JP2013250188A5 - - Google Patents

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Publication number
JP2013250188A5
JP2013250188A5 JP2012125889A JP2012125889A JP2013250188A5 JP 2013250188 A5 JP2013250188 A5 JP 2013250188A5 JP 2012125889 A JP2012125889 A JP 2012125889A JP 2012125889 A JP2012125889 A JP 2012125889A JP 2013250188 A5 JP2013250188 A5 JP 2013250188A5
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JP
Japan
Prior art keywords
image
inspection image
pixel data
inspection
pixel
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Application number
JP2012125889A
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English (en)
Japanese (ja)
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JP2013250188A (ja
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Priority to JP2012125889A priority Critical patent/JP2013250188A/ja
Priority claimed from JP2012125889A external-priority patent/JP2013250188A/ja
Publication of JP2013250188A publication Critical patent/JP2013250188A/ja
Publication of JP2013250188A5 publication Critical patent/JP2013250188A5/ja
Withdrawn legal-status Critical Current

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JP2012125889A 2012-06-01 2012-06-01 欠陥検出装置、欠陥検出方法、および欠陥検出プログラム Withdrawn JP2013250188A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012125889A JP2013250188A (ja) 2012-06-01 2012-06-01 欠陥検出装置、欠陥検出方法、および欠陥検出プログラム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012125889A JP2013250188A (ja) 2012-06-01 2012-06-01 欠陥検出装置、欠陥検出方法、および欠陥検出プログラム

Publications (2)

Publication Number Publication Date
JP2013250188A JP2013250188A (ja) 2013-12-12
JP2013250188A5 true JP2013250188A5 (enExample) 2015-06-18

Family

ID=49849007

Family Applications (1)

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JP2012125889A Withdrawn JP2013250188A (ja) 2012-06-01 2012-06-01 欠陥検出装置、欠陥検出方法、および欠陥検出プログラム

Country Status (1)

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JP (1) JP2013250188A (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6329397B2 (ja) * 2014-03-07 2018-05-23 株式会社ダイヘン 画像検査装置及び画像検査方法
KR101711192B1 (ko) 2014-08-19 2017-03-14 삼성전자 주식회사 전기-광학 변조기, 및 그 전기-광학 변조기를 포함한 검사 장치
CN109900707B (zh) * 2019-03-20 2021-07-02 湖南华曙高科技有限责任公司 一种铺粉质量检测方法、设备以及可读存储介质
KR102595278B1 (ko) 2020-12-29 2023-10-27 부산대학교 산학협력단 표면결함검출 스캐너를 위한 이미지 데이터 저장 장치 및 방법
CN116973311B (zh) * 2023-09-22 2023-12-12 成都中嘉微视科技有限公司 一种膜上膜下异物的检测装置及检测方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09145638A (ja) * 1995-11-24 1997-06-06 Kawasaki Steel Corp 表面欠陥検査方法及び装置
JP2000329699A (ja) * 1999-05-20 2000-11-30 Kobe Steel Ltd 欠陥検査方法及びその装置
JP5147287B2 (ja) * 2006-05-23 2013-02-20 パナソニック株式会社 画像処理装置、画像処理方法、プログラム、記録媒体および集積回路
JP2008070242A (ja) * 2006-09-14 2008-03-27 Seiko Epson Corp ノイズ除去方法および装置、ムラ欠陥検査方法および装置
JP4820971B2 (ja) * 2008-03-08 2011-11-24 関東自動車工業株式会社 表面検査方法

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