3A EP2988141A1 (en) | 2014-08-19 | 2014-08-19 | Aging control of a system on chip |
| PCT/EP2015/068923 WO2016026846A1 (en) | 2014-08-19 | 2015-08-18 | Aging control of a system on chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| MX2017002232A true MX2017002232A (es) | 2017-05-12 |
Family
ID=51429028
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| MX2017002232A MX2017002232A (es) | 2014-08-19 | 2015-08-18 | Control de envejecimiento de un sistema en chip. |
Country Status (11)
| Country | Link |
|---|---|
| US (1) | US20170269151A1 (es) |
| EP (2) | EP2988141A1 (es) |
| JP (1) | JP2017527798A (es) |
| KR (1) | KR20170041748A (es) |
| CN (1) | CN106796264A (es) |
| AU (1) | AU2015306222B2 (es) |
| BR (1) | BR112017003350A2 (es) |
| CA (1) | CA2956579A1 (es) |
| MX (1) | MX2017002232A (es) |
| SG (1) | SG11201700923RA (es) |
| WO (1) | WO2016026846A1 (es) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10102090B2 (en) * | 2016-05-16 | 2018-10-16 | International Business Machines Corporation | Non-destructive analysis to determine use history of processor |
| CN106020170B (zh) * | 2016-07-07 | 2019-03-15 | 工业和信息化部电子第五研究所 | SoC健康监测的方法、装置及系统 |
| FR3054949A1 (fr) | 2016-08-03 | 2018-02-09 | Stmicroelectronics (Crolles 2) Sas | Procede de reglage d'au moins un point de fonctionnement d'au moins un circuit integre d'un systeme sur puce, et systeme sur puce correspondant |
| FR3054885B1 (fr) | 2016-08-03 | 2018-09-07 | Stmicroelectronics (Crolles 2) Sas | Procede d'estimation d'un profil d'exploitation d'un circuit integre d'un systeme sur puce, et systeme sur puce correspondant |
| CN108254670A (zh) * | 2017-12-06 | 2018-07-06 | 中国航空工业集团公司西安航空计算技术研究所 | 用于高速交换SoC的健康监控电路结构 |
| FR3077005B1 (fr) * | 2018-01-19 | 2022-07-15 | Rossignol Sa | Systeme d'analyse et planche de glisse associee |
| US11018693B2 (en) * | 2018-07-12 | 2021-05-25 | Maxim Integrated Products, Inc. | System and method for continuously verifying device state integrity |
| JP7236231B2 (ja) * | 2018-09-07 | 2023-03-09 | ルネサスエレクトロニクス株式会社 | 半導体装置及び解析システム |
| CN110672943B (zh) * | 2019-09-26 | 2022-11-08 | 宁波大学 | 基于电压比较器的老化检测传感器 |
| CN111030195B (zh) * | 2019-12-31 | 2023-02-07 | 深圳市科陆电子科技股份有限公司 | 储能系统参与电网电力调频的控制方法、装置及存储装置 |
| US11528017B1 (en) * | 2020-08-27 | 2022-12-13 | Amazon Technologies, Inc. | Digital ring oscillator for monitoring aging of silicon devices |
| CN113238111A (zh) * | 2021-05-11 | 2021-08-10 | 杭州高裕电子科技有限公司 | 高低温反偏老化测试系统及其控制方法 |
| US11789064B1 (en) * | 2022-06-28 | 2023-10-17 | International Business Machines Corporation | Decoupling BTI and HCI mechanism in ring oscillator |
| CN115166462B (zh) * | 2022-07-04 | 2023-08-22 | 赖俊生 | 一种半导体芯片全生命周期持续检测方法、装置和设备 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6903564B1 (en) * | 2003-11-12 | 2005-06-07 | Transmeta Corporation | Device aging determination circuit |
| US7205854B2 (en) * | 2003-12-23 | 2007-04-17 | Intel Corporation | On-chip transistor degradation monitoring |
| US7495519B2 (en) * | 2007-04-30 | 2009-02-24 | International Business Machines Corporation | System and method for monitoring reliability of a digital system |
| US8674774B2 (en) * | 2009-09-07 | 2014-03-18 | Nec Corporation | Aging diagnostic device, aging diagnostic method |
| US9535473B2 (en) * | 2009-10-30 | 2017-01-03 | Apple Inc. | Compensating for aging in integrated circuits |
| US20110181315A1 (en) * | 2010-01-25 | 2011-07-28 | Broadcom Corporation | Adaptive Device Aging Monitoring and Compensation |
| US9714966B2 (en) * | 2012-10-05 | 2017-07-25 | Texas Instruments Incorporated | Circuit aging sensor |
-
2014
- 2014-08-19 EP EP14181467.3A patent/EP2988141A1/en not_active Withdrawn
-
2015
- 2015-08-18 US US15/505,010 patent/US20170269151A1/en not_active Abandoned
- 2015-08-18 EP EP15754152.5A patent/EP3183588A1/en not_active Withdrawn
- 2015-08-18 MX MX2017002232A patent/MX2017002232A/es unknown
- 2015-08-18 CA CA2956579A patent/CA2956579A1/en not_active Abandoned
- 2015-08-18 SG SG11201700923RA patent/SG11201700923RA/en unknown
- 2015-08-18 WO PCT/EP2015/068923 patent/WO2016026846A1/en active Application Filing
- 2015-08-18 AU AU2015306222A patent/AU2015306222B2/en not_active Expired - Fee Related
- 2015-08-18 CN CN201580044505.0A patent/CN106796264A/zh active Pending
- 2015-08-18 KR KR1020177004223A patent/KR20170041748A/ko unknown
- 2015-08-18 JP JP2017509646A patent/JP2017527798A/ja not_active Ceased
- 2015-08-18 BR BR112017003350A patent/BR112017003350A2/pt not_active Application Discontinuation
Also Published As
| Publication number | Publication date |
|---|---|
| CA2956579A1 (en) | 2016-02-25 |
| WO2016026846A1 (en) | 2016-02-25 |
| CN106796264A (zh) | 2017-05-31 |
| EP3183588A1 (en) | 2017-06-28 |
| SG11201700923RA (en) | 2017-03-30 |
| AU2015306222B2 (en) | 2018-06-14 |
| JP2017527798A (ja) | 2017-09-21 |
| BR112017003350A2 (pt) | 2017-11-28 |
| AU2015306222A1 (en) | 2017-04-06 |
| CN106796264A8 (zh) | 2017-07-11 |
| EP2988141A1 (en) | 2016-02-24 |
| US20170269151A1 (en) | 2017-09-21 |
| KR20170041748A (ko) | 2017-04-17 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| MX2017002232A (es) | Control de envejecimiento de un sistema en chip. | |
| AU2024202185A1 (en) | Continuous analyte monitoring system power conservation | |
| WO2014120439A3 (en) | Soft start circuits and techniques | |
| MX2016015131A (es) | Sistemas de diagnostico y control de alojamientos. | |
| WO2014109895A3 (en) | Energy storage control system and method | |
| GB2539832A (en) | Adjusting a power mode of a wearable computing device based on motion data | |
| MX2015002437A (es) | Sistema y metodo para determinar el estado de salud de una fuente de energia de un dispositivo portatil. | |
| WO2014152816A3 (en) | Systems and methods for lte interference detection | |
| EP2897322A3 (en) | Semiconductor integrated circuit, authentication system, and authentication method | |
| MX2019002001A (es) | Metodo de deteccion de anormalidad de temperatura para dispositivo de conversion de energia y dispositivo de deteccion de anormalidad de temperatura para dispositivo de conversion de energia. | |
| MX2018007217A (es) | Sistemas de monitoreo de estado y pronostico de disyuntores. | |
| TWM490688U (en) | Output short circuit protecting device | |
| WO2014182937A3 (en) | Method and devices for non-intrusive power monitoring | |
| PH12015501694A1 (en) | Systems and methods of performing gain control | |
| WO2014186119A3 (en) | Electronic circuit and method for synchronizing electric motor drive signals between a start-up mode of operation and a normal mode of operation | |
| MX2017003906A (es) | Sistema de cilindro integrado para asegurar puntos de acceso. | |
| JP2013196698A5 (es) | ||
| WO2016139067A3 (en) | Vehicle reference velocity estimation apparatus and method | |
| WO2013152374A3 (de) | Verfahren zum regeln einer leistungsfaktorkorrekturschaltung, leistungsfaktorkorrekturschaltung und betriebsgerät für ein leuchtmittel | |
| WO2016150761A3 (en) | Method and arrangement for automatic tuning of a controller | |
| WO2016201194A3 (en) | Method and apparatus for integrated circuit monitoring and prevention of electromigration failure | |
| IN2014DN03309A (es) | ||
| MX2018003818A (es) | Metodo de control de energia electrica y dispositivo de control de energia electrica. | |
| MX2019010304A (es) | Dispositivo y metodo para determinar la longitud de una linea. | |
| JP2016111879A5 (es) |