SG11201700923RA - Aging control of a system on chip - Google Patents

Aging control of a system on chip

Info

Publication number
SG11201700923RA
SG11201700923RA SG11201700923RA SG11201700923RA SG11201700923RA SG 11201700923R A SG11201700923R A SG 11201700923RA SG 11201700923R A SG11201700923R A SG 11201700923RA SG 11201700923R A SG11201700923R A SG 11201700923RA SG 11201700923R A SG11201700923R A SG 11201700923RA
Authority
SG
Singapore
Prior art keywords
chip
aging control
aging
control
Prior art date
Application number
SG11201700923RA
Inventor
Claudio Favi
Marco Macchetti
Karl Osen
Original Assignee
Nagravision Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nagravision Sa filed Critical Nagravision Sa
Publication of SG11201700923RA publication Critical patent/SG11201700923RA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2856—Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3016—Delay or race condition test, e.g. race hazard test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/50—Monitoring users, programs or devices to maintain the integrity of platforms, e.g. of processors, firmware or operating systems
    • G06F21/57—Certifying or maintaining trusted computer platforms, e.g. secure boots or power-downs, version controls, system software checks, secure updates or assessing vulnerabilities
    • G06F21/577—Assessing vulnerabilities and evaluating computer system security
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/60—Protecting data
    • G06F21/602—Providing cryptographic facilities or services
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2221/00—Indexing scheme relating to security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F2221/03—Indexing scheme relating to G06F21/50, monitoring users, programs or devices to maintain the integrity of platforms
    • G06F2221/034—Test or assess a computer or a system

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Computer Security & Cryptography (AREA)
  • Theoretical Computer Science (AREA)
  • Software Systems (AREA)
  • Environmental & Geological Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Bioethics (AREA)
  • Health & Medical Sciences (AREA)
  • Computing Systems (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
SG11201700923RA 2014-08-19 2015-08-18 Aging control of a system on chip SG11201700923RA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP14181467.3A EP2988141A1 (en) 2014-08-19 2014-08-19 Aging control of a system on chip
PCT/EP2015/068923 WO2016026846A1 (en) 2014-08-19 2015-08-18 Aging control of a system on chip

Publications (1)

Publication Number Publication Date
SG11201700923RA true SG11201700923RA (en) 2017-03-30

Family

ID=51429028

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201700923RA SG11201700923RA (en) 2014-08-19 2015-08-18 Aging control of a system on chip

Country Status (11)

Country Link
US (1) US20170269151A1 (en)
EP (2) EP2988141A1 (en)
JP (1) JP2017527798A (en)
KR (1) KR20170041748A (en)
CN (1) CN106796264A (en)
AU (1) AU2015306222B2 (en)
BR (1) BR112017003350A2 (en)
CA (1) CA2956579A1 (en)
MX (1) MX2017002232A (en)
SG (1) SG11201700923RA (en)
WO (1) WO2016026846A1 (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10102090B2 (en) * 2016-05-16 2018-10-16 International Business Machines Corporation Non-destructive analysis to determine use history of processor
CN106020170B (en) * 2016-07-07 2019-03-15 工业和信息化部电子第五研究所 The method, apparatus and system of SoC health monitoring
FR3054885B1 (en) * 2016-08-03 2018-09-07 Stmicroelectronics (Crolles 2) Sas METHOD FOR ESTIMATING AN OPERATING PROFILE OF AN INTEGRATED CIRCUIT OF A SYSTEM ON A CHIP, AND A SYSTEM THEREON ON A CHIP CORRESPONDING
FR3054949A1 (en) 2016-08-03 2018-02-09 Stmicroelectronics (Crolles 2) Sas METHOD FOR ADJUSTING AT LEAST ONE OPERATING POINT OF AT LEAST ONE INTEGRATED CIRCUIT OF AN ON-CHIP SYSTEM, AND CORRESPONDING CHIP SYSTEM
CN108254670A (en) * 2017-12-06 2018-07-06 中国航空工业集团公司西安航空计算技术研究所 For exchanging the health monitoring circuit structure of SoC at a high speed
FR3077005B1 (en) * 2018-01-19 2022-07-15 Rossignol Sa ANALYSIS SYSTEM AND ASSOCIATED SLIDING BOARD
US11018693B2 (en) * 2018-07-12 2021-05-25 Maxim Integrated Products, Inc. System and method for continuously verifying device state integrity
JP7236231B2 (en) * 2018-09-07 2023-03-09 ルネサスエレクトロニクス株式会社 Semiconductor device and analysis system
CN110672943B (en) * 2019-09-26 2022-11-08 宁波大学 Aging detection sensor based on voltage comparator
CN111030195B (en) * 2019-12-31 2023-02-07 深圳市科陆电子科技股份有限公司 Control method and device for energy storage system to participate in power grid power frequency modulation and storage device
US11528017B1 (en) * 2020-08-27 2022-12-13 Amazon Technologies, Inc. Digital ring oscillator for monitoring aging of silicon devices
CN113238111A (en) * 2021-05-11 2021-08-10 杭州高裕电子科技有限公司 High-low temperature anti-bias aging test system and control method thereof
US11789064B1 (en) * 2022-06-28 2023-10-17 International Business Machines Corporation Decoupling BTI and HCI mechanism in ring oscillator
CN115166462B (en) * 2022-07-04 2023-08-22 赖俊生 Method, device and equipment for continuously detecting full life cycle of semiconductor chip

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6903564B1 (en) * 2003-11-12 2005-06-07 Transmeta Corporation Device aging determination circuit
US7205854B2 (en) * 2003-12-23 2007-04-17 Intel Corporation On-chip transistor degradation monitoring
US7495519B2 (en) * 2007-04-30 2009-02-24 International Business Machines Corporation System and method for monitoring reliability of a digital system
WO2011027553A1 (en) * 2009-09-07 2011-03-10 日本電気株式会社 Aging diagnostic device, aging diagnostic method
US9535473B2 (en) * 2009-10-30 2017-01-03 Apple Inc. Compensating for aging in integrated circuits
US20110181315A1 (en) * 2010-01-25 2011-07-28 Broadcom Corporation Adaptive Device Aging Monitoring and Compensation
US9714966B2 (en) * 2012-10-05 2017-07-25 Texas Instruments Incorporated Circuit aging sensor

Also Published As

Publication number Publication date
CN106796264A (en) 2017-05-31
WO2016026846A1 (en) 2016-02-25
AU2015306222A1 (en) 2017-04-06
JP2017527798A (en) 2017-09-21
EP2988141A1 (en) 2016-02-24
CN106796264A8 (en) 2017-07-11
KR20170041748A (en) 2017-04-17
BR112017003350A2 (en) 2017-11-28
CA2956579A1 (en) 2016-02-25
AU2015306222B2 (en) 2018-06-14
EP3183588A1 (en) 2017-06-28
US20170269151A1 (en) 2017-09-21
MX2017002232A (en) 2017-05-12

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