JP2014142639A5 - - Google Patents

Download PDF

Info

Publication number
JP2014142639A5
JP2014142639A5 JP2014007377A JP2014007377A JP2014142639A5 JP 2014142639 A5 JP2014142639 A5 JP 2014142639A5 JP 2014007377 A JP2014007377 A JP 2014007377A JP 2014007377 A JP2014007377 A JP 2014007377A JP 2014142639 A5 JP2014142639 A5 JP 2014142639A5
Authority
JP
Japan
Prior art keywords
sample
excitation light
carbon
absorbance
fluorescence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2014007377A
Other languages
English (en)
Japanese (ja)
Other versions
JP6262543B2 (ja
JP2014142639A (ja
Filing date
Publication date
Priority claimed from EP13152215.3A external-priority patent/EP2757402B1/en
Application filed filed Critical
Publication of JP2014142639A publication Critical patent/JP2014142639A/ja
Publication of JP2014142639A5 publication Critical patent/JP2014142639A5/ja
Application granted granted Critical
Publication of JP6262543B2 publication Critical patent/JP6262543B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2014007377A 2013-01-22 2014-01-20 蛍光顕微鏡による試料の観察方法 Active JP6262543B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP13152215.3 2013-01-22
EP13152215.3A EP2757402B1 (en) 2013-01-22 2013-01-22 Method of observing samples with a fluorescent microscope

Publications (3)

Publication Number Publication Date
JP2014142639A JP2014142639A (ja) 2014-08-07
JP2014142639A5 true JP2014142639A5 (cg-RX-API-DMAC10.html) 2017-11-02
JP6262543B2 JP6262543B2 (ja) 2018-01-17

Family

ID=47715843

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014007377A Active JP6262543B2 (ja) 2013-01-22 2014-01-20 蛍光顕微鏡による試料の観察方法

Country Status (4)

Country Link
US (1) US20140203191A1 (cg-RX-API-DMAC10.html)
EP (1) EP2757402B1 (cg-RX-API-DMAC10.html)
JP (1) JP6262543B2 (cg-RX-API-DMAC10.html)
CN (1) CN103940791A (cg-RX-API-DMAC10.html)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2824445B1 (en) 2013-07-08 2016-03-02 Fei Company Charged-particle microscopy combined with raman spectroscopy
SE537103C2 (sv) 2013-12-16 2015-01-07 Per Fogelstrand System och metod för fluorescensmikroskopi med detektering av ljusemission från multipla fluorokromer
US11101104B2 (en) * 2019-08-30 2021-08-24 Fei Company Multi modal cryo compatible GUID grid
US12366509B2 (en) * 2019-10-04 2025-07-22 Mitegen, Llc Sample supports and sample cooling systems for cryo-electron microscopy
CN111855567B (zh) * 2019-10-16 2021-07-20 中国科学院物理研究所 一种实现光学智能聚焦的透射电镜系统及方法
WO2022256588A1 (en) * 2021-06-04 2022-12-08 Mitegen, Llc Sample supports for cryo-electron microscopy
US20250076159A1 (en) * 2023-08-28 2025-03-06 Fei Company Liquid specimen grid for transmission electron microscope

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0853238B1 (de) 1997-01-13 2002-09-18 Daniel Dr. Studer Probenhalter für wasserhaltige Proben sowie Verfahren zu deren Verwendung
JP4372996B2 (ja) * 1997-10-29 2009-11-25 ディジタル オプティカル イメージング コーポレイション 空間的に光変調された顕微鏡法に関する装置及び方法
NL1017669C2 (nl) 2001-03-22 2002-09-24 Univ Maastricht Inrichting voor het vervaardigen van preparaten voor een cryo-elektronenmicroscoop.
US6687035B2 (en) * 2001-06-07 2004-02-03 Leica Microsystems Heildelberg Gmbh Method and apparatus for ROI-scan with high temporal resolution
ATE539345T1 (de) * 2001-10-09 2012-01-15 Univ Ruprecht Karls Heidelberg Mikroskopisches weitfeldlichtverfahren
NL1023717C2 (nl) 2003-06-20 2004-12-21 Fei Co Preparaatdrager voor het dragen van een met een elektronenbundel te doorstralen preparaat.
JP2005216645A (ja) * 2004-01-29 2005-08-11 Jeol Ltd 透過電子顕微鏡
JP4425098B2 (ja) 2004-09-06 2010-03-03 浜松ホトニクス株式会社 蛍光顕微鏡および蛍光相関分光解析装置
US7355696B2 (en) * 2005-02-01 2008-04-08 Arryx, Inc Method and apparatus for sorting cells
JP2006292421A (ja) * 2005-04-06 2006-10-26 Sharp Corp 蛍光検出装置
EP1863066A1 (en) 2006-05-29 2007-12-05 FEI Company Sample carrier and sample holder
EP1953791A1 (en) * 2007-02-05 2008-08-06 FEI Company Apparatus for observing a sample with a particle beam and an optical microscope
EP1998165A1 (en) * 2007-06-01 2008-12-03 The European Community, represented by the European Commission Method of fluorescence imaging

Similar Documents

Publication Publication Date Title
JP5392406B2 (ja) 顕微鏡装置、観察方法
JP2011039290A5 (cg-RX-API-DMAC10.html)
JP2010500563A5 (cg-RX-API-DMAC10.html)
DE502006004676D1 (de) Auflösungsgesteigerte lumineszenz-mikroskopie
JP2012002601A5 (cg-RX-API-DMAC10.html)
WO2013010976A3 (en) Method and apparatus for analyzing and for removing a defect of an euv photomask
JP2014095863A5 (ja) 光照射装置、顕微鏡装置及びレーザ加工装置
BR112018011850A2 (pt) método e aparelho para verificar um pneu
JP2011223036A5 (ja) 露光装置及びデバイス製造方法
WO2012142595A3 (en) Systems and methods for imaging using a random laser
JP6262543B2 (ja) 蛍光顕微鏡による試料の観察方法
ES2720870T3 (es) Procedimiento de formación de imágenes láser en color y documento así realizado
CN203376545U (zh) 一种采用旋转匀光片匀化的激光照明装置
EP3109700A3 (en) Defect inspecting method, sorting method, and producing method for photomask blank
TW201129793A (en) Inspection device of mold for antidazzle process
WO2015077667A3 (en) System and method for holography-based fabrication
WO2015046518A1 (ja) 薄切片試料評価装置、該薄切片試料評価装置を含む薄切片試料作製装置、及び、薄切片試料評価方法
CN203677064U (zh) 一种利用线型光纤的反射式荧光断层成像系统
JP2014142339A5 (cg-RX-API-DMAC10.html)
JP2013073063A5 (cg-RX-API-DMAC10.html)
JP2015156422A (ja) パターン検査方法、パターン形成制御方法およびパターン検査装置
JP2012212133A5 (cg-RX-API-DMAC10.html)
JP2017215225A5 (cg-RX-API-DMAC10.html)
JP2007139870A5 (cg-RX-API-DMAC10.html)
JP2013235043A5 (cg-RX-API-DMAC10.html)