JP2016053540A5 - - Google Patents

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Publication number
JP2016053540A5
JP2016053540A5 JP2014180117A JP2014180117A JP2016053540A5 JP 2016053540 A5 JP2016053540 A5 JP 2016053540A5 JP 2014180117 A JP2014180117 A JP 2014180117A JP 2014180117 A JP2014180117 A JP 2014180117A JP 2016053540 A5 JP2016053540 A5 JP 2016053540A5
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JP
Japan
Prior art keywords
terahertz wave
time
laser beam
adjusting
period
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Pending
Application number
JP2014180117A
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English (en)
Japanese (ja)
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JP2016053540A (ja
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Priority to JP2014180117A priority Critical patent/JP2016053540A/ja
Priority claimed from JP2014180117A external-priority patent/JP2016053540A/ja
Publication of JP2016053540A publication Critical patent/JP2016053540A/ja
Publication of JP2016053540A5 publication Critical patent/JP2016053540A5/ja
Pending legal-status Critical Current

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JP2014180117A 2014-09-04 2014-09-04 テラヘルツ波計測装置及びテラヘルツ波計測装置の調整方法 Pending JP2016053540A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2014180117A JP2016053540A (ja) 2014-09-04 2014-09-04 テラヘルツ波計測装置及びテラヘルツ波計測装置の調整方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014180117A JP2016053540A (ja) 2014-09-04 2014-09-04 テラヘルツ波計測装置及びテラヘルツ波計測装置の調整方法

Publications (2)

Publication Number Publication Date
JP2016053540A JP2016053540A (ja) 2016-04-14
JP2016053540A5 true JP2016053540A5 (enExample) 2017-08-17

Family

ID=55745074

Family Applications (1)

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JP2014180117A Pending JP2016053540A (ja) 2014-09-04 2014-09-04 テラヘルツ波計測装置及びテラヘルツ波計測装置の調整方法

Country Status (1)

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JP (1) JP2016053540A (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117437150B (zh) * 2023-12-20 2024-03-15 齐鲁工业大学(山东省科学院) 太赫兹时域成像的图像去模糊方法、系统、介质及设备
CN117969449B (zh) * 2024-03-29 2024-07-05 三峡金沙江云川水电开发有限公司 一种太赫兹检测发电机定子线棒绝缘缺陷的方法及系统

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5776653B2 (ja) * 2012-09-03 2015-09-09 パルステック工業株式会社 透光性物体の厚さ測定装置及び厚さ測定方法
JP2014106127A (ja) * 2012-11-28 2014-06-09 Pioneer Electronic Corp テラヘルツ波計測装置及び方法

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