JP5890327B2 - 検出器デバイスおよびその製造方法、材料検査と特性解析のための装置および方法 - Google Patents

検出器デバイスおよびその製造方法、材料検査と特性解析のための装置および方法 Download PDF

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JP5890327B2
JP5890327B2 JP2012556589A JP2012556589A JP5890327B2 JP 5890327 B2 JP5890327 B2 JP 5890327B2 JP 2012556589 A JP2012556589 A JP 2012556589A JP 2012556589 A JP2012556589 A JP 2012556589A JP 5890327 B2 JP5890327 B2 JP 5890327B2
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detector
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JP2013522585A (ja
JP2013522585A5 (enExample
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アルナブ バス
アルナブ バス
イアン ラドリー
イアン ラドリー
マックス ロビンソン
マックス ロビンソン
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Durham Scientific Crystals Ltd
Kromek Ltd
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Durham Scientific Crystals Ltd
Kromek Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays

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  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
JP2012556589A 2010-03-12 2011-03-11 検出器デバイスおよびその製造方法、材料検査と特性解析のための装置および方法 Active JP5890327B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1004121.8 2010-03-12
GBGB1004121.8A GB201004121D0 (en) 2010-03-12 2010-03-12 Detector device, inspection apparatus and method
PCT/GB2011/050483 WO2011110862A1 (en) 2010-03-12 2011-03-11 Detector device, inspection apparatus and method

Publications (3)

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JP2013522585A JP2013522585A (ja) 2013-06-13
JP2013522585A5 JP2013522585A5 (enExample) 2014-04-24
JP5890327B2 true JP5890327B2 (ja) 2016-03-22

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JP2012556589A Active JP5890327B2 (ja) 2010-03-12 2011-03-11 検出器デバイスおよびその製造方法、材料検査と特性解析のための装置および方法

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US (1) US9086361B2 (enExample)
EP (1) EP2545362B1 (enExample)
JP (1) JP5890327B2 (enExample)
ES (1) ES2530855T3 (enExample)
GB (1) GB201004121D0 (enExample)
WO (1) WO2011110862A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201119257D0 (en) * 2011-11-08 2011-12-21 Eshtech Ltd X-ray detection apparatus
JP2013156172A (ja) * 2012-01-31 2013-08-15 X-Ray Precision Inc Ｘ線検査装置
GB201308818D0 (en) 2013-05-16 2013-07-03 Ibex Innovations Ltd X-ray detector apparatus
GB201308876D0 (en) * 2013-05-16 2013-07-03 Ibex Innovations Ltd X-Ray imaging apparatus and methods
GB201308851D0 (en) * 2013-05-16 2013-07-03 Ibex Innovations Ltd Multi-spectral x-ray detection apparatus
CN106168674B (zh) * 2016-07-27 2018-11-20 中国检验检疫科学研究院 一种用于闪烁体探测器的性能校验装置
US10987071B2 (en) * 2017-06-29 2021-04-27 University Of Delaware Pixelated K-edge coded aperture system for compressive spectral X-ray imaging
EP3521862A1 (en) * 2018-02-02 2019-08-07 Koninklijke Philips N.V. Multi-spectral x-ray detector
EP3620826A1 (en) * 2018-09-10 2020-03-11 Koninklijke Philips N.V. Multi-piece mono-layer radiation detector

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4361900A (en) * 1980-11-20 1982-11-30 Victoreen, Inc. Radiation monitoring device
US4626688A (en) 1982-11-26 1986-12-02 Barnes Gary T Split energy level radiation detection
US4843619A (en) * 1988-04-22 1989-06-27 Keithley Instruments Inc. Apparatus for measuring the peak voltage applied to a radiation source
US4891522A (en) 1988-10-11 1990-01-02 Microtronics Associates, Inc. Modular multi-element high energy particle detector
GB2244328A (en) * 1990-03-15 1991-11-27 Gen Electric Energy detector
JPH04130292A (ja) 1990-09-21 1992-05-01 Olympus Optical Co Ltd 軟ｘ線検出器
JP2962015B2 (ja) 1991-02-20 1999-10-12 松下電器産業株式会社 ｋ吸収端フィルタおよびＸ線装置
JPH06121791A (ja) * 1992-10-13 1994-05-06 Matsushita Electric Ind Co Ltd Ｘ線定量装置およびｘ線定量方法
GB2289983B (en) 1994-06-01 1996-10-16 Simage Oy Imaging devices,systems and methods
JP3204036B2 (ja) 1995-04-24 2001-09-04 松下電器産業株式会社 Ｘ線装置およびｋエッジフィルタ
US5943388A (en) 1996-07-30 1999-08-24 Nova R & D, Inc. Radiation detector and non-destructive inspection
US6285029B1 (en) 1998-07-27 2001-09-04 Imarad Imaging Systems Ltd. Semiconductor gamma-ray detector
GB9914705D0 (en) * 1999-06-23 1999-08-25 Stereo Scan Systems Limited Castellated linear array scintillator system
US7092481B2 (en) * 2004-05-19 2006-08-15 General Electric Company Direct conversion energy discriminating CT detector
JP2007071602A (ja) 2005-09-05 2007-03-22 Kyoto Univ 放射線検出器
WO2008142446A2 (en) 2007-05-17 2008-11-27 Durham Scientific Crystals Ltd Energy dispersive x-ray absorption spectroscopy in scanning transmission mode involving the calculation of the intensity ratios between successive frequency bands
CN102215754B (zh) 2007-08-15 2013-06-05 国立大学法人京都大学 X线ct装置及x线ct方法
GB0821050D0 (en) 2008-11-18 2008-12-24 Durham Scient Crystals Ltd Detector apparatus and method
US8111803B2 (en) * 2009-04-29 2012-02-07 General Electric Company Method for energy sensitive computed tomography using checkerboard filtering

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Publication number Publication date
US20130051521A1 (en) 2013-02-28
JP2013522585A (ja) 2013-06-13
GB201004121D0 (en) 2010-04-28
WO2011110862A1 (en) 2011-09-15
EP2545362A1 (en) 2013-01-16
EP2545362B1 (en) 2014-12-17
US9086361B2 (en) 2015-07-21
ES2530855T3 (es) 2015-03-06

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