JP2014142309A - 測定物情報取得装置とその取得方法 - Google Patents

測定物情報取得装置とその取得方法 Download PDF

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Publication number
JP2014142309A
JP2014142309A JP2013012174A JP2013012174A JP2014142309A JP 2014142309 A JP2014142309 A JP 2014142309A JP 2013012174 A JP2013012174 A JP 2013012174A JP 2013012174 A JP2013012174 A JP 2013012174A JP 2014142309 A JP2014142309 A JP 2014142309A
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JP
Japan
Prior art keywords
measurement
wave pulse
measurement window
electromagnetic wave
waveform
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Pending
Application number
JP2013012174A
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English (en)
Japanese (ja)
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JP2014142309A5 (enExample
Inventor
Takeaki Itsuji
健明 井辻
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
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Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2013012174A priority Critical patent/JP2014142309A/ja
Priority to US14/161,509 priority patent/US9310254B2/en
Publication of JP2014142309A publication Critical patent/JP2014142309A/ja
Publication of JP2014142309A5 publication Critical patent/JP2014142309A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0896—Optical arrangements using a light source, e.g. for illuminating a surface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/0303—Optical path conditioning in cuvettes, e.g. windows; adapted optical elements or systems; path modifying or adjustment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N2021/0339—Holders for solids, powders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/02—Mechanical
    • G01N2201/022—Casings
    • G01N2201/0225—Part of casing being slidable, telescopic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/02—Mechanical
    • G01N2201/023—Controlling conditions in casing

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Toxicology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2013012174A 2013-01-25 2013-01-25 測定物情報取得装置とその取得方法 Pending JP2014142309A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2013012174A JP2014142309A (ja) 2013-01-25 2013-01-25 測定物情報取得装置とその取得方法
US14/161,509 US9310254B2 (en) 2013-01-25 2014-01-22 Apparatus for acquiring information from object to be measured and aquiring method therefor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013012174A JP2014142309A (ja) 2013-01-25 2013-01-25 測定物情報取得装置とその取得方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2017178873A Division JP6590883B2 (ja) 2017-09-19 2017-09-19 測定物情報取得装置とその取得方法

Publications (2)

Publication Number Publication Date
JP2014142309A true JP2014142309A (ja) 2014-08-07
JP2014142309A5 JP2014142309A5 (enExample) 2016-03-10

Family

ID=51221903

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013012174A Pending JP2014142309A (ja) 2013-01-25 2013-01-25 測定物情報取得装置とその取得方法

Country Status (2)

Country Link
US (1) US9310254B2 (enExample)
JP (1) JP2014142309A (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117293132A (zh) 2017-06-27 2023-12-26 罗姆股份有限公司 半导体装置
EP3660489A4 (en) * 2017-08-31 2021-04-14 Pioneer Corporation OPTICAL MEASURING DEVICE, MEASURING PROCESS, PROGRAM AND RECORDING MEDIA
DE102018122391A1 (de) * 2018-09-13 2020-03-19 Sikora Ag Vorrichtung und Verfahren zum Detektieren eines Gegenstandes
EP3742191A1 (en) * 2019-05-24 2020-11-25 Helmut Fischer GmbH Terahertz measuring device and method of operating a terahertz measuring device
CN113418855B (zh) * 2021-06-29 2024-08-20 华北水利水电大学 生物癌细胞检测的对称弓字型柔性超表面传感器及应用

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003058212A1 (fr) * 2001-12-28 2003-07-17 Nikon Corporation Dispositif de mesure spectrale
JP2003322611A (ja) * 2002-04-30 2003-11-14 Horiba Ltd 光学窓を備える測定室
JP2011085412A (ja) * 2009-10-13 2011-04-28 Sony Corp テラヘルツ合焦方法、テラヘルツ合焦装置及びテラヘルツ合焦プログラム
WO2011069549A1 (en) * 2009-12-10 2011-06-16 Foss Analytical A/S Variable path length probe
JP2012053452A (ja) * 2010-08-05 2012-03-15 Canon Inc 光周波数変換素子

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4871176B2 (ja) * 2007-03-13 2012-02-08 浜松ホトニクス株式会社 全反射テラヘルツ波測定装置
JP5717335B2 (ja) * 2009-01-23 2015-05-13 キヤノン株式会社 分析装置
JP2012026943A (ja) * 2010-07-27 2012-02-09 Hitachi High-Technologies Corp 遠赤外撮像装置およびそれを用いた撮像方法
JP5494351B2 (ja) 2010-08-24 2014-05-14 ソニー株式会社 蛍光強度補正方法、蛍光強度算出方法及び蛍光強度算出装置並びに蛍光強度補正プログラム
JP2013104804A (ja) * 2011-11-15 2013-05-30 Seiko Epson Corp 半導体短パルス発生装置、テラヘルツ波発生装置、カメラ、イメージング装置および計測装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003058212A1 (fr) * 2001-12-28 2003-07-17 Nikon Corporation Dispositif de mesure spectrale
JP2003322611A (ja) * 2002-04-30 2003-11-14 Horiba Ltd 光学窓を備える測定室
JP2011085412A (ja) * 2009-10-13 2011-04-28 Sony Corp テラヘルツ合焦方法、テラヘルツ合焦装置及びテラヘルツ合焦プログラム
WO2011069549A1 (en) * 2009-12-10 2011-06-16 Foss Analytical A/S Variable path length probe
JP2012053452A (ja) * 2010-08-05 2012-03-15 Canon Inc 光周波数変換素子

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Publication number Publication date
US20140209802A1 (en) 2014-07-31
US9310254B2 (en) 2016-04-12

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