JP2014099856A5 - - Google Patents

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Publication number
JP2014099856A5
JP2014099856A5 JP2013236015A JP2013236015A JP2014099856A5 JP 2014099856 A5 JP2014099856 A5 JP 2014099856A5 JP 2013236015 A JP2013236015 A JP 2013236015A JP 2013236015 A JP2013236015 A JP 2013236015A JP 2014099856 A5 JP2014099856 A5 JP 2014099856A5
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JP
Japan
Prior art keywords
node
comparator
input
voltage
output
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Application number
JP2013236015A
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English (en)
Japanese (ja)
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JP6327742B2 (ja
JP2014099856A (ja
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Priority claimed from US13/678,117 external-priority patent/US8981857B2/en
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Publication of JP2014099856A publication Critical patent/JP2014099856A/ja
Publication of JP2014099856A5 publication Critical patent/JP2014099856A5/ja
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Publication of JP6327742B2 publication Critical patent/JP6327742B2/ja
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JP2013236015A 2012-11-15 2013-11-14 温度依存性タイマ回路 Active JP6327742B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/678,117 2012-11-15
US13/678,117 US8981857B2 (en) 2012-11-15 2012-11-15 Temperature dependent timer circuit

Publications (3)

Publication Number Publication Date
JP2014099856A JP2014099856A (ja) 2014-05-29
JP2014099856A5 true JP2014099856A5 (OSRAM) 2016-12-28
JP6327742B2 JP6327742B2 (ja) 2018-05-23

Family

ID=50681085

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013236015A Active JP6327742B2 (ja) 2012-11-15 2013-11-14 温度依存性タイマ回路

Country Status (4)

Country Link
US (1) US8981857B2 (OSRAM)
JP (1) JP6327742B2 (OSRAM)
KR (1) KR102104681B1 (OSRAM)
CN (1) CN103823494B (OSRAM)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9244440B2 (en) 2014-11-19 2016-01-26 Oxana S Pantchenko Temperature dependent device
TWI557529B (zh) * 2016-01-12 2016-11-11 新唐科技股份有限公司 參考電壓電路
GB201622029D0 (en) 2016-12-22 2017-02-08 Nederlands Inst Voor Ecologie (Nioo-Knaw) See Scientia Terrae Vzw Nordic Semiconductor Asa Voltage sampling circuits
CN107204775B (zh) * 2017-06-02 2021-02-02 广州视源电子科技股份有限公司 模拟信号的采样方法及采样装置
US20250232826A1 (en) * 2024-01-12 2025-07-17 Qualcomm Incorporated Multi-reference-voltage sampled-bandgap system

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4906865A (en) 1988-12-09 1990-03-06 Intel Corporation Sample and hold circuit for temporal associations in a neural network
US5619066A (en) * 1990-05-15 1997-04-08 Dallas Semiconductor Corporation Memory for an electronic token
US5184218A (en) 1991-07-03 1993-02-02 Wavephore, Inc. Bandwidth compression and expansion system
US5479169A (en) 1994-06-07 1995-12-26 Louisiana Simchip Technologies, Inc. Multiple neural network analog to digital converter for simultaneously processing multiple samples
US5627970A (en) 1994-08-08 1997-05-06 Lucent Technologies Inc. Methods and apparatus for achieving and maintaining optimum transmission rates and preventing data loss in a processing system nework
JPH0973331A (ja) * 1995-06-30 1997-03-18 Seiko Instr Inc 半導体集積回路装置
US5870345A (en) * 1997-09-04 1999-02-09 Siemens Aktiengesellschaft Temperature independent oscillator
US6163225A (en) 1999-05-05 2000-12-19 Intel Corporation Method and apparatus for achieving low standby power using a positive temperature correlated clock frequency
US6510033B1 (en) * 2000-06-30 2003-01-21 Intel Corporation RC-timer circuit to reduce current leakage in future semiconductor processes
JP2002261608A (ja) * 2001-03-06 2002-09-13 Ricoh Co Ltd Ａ／ｄ変換回路
EP1384232A4 (en) * 2001-04-05 2008-11-19 T Ram Inc DYNAMIC DATA RESTORATION IN A THYRISTOR MEMORY DEVICE
US7583059B2 (en) 2003-12-18 2009-09-01 Lg Chem, Ltd. Apparatus and method for estimating state of charge of battery using neural network
US7031273B2 (en) 2004-04-23 2006-04-18 Motorola, Inc. Session initiation protocol retransmission method
JP2006012968A (ja) * 2004-06-23 2006-01-12 Nec Electronics Corp 半導体集積回路装置及びその設計方法
CN100505718C (zh) * 2004-10-28 2009-06-24 电子科技大学 一种高速突发模式时钟数据恢复电路
JP4461430B2 (ja) 2004-12-10 2010-05-12 エルピーダメモリ株式会社 セルフリフレッシュタイマ回路及びセルフリフレッシュタイマの調整方法
KR100963308B1 (ko) 2005-02-28 2010-06-11 후지쯔 가부시끼가이샤 전류 제어 발진기
US7236061B2 (en) 2005-05-03 2007-06-26 Macronix International Co., Ltd. Temperature compensated refresh clock circuit for memory circuits
US7391196B2 (en) * 2005-09-30 2008-06-24 Silicon Laboratories Inc. In system analysis and compensation for a digital PWM controller
US7342463B2 (en) * 2005-11-15 2008-03-11 Analog Devices, Inc. Timer circuits and method
US7535309B2 (en) * 2006-05-09 2009-05-19 Fairchild Semiconductor Corporation Low power, temperature and frequency, tunable, on-chip clock generator
JP4899738B2 (ja) * 2006-09-15 2012-03-21 日本電気株式会社 半導体集積回路装置
US7557665B2 (en) 2007-03-13 2009-07-07 Taiwan Semiconductor Manufacturing Company, Ltd. Temperature tracking oscillator circuit
JP4791581B2 (ja) * 2009-08-01 2011-10-12 株式会社半導体理工学研究センター サブスレッショルドディジタルｃｍｏｓ回路のための電源電圧制御回路及び制御方法

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