JP2013522585A5 - - Google Patents

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Publication number
JP2013522585A5
JP2013522585A5 JP2012556589A JP2012556589A JP2013522585A5 JP 2013522585 A5 JP2013522585 A5 JP 2013522585A5 JP 2012556589 A JP2012556589 A JP 2012556589A JP 2012556589 A JP2012556589 A JP 2012556589A JP 2013522585 A5 JP2013522585 A5 JP 2013522585A5
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Japan
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detector
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JP2012556589A
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Japanese (ja)
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JP2013522585A (ja
JP5890327B2 (ja
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Priority claimed from GBGB1004121.8A external-priority patent/GB201004121D0/en
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JP2012556589A 2010-03-12 2011-03-11 検出器デバイスおよびその製造方法、材料検査と特性解析のための装置および方法 Active JP5890327B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1004121.8 2010-03-12
GBGB1004121.8A GB201004121D0 (en) 2010-03-12 2010-03-12 Detector device, inspection apparatus and method
PCT/GB2011/050483 WO2011110862A1 (en) 2010-03-12 2011-03-11 Detector device, inspection apparatus and method

Publications (3)

Publication Number Publication Date
JP2013522585A JP2013522585A (ja) 2013-06-13
JP2013522585A5 true JP2013522585A5 (enExample) 2014-04-24
JP5890327B2 JP5890327B2 (ja) 2016-03-22

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ID=42261463

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Application Number Title Priority Date Filing Date
JP2012556589A Active JP5890327B2 (ja) 2010-03-12 2011-03-11 検出器デバイスおよびその製造方法、材料検査と特性解析のための装置および方法

Country Status (6)

Country Link
US (1) US9086361B2 (enExample)
EP (1) EP2545362B1 (enExample)
JP (1) JP5890327B2 (enExample)
ES (1) ES2530855T3 (enExample)
GB (1) GB201004121D0 (enExample)
WO (1) WO2011110862A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201119257D0 (en) * 2011-11-08 2011-12-21 Eshtech Ltd X-ray detection apparatus
JP2013156172A (ja) * 2012-01-31 2013-08-15 X-Ray Precision Inc X線検査装置
GB201308818D0 (en) 2013-05-16 2013-07-03 Ibex Innovations Ltd X-ray detector apparatus
GB201308876D0 (en) * 2013-05-16 2013-07-03 Ibex Innovations Ltd X-Ray imaging apparatus and methods
GB201308851D0 (en) * 2013-05-16 2013-07-03 Ibex Innovations Ltd Multi-spectral x-ray detection apparatus
CN106168674B (zh) * 2016-07-27 2018-11-20 中国检验检疫科学研究院 一种用于闪烁体探测器的性能校验装置
US10987071B2 (en) * 2017-06-29 2021-04-27 University Of Delaware Pixelated K-edge coded aperture system for compressive spectral X-ray imaging
EP3521862A1 (en) * 2018-02-02 2019-08-07 Koninklijke Philips N.V. Multi-spectral x-ray detector
EP3620826A1 (en) * 2018-09-10 2020-03-11 Koninklijke Philips N.V. Multi-piece mono-layer radiation detector

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US4361900A (en) * 1980-11-20 1982-11-30 Victoreen, Inc. Radiation monitoring device
US4626688A (en) 1982-11-26 1986-12-02 Barnes Gary T Split energy level radiation detection
US4843619A (en) * 1988-04-22 1989-06-27 Keithley Instruments Inc. Apparatus for measuring the peak voltage applied to a radiation source
US4891522A (en) 1988-10-11 1990-01-02 Microtronics Associates, Inc. Modular multi-element high energy particle detector
GB2244328A (en) * 1990-03-15 1991-11-27 Gen Electric Energy detector
JPH04130292A (ja) 1990-09-21 1992-05-01 Olympus Optical Co Ltd 軟x線検出器
JP2962015B2 (ja) 1991-02-20 1999-10-12 松下電器産業株式会社 k吸収端フィルタおよびX線装置
JPH06121791A (ja) * 1992-10-13 1994-05-06 Matsushita Electric Ind Co Ltd X線定量装置およびx線定量方法
GB2289983B (en) 1994-06-01 1996-10-16 Simage Oy Imaging devices,systems and methods
JP3204036B2 (ja) 1995-04-24 2001-09-04 松下電器産業株式会社 X線装置およびkエッジフィルタ
US5943388A (en) 1996-07-30 1999-08-24 Nova R & D, Inc. Radiation detector and non-destructive inspection
US6285029B1 (en) 1998-07-27 2001-09-04 Imarad Imaging Systems Ltd. Semiconductor gamma-ray detector
GB9914705D0 (en) * 1999-06-23 1999-08-25 Stereo Scan Systems Limited Castellated linear array scintillator system
US7092481B2 (en) * 2004-05-19 2006-08-15 General Electric Company Direct conversion energy discriminating CT detector
JP2007071602A (ja) 2005-09-05 2007-03-22 Kyoto Univ 放射線検出器
WO2008142446A2 (en) 2007-05-17 2008-11-27 Durham Scientific Crystals Ltd Energy dispersive x-ray absorption spectroscopy in scanning transmission mode involving the calculation of the intensity ratios between successive frequency bands
CN102215754B (zh) 2007-08-15 2013-06-05 国立大学法人京都大学 X线ct装置及x线ct方法
GB0821050D0 (en) 2008-11-18 2008-12-24 Durham Scient Crystals Ltd Detector apparatus and method
US8111803B2 (en) * 2009-04-29 2012-02-07 General Electric Company Method for energy sensitive computed tomography using checkerboard filtering

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