|
US20150117599A1
(en)
|
2013-10-31 |
2015-04-30 |
Sigray, Inc. |
X-ray interferometric imaging system
|
|
US9570265B1
(en)
|
2013-12-05 |
2017-02-14 |
Sigray, Inc. |
X-ray fluorescence system with high flux and high flux density
|
|
US10295485B2
(en)
|
2013-12-05 |
2019-05-21 |
Sigray, Inc. |
X-ray transmission spectrometer system
|
|
US9448190B2
(en)
|
2014-06-06 |
2016-09-20 |
Sigray, Inc. |
High brightness X-ray absorption spectroscopy system
|
|
US10297359B2
(en)
|
2013-09-19 |
2019-05-21 |
Sigray, Inc. |
X-ray illumination system with multiple target microstructures
|
|
US10269528B2
(en)
|
2013-09-19 |
2019-04-23 |
Sigray, Inc. |
Diverging X-ray sources using linear accumulation
|
|
FR3012663B1
(fr)
*
|
2013-10-25 |
2015-12-04 |
Thales Sa |
Generateur de rayons x a capteur de flux integre
|
|
US10304580B2
(en)
|
2013-10-31 |
2019-05-28 |
Sigray, Inc. |
Talbot X-ray microscope
|
|
USRE48612E1
(en)
|
2013-10-31 |
2021-06-29 |
Sigray, Inc. |
X-ray interferometric imaging system
|
|
JP6594479B2
(ja)
*
|
2013-12-06 |
2019-10-23 |
キヤノン株式会社 |
透過型ターゲットおよび該透過型ターゲットを備えるｘ線発生管
|
|
JP6335729B2
(ja)
*
|
2013-12-06 |
2018-05-30 |
キヤノン株式会社 |
透過型ターゲットおよび該透過型ターゲットを備えるｘ線発生管
|
|
US9594036B2
(en)
|
2014-02-28 |
2017-03-14 |
Sigray, Inc. |
X-ray surface analysis and measurement apparatus
|
|
US9823203B2
(en)
|
2014-02-28 |
2017-11-21 |
Sigray, Inc. |
X-ray surface analysis and measurement apparatus
|
|
JP6381269B2
(ja)
*
|
2014-04-21 |
2018-08-29 |
キヤノン株式会社 |
ターゲットおよび前記ターゲットを備えるｘ線発生管、ｘ線発生装置、ｘ線撮影システム
|
|
US10401309B2
(en)
|
2014-05-15 |
2019-09-03 |
Sigray, Inc. |
X-ray techniques using structured illumination
|
|
US10352880B2
(en)
|
2015-04-29 |
2019-07-16 |
Sigray, Inc. |
Method and apparatus for x-ray microscopy
|
|
US10295486B2
(en)
|
2015-08-18 |
2019-05-21 |
Sigray, Inc. |
Detector for X-rays with high spatial and high spectral resolution
|
|
US10247683B2
(en)
|
2016-12-03 |
2019-04-02 |
Sigray, Inc. |
Material measurement techniques using multiple X-ray micro-beams
|
|
JP6937380B2
(ja)
|
2017-03-22 |
2021-09-22 |
シグレイ、インコーポレイテッド |
Ｘ線分光を実施するための方法およびｘ線吸収分光システム
|
|
US10578566B2
(en)
|
2018-04-03 |
2020-03-03 |
Sigray, Inc. |
X-ray emission spectrometer system
|
|
DE112019002822T5
(de)
|
2018-06-04 |
2021-02-18 |
Sigray, Inc. |
Wellenlängendispersives röntgenspektrometer
|
|
CN112470245B
(zh)
|
2018-07-26 |
2025-03-18 |
斯格瑞公司 |
高亮度x射线反射源
|
|
US10656105B2
(en)
|
2018-08-06 |
2020-05-19 |
Sigray, Inc. |
Talbot-lau x-ray source and interferometric system
|
|
US10962491B2
(en)
|
2018-09-04 |
2021-03-30 |
Sigray, Inc. |
System and method for x-ray fluorescence with filtering
|
|
WO2020051221A2
(en)
|
2018-09-07 |
2020-03-12 |
Sigray, Inc. |
System and method for depth-selectable x-ray analysis
|
|
US11152183B2
(en)
|
2019-07-15 |
2021-10-19 |
Sigray, Inc. |
X-ray source with rotating anode at atmospheric pressure
|
|
JP7097480B1
(ja)
*
|
2021-06-24 |
2022-07-07 |
浜松ホトニクス株式会社 |
Ｘ線管、ｘ線発生装置、及び窓部材の製造方法
|
|
DE112023000574T5
(de)
|
2022-01-13 |
2024-10-24 |
Sigray, Inc. |
Mikrofokus-röntgenquelle zur erzeugung von röntgenstrahlen mit hohem fluss und niedriger energie
|
|
US12360067B2
(en)
|
2022-03-02 |
2025-07-15 |
Sigray, Inc. |
X-ray fluorescence system and x-ray source with electrically insulative target material
|
|
US12181423B1
(en)
|
2023-09-07 |
2024-12-31 |
Sigray, Inc. |
Secondary image removal using high resolution x-ray transmission sources
|