JP2014081378A5 - - Google Patents
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- JP2014081378A5 JP2014081378A5 JP2013214991A JP2013214991A JP2014081378A5 JP 2014081378 A5 JP2014081378 A5 JP 2014081378A5 JP 2013214991 A JP2013214991 A JP 2013214991A JP 2013214991 A JP2013214991 A JP 2013214991A JP 2014081378 A5 JP2014081378 A5 JP 2014081378A5
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- JP
- Japan
- Prior art keywords
- mirror
- test surface
- sent
- similar
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 230000007547 defect Effects 0.000 description 1
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201261714170P | 2012-10-15 | 2012-10-15 | |
| US61/714,170 | 2012-10-15 | ||
| US14/053,493 US10234400B2 (en) | 2012-10-15 | 2013-10-14 | Feature detection with light transmitting medium |
| US14/053,493 | 2013-10-14 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014081378A JP2014081378A (ja) | 2014-05-08 |
| JP2014081378A5 true JP2014081378A5 (enExample) | 2016-07-14 |
| JP6344898B2 JP6344898B2 (ja) | 2018-06-20 |
Family
ID=50475078
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013214991A Expired - Fee Related JP6344898B2 (ja) | 2012-10-15 | 2013-10-15 | 欠陥および特徴的形状を検出する装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US10234400B2 (enExample) |
| JP (1) | JP6344898B2 (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9068917B1 (en) * | 2006-03-14 | 2015-06-30 | Kla-Tencor Technologies Corp. | Systems and methods for inspection of a specimen |
| US9297759B2 (en) * | 2012-10-05 | 2016-03-29 | Seagate Technology Llc | Classification of surface features using fluorescence |
| CN116482122A (zh) * | 2023-05-09 | 2023-07-25 | 中国工商银行股份有限公司 | 一种箱体及监测箱体表面完整性的方法和装置 |
Family Cites Families (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3623809A (en) * | 1969-12-23 | 1971-11-30 | Hancock & Co Eng Ltd | Optical system with polarizing filters for line follower head |
| US3729636A (en) * | 1971-09-03 | 1973-04-24 | Brown & Williamson Tobacco Corp | System for detecting loose tobacco at cigarette ends |
| US4087685A (en) * | 1977-01-11 | 1978-05-02 | International Business Machines Corporation | Fluorescent microanalytical system and method for detecting and identifying organic materials |
| GB2108357B (en) * | 1981-09-28 | 1985-08-14 | Nippon Telegraph & Telephone | Method for resolving collision in local network |
| US4737004A (en) * | 1985-10-03 | 1988-04-12 | American Telephone And Telegraph Company, At&T Bell Laboratories | Expanded end optical fiber and associated coupling arrangements |
| JP2526576B2 (ja) | 1987-04-08 | 1996-08-21 | 株式会社豊田自動織機製作所 | 紡機における停止方法 |
| JPH0396903A (ja) | 1989-09-11 | 1991-04-22 | Nippon Telegr & Teleph Corp <Ntt> | 光ガイド検出器 |
| US5519526A (en) * | 1992-10-21 | 1996-05-21 | California Institute Of Technology | Optical protocols for communication networks |
| US5329351A (en) * | 1992-11-24 | 1994-07-12 | Estek Corporation | Particle detection system with coincident detection |
| CN2238435Y (zh) | 1994-07-12 | 1996-10-23 | 王仲明 | 光荧光显微镜 |
| DE9414467U1 (de) * | 1994-07-15 | 1994-11-10 | Bruker Analytische Meßtechnik GmbH, 76287 Rheinstetten | Raman-Spektrometer mit einer Meßsonde |
| US5506676A (en) * | 1994-10-25 | 1996-04-09 | Pixel Systems, Inc. | Defect detection using fourier optics and a spatial separator for simultaneous optical computing of separated fourier transform components |
| JPH08334648A (ja) | 1995-06-07 | 1996-12-17 | Sumitomo Electric Ind Ltd | 光機能モジュール |
| US6174424B1 (en) * | 1995-11-20 | 2001-01-16 | Cirrex Corp. | Couplers for optical fibers |
| WO1997026529A1 (en) * | 1996-01-19 | 1997-07-24 | Phase Metrics | Surface inspection apparatus and method |
| US5661559A (en) | 1996-03-14 | 1997-08-26 | Phase Metrics, Inc. | Optical surface detection for magnetic disks |
| JP3445722B2 (ja) | 1997-05-14 | 2003-09-08 | 出光石油化学株式会社 | 表面検査装置および表面検査方法 |
| JPH10332348A (ja) | 1997-05-27 | 1998-12-18 | Mitsubishi Heavy Ind Ltd | 半導体チップ外観検査装置 |
| US6800859B1 (en) | 1998-12-28 | 2004-10-05 | Hitachi, Ltd. | Method and equipment for detecting pattern defect |
| US6128078A (en) * | 1999-04-09 | 2000-10-03 | Three Lc, Inc. | Radiation filter, spectrometer and imager using a micro-mirror array |
| CN2433619Y (zh) | 2000-08-03 | 2001-06-06 | 中国科学院上海光学精密机械研究所 | 材料损坏的测量仪 |
| JP2002350283A (ja) | 2001-05-30 | 2002-12-04 | Tb Optical Co Ltd | 検査装置 |
| FR2832505B1 (fr) * | 2001-11-16 | 2008-07-04 | Inst Francais Du Petrole | Refractometre a fibre optique |
| JP2003255195A (ja) | 2002-02-27 | 2003-09-10 | Sumitomo Electric Ind Ltd | 波長多重コネクタ、光通信装置および光通信システム |
| US6781699B2 (en) | 2002-10-22 | 2004-08-24 | Corning-Tropel | Two-wavelength confocal interferometer for measuring multiple surfaces |
| US20040208458A1 (en) * | 2002-11-26 | 2004-10-21 | Hitoshi Uno | Bidirectional optical module, optical drop module, and optical transmission device |
| AU2003280199A1 (en) * | 2002-12-19 | 2004-07-14 | Koninklijke Philips Electronics N.V. | Optical analysis system |
| US20060066842A1 (en) * | 2004-09-30 | 2006-03-30 | Saunders Winston A | Wafer inspection with a customized reflective optical channel component |
| US9068917B1 (en) * | 2006-03-14 | 2015-06-30 | Kla-Tencor Technologies Corp. | Systems and methods for inspection of a specimen |
| US7864316B2 (en) * | 2006-11-20 | 2011-01-04 | Malvern Instruments, Ltd. | Spectrometric characterization of pharmaceutical heterogeneity |
| JP5237874B2 (ja) | 2009-04-24 | 2013-07-17 | 株式会社日立ハイテクノロジーズ | 欠陥検査方法および欠陥検査装置 |
| US8115932B2 (en) * | 2009-05-28 | 2012-02-14 | Corning Incorporated | Methods and apparatus for measuring ion implant dose |
| CN101762566B (zh) | 2010-01-13 | 2011-08-31 | 中国科学院半导体研究所 | 光子晶体微腔缺陷模气体传感方法 |
| JP5553716B2 (ja) | 2010-09-15 | 2014-07-16 | 株式会社日立ハイテクノロジーズ | 欠陥検査方法及びその装置 |
| CN202442950U (zh) | 2011-12-14 | 2012-09-19 | 杭州慕才科技有限公司 | 用于机器视觉的产品质量检测装置 |
| CN202794062U (zh) | 2012-09-28 | 2013-03-13 | 肇庆中导光电设备有限公司 | 具有透射及反射光源的照明装置及光学检测系统 |
-
2013
- 2013-10-14 US US14/053,493 patent/US10234400B2/en active Active
- 2013-10-15 JP JP2013214991A patent/JP6344898B2/ja not_active Expired - Fee Related
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