ES2530855T3 - Dispositivo detector, método y aparato de inspección - Google Patents

Dispositivo detector, método y aparato de inspección Download PDF

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Publication number
ES2530855T3
ES2530855T3 ES11711975T ES11711975T ES2530855T3 ES 2530855 T3 ES2530855 T3 ES 2530855T3 ES 11711975 T ES11711975 T ES 11711975T ES 11711975 T ES11711975 T ES 11711975T ES 2530855 T3 ES2530855 T3 ES 2530855T3
Authority
ES
Spain
Prior art keywords
separately addressable
detection surface
ray
detector
discrete
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
ES11711975T
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English (en)
Spanish (es)
Inventor
Arnab Basu
Ian Radley
Max Robinson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kromek Ltd
Original Assignee
Kromek Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kromek Ltd filed Critical Kromek Ltd
Application granted granted Critical
Publication of ES2530855T3 publication Critical patent/ES2530855T3/es
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays

Landscapes

  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
ES11711975T 2010-03-12 2011-03-11 Dispositivo detector, método y aparato de inspección Active ES2530855T3 (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB1004121.8A GB201004121D0 (en) 2010-03-12 2010-03-12 Detector device, inspection apparatus and method
PCT/GB2011/050483 WO2011110862A1 (en) 2010-03-12 2011-03-11 Detector device, inspection apparatus and method

Publications (1)

Publication Number Publication Date
ES2530855T3 true ES2530855T3 (es) 2015-03-06

Family

ID=42261463

Family Applications (1)

Application Number Title Priority Date Filing Date
ES11711975T Active ES2530855T3 (es) 2010-03-12 2011-03-11 Dispositivo detector, método y aparato de inspección

Country Status (6)

Country Link
US (1) US9086361B2 (enExample)
EP (1) EP2545362B1 (enExample)
JP (1) JP5890327B2 (enExample)
ES (1) ES2530855T3 (enExample)
GB (1) GB201004121D0 (enExample)
WO (1) WO2011110862A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201119257D0 (en) * 2011-11-08 2011-12-21 Eshtech Ltd X-ray detection apparatus
JP2013156172A (ja) * 2012-01-31 2013-08-15 X-Ray Precision Inc Ｘ線検査装置
GB201308818D0 (en) 2013-05-16 2013-07-03 Ibex Innovations Ltd X-ray detector apparatus
GB201308876D0 (en) * 2013-05-16 2013-07-03 Ibex Innovations Ltd X-Ray imaging apparatus and methods
GB201308851D0 (en) * 2013-05-16 2013-07-03 Ibex Innovations Ltd Multi-spectral x-ray detection apparatus
CN106168674B (zh) * 2016-07-27 2018-11-20 中国检验检疫科学研究院 一种用于闪烁体探测器的性能校验装置
US10987071B2 (en) * 2017-06-29 2021-04-27 University Of Delaware Pixelated K-edge coded aperture system for compressive spectral X-ray imaging
EP3521862A1 (en) * 2018-02-02 2019-08-07 Koninklijke Philips N.V. Multi-spectral x-ray detector
EP3620826A1 (en) * 2018-09-10 2020-03-11 Koninklijke Philips N.V. Multi-piece mono-layer radiation detector

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4361900A (en) * 1980-11-20 1982-11-30 Victoreen, Inc. Radiation monitoring device
US4626688A (en) 1982-11-26 1986-12-02 Barnes Gary T Split energy level radiation detection
US4843619A (en) * 1988-04-22 1989-06-27 Keithley Instruments Inc. Apparatus for measuring the peak voltage applied to a radiation source
US4891522A (en) 1988-10-11 1990-01-02 Microtronics Associates, Inc. Modular multi-element high energy particle detector
GB2244328A (en) * 1990-03-15 1991-11-27 Gen Electric Energy detector
JPH04130292A (ja) 1990-09-21 1992-05-01 Olympus Optical Co Ltd 軟ｘ線検出器
JP2962015B2 (ja) 1991-02-20 1999-10-12 松下電器産業株式会社 ｋ吸収端フィルタおよびＸ線装置
JPH06121791A (ja) * 1992-10-13 1994-05-06 Matsushita Electric Ind Co Ltd Ｘ線定量装置およびｘ線定量方法
GB2289983B (en) 1994-06-01 1996-10-16 Simage Oy Imaging devices,systems and methods
JP3204036B2 (ja) 1995-04-24 2001-09-04 松下電器産業株式会社 Ｘ線装置およびｋエッジフィルタ
US5943388A (en) 1996-07-30 1999-08-24 Nova R & D, Inc. Radiation detector and non-destructive inspection
US6285029B1 (en) 1998-07-27 2001-09-04 Imarad Imaging Systems Ltd. Semiconductor gamma-ray detector
GB9914705D0 (en) * 1999-06-23 1999-08-25 Stereo Scan Systems Limited Castellated linear array scintillator system
US7092481B2 (en) * 2004-05-19 2006-08-15 General Electric Company Direct conversion energy discriminating CT detector
JP2007071602A (ja) 2005-09-05 2007-03-22 Kyoto Univ 放射線検出器
WO2008142446A2 (en) 2007-05-17 2008-11-27 Durham Scientific Crystals Ltd Energy dispersive x-ray absorption spectroscopy in scanning transmission mode involving the calculation of the intensity ratios between successive frequency bands
CN102215754B (zh) 2007-08-15 2013-06-05 国立大学法人京都大学 X线ct装置及x线ct方法
GB0821050D0 (en) 2008-11-18 2008-12-24 Durham Scient Crystals Ltd Detector apparatus and method
US8111803B2 (en) * 2009-04-29 2012-02-07 General Electric Company Method for energy sensitive computed tomography using checkerboard filtering

Also Published As

Publication number Publication date
US20130051521A1 (en) 2013-02-28
JP2013522585A (ja) 2013-06-13
GB201004121D0 (en) 2010-04-28
WO2011110862A1 (en) 2011-09-15
EP2545362A1 (en) 2013-01-16
JP5890327B2 (ja) 2016-03-22
EP2545362B1 (en) 2014-12-17
US9086361B2 (en) 2015-07-21

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