TW201129793A - Inspection device of mold for antidazzle process - Google Patents

Inspection device of mold for antidazzle process

Info

Publication number
TW201129793A
TW201129793A TW99128216A TW99128216A TW201129793A TW 201129793 A TW201129793 A TW 201129793A TW 99128216 A TW99128216 A TW 99128216A TW 99128216 A TW99128216 A TW 99128216A TW 201129793 A TW201129793 A TW 201129793A
Authority
TW
Taiwan
Prior art keywords
mold
light
inspection device
predesignated
antidazzle
Prior art date
Application number
TW99128216A
Other languages
Chinese (zh)
Inventor
Takashi Fujii
Original Assignee
Sumitomo Chemical Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Co filed Critical Sumitomo Chemical Co
Publication of TW201129793A publication Critical patent/TW201129793A/en

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Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)

Abstract

Provided is an inspection device of mold for inspecting concave defects and/or convex defects upon surfaces of a mold for antidazzle process, wherein the inspection device comprises a first illumination for irradiating a first light upon the mold surface, a second illumination for irradiating a second light upon the mold surface, a two-dimensional imaging device for obtaining image of a partial area of the mold surface comprising the area irradiated with the first and the second light, a light intensity control means for controling the intensity of the first and second light, and a calculation means for calculating the difference between the brightness of a spot predesignated upon the image and a predesignated brightness or a range thereof of the predesignated spot.
TW99128216A 2009-08-25 2010-08-24 Inspection device of mold for antidazzle process TW201129793A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009194243A JP2011047681A (en) 2009-08-25 2009-08-25 Inspection apparatus of mold for anti-glaring treatment

Publications (1)

Publication Number Publication Date
TW201129793A true TW201129793A (en) 2011-09-01

Family

ID=43785855

Family Applications (1)

Application Number Title Priority Date Filing Date
TW99128216A TW201129793A (en) 2009-08-25 2010-08-24 Inspection device of mold for antidazzle process

Country Status (4)

Country Link
JP (1) JP2011047681A (en)
KR (1) KR20110021664A (en)
CN (1) CN101995409A (en)
TW (1) TW201129793A (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012207977A (en) * 2011-03-29 2012-10-25 Sumitomo Chemical Co Ltd Defect marking method, defect marking device, and defect detecting system for anti-glare die
CN102305794A (en) * 2011-07-04 2012-01-04 上海熙视光电科技有限公司 Online die safety detector
TWI529385B (en) * 2011-09-26 2016-04-11 三菱麗陽股份有限公司 Inspection device and inspection method for member having fine uneven structure on surface, method for manufacturing member having anodized alumina layer on surface and method for manufacturing optical film
KR101474952B1 (en) * 2013-02-27 2014-12-31 한국표준과학연구원 Infrared thermography system and method for wind blade
CN106200253B (en) * 2015-04-29 2020-10-20 鸿富锦精密工业（深圳）有限公司 Camera module glare testing machine and glare testing method
JP6321709B2 (en) * 2016-03-25 2018-05-09 株式会社サンユウ Surface wrinkle inspection method

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06118007A (en) * 1992-10-08 1994-04-28 Fuji Xerox Co Ltd Method and device for inspecting defect on cylinder surface
JP2001255282A (en) * 2000-03-13 2001-09-21 Seiko Instruments Inc Method and apparatus for inspecting piezoelectric ceramics for defect
JP2001304835A (en) * 2000-04-26 2001-10-31 Toshiba Eng Co Ltd Illuminating device for measuring unevenness, unevenness measuring device, illuminating device for inspecting defect, defect inspection device and illuminating method therefor
JP2002082066A (en) * 2000-09-08 2002-03-22 Nippi:Kk Flaw inspecting method and device
JP4589101B2 (en) * 2003-12-25 2010-12-01 昭和電工株式会社 Surface inspection method and apparatus
JP4652024B2 (en) * 2004-11-22 2011-03-16 富士通株式会社 Surface inspection method and apparatus
CN1844901A (en) * 2005-04-08 2006-10-11 欧姆龙株式会社 Defect inspection method and defect inspection system using the method
JP5099546B2 (en) * 2007-10-31 2012-12-19 住友化学株式会社 Method for producing mold and method for producing antiglare film using mold obtained by the method

Also Published As

Publication number Publication date
KR20110021664A (en) 2011-03-04
JP2011047681A (en) 2011-03-10
CN101995409A (en) 2011-03-30

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