JP2013250188A - 欠陥検出装置、欠陥検出方法、および欠陥検出プログラム - Google Patents
欠陥検出装置、欠陥検出方法、および欠陥検出プログラム Download PDFInfo
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- JP2013250188A JP2013250188A JP2012125889A JP2012125889A JP2013250188A JP 2013250188 A JP2013250188 A JP 2013250188A JP 2012125889 A JP2012125889 A JP 2012125889A JP 2012125889 A JP2012125889 A JP 2012125889A JP 2013250188 A JP2013250188 A JP 2013250188A
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| JP2012125889A JP2013250188A (ja) | 2012-06-01 | 2012-06-01 | 欠陥検出装置、欠陥検出方法、および欠陥検出プログラム |
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| JP2012125889A JP2013250188A (ja) | 2012-06-01 | 2012-06-01 | 欠陥検出装置、欠陥検出方法、および欠陥検出プログラム |
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| JP2013250188A true JP2013250188A (ja) | 2013-12-12 |
| JP2013250188A5 JP2013250188A5 (enExample) | 2015-06-18 |
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| JP2012125889A Withdrawn JP2013250188A (ja) | 2012-06-01 | 2012-06-01 | 欠陥検出装置、欠陥検出方法、および欠陥検出プログラム |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015169564A (ja) * | 2014-03-07 | 2015-09-28 | 株式会社ダイヘン | 画像検査装置及び画像検査方法 |
| US9429779B2 (en) | 2014-08-19 | 2016-08-30 | Samsung Electronics Co., Ltd. | Electro-optic modulator including composite materials and testing apparatus including the same |
| CN109900707A (zh) * | 2019-03-20 | 2019-06-18 | 湖南华曙高科技有限责任公司 | 一种铺粉质量检测方法、设备以及可读存储介质 |
| KR20220094593A (ko) * | 2020-12-29 | 2022-07-06 | 부산대학교 산학협력단 | 표면결함검출 스캐너를 위한 이미지 데이터 저장 장치 및 방법 |
| CN116973311A (zh) * | 2023-09-22 | 2023-10-31 | 成都中嘉微视科技有限公司 | 一种膜上膜下异物的检测装置及检测方法 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09145638A (ja) * | 1995-11-24 | 1997-06-06 | Kawasaki Steel Corp | 表面欠陥検査方法及び装置 |
| JP2000329699A (ja) * | 1999-05-20 | 2000-11-30 | Kobe Steel Ltd | 欠陥検査方法及びその装置 |
| JP2008004085A (ja) * | 2006-05-23 | 2008-01-10 | Matsushita Electric Ind Co Ltd | 画像処理装置、画像処理方法、プログラム、記録媒体および集積回路 |
| JP2008070242A (ja) * | 2006-09-14 | 2008-03-27 | Seiko Epson Corp | ノイズ除去方法および装置、ムラ欠陥検査方法および装置 |
| JP2009216475A (ja) * | 2008-03-08 | 2009-09-24 | Kanto Auto Works Ltd | 表面検査システム及びこれを用いた表面検査方法 |
-
2012
- 2012-06-01 JP JP2012125889A patent/JP2013250188A/ja not_active Withdrawn
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09145638A (ja) * | 1995-11-24 | 1997-06-06 | Kawasaki Steel Corp | 表面欠陥検査方法及び装置 |
| JP2000329699A (ja) * | 1999-05-20 | 2000-11-30 | Kobe Steel Ltd | 欠陥検査方法及びその装置 |
| JP2008004085A (ja) * | 2006-05-23 | 2008-01-10 | Matsushita Electric Ind Co Ltd | 画像処理装置、画像処理方法、プログラム、記録媒体および集積回路 |
| JP2008070242A (ja) * | 2006-09-14 | 2008-03-27 | Seiko Epson Corp | ノイズ除去方法および装置、ムラ欠陥検査方法および装置 |
| JP2009216475A (ja) * | 2008-03-08 | 2009-09-24 | Kanto Auto Works Ltd | 表面検査システム及びこれを用いた表面検査方法 |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015169564A (ja) * | 2014-03-07 | 2015-09-28 | 株式会社ダイヘン | 画像検査装置及び画像検査方法 |
| US9429779B2 (en) | 2014-08-19 | 2016-08-30 | Samsung Electronics Co., Ltd. | Electro-optic modulator including composite materials and testing apparatus including the same |
| CN109900707A (zh) * | 2019-03-20 | 2019-06-18 | 湖南华曙高科技有限责任公司 | 一种铺粉质量检测方法、设备以及可读存储介质 |
| CN109900707B (zh) * | 2019-03-20 | 2021-07-02 | 湖南华曙高科技有限责任公司 | 一种铺粉质量检测方法、设备以及可读存储介质 |
| KR20220094593A (ko) * | 2020-12-29 | 2022-07-06 | 부산대학교 산학협력단 | 표면결함검출 스캐너를 위한 이미지 데이터 저장 장치 및 방법 |
| KR102595278B1 (ko) * | 2020-12-29 | 2023-10-27 | 부산대학교 산학협력단 | 표면결함검출 스캐너를 위한 이미지 데이터 저장 장치 및 방법 |
| US11961217B2 (en) | 2020-12-29 | 2024-04-16 | Pusan National University Industry—University Cooperation Foundation | Device and method for storing image data for surface defect detection scanner |
| CN116973311A (zh) * | 2023-09-22 | 2023-10-31 | 成都中嘉微视科技有限公司 | 一种膜上膜下异物的检测装置及检测方法 |
| CN116973311B (zh) * | 2023-09-22 | 2023-12-12 | 成都中嘉微视科技有限公司 | 一种膜上膜下异物的检测装置及检测方法 |
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