JP2013508966A - ナノワイヤトンネルダイオードおよびその製造方法 - Google Patents
ナノワイヤトンネルダイオードおよびその製造方法 Download PDFInfo
- Publication number
- JP2013508966A JP2013508966A JP2012535166A JP2012535166A JP2013508966A JP 2013508966 A JP2013508966 A JP 2013508966A JP 2012535166 A JP2012535166 A JP 2012535166A JP 2012535166 A JP2012535166 A JP 2012535166A JP 2013508966 A JP2013508966 A JP 2013508966A
- Authority
- JP
- Japan
- Prior art keywords
- tunnel diode
- doped
- junction
- nanowire
- semiconductor region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000002070 nanowire Substances 0.000 title claims abstract description 66
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 8
- 239000004065 semiconductor Substances 0.000 claims abstract description 74
- 239000000463 material Substances 0.000 claims abstract description 53
- 150000001875 compounds Chemical class 0.000 claims abstract description 21
- 238000000034 method Methods 0.000 claims abstract description 15
- 239000000758 substrate Substances 0.000 claims description 23
- 229910000673 Indium arsenide Inorganic materials 0.000 claims description 17
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 claims description 17
- 229910005542 GaSb Inorganic materials 0.000 claims description 12
- WPYVAWXEWQSOGY-UHFFFAOYSA-N indium antimonide Chemical compound [Sb]#[In] WPYVAWXEWQSOGY-UHFFFAOYSA-N 0.000 claims description 11
- 229910052710 silicon Inorganic materials 0.000 claims description 7
- 239000011258 core-shell material Substances 0.000 claims description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 4
- 229910052785 arsenic Inorganic materials 0.000 claims description 4
- 229910052738 indium Inorganic materials 0.000 claims description 4
- 239000010703 silicon Substances 0.000 claims description 4
- 229910052787 antimony Inorganic materials 0.000 claims description 3
- 238000001228 spectrum Methods 0.000 claims 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 22
- 239000000203 mixture Substances 0.000 description 9
- 230000006870 function Effects 0.000 description 8
- 239000007789 gas Substances 0.000 description 8
- 239000002243 precursor Substances 0.000 description 7
- 230000005641 tunneling Effects 0.000 description 7
- 230000004888 barrier function Effects 0.000 description 5
- 230000008901 benefit Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000002245 particle Substances 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 239000010409 thin film Substances 0.000 description 4
- 238000013459 approach Methods 0.000 description 3
- RBFQJDQYXXHULB-UHFFFAOYSA-N arsane Chemical compound [AsH3] RBFQJDQYXXHULB-UHFFFAOYSA-N 0.000 description 3
- 229910000070 arsenic hydride Inorganic materials 0.000 description 3
- 238000010420 art technique Methods 0.000 description 3
- 239000002800 charge carrier Substances 0.000 description 3
- 239000002019 doping agent Substances 0.000 description 3
- -1 InN Chemical compound 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 229910052732 germanium Inorganic materials 0.000 description 2
- 229910052717 sulfur Inorganic materials 0.000 description 2
- 229910004613 CdTe Inorganic materials 0.000 description 1
- 101100208382 Danio rerio tmsb gene Proteins 0.000 description 1
- 229910005540 GaP Inorganic materials 0.000 description 1
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 1
- 229910000577 Silicon-germanium Inorganic materials 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 229910052790 beryllium Inorganic materials 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 229910052793 cadmium Inorganic materials 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 238000004871 chemical beam epitaxy Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 239000003574 free electron Substances 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 238000001000 micrograph Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002086 nanomaterial Substances 0.000 description 1
- 239000002073 nanorod Substances 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 239000012071 phase Substances 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000013082 photovoltaic technology Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000001878 scanning electron micrograph Methods 0.000 description 1
- 229910052711 selenium Inorganic materials 0.000 description 1
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052714 tellurium Inorganic materials 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 238000000927 vapour-phase epitaxy Methods 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
- H10D8/70—Tunnel-effect diodes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/117—Shapes of semiconductor bodies
- H10D62/118—Nanostructure semiconductor bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/117—Shapes of semiconductor bodies
- H10D62/118—Nanostructure semiconductor bodies
- H10D62/119—Nanowire, nanosheet or nanotube semiconductor bodies
- H10D62/122—Nanowire, nanosheet or nanotube semiconductor bodies oriented at angles to substrates, e.g. perpendicular to substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/117—Shapes of semiconductor bodies
- H10D62/118—Nanostructure semiconductor bodies
- H10D62/119—Nanowire, nanosheet or nanotube semiconductor bodies
- H10D62/123—Nanowire, nanosheet or nanotube semiconductor bodies comprising junctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/82—Heterojunctions
- H10D62/824—Heterojunctions comprising only Group III-V materials heterojunctions, e.g. GaN/AlGaN heterojunctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
- H10D8/70—Tunnel-effect diodes
- H10D8/75—Tunnel-effect PN diodes, e.g. Esaki diodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F10/00—Individual photovoltaic cells, e.g. solar cells
- H10F10/10—Individual photovoltaic cells, e.g. solar cells having potential barriers
- H10F10/17—Photovoltaic cells having only PIN junction potential barriers
- H10F10/172—Photovoltaic cells having only PIN junction potential barriers comprising multiple PIN junctions, e.g. tandem cells
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/127—The active layers comprising only Group III-V materials, e.g. GaAs or InP
- H10F71/1276—The active layers comprising only Group III-V materials, e.g. GaAs or InP comprising growth substrates not made of Group III-V materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
- H10F77/143—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies comprising quantum structures
- H10F77/1437—Quantum wires or nanorods
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/544—Solar cells from Group III-V materials
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/548—Amorphous silicon PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Photovoltaic Devices (AREA)
- Bipolar Transistors (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SE0950781-5 | 2009-10-22 | ||
| SE0950781 | 2009-10-22 | ||
| PCT/SE2010/051147 WO2011049529A1 (en) | 2009-10-22 | 2010-10-22 | Nanowire tunnel diode and method for making the same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2013508966A true JP2013508966A (ja) | 2013-03-07 |
| JP2013508966A5 JP2013508966A5 (https=) | 2013-12-05 |
Family
ID=43900554
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012535166A Pending JP2013508966A (ja) | 2009-10-22 | 2010-10-22 | ナノワイヤトンネルダイオードおよびその製造方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20120199187A1 (https=) |
| EP (1) | EP2491595A4 (https=) |
| JP (1) | JP2013508966A (https=) |
| KR (1) | KR20120099441A (https=) |
| CN (1) | CN102656700A (https=) |
| WO (1) | WO2011049529A1 (https=) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019016710A (ja) * | 2017-07-07 | 2019-01-31 | 富士通株式会社 | 電子デバイス、及び電子デバイスの製造方法 |
| JP2019153639A (ja) * | 2018-03-01 | 2019-09-12 | 富士通株式会社 | 半導体デバイス、受信機及び半導体デバイスの製造方法 |
| JP2020021776A (ja) * | 2018-07-30 | 2020-02-06 | 富士通株式会社 | 化合物半導体装置、化合物半導体装置の製造方法、発電装置及び電源装置 |
| JP2020161661A (ja) * | 2019-03-27 | 2020-10-01 | 富士通株式会社 | 化合物半導体装置及びその製造方法、検波器 |
| JP2020181937A (ja) * | 2019-04-26 | 2020-11-05 | 富士通株式会社 | 半導体デバイス、コンピュータ、及び半導体デバイスの製造方法 |
| JPWO2021210095A1 (https=) * | 2020-04-15 | 2021-10-21 |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20120006390A1 (en) * | 2009-12-08 | 2012-01-12 | Yijie Huo | Nano-wire solar cell or detector |
| JP6290199B2 (ja) * | 2012-07-06 | 2018-03-07 | クナノ・アーベー | 径方向ナノワイヤエサキダイオードデバイスおよび方法 |
| US8785909B2 (en) * | 2012-09-27 | 2014-07-22 | Intel Corporation | Non-planar semiconductor device having channel region with low band-gap cladding layer |
| US8937294B2 (en) * | 2013-03-15 | 2015-01-20 | Rohm And Haas Electronic Materials Llc | Multi-heterojunction nanoparticles, methods of manufacture thereof and articles comprising the same |
| GB2517186A (en) * | 2013-08-14 | 2015-02-18 | Norwegian University Of Science And Technology | Radial P-N junction nanowire solar cells |
| KR102149331B1 (ko) | 2013-08-30 | 2020-08-28 | 삼성전자주식회사 | 와이어 구조체와 이를 구비하는 반도체 소자 및 와이어 구조체의 제조방법 |
| US20150187889A1 (en) * | 2013-12-27 | 2015-07-02 | University Of Rochester | Surface-controlled semiconductor nano-devices, methods and applications |
| CN111162141A (zh) * | 2019-12-20 | 2020-05-15 | 燕山大学 | 一种多结纳米线太阳能电池的制备方法 |
| CN116031297A (zh) * | 2022-12-23 | 2023-04-28 | 中芯越州集成电路制造(绍兴)有限公司 | 一种异质结双极型晶体管及其制作方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2004088755A1 (en) * | 2003-04-04 | 2004-10-14 | Startskottet 22286 Ab | Nanowhiskers with pn junctions and methods of fabricating thereof |
| WO2008108981A1 (en) * | 2007-03-01 | 2008-09-12 | Hewlett-Packard Development Company, L.P. | Hetero-crystalline semiconductor device and method of making same |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4198644A (en) * | 1978-06-09 | 1980-04-15 | The United States Of America As Represented By The Secretary Of The Army | Tunnel diode |
| US4667059A (en) * | 1985-10-22 | 1987-05-19 | The United States Of America As Represented By The United States Department Of Energy | Current and lattice matched tandem solar cell |
| US6660928B1 (en) * | 2002-04-02 | 2003-12-09 | Essential Research, Inc. | Multi-junction photovoltaic cell |
| US7335908B2 (en) | 2002-07-08 | 2008-02-26 | Qunano Ab | Nanostructures and methods for manufacturing the same |
| WO2005001900A2 (en) * | 2003-06-12 | 2005-01-06 | Sirica Corporation | Steady-state-non-equilibrium distribution of free carriers and photon energy up-conversion using same |
| CN101443265B (zh) | 2006-03-08 | 2014-03-26 | 昆南诺股份有限公司 | 在硅上无金属合成外延半导体纳米线的方法 |
| US7893476B2 (en) * | 2006-09-15 | 2011-02-22 | Imec | Tunnel effect transistors based on silicon nanowires |
| US8003883B2 (en) * | 2007-01-11 | 2011-08-23 | General Electric Company | Nanowall solar cells and optoelectronic devices |
| TW200849625A (en) * | 2007-04-09 | 2008-12-16 | Univ California | Low resistance tunnel junctions for high efficiency tandem solar cells |
| KR101547711B1 (ko) * | 2007-06-19 | 2015-08-26 | 큐나노 에이비 | 나노와이어-기반 태양 전지 구조 |
| US7960715B2 (en) * | 2008-04-24 | 2011-06-14 | University Of Iowa Research Foundation | Semiconductor heterostructure nanowire devices |
| US8242353B2 (en) * | 2009-03-16 | 2012-08-14 | International Business Machines Corporation | Nanowire multijunction solar cell |
-
2010
- 2010-10-22 KR KR1020127013173A patent/KR20120099441A/ko not_active Ceased
- 2010-10-22 WO PCT/SE2010/051147 patent/WO2011049529A1/en not_active Ceased
- 2010-10-22 JP JP2012535166A patent/JP2013508966A/ja active Pending
- 2010-10-22 EP EP10825300.6A patent/EP2491595A4/en not_active Withdrawn
- 2010-10-22 US US13/503,314 patent/US20120199187A1/en not_active Abandoned
- 2010-10-22 CN CN2010800588460A patent/CN102656700A/zh active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2004088755A1 (en) * | 2003-04-04 | 2004-10-14 | Startskottet 22286 Ab | Nanowhiskers with pn junctions and methods of fabricating thereof |
| JP2006522472A (ja) * | 2003-04-04 | 2006-09-28 | スターツコテット 22286 エービー | Pn接合を有するナノウィスカ及びその製造方法 |
| WO2008108981A1 (en) * | 2007-03-01 | 2008-09-12 | Hewlett-Packard Development Company, L.P. | Hetero-crystalline semiconductor device and method of making same |
| JP2010520618A (ja) * | 2007-03-01 | 2010-06-10 | ヒューレット−パッカード デベロップメント カンパニー エル.ピー. | ヘテロ結晶半導体デバイス及びその製造方法 |
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019016710A (ja) * | 2017-07-07 | 2019-01-31 | 富士通株式会社 | 電子デバイス、及び電子デバイスの製造方法 |
| JP2019153639A (ja) * | 2018-03-01 | 2019-09-12 | 富士通株式会社 | 半導体デバイス、受信機及び半導体デバイスの製造方法 |
| JP2020021776A (ja) * | 2018-07-30 | 2020-02-06 | 富士通株式会社 | 化合物半導体装置、化合物半導体装置の製造方法、発電装置及び電源装置 |
| JP7103027B2 (ja) | 2018-07-30 | 2022-07-20 | 富士通株式会社 | 化合物半導体装置、化合物半導体装置の製造方法、発電装置及び電源装置 |
| JP2020161661A (ja) * | 2019-03-27 | 2020-10-01 | 富士通株式会社 | 化合物半導体装置及びその製造方法、検波器 |
| JP7211201B2 (ja) | 2019-03-27 | 2023-01-24 | 富士通株式会社 | 化合物半導体装置及びその製造方法、検波器 |
| JP2020181937A (ja) * | 2019-04-26 | 2020-11-05 | 富士通株式会社 | 半導体デバイス、コンピュータ、及び半導体デバイスの製造方法 |
| JP7265138B2 (ja) | 2019-04-26 | 2023-04-26 | 富士通株式会社 | 半導体デバイス、コンピュータ、及び半導体デバイスの製造方法 |
| JPWO2021210095A1 (https=) * | 2020-04-15 | 2021-10-21 | ||
| WO2021210095A1 (ja) * | 2020-04-15 | 2021-10-21 | 富士通株式会社 | 半導体装置、リザバーコンピューティングシステム及び半導体装置の製造方法 |
| JP7384273B2 (ja) | 2020-04-15 | 2023-11-21 | 富士通株式会社 | 半導体装置、リザバーコンピューティングシステム及び半導体装置の製造方法 |
| US12363968B2 (en) | 2020-04-15 | 2025-07-15 | Fujitsu Limited | Semiconductor device, reservoir computing system, and method for manufacturing semiconductor device |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20120099441A (ko) | 2012-09-10 |
| EP2491595A1 (en) | 2012-08-29 |
| EP2491595A4 (en) | 2014-03-19 |
| WO2011049529A1 (en) | 2011-04-28 |
| CN102656700A (zh) | 2012-09-05 |
| US20120199187A1 (en) | 2012-08-09 |
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