JP2013252528A - Laser beam-machining apparatus and laser beam-machining method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a laser beam-machining apparatus and a laser beam-machining method, which enable surface roughness in three-dimensional machining to be more reduced.SOLUTION: A machining area is set in such a way that a plurality of machining layers are stacked in a laser beam irradiation direction. Lattice points of an imaginary rectangular lattice having been set with respect to the machining layers are used as pulse irradiation points and the machining layers are irradiated with laser beam to be machined. The machining area includes at least one period of the plurality of machining layers in which four continuous layers from a first layer to a fourth layer in machining order form one period. In the second layer, pulse irradiation points P2 are formed by shifting lattice points to a gravity center G1 of a quadrangle Q1 formed of adjacent pulse irradiation points P1 of the first layer. In the third layer, pulse irradiation points P3 are formed by shifting lattice points to a gravity center G2 of a quadrangle Q2 formed of the adjacent pulse irradiation points P1, P2 of the first and second layers. In the fourth layer, pulse irradiation points P4 are formed by shifting lattice points to a gravity center G3 of a quadrangle Q3 formed of four adjacent pulse irradiation points P3 of the third layer.

Description

  The present invention relates to a laser processing apparatus and a laser processing method capable of three-dimensional processing with greatly reduced surface roughness.

  Conventionally, as one method for processing a three-dimensional shape of a material using a laser, a part to be processed and removed from a workpiece W is laminated in a direction perpendicular to the irradiation direction of the laser beam L as shown in FIG. In addition, there is known a method (hereinafter referred to as a layer processing method) in which a plurality of layers (hereinafter also referred to as processing layers LY) are divided and processed in order from the processing layer LY on the side close to the surface of the processing target W. (See Patent Document 1). Although this layer processing method can process a relatively free form with high accuracy, unevenness due to fine processing marks (hereinafter referred to as pulse marks) due to a pulse of the laser beam L occurs on the processing surface. The surface roughness of the processed surface tends to be larger than grinding.

  For this reason, in order to reduce the surface roughness of the processed surface, the distribution (hereinafter also referred to as pulse irradiation point distribution) of the laser beam irradiation position (hereinafter referred to as pulse irradiation point) for irradiating the processing layer with pulses is regularly controlled. Thus, a means for suppressing unevenness caused by the pulse mark is performed. For example, in Patent Document 2, the interval between scanning lines of laser light to be scanned is controlled, and pulse irradiation points are distributed in a square lattice shape, for example.

JP 2012-16735 A JP 2007-229756 A

The following problems remain in the conventional technology.
In the processing method described in Patent Document 2, the surface roughness of the laser processed surface may not be sufficiently reduced. The reason for this is that the overlapping of the pulse irradiation point distribution between layers is not taken into consideration, and the unevenness generated in the layer may be accumulated between the layers, which may be emphasized, and the surface roughness increases as the processing depth increases. This is because it may increase. In addition, as the distance between adjacent pulse irradiation points is reduced, unevenness due to pulse marks in one layer becomes less noticeable, and the surface roughness in one layer tends to decrease. As a result, when processing and forming a surface inclined with respect to the laser optical axis, a large stepped step is formed, so that the surface roughness of the surface inclined with respect to the laser optical axis is increased. There was a problem.

  The present invention has been made in view of the above-described problems, and an object thereof is to provide a laser processing apparatus and a laser processing method capable of further reducing surface roughness in three-dimensional processing.

  The present invention employs the following configuration in order to solve the above problems. That is, the laser processing apparatus of the present invention is a processing apparatus that irradiates a processing target with laser light to form a shape, and irradiates the processing target with the laser light at a constant repetition frequency and performs scanning. A light irradiation mechanism, a position adjusting mechanism that holds the object to be processed and can adjust a relative positional relationship between the object to be processed and the laser beam, and controls these mechanisms to scan the laser beam. When performing, the processing area is set as a stack of multiple processing layers in the direction of laser light irradiation, the laser light is irradiated to each processing layer, and a predetermined portion is removed for each processing layer And a control unit that forms a three-dimensional machining surface, and the control unit irradiates the laser beam with a lattice point of a virtual square lattice set for the machining layer as a pulse irradiation point. And includes at least one cycle of four layers from the first layer to the fourth layer in the processing order among the plurality of processing layers, and the second layer includes the first layer. The grid point of the square lattice is shifted to the center of gravity of a quadrangle constituted by the four pulse irradiation points adjacent to each other to form a pulse irradiation point, and the first layer and the second layer are adjacent to each other in the third layer. The grid point of the square lattice is shifted to the center of gravity of the quadrangle formed by the pulse irradiation points to form pulse irradiation points, and the fourth layer includes the four pulse irradiation points adjacent to the third layer. A pulse irradiation point is formed by shifting a lattice point of the square lattice to a square center of gravity. Here, the square lattice means that the four closest lattice points take any one of a square, a rectangle, a rhombus, and a parallelogram, and the same shape is spread on the plane without any gaps. Define. For example, when the three closest lattice points are equilateral triangles, they are generally treated as equilateral triangle lattices, but here they are regarded as parallelograms having an acute angle of 60 ° and are included in the square lattice. .

  The laser processing method of the present invention is a processing method for forming a shape by irradiating a processing target with laser light, and irradiating the processing target with the laser light at a constant repetition frequency and scanning the laser. A light irradiation step, and a position adjustment step of holding the processing object and adjusting a relative positional relationship between the processing object and the laser light, and when scanning the laser light, The processing region is set as a stack of a plurality of processing layers in the irradiation direction of the laser light, the laser light is irradiated to each processing layer, a predetermined portion is removed for each processing layer, and tertiary A processing surface having an original shape is formed, and processing is performed by irradiating the laser beam onto a lattice point of a virtual lattice set for the processing layer. 4th layer Of the four squares of the square lattice including at least one period, and the second layer has a quadrangular center of gravity formed by four pulse irradiation points adjacent to the first layer. The grid point is shifted to be a pulse irradiation point. In the third layer, the lattice point of the square lattice is shifted to the center of gravity of the rectangle formed by the pulse irradiation points adjacent to the first layer and the second layer. The irradiation point is a pulse irradiation point by shifting the lattice point of the square lattice to the center of gravity of a quadrangle composed of the four pulse irradiation points adjacent to the third layer in the fourth layer. To do.

  In these laser processing apparatuses and laser processing methods, a plurality of processing layers include at least one period of layers in which four consecutive layers from the first layer to the fourth layer are included in the order of processing, from the second layer. As described above, when the lattice points of the square lattices are shifted to be pulse irradiation points as described above, the rectangular lattices whose lattice points are the pulse irradiation points are randomly shifted in the xy plane and stacked. As compared with the case, the unevenness caused by the pulse mark can be reduced.

In the laser processing apparatus of the present invention, when the control unit continuously repeats the one cycle, it is configured by the pulse irradiation points adjacent to the previous cycle in the first layer in the second and subsequent cycles. A pulse irradiation point is formed by shifting a lattice point of the square lattice to the center of gravity of any square.
That is, in this laser processing apparatus, when the one cycle is continuously repeated, in the second and subsequent cycles, the center of any quadrangle constituted by the adjacent pulse irradiation points up to the previous cycle in the first layer. Since the pulse points are shifted by shifting the lattice points of the square lattice, the unevenness can be further reduced.

In the laser processing apparatus of the present invention, it is preferable that the control unit sets the fourth layer to be the last processing layer.
That is, in this laser processing apparatus, by setting the fourth layer to be the last processing layer, it is possible to obtain a very small surface roughness.

The present invention has the following effects.
That is, according to the laser processing apparatus and the laser processing method of the present invention, at least one cycle of layers in which four consecutive layers from the first layer to the fourth layer are processed in the processing order among a plurality of processing layers. In addition, by shifting the lattice points of the quadrangular lattices to pulse irradiation points as described above from the second layer to the fourth layer, the rectangular lattices whose lattice points are the pulse irradiation points are randomly formed in the xy plane. Compared with the case of shifting and stacking, the unevenness caused by the pulse marks can be reduced, and the surface roughness of the laser processed surface can be reduced.
Therefore, the laser processing apparatus and laser processing method of the present invention are suitable for, for example, shape processing of a product having a complicated three-dimensional shape that requires a surface roughness Rz ≦ 3 μm.

1 is a schematic overall configuration diagram showing a laser processing apparatus in an embodiment of a laser processing apparatus and a laser processing method according to the present invention. In this embodiment, it is explanatory drawing which shows the pulse irradiation point by the square grating | lattice from the 1st layer (a) to the 4th layer (d) in order of a process. In this embodiment, it is explanatory drawing which shows the pulse irradiation point by the parallelogram lattice from the 1st layer to the 16th layer in order of a process. As an example according to the present invention, it is a shape diagram of a laser processing surface showing a simulation result when laser irradiation is performed by the method of the present invention from the first layer (a) to the fourth layer (d). As a comparative example according to the present invention, it is a shape diagram of a laser processing surface showing a simulation result when laser irradiation is performed at random shift from the first layer (a) to the fourth layer (d). In the Example and comparative example which concern on this invention, it is a graph which shows the actual laser processing test result which shows the surface roughness with respect to the number of layers. It is explanatory drawing which shows the layer processing method by laser processing.

  Hereinafter, an embodiment of a laser processing apparatus and a laser processing method according to the present invention will be described with reference to FIGS. 1 to 3.

  As shown in FIG. 1, the laser processing apparatus 1 of the present embodiment is a processing apparatus that forms a shape by irradiating a workpiece W with a laser beam L, and the laser beam L is applied to the workpiece W at a certain level. A laser beam irradiation mechanism 2 that irradiates and scans at a repetition frequency; a position adjustment mechanism 3 that holds the workpiece W and can adjust the relative positional relationship between the workpiece W and the laser beam L; and When the laser beam L is scanned by controlling the mechanism, the processing region is set as a stack of a plurality of processing layers in the irradiation direction of the laser light L, and each processing layer is irradiated with the laser light L And a control unit C that removes a predetermined portion for each processing layer and forms a three-dimensional processing surface.

  The position adjusting mechanism 3 includes an X-axis stage unit 4x that can move in the X direction parallel to the horizontal plane, and a moving direction in the Y direction that is provided on the X-axis stage unit 4x and is perpendicular to the X direction and parallel to the horizontal plane. The Y-axis stage unit 4y and the Z-axis stage unit 4z provided on the Y-axis stage unit 4y and capable of holding the workpiece W and movable in the direction perpendicular to the horizontal plane.

  The laser beam irradiation mechanism 2 includes a laser light source 5 that oscillates a laser beam L pulsed by a trigger signal of a Q switch, and a beam expander 6 that expands the beam of the laser beam L from the laser light source 5 to a certain diameter. The galvano scanner 7 that scans the laser beam L from the beam expander 6, the f-θ lens 8 that collects the laser beam L from the galvano scanner 7 and irradiates the workpiece W, and the held processing A CCD camera 9 that captures an image to confirm the processing position of the object W is provided. An optical member such as a mirror or a wave plate may be disposed in the optical path around the beam expander 6.

The laser light L emitted by the laser light irradiation mechanism 2 is in a single mode, and the light intensity distribution in the beam cross section has a Gaussian distribution.
As the laser light source 5, a laser light source that can irradiate laser light having a wavelength of 190 to 550 nm can be used. For example, in this embodiment, a laser light source that can oscillate and emit laser light having a wavelength of 266 nm is used.
The galvano scanner 7 is disposed immediately above the Z-axis stage portion 4z. The CCD camera 9 is installed adjacent to the galvano scanner 7.

  As shown in FIG. 2, the control unit C performs processing by irradiating the laser beam L with the lattice points of the virtual square lattice set for the processing layer as pulse irradiation points, and among the plurality of processing layers. It includes at least one period of four consecutive layers from the first layer to the fourth layer in the processing order for one period, and is composed of four pulse irradiation points P1 adjacent to the first layer in the second layer. The grid point of the square lattice is shifted to the gravity center G1 of the quadrangle Q1 to form a pulse irradiation point P2, and the gravity center G2 of the quadrangle Q2 formed by the third layer and the adjacent pulse irradiation points P1 and P2 of the first layer and the second layer. The grid point of the square lattice is shifted to a pulse irradiation point P3, and the lattice point of the square lattice is centered on the center of gravity G3 of the quadrangle Q3 composed of the four pulse irradiation points P3 adjacent to the third layer in the fourth layer. Has the function of shifting to a pulse irradiation point P4 That. The lattice points and the pulse irradiation points are coordinate points in a plan view on a plane (xy plane) perpendicular to the irradiation direction (z direction) of the laser light L.

In addition, when the control unit C continuously repeats the one cycle, in the second and subsequent cycles, the control unit C is arranged on the center of gravity of any square formed by the adjacent pulse irradiation points up to the previous cycle in the first layer. The lattice points of the square lattice are shifted to be pulse irradiation points.
Furthermore, the control unit C is preferably set so that the fourth layer becomes the last processed layer of the processed layers.

In the present embodiment, when scanning with the laser beam L, a plurality of processing layers are stacked and set in the scanning program so that each processing layer is irradiated with the laser beam L vertically and is processed for each processing layer. A predetermined portion is removed to form a three-dimensional processed surface. For this reason, in the scanning control of the laser beam L, first, the workpiece W is set in a plurality of processing layers in the irradiation direction of the laser beam L.
Then, a portion to be processed and removed from the shape before processing and the shape after processing in design is set for each processing layer, and predetermined processing is performed by scanning the laser beam L for each processing layer and removing a predetermined portion. Form a surface.

This laser processing method will be described in more detail. First, the control unit C removes the processing when the target three-dimensional shape is processed from the original shape of the processing object W by the laser light L as shown in FIG. The three-dimensional shape portion to be divided is divided (layer division) into a plurality of processing layers LY at equal intervals on a plane perpendicular to the Z axis.
At this time, the thickness of the layer (processed layer LY) is determined by the energy per pulse and the spatial density of the pulse irradiation point in the layer, but it is easier to control if the layer thickness is always constant, Since the unevenness of the surface inclined with respect to the laser optical axis due to the layer step becomes uniform, it is preferable. Therefore, in order to make the thickness of the layer constant, conditions for the energy density of the laser beam L, the repetition frequency of the laser beam L, the scanning speed of the laser beam L, and the interval between the scanning lines are always set constant during processing. The For this reason, it is a necessary condition that the pulse irradiation point distributions of all the layers have the same shape and the same size.

  The control unit C equalizes the distribution of the pulse irradiation points under the above-described conditions of the layer processing method, and sets the shape of a square lattice in which the lattice points become the pulse irradiation points. That is, the distance between pulse irradiation points in the laser scanning line of the square lattice, the interval between adjacent laser scanning lines, the amount of deviation between the laser scanning lines of the pulse irradiation points (between the adjacent pulse irradiation points between adjacent laser scanning lines) The distance in the laser scanning line direction), the scanning start point of each laser scanning line, and the like are set. At this time, as shown in FIG. 2A, the square lattice is preferably a square lattice in the case of ideal Gaussian laser beam cross-sectional intensity distribution. When anisotropy exists, the surface roughness is reduced by using a rectangular lattice or a parallelogram lattice according to the distortion of the shape.

Then, processing of the processing layer is started with the above settings. First, in the processing of the first layer of the processing layer, as shown in FIG. 2A, scanning with the laser beam L is performed with a lattice point of a predetermined square lattice as a pulse irradiation point P1 of the first layer. In addition, the arrow in a figure has shown the scanning direction of the laser beam L. FIG.
Next, in the processing of the second layer, as shown in FIGS. 2A and 2B, the center of gravity G1 of the first quadrangle Q1 formed by the four pulse irradiation points P1 adjacent to the first layer is set. The lattice point of the square lattice is shifted to the pulse irradiation point P2 of the second layer, and the laser beam L is scanned.

Furthermore, in the processing of the third layer, as shown in FIGS. 2B and 2C, the center of gravity of the second quadrangle Q2 constituted by the adjacent pulse irradiation points P1 and P2 of the first layer and the second layer. The lattice point of the square lattice is shifted to G2 to obtain a pulse irradiation point P3 of the third layer, and the laser beam L is scanned.
Then, at the end of one cycle, in the processing of the fourth layer, as shown in FIGS. 2C and 2D, a third quadrangle Q3 composed of four adjacent pulse irradiation points P3 of the third layer. The lattice point of the square lattice is shifted to the center of gravity G3 to form an irradiation point P4, and the laser beam L is scanned.

In this way, the processing of the four layers is completed for the first cycle of the processing layer. Thereafter, when the one cycle is repeated continuously, that is, when the number of divided layers exceeds four layers, the laser processing of the one cycle is repeated in the same manner.
For example, in the case where the square lattice is a parallelogram lattice and the number of layers is 16 and processing is performed up to four cycles, the pulse irradiation points will be described. In the second and subsequent cycles, as shown in FIG. In one layer, the lattice point of the square lattice is shifted to the center of gravity of any quadrangle constituted by adjacent pulse irradiation points up to the previous cycle, and set as pulse irradiation points.

  That is, as shown in FIG. 3A, when the pulse irradiation points P1 to P4 of the four layers in the first period are set to the lattice points of the parallelogram lattice, in the first layer of the second period, As shown in FIG. 3B, pulse irradiation is performed by shifting the lattice points of the parallelogram lattice to the center of gravity G4 of the fourth quadrangle Q4 composed of adjacent pulse irradiation points P1 to P4 in the first period. Scanning with the laser beam L is performed at point P5. The second layer from the second layer to the fourth layer, that is, the third layer from the fifth layer to the eighth layer counting from the beginning, is the same as the first cycle with reference to the pulse irradiation point P5 of the fifth layer. A pulse irradiation point P6 for the sixth layer, a pulse irradiation point P7 for the seventh layer, and a pulse irradiation point P8 for the eighth layer are set, and the laser beam L is scanned sequentially.

  Further, as shown in FIG. 3B, the center of gravity G5 of any fifth quadrangle Q5 constituted by the adjacent pulse irradiation points P1 to P8 up to the previous cycle (first cycle and second cycle). As shown in FIG. 3C, the lattice points of the parallelogram lattice are shifted to the first layer of the third period, that is, the pulse irradiation point P9 of the ninth layer counted from the beginning, and the laser beam L Scan. The third layer from the second layer to the fourth layer, that is, the third layer from the tenth layer to the twelfth layer counted from the beginning, is the same as the first cycle with reference to the pulse irradiation point P9 of the ninth layer. The pulse irradiation point P10 of the tenth layer, the pulse irradiation point P11 of the eleventh layer, and the pulse irradiation point P12 of the twelfth layer are set, and the laser beam L is sequentially scanned.

  Next, the lattice point of the parallelogram lattice is shifted to the center of gravity G6 of the sixth quadrangle Q6 composed of the adjacent pulse irradiation points P9 to P12 in the third period, that is, the first layer in the fourth period, that is, from the beginning. The pulse irradiation point P13 of the thirteenth layer is counted and the laser beam L is scanned. The third layer from the second layer to the fourth layer in the fourth period, that is, the third layer from the fourteenth layer to the sixteenth layer from the beginning is the same as the first period with reference to the pulse irradiation point P13 of the thirteenth layer. The pulse irradiation point P14 of the 14th layer, the pulse irradiation point P15 of the 15th layer, and the pulse irradiation point P16 of the 16th layer are set to the laser beam L in order.

  As described above, the four-layer pulse irradiation points in the first cycle are shifted to the center of gravity of any square surrounded by the pulse irradiation points adjacent to each other up to the previous cycle by shifting the pulse irradiation points in the first layer in the next cycle. By setting, the space between the adjacent pulse irradiation points is filled with the pulse irradiation points, and the space is narrowed small each time the above cycle is repeated, so that the unevenness due to the processing marks can be gradually reduced.

  Therefore, in the laser processing apparatus 1 and the laser processing method of the present embodiment, at least one cycle includes a layer in which four consecutive layers from the first layer to the fourth layer are processed in the processing order among a plurality of processing layers. As described above, by shifting the grid points of the square lattice to the pulse irradiation points in the second layer to the fourth layer, the square lattices whose lattice points are the pulse irradiation points are randomly shifted in the xy direction. As compared with the case of stacking, unevenness due to pulse marks can be reduced.

  In addition, when the one cycle is repeated continuously, in the second and subsequent cycles, the lattice point of the square lattice at the center of gravity of any quadrangle formed by the adjacent pulse irradiation points up to the previous cycle in the first layer As the pulse irradiation point is shifted, the unevenness can be further reduced. In particular, by setting the fourth layer to be the last processed layer, it is possible to achieve very small surface roughness.

Next, a simulation result when the surface of the workpiece is laser processed using the laser processing apparatus of the above embodiment will be described.
In this simulation, a square lattice having a side of 2.5 μm is set as the quadrangular lattice, and the first layer (a) in the first period is changed from the first layer (a) to the second period as shown in FIGS. The unevenness of the surface state of the processing object when processing up to four layers (d) was processed was calculated.

In this simulation, the calculation is performed on the assumption that at one pulse irradiation point, a machining trace is generated on the machining surface of the workpiece with a cross-sectional shape defined by the following Gaussian function.
Gaussian function: z = −exp (−x ² −y ² )
As can be seen from the simulation results, the unevenness is canceled each time the layers are stacked, and a smooth processed surface is obtained. At the time of the fourth layer, the surface roughness Rz (maximum height) was 0.029 μm.

As a comparative example, similarly to the above-described embodiment, a square lattice having a side of 2.5 μm is set as a quadrangular lattice, and the entire layer is shifted by a random amount in the xy direction. As shown to (a)-(d), the unevenness | corrugation of the surface state of the process target object at the time of processing the process layer from the 1st layer (a) of the 1st period to the 4th layer (d) was calculated.
As can be seen from the simulation results, in the comparative example in which laser processing is performed at random shifts, the unevenness is not canceled even if the layers are stacked, and the unevenness increases as the layers are stacked. At the time of the fourth layer, the surface roughness Rz (maximum height) was 1.878 μm.

Next, when an alumina plate (surface roughness Rz before processing: about 0.2 μm) is a processing target, the relationship between the number of processing layers and surface roughness when laser processing of the present invention is performed ( FIG. 6 shows “tetragonal lattice regular lamination” in the figure.
The laser conditions at this time were a wavelength of 266 nm, a repetition frequency of 100 kHz, and an output of 2 W. Further, the square lattice was set to a square lattice having a side of 6 μm. The plot of the graph is an actual measurement value of the surface roughness, and the dotted line and the solid line are obtained by fitting these plots with the naked eye.

  As a comparative example, as in the above example, a square lattice having a side size of 6 μm is set as a quadrangular lattice, and the entire layer is shifted by a random amount in the xy direction, and the number of layers is the same as above. 6 is also shown in FIG. 6 (“square lattice random shift lamination” in the figure). Further, similarly to the above comparative example, processing was performed by randomly shifting, and only the intermediate four layers (from the tenth layer to the thirteenth layer) were subjected to the same laser processing as the first layer to the fourth layer of the present invention. The case (“square lattice random shift stack (solid line part) in the drawing) is also shown in FIG.

  As can be seen from these results, when all layers are processed by the laser processing method of the present invention, the surface roughness decreases as the number of layers is increased from the first layer, whereas all layers are processed. In the comparative example processed by random shift, the surface roughness increases as the number of layers increases. In addition, in the example in which only a part of the total number of layers is processed by the laser processing method of the present invention, the surface roughness is smaller than in the comparative example in which all the layers are processed by random shift. By processing with the ordered laser processing method of the present invention, an effect of reducing the surface roughness is obtained.

  The technical scope of the present invention is not limited to the above-described embodiments and examples, and various modifications can be made without departing from the spirit of the present invention.

  DESCRIPTION OF SYMBOLS 1 ... Laser processing apparatus, 2 ... Laser beam irradiation mechanism, 3 ... Position adjustment mechanism, C ... Control part, G1-G6 ... Square gravity center, L ... Laser beam, P1-P16 ... Pulse irradiation point, W ... Work object

Claims (4)

A processing apparatus for forming a shape by irradiating a processing object with a pulsed laser beam,
A pulsed laser light irradiation mechanism for irradiating and scanning the processing object with the laser light at a constant repetition frequency; and
A position adjustment mechanism capable of holding the workpiece and adjusting a relative positional relationship between the workpiece and the laser beam;
When the laser beam is scanned by controlling these mechanisms, the processing region is set as a stack of a plurality of processing layers in the irradiation direction of the laser beam, and the laser beam is applied to each processing layer. A control unit that forms a three-dimensional machining surface by removing a predetermined portion for each machining layer,
The control unit performs processing by irradiating the laser beam with a pulse point of a virtual square lattice set for the processing layer,
Including at least one period of layers in which four consecutive layers from the first layer to the fourth layer are processed in the processing order among the plurality of processing layers,
In the second layer, the grid point of the square lattice is shifted to the center of gravity of the quadrangle formed by the four pulse irradiation points adjacent to the first layer, and the pulse irradiation point is obtained.
In the third layer, the lattice point of the square lattice is shifted to the center of gravity of the quadrangle formed by the pulse irradiation points adjacent to the first layer and the second layer, and the pulse irradiation points are obtained.
In the fourth layer, the laser processing apparatus is characterized in that a lattice point of the square lattice is shifted to a center of gravity of a quadrangle formed by the four pulse irradiation points adjacent to the third layer to form a pulse irradiation point. . The laser processing apparatus according to claim 1,
When the control unit continuously repeats the one cycle, in the second and subsequent cycles, in the first layer, the center of any square formed by the adjacent pulse irradiation points up to the previous cycle A laser processing apparatus characterized by shifting a lattice point of a square lattice to a pulse irradiation point. In the laser processing apparatus according to claim 1 or 2,
The laser processing apparatus, wherein the control unit sets the fourth layer to be the last processing layer. A processing method for forming a shape by irradiating a processing object with pulsed laser light,
Irradiating the workpiece with the laser beam at a constant repetition frequency and scanning the laser beam; and
A position adjustment step of holding the workpiece and adjusting a relative positional relationship between the workpiece and the laser beam;
When scanning with the laser beam, the processing region is set as a stack of a plurality of processing layers in the irradiation direction of the laser beam, each processing layer is irradiated with the laser beam, and the processing layer Remove a predetermined part every time to form a three-dimensional machining surface,
Perform processing by irradiating the laser beam on the lattice points of the virtual lattice set for the processing layer,
Including at least one period of layers in which four consecutive layers from the first layer to the fourth layer are processed in the processing order among the plurality of processing layers,
In the second layer, the grid point of the square lattice is shifted to the center of gravity of the quadrangle formed by the four pulse irradiation points adjacent to the first layer, and the pulse irradiation point is obtained.
In the third layer, the lattice point of the square lattice is shifted to the center of gravity of the quadrangle formed by the pulse irradiation points adjacent to the first layer and the second layer, and the pulse irradiation points are obtained.
In the fourth layer, the laser processing method is characterized in that the grid point of the square lattice is shifted to the center of gravity of a quadrangle constituted by the four pulse irradiation points adjacent to the third layer to form a pulse irradiation point. .