BR112017003350A2 - controle de envelhecimento de um sistema em chip - Google Patents
controle de envelhecimento de um sistema em chipInfo
- Publication number
- BR112017003350A2 BR112017003350A2 BR112017003350A BR112017003350A BR112017003350A2 BR 112017003350 A2 BR112017003350 A2 BR 112017003350A2 BR 112017003350 A BR112017003350 A BR 112017003350A BR 112017003350 A BR112017003350 A BR 112017003350A BR 112017003350 A2 BR112017003350 A2 BR 112017003350A2
- Authority
- BR
- Brazil
- Prior art keywords
- chip system
- aging
- age value
- mode
- stress state
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2856—Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3016—Delay or race condition test, e.g. race hazard test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/50—Monitoring users, programs or devices to maintain the integrity of platforms, e.g. of processors, firmware or operating systems
- G06F21/57—Certifying or maintaining trusted computer platforms, e.g. secure boots or power-downs, version controls, system software checks, secure updates or assessing vulnerabilities
- G06F21/577—Assessing vulnerabilities and evaluating computer system security
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/60—Protecting data
- G06F21/602—Providing cryptographic facilities or services
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2221/00—Indexing scheme relating to security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F2221/03—Indexing scheme relating to G06F21/50, monitoring users, programs or devices to maintain the integrity of platforms
- G06F2221/034—Test or assess a computer or a system
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Computer Security & Cryptography (AREA)
- Software Systems (AREA)
- Environmental & Geological Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computing Systems (AREA)
- Health & Medical Sciences (AREA)
- Bioethics (AREA)
- General Health & Medical Sciences (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
resumo ?controle de envelhecimento de um sistema em chip? trata-se de um método para controlar o envelhecimento de um sistema em chip que compreende um ou mais dispositivos que incluem componentes de circuito semicondutor e ao menos um controlador de envelhecimento que monitora sinais elétricos que circulam dentro do sistema em chip. o método compreende as etapas de submeter ao estresse ao menos um dispositivo do sistema em chip por meio da variação de parâmetros de hardware relacionados a seu modo de operação, da comparação de ao menos um parâmetro associado a um sinal elétrico produzido pelo ao menos um dispositivo com um parâmetro de referência para determinar uma diferença que corresponde a um valor de idade de operação do ao menos um dispositivo, se o valor de idade de operação se igualar a ou exceder um valor de idade limiar, determinar um valor de estado de estresse e modificar o modo de operação do ao menos um dispositivo de acordo com o valor de estado de estresse. é revelado também um sistema em chip que realiza o método.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP14181467.3A EP2988141A1 (en) | 2014-08-19 | 2014-08-19 | Aging control of a system on chip |
| PCT/EP2015/068923 WO2016026846A1 (en) | 2014-08-19 | 2015-08-18 | Aging control of a system on chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| BR112017003350A2 true BR112017003350A2 (pt) | 2017-11-28 |
Family
ID=51429028
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BR112017003350A BR112017003350A2 (pt) | 2014-08-19 | 2015-08-18 | controle de envelhecimento de um sistema em chip |
Country Status (11)
| Country | Link |
|---|---|
| US (1) | US20170269151A1 (pt) |
| EP (2) | EP2988141A1 (pt) |
| JP (1) | JP2017527798A (pt) |
| KR (1) | KR20170041748A (pt) |
| CN (1) | CN106796264A (pt) |
| AU (1) | AU2015306222B2 (pt) |
| BR (1) | BR112017003350A2 (pt) |
| CA (1) | CA2956579A1 (pt) |
| MX (1) | MX2017002232A (pt) |
| SG (1) | SG11201700923RA (pt) |
| WO (1) | WO2016026846A1 (pt) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10102090B2 (en) * | 2016-05-16 | 2018-10-16 | International Business Machines Corporation | Non-destructive analysis to determine use history of processor |
| CN106020170B (zh) * | 2016-07-07 | 2019-03-15 | 工业和信息化部电子第五研究所 | SoC健康监测的方法、装置及系统 |
| FR3054885B1 (fr) | 2016-08-03 | 2018-09-07 | Stmicroelectronics (Crolles 2) Sas | Procede d'estimation d'un profil d'exploitation d'un circuit integre d'un systeme sur puce, et systeme sur puce correspondant |
| FR3054949A1 (fr) | 2016-08-03 | 2018-02-09 | Stmicroelectronics (Crolles 2) Sas | Procede de reglage d'au moins un point de fonctionnement d'au moins un circuit integre d'un systeme sur puce, et systeme sur puce correspondant |
| CN108254670A (zh) * | 2017-12-06 | 2018-07-06 | 中国航空工业集团公司西安航空计算技术研究所 | 用于高速交换SoC的健康监控电路结构 |
| FR3077005B1 (fr) * | 2018-01-19 | 2022-07-15 | Rossignol Sa | Systeme d'analyse et planche de glisse associee |
| US11018693B2 (en) * | 2018-07-12 | 2021-05-25 | Maxim Integrated Products, Inc. | System and method for continuously verifying device state integrity |
| JP7236231B2 (ja) * | 2018-09-07 | 2023-03-09 | ルネサスエレクトロニクス株式会社 | 半導体装置及び解析システム |
| CN110672943B (zh) * | 2019-09-26 | 2022-11-08 | 宁波大学 | 基于电压比较器的老化检测传感器 |
| CN111030195B (zh) * | 2019-12-31 | 2023-02-07 | 深圳市科陆电子科技股份有限公司 | 储能系统参与电网电力调频的控制方法、装置及存储装置 |
| US11528017B1 (en) * | 2020-08-27 | 2022-12-13 | Amazon Technologies, Inc. | Digital ring oscillator for monitoring aging of silicon devices |
| US11829222B2 (en) * | 2020-09-25 | 2023-11-28 | Advanced Micro Devices, Inc. | Operating voltage adjustment for aging circuits |
| CN113238111A (zh) * | 2021-05-11 | 2021-08-10 | 杭州高裕电子科技有限公司 | 高低温反偏老化测试系统及其控制方法 |
| US11789064B1 (en) * | 2022-06-28 | 2023-10-17 | International Business Machines Corporation | Decoupling BTI and HCI mechanism in ring oscillator |
| CN115166462B (zh) * | 2022-07-04 | 2023-08-22 | 赖俊生 | 一种半导体芯片全生命周期持续检测方法、装置和设备 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6903564B1 (en) * | 2003-11-12 | 2005-06-07 | Transmeta Corporation | Device aging determination circuit |
| US7205854B2 (en) * | 2003-12-23 | 2007-04-17 | Intel Corporation | On-chip transistor degradation monitoring |
| US7495519B2 (en) * | 2007-04-30 | 2009-02-24 | International Business Machines Corporation | System and method for monitoring reliability of a digital system |
| US8674774B2 (en) * | 2009-09-07 | 2014-03-18 | Nec Corporation | Aging diagnostic device, aging diagnostic method |
| US9535473B2 (en) * | 2009-10-30 | 2017-01-03 | Apple Inc. | Compensating for aging in integrated circuits |
| US20110181315A1 (en) * | 2010-01-25 | 2011-07-28 | Broadcom Corporation | Adaptive Device Aging Monitoring and Compensation |
| US9714966B2 (en) * | 2012-10-05 | 2017-07-25 | Texas Instruments Incorporated | Circuit aging sensor |
-
2014
- 2014-08-19 EP EP14181467.3A patent/EP2988141A1/en not_active Withdrawn
-
2015
- 2015-08-18 EP EP15754152.5A patent/EP3183588A1/en not_active Withdrawn
- 2015-08-18 US US15/505,010 patent/US20170269151A1/en not_active Abandoned
- 2015-08-18 BR BR112017003350A patent/BR112017003350A2/pt not_active Application Discontinuation
- 2015-08-18 JP JP2017509646A patent/JP2017527798A/ja not_active Ceased
- 2015-08-18 CA CA2956579A patent/CA2956579A1/en not_active Abandoned
- 2015-08-18 AU AU2015306222A patent/AU2015306222B2/en not_active Expired - Fee Related
- 2015-08-18 KR KR1020177004223A patent/KR20170041748A/ko unknown
- 2015-08-18 CN CN201580044505.0A patent/CN106796264A/zh active Pending
- 2015-08-18 WO PCT/EP2015/068923 patent/WO2016026846A1/en active Application Filing
- 2015-08-18 SG SG11201700923RA patent/SG11201700923RA/en unknown
- 2015-08-18 MX MX2017002232A patent/MX2017002232A/es unknown
Also Published As
| Publication number | Publication date |
|---|---|
| AU2015306222A1 (en) | 2017-04-06 |
| JP2017527798A (ja) | 2017-09-21 |
| US20170269151A1 (en) | 2017-09-21 |
| EP3183588A1 (en) | 2017-06-28 |
| EP2988141A1 (en) | 2016-02-24 |
| MX2017002232A (es) | 2017-05-12 |
| CN106796264A8 (zh) | 2017-07-11 |
| SG11201700923RA (en) | 2017-03-30 |
| WO2016026846A1 (en) | 2016-02-25 |
| KR20170041748A (ko) | 2017-04-17 |
| CN106796264A (zh) | 2017-05-31 |
| AU2015306222B2 (en) | 2018-06-14 |
| CA2956579A1 (en) | 2016-02-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| B11A | Dismissal acc. art.33 of ipl - examination not requested within 36 months of filing | ||
| B11Y | Definitive dismissal acc. article 33 of ipl - extension of time limit for request of examination expired |