JP2014142309A5 - - Google Patents

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Publication number
JP2014142309A5
JP2014142309A5 JP2013012174A JP2013012174A JP2014142309A5 JP 2014142309 A5 JP2014142309 A5 JP 2014142309A5 JP 2013012174 A JP2013012174 A JP 2013012174A JP 2013012174 A JP2013012174 A JP 2013012174A JP 2014142309 A5 JP2014142309 A5 JP 2014142309A5
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JP
Japan
Prior art keywords
wave pulse
electromagnetic wave
information
waveform
electromagnetic
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Pending
Application number
JP2013012174A
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English (en)
Japanese (ja)
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JP2014142309A (ja
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Priority to JP2013012174A priority Critical patent/JP2014142309A/ja
Priority claimed from JP2013012174A external-priority patent/JP2014142309A/ja
Priority to US14/161,509 priority patent/US9310254B2/en
Publication of JP2014142309A publication Critical patent/JP2014142309A/ja
Publication of JP2014142309A5 publication Critical patent/JP2014142309A5/ja
Pending legal-status Critical Current

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JP2013012174A 2013-01-25 2013-01-25 測定物情報取得装置とその取得方法 Pending JP2014142309A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2013012174A JP2014142309A (ja) 2013-01-25 2013-01-25 測定物情報取得装置とその取得方法
US14/161,509 US9310254B2 (en) 2013-01-25 2014-01-22 Apparatus for acquiring information from object to be measured and aquiring method therefor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013012174A JP2014142309A (ja) 2013-01-25 2013-01-25 測定物情報取得装置とその取得方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2017178873A Division JP6590883B2 (ja) 2017-09-19 2017-09-19 測定物情報取得装置とその取得方法

Publications (2)

Publication Number Publication Date
JP2014142309A JP2014142309A (ja) 2014-08-07
JP2014142309A5 true JP2014142309A5 (enExample) 2016-03-10

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Family Applications (1)

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JP2013012174A Pending JP2014142309A (ja) 2013-01-25 2013-01-25 測定物情報取得装置とその取得方法

Country Status (2)

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US (1) US9310254B2 (enExample)
JP (1) JP2014142309A (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117293132A (zh) 2017-06-27 2023-12-26 罗姆股份有限公司 半导体装置
EP3660489A4 (en) * 2017-08-31 2021-04-14 Pioneer Corporation OPTICAL MEASURING DEVICE, MEASURING PROCESS, PROGRAM AND RECORDING MEDIA
DE102018122391A1 (de) * 2018-09-13 2020-03-19 Sikora Ag Vorrichtung und Verfahren zum Detektieren eines Gegenstandes
EP3742191A1 (en) * 2019-05-24 2020-11-25 Helmut Fischer GmbH Terahertz measuring device and method of operating a terahertz measuring device
CN113418855B (zh) * 2021-06-29 2024-08-20 华北水利水电大学 生物癌细胞检测的对称弓字型柔性超表面传感器及应用

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050087690A1 (en) * 2001-12-28 2005-04-28 Mamoru Usami Spectral measurnig device
JP2003322611A (ja) * 2002-04-30 2003-11-14 Horiba Ltd 光学窓を備える測定室
JP4871176B2 (ja) * 2007-03-13 2012-02-08 浜松ホトニクス株式会社 全反射テラヘルツ波測定装置
JP5717335B2 (ja) * 2009-01-23 2015-05-13 キヤノン株式会社 分析装置
JP2011085412A (ja) * 2009-10-13 2011-04-28 Sony Corp テラヘルツ合焦方法、テラヘルツ合焦装置及びテラヘルツ合焦プログラム
WO2011069549A1 (en) * 2009-12-10 2011-06-16 Foss Analytical A/S Variable path length probe
JP2012026943A (ja) * 2010-07-27 2012-02-09 Hitachi High-Technologies Corp 遠赤外撮像装置およびそれを用いた撮像方法
JP5885414B2 (ja) * 2010-08-05 2016-03-15 キヤノン株式会社 光周波数変換素子
JP5494351B2 (ja) 2010-08-24 2014-05-14 ソニー株式会社 蛍光強度補正方法、蛍光強度算出方法及び蛍光強度算出装置並びに蛍光強度補正プログラム
JP2013104804A (ja) * 2011-11-15 2013-05-30 Seiko Epson Corp 半導体短パルス発生装置、テラヘルツ波発生装置、カメラ、イメージング装置および計測装置

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