JP2013217670A5 - - Google Patents

Download PDF

Info

Publication number
JP2013217670A5
JP2013217670A5 JP2012085895A JP2012085895A JP2013217670A5 JP 2013217670 A5 JP2013217670 A5 JP 2013217670A5 JP 2012085895 A JP2012085895 A JP 2012085895A JP 2012085895 A JP2012085895 A JP 2012085895A JP 2013217670 A5 JP2013217670 A5 JP 2013217670A5
Authority
JP
Japan
Prior art keywords
signal
interference
light
measurement
processing unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2012085895A
Other languages
English (en)
Japanese (ja)
Other versions
JP2013217670A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2012085895A priority Critical patent/JP2013217670A/ja
Priority claimed from JP2012085895A external-priority patent/JP2013217670A/ja
Priority to EP13158297.5A priority patent/EP2648044A3/en
Priority to US13/804,006 priority patent/US20130268225A1/en
Publication of JP2013217670A publication Critical patent/JP2013217670A/ja
Publication of JP2013217670A5 publication Critical patent/JP2013217670A5/ja
Withdrawn legal-status Critical Current

Links

JP2012085895A 2012-04-04 2012-04-04 計測装置及び計測方法 Withdrawn JP2013217670A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2012085895A JP2013217670A (ja) 2012-04-04 2012-04-04 計測装置及び計測方法
EP13158297.5A EP2648044A3 (en) 2012-04-04 2013-03-08 Measurement apparatus and measurement method
US13/804,006 US20130268225A1 (en) 2012-04-04 2013-03-14 Measurement apparatus and measurement method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012085895A JP2013217670A (ja) 2012-04-04 2012-04-04 計測装置及び計測方法

Publications (2)

Publication Number Publication Date
JP2013217670A JP2013217670A (ja) 2013-10-24
JP2013217670A5 true JP2013217670A5 (enExample) 2015-05-21

Family

ID=47827075

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012085895A Withdrawn JP2013217670A (ja) 2012-04-04 2012-04-04 計測装置及び計測方法

Country Status (3)

Country Link
US (1) US20130268225A1 (enExample)
EP (1) EP2648044A3 (enExample)
JP (1) JP2013217670A (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014109481A (ja) * 2012-11-30 2014-06-12 Canon Inc 計測方法及び計測装置
WO2016154780A1 (zh) * 2015-03-27 2016-10-06 浙江理工大学 激光干涉波长杠杆式绝对距离测量装置与方法
JP7293078B2 (ja) * 2019-10-08 2023-06-19 株式会社ミツトヨ 解析装置、解析方法、干渉測定システム、およびプログラム

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5828454A (en) * 1996-07-29 1998-10-27 Gust; Gary R. Optical heterodyne interferometer for measurement of ocular displacement
US6147755A (en) * 1999-04-01 2000-11-14 Trw Inc. Dynamic optical phase state detector
US7428685B2 (en) * 2002-07-08 2008-09-23 Zygo Corporation Cyclic error compensation in interferometry systems
EP1543291A4 (en) * 2002-09-26 2006-05-10 Prime Photonics Inc STABILIZATION OF THE ACTIVE Q POINT FOR LINEAR INTERFEROMETER SENSORS
US7640140B2 (en) * 2003-03-07 2009-12-29 Sensys Medical, Inc. Method of processing noninvasive spectra
CN101015124B (zh) * 2004-09-08 2011-04-20 富士通半导体股份有限公司 Pll频率合成器
JP4465451B2 (ja) 2004-12-15 2010-05-19 独立行政法人産業技術総合研究所 光干渉計の周期誤差低減方法および装置
US7576868B2 (en) * 2007-06-08 2009-08-18 Zygo Corporation Cyclic error compensation in interferometry systems
US7956630B1 (en) * 2008-04-15 2011-06-07 Veeco Instruments, Inc. Real-time effective-wavelength error correction for HDVSI

Similar Documents

Publication Publication Date Title
JP2015068775A5 (enExample)
JP2013156229A5 (ja) 光断層像撮影装置及びノイズ除去方法
JP6125981B2 (ja) 光断層画像装置用サンプルクロック発生装置、および光断層画像装置
JP2014045908A5 (enExample)
JP2013092402A5 (enExample)
KR101861672B1 (ko) 파장 가변 레이저를 이용한 대면적 oct 시스템과 3차원 이미지 보정 방법
GB2529116A (en) Fiber optic distributed vibration sensing with wavenumber sensitivity correction
JP2011179934A5 (enExample)
WO2014056708A3 (en) Mark position measuring apparatus and method, lithographic apparatus and device manufacturing method
JP2015180863A5 (enExample)
JP2011005235A5 (enExample)
JP2013113637A5 (enExample)
JP2016075585A5 (enExample)
JP2011242177A5 (enExample)
JP2012021856A (ja) 干渉膜厚計
JP2008233063A5 (enExample)
JP2016033489A5 (enExample)
JP2013217670A5 (enExample)
JP2014202568A5 (enExample)
JP2013083581A5 (enExample)
JP2014523517A5 (enExample)
WO2015166495A3 (en) Method for analyzing an object using a combination of long and short coherence interferometry
JP2014165800A5 (enExample)
JP2010164389A5 (enExample)
EP2610592A3 (en) Encoder with error detection and error correction