JP2014059155A5 - - Google Patents

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Publication number
JP2014059155A5
JP2014059155A5 JP2012202723A JP2012202723A JP2014059155A5 JP 2014059155 A5 JP2014059155 A5 JP 2014059155A5 JP 2012202723 A JP2012202723 A JP 2012202723A JP 2012202723 A JP2012202723 A JP 2012202723A JP 2014059155 A5 JP2014059155 A5 JP 2014059155A5
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JP
Japan
Prior art keywords
layer
charge blocking
blocking layer
substrate
generating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2012202723A
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English (en)
Japanese (ja)
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JP2014059155A (ja
JP6061129B2 (ja
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Publication date
Application filed filed Critical
Priority to JP2012202723A priority Critical patent/JP6061129B2/ja
Priority claimed from JP2012202723A external-priority patent/JP6061129B2/ja
Priority to US13/784,117 priority patent/US8895341B2/en
Publication of JP2014059155A publication Critical patent/JP2014059155A/ja
Publication of JP2014059155A5 publication Critical patent/JP2014059155A5/ja
Application granted granted Critical
Publication of JP6061129B2 publication Critical patent/JP6061129B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2012202723A 2012-09-14 2012-09-14 放射線検出器の製造方法 Expired - Fee Related JP6061129B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2012202723A JP6061129B2 (ja) 2012-09-14 2012-09-14 放射線検出器の製造方法
US13/784,117 US8895341B2 (en) 2012-09-14 2013-03-04 Method of manufacturing radiation detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012202723A JP6061129B2 (ja) 2012-09-14 2012-09-14 放射線検出器の製造方法

Publications (3)

Publication Number Publication Date
JP2014059155A JP2014059155A (ja) 2014-04-03
JP2014059155A5 true JP2014059155A5 (enExample) 2015-08-20
JP6061129B2 JP6061129B2 (ja) 2017-01-18

Family

ID=50274886

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012202723A Expired - Fee Related JP6061129B2 (ja) 2012-09-14 2012-09-14 放射線検出器の製造方法

Country Status (2)

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US (1) US8895341B2 (enExample)
JP (1) JP6061129B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3281039B1 (en) * 2015-04-07 2020-03-11 Shenzhen Xpectvision Technology Co., Ltd. Semiconductor x-ray detector
US10007009B2 (en) 2015-04-07 2018-06-26 Shenzhen Xpectvision Technology Co., Ltd. Semiconductor X-ray detector
US10910432B1 (en) * 2019-07-23 2021-02-02 Cyber Medical Imaging, Inc. Use of surface patterning for fabricating a single die direct capture dental X-ray imaging sensor

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4343881A (en) * 1981-07-06 1982-08-10 Savin Corporation Multilayer photoconductive assembly with intermediate heterojunction
JPH04269653A (ja) 1991-02-25 1992-09-25 Nippon Telegr & Teleph Corp <Ntt> 漏洩磁束検出装置
JPH06345598A (ja) * 1993-06-04 1994-12-20 Japan Energy Corp 放射線検出素子用CdTe結晶およびその製造方法
JPH09124310A (ja) * 1995-10-27 1997-05-13 Sumitomo Metal Mining Co Ltd CdTe結晶の製造方法
JP4269653B2 (ja) 2002-11-20 2009-05-27 株式会社島津製作所 放射線検出器の製造方法
EP2244294B1 (en) * 2008-02-12 2018-06-27 Shimadzu Corporation Method for manufacturing radiation detector
US20110155208A1 (en) * 2008-06-25 2011-06-30 Michael Wang Semiconductor heterojunction photovoltaic solar cell with a charge blocking layer
CN102460215B (zh) * 2009-04-03 2014-02-26 株式会社岛津制作所 放射线检测器的制造方法、放射线检测器以及放射线摄像装置
DE102010006452B4 (de) * 2010-02-01 2012-01-26 Siemens Aktiengesellschaft Strahlenwandlermaterial, Strahlenwandler, Strahlendetektor, Verwendung eines Strahlenwandlermaterials und Verfahren zur Herstellung eines Strahlenwandlermaterials

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