JP2013058800A - Adhesive sheet for fragile member processing and processing method of fragile member - Google Patents

Adhesive sheet for fragile member processing and processing method of fragile member Download PDF

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JP2013058800A
JP2013058800A JP2012266663A JP2012266663A JP2013058800A JP 2013058800 A JP2013058800 A JP 2013058800A JP 2012266663 A JP2012266663 A JP 2012266663A JP 2012266663 A JP2012266663 A JP 2012266663A JP 2013058800 A JP2013058800 A JP 2013058800A
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film
processing
brittle member
fragile member
adhesive sheet
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Hitoshi Ohashi
仁 大橋
Michio Kanai
道生 金井
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Lintec Corp
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Lintec Corp
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PROBLEM TO BE SOLVED: To provide an adhesive sheet for fragile member processing that is suitably used for a processing method of a fragile member which stably holds the fragile member when the fragile member, such as a semiconductor wafer, is transported and processing, such as a rear surface grinding, is performed and enables the fragile member to be peeled without causing the damage after the required processing is finished.SOLUTION: An adhesive sheet for fragile member processing according to the invention is composed of: a lamination film base material which has a first film and a second film and is formed by fastening peripheral parts of the first and second films and placing the two films in contact with each other in an airtight manner to be integrated at an internal region enclosed by fastening parts; and an adhesive layer formed on both outer surfaces of the lamination film base material.

Description

本発明は、半導体ウエハ等の脆質部材の搬送や半導体ウエハの裏面研削等の加工に代表される各種の処理工程を含む、脆質部材の処理方法に好適に用いられる脆質部材加工用粘着シートに関する。また、本発明は、脆質部材の処理方法に関する。   The present invention relates to an adhesive for processing a brittle member suitably used in a processing method for a brittle member, including various processing steps represented by processing such as conveyance of a brittle member such as a semiconductor wafer and back grinding of a semiconductor wafer. Regarding the sheet. Moreover, this invention relates to the processing method of a brittle member.

近年のICカードの普及にともない、その構成部材であるウエハの薄型化が進められている。従来350μm程度の厚みであったウエハを、50〜100μmあるいはそれ以下まで薄くすることが求められるようになった。   With the spread of IC cards in recent years, thinning of wafers as constituent members has been promoted. It has been demanded to reduce the thickness of a conventional wafer having a thickness of about 350 μm to 50 to 100 μm or less.

脆質部材であるウエハは、薄くなるにつれて、加工や運搬の際、破損する危険性が高くなる。このため、ウエハを極薄まで研削したり、極薄のウエハを運搬したりする場合は、ウエハをガラス板やアクリル板のような硬質板上に両面粘着シートなどにより固定・保護して作業を進めるのが望ましい。   As the wafer that is a brittle member becomes thinner, the risk of breakage increases during processing and transportation. For this reason, when grinding a wafer to an extremely thin thickness or transporting an extremely thin wafer, the wafer is fixed and protected on a hard plate such as a glass plate or an acrylic plate with a double-sided adhesive sheet. It is desirable to proceed.

しかしながら、両面粘着シートでウエハと硬質板とを貼り合わせる方法では、一連の工程を終えた後、ウエハを硬質板から剥離する際、ウエハが割れてしまうことがあった。2枚の薄層品が貼り合わせてなる積層物を剥離する際には、薄層品の何れか一方、または両者を湾曲させて剥離する必要がある。しかし、硬質板を湾曲することは不可能ないし困難であるため、ウエハ側を湾曲せざるをえない。このため、脆弱なウエハにひずみがかかって割れてしまうことになる。   However, in the method of bonding a wafer and a hard plate with a double-sided pressure-sensitive adhesive sheet, the wafer may be broken when the wafer is peeled off from the hard plate after a series of steps. When peeling a laminate formed by laminating two thin-layer products, it is necessary to bend either one of the thin-layer products or both. However, since it is impossible or difficult to curve the hard plate, the wafer side must be curved. For this reason, a fragile wafer is distorted and cracked.

このような問題を解決するための手段として、ウエハの変形をできる限り低減して剥離を行う方法や、ウエハに保護フィルムを積層するなどしてウエハを補強した上で剥離を行う方法、さらにはウエハを硬質板に固定する手段として、接着力を制御可能な粘着剤や両面粘着テープを用い、剥離時に粘着剤の発泡などの適宜な手段により接着力を低下させた後に剥離を行う方法などが種々提案されている(特許文献1〜5)。   As a means for solving such a problem, a method of performing separation while reducing deformation of the wafer as much as possible, a method of performing separation after reinforcing the wafer by laminating a protective film on the wafer, and the like As a means of fixing the wafer to the hard plate, there is a method of using a pressure-sensitive adhesive or double-sided pressure-sensitive adhesive tape whose adhesive force can be controlled, and performing peeling after reducing the adhesive force by an appropriate means such as foaming of the adhesive during peeling Various proposals have been made (Patent Documents 1 to 5).

特許文献6では、硬質板を使用せずに、比較的剛性の高い樹脂フィルムを用いた脆質部材の保護方法が開示されている。
特開2004-153227号公報 特開2005-116678号公報 特開2003-324142号公報 特開2005-277037号公報 国際特許公開WO2003/049164 特開2004-63678号公報
Patent Document 6 discloses a method for protecting a brittle member using a relatively rigid resin film without using a hard plate.
JP 2004-153227 A JP 2005-116678 A JP 2003-324142 A JP 2005-277037 A International Patent Publication WO2003 / 049164 JP 2004-63678 A

ウエハを硬質板上に保持した場合には、ウエハを剥離する際にウエハ側を変形することとなる。このため、ウエハの破損を完全に防止することは難しい。また、発泡などにより接着力を低減するように設計された特殊な粘着剤や両面粘着テープを使用した場合には、ウエハに接着剤が残着し、ウエハを汚染してしまう可能性もある。特許文献6に提案されている方法では、剛性の樹脂フィルム側を変形してウエハからの剥離を行うため、ウエハの破損という問題は解消できる。しかし、樹脂フィルムであるため、形状保持性が必ずしも十分ではなく、ウエハの搬送時にウエハが破損するおそれがある。   When the wafer is held on a hard plate, the wafer side is deformed when the wafer is peeled off. For this reason, it is difficult to completely prevent the wafer from being damaged. In addition, when a special pressure-sensitive adhesive or double-sided pressure-sensitive adhesive tape designed to reduce the adhesive force by foaming or the like is used, the adhesive may remain on the wafer and contaminate the wafer. In the method proposed in Patent Document 6, since the rigid resin film side is deformed and peeled off from the wafer, the problem of wafer breakage can be solved. However, since it is a resin film, shape retention is not always sufficient, and the wafer may be damaged when the wafer is transferred.

本発明は、上記のような従来技術に伴う問題を解決しようとするものである。すなわち、本発明は、半導体ウエハ等の脆質部材の搬送や裏面研削等の加工を施す際に、脆質部材を安定して保持でき、しかも所要の処理が終了した後には、脆質部材を破損することなく剥離することができる脆質部材の処理方法に好ましく用いられる脆質部材加工用粘着シートを提供することを目的としている。   The present invention seeks to solve the problems associated with the prior art as described above. That is, the present invention can stably hold a brittle member when performing processing such as conveyance of a brittle member such as a semiconductor wafer or back grinding, and after the required processing is completed, It aims at providing the adhesive sheet for brittle member processing preferably used for the processing method of the brittle member which can be peeled without being damaged.

このような課題の解決を目的とした本発明の要旨は以下のとおりである。   The gist of the present invention aimed at solving such problems is as follows.

(1)第1のフィルムと第2のフィルムとを有し、これらの周縁部が結着され、結着部に囲繞された内部領域で2枚のフィルムが気密的に密着一体化してなる積層フィルム基材と、
該積層フィルム基材の両外表面に形成された粘着剤層とからなる粘着シート。
(1) Lamination having a first film and a second film, the peripheral edges of which are bound together, and the two films being hermetically tightly integrated in an inner region surrounded by the binding part A film substrate;
A pressure-sensitive adhesive sheet comprising a pressure-sensitive adhesive layer formed on both outer surfaces of the laminated film substrate.

(2)前記積層フィルム基材の内側表面同士の静摩擦係数が0.1以上である(1)に記載の脆質部材加工用粘着シート。 (2) The adhesive sheet for brittle member processing according to (1), wherein the coefficient of static friction between the inner surfaces of the laminated film substrate is 0.1 or more.

本発明においては、周縁部においてのみ結着された積層フィルム基材を有する脆質部材加工用粘着シートを介して半導体ウエハ等の脆質部材を硬質板に固定して保護しているため、脆質部材の搬送・保管・加工時において脆質部材を変形することなく保持できる。また、所要の処理の後には、積層フィルム基材を切断することで脆質部材を硬質板から容易に分離できるため、脆質部材の剥離が容易になり、脆質部材の破損が防止される。   In the present invention, a brittle member such as a semiconductor wafer is fixed to and protected by a hard plate via an adhesive sheet for processing a brittle member having a laminated film base material bonded only at the peripheral portion. The brittle member can be held without being deformed during transportation, storage, and processing of the material member. Further, after the required treatment, the brittle member can be easily separated from the hard plate by cutting the laminated film substrate, so that the brittle member can be easily peeled off and the brittle member is prevented from being damaged. .

以下、本発明について図面を参照しながら、本発明の脆質部材の処理方法を説明するとともに、本発明の脆質部材加工用粘着シートについて、さらに具体的に説明する。   Hereinafter, while describing the processing method of the brittle member of this invention, referring to drawings about this invention, the adhesive sheet for brittle member processing of this invention is demonstrated more concretely.

図1に示すように、本発明に係る脆質部材の処理方法では、脆質部材加工用粘着シート1の片面に脆質部材2を再剥離可能に固定し、他面に硬質板3を再剥離可能に固定する。   As shown in FIG. 1, in the brittle member processing method according to the present invention, the brittle member 2 is removably fixed to one side of the adhesive sheet 1 for brittle member processing, and the hard plate 3 is reattached to the other side. Fix in a peelable manner.

脆質部材2としては、シリコンウエハ、ガリウム・ヒ素ウエハ等の各種半導体ウエハ、セラミックス板、ガラス板、金属板等が挙げられるが、これらに限定されない。これらの中でも、本発明の処理方法は、表面に回路が形成された半導体ウエハに適用することが特に好ましい。さらに、裏面研削を施されて厚みが極めて薄くなり、強度が極端に低下した半導体ウエハに好ましく適用できる。   Examples of the brittle member 2 include, but are not limited to, various semiconductor wafers such as a silicon wafer and a gallium / arsenic wafer, a ceramic plate, a glass plate, and a metal plate. Among these, the treatment method of the present invention is particularly preferably applied to a semiconductor wafer having a circuit formed on the surface. Furthermore, it can be preferably applied to a semiconductor wafer that has been subjected to backside grinding and has a very thin thickness and extremely low strength.

硬質板3は、脆質部材2の搬送・保管・加工時において、これを支持し保護する機能を果たす。硬質板3としては、たとえばガラス板、石英板や、アクリル板、ポリ塩化ビニル板、ポリエチレンテレフタレート板、ポリプロピレン板、ポリカーボネート板等のプラスチック板が使用できる。硬質板3のASTM D 883により定義される硬度は、好ましくは70MPa以上である。硬質板3の厚さは、その材質にもよるが、通常は、0.1〜10mm程度である。硬質板3の径は、脆質部材2の径と同一またはこれよりも若干大きめのものが採用される。さらに、後述するように、脆質部材加工用粘着シート1の粘着剤層11a、12aとして、紫外線硬化型の粘着剤を使用する場合は、硬質板3は、紫外線透過性の材質により形成される。   The hard plate 3 functions to support and protect the brittle member 2 during transportation, storage, and processing. As the hard plate 3, for example, a glass plate, a quartz plate, an acrylic plate, a polyvinyl chloride plate, a polyethylene terephthalate plate, a polypropylene plate, a polycarbonate plate, or the like can be used. The hardness defined by ASTM D 883 of the hard plate 3 is preferably 70 MPa or more. The thickness of the hard plate 3 is usually about 0.1 to 10 mm, although it depends on the material. The diameter of the hard plate 3 is the same as or slightly larger than the diameter of the brittle member 2. Furthermore, as will be described later, when an ultraviolet curable adhesive is used as the adhesive layers 11a and 12a of the brittle member processing adhesive sheet 1, the hard plate 3 is formed of an ultraviolet transmissive material. .

本発明では、上記硬質板3上に、脆質部材加工用粘着シート1を介して脆質部材2が固定されてなる。   In the present invention, the brittle member 2 is fixed on the hard plate 3 via the adhesive sheet 1 for brittle member processing.

脆質部材加工用粘着シート1は、第1のフィルム11と第2のフィルム12とを有し、これらの周縁部が結着されてなる積層フィルム基材10と、積層フィルム基材10の両外表面に形成された粘着剤層11aおよび12aからなる。   The pressure-sensitive adhesive sheet 1 for processing a brittle member has a first film 11 and a second film 12, and a laminated film substrate 10 formed by binding the peripheral edges thereof, and both the laminated film substrate 10. It consists of adhesive layers 11a and 12a formed on the outer surface.

積層フィルム基材10は、図1にその断面図を示したように、第1のフィルム11と第2のフィルム12とを有し、これらの周縁部が結着されてなる積層フィルム基材があげられる。図1において、第1のフィルム11と第2のフィルム12との接触面での周縁部における符号13は、第1のフィルム11と第2のフィルム12との結着部13を示す。第1のフィルム11と第2のフィルム12とは、常態においては、気密的に密着一体化している。すなわち、積層フィルム基材10は、2枚のフィルムが周縁部において結着、固定された積層フィルムである。結着部13は、貼付される脆質部材2の外縁よりも外側に位置するように設けられる。   As shown in the cross-sectional view of FIG. 1, the laminated film base material 10 includes a first film 11 and a second film 12, and a laminated film base material formed by binding these peripheral portions. can give. In FIG. 1, reference numeral 13 at the peripheral edge at the contact surface between the first film 11 and the second film 12 indicates the binding portion 13 between the first film 11 and the second film 12. In the normal state, the first film 11 and the second film 12 are airtightly closely integrated. That is, the laminated film substrate 10 is a laminated film in which two films are bound and fixed at the peripheral edge. The binding portion 13 is provided so as to be located outside the outer edge of the brittle member 2 to be stuck.

第1のフィルム11および第2のフィルム12は、適度な柔軟性を有する樹脂フィルムであれば、特に限定されず、各種の樹脂フィルムが使用可能である。このような樹脂フィルムとしては、例えば、低密度ポリエチレン、直鎖低密度ポリエチレン、ポリプロピレン、ポリブテン等のポリオレフィン、エチレン酢酸ビニル共重合体、エチレン(メタ)アクリル酸共重合体、エチレン(メタ)アクリル酸エステル共重合体等のエチレン共重合体、ポリエチレンテレフタレート、ポリエチレンナフタレート等のポリエステル、ポリ塩化ビニル、アクリルゴム、ポリアミド、ウレタン、ポリイミド等の樹脂フィルムが挙げられる。また、それぞれのフィルム11およびフィルム12はこれらの単層であってもよいし、積層体からなってもよい。また、架橋等の処理を施したフィルムであってもよい。さらに、第1のフィルム11および第2のフィルム12は、熱可塑性樹脂を押出成形によりシート化したフィルムであってもよいし、硬化性樹脂を所定手段により薄膜化、硬化してシート化したフィルムが使われてもよい。硬化性樹脂としては、たとえば、エネルギー線硬化性のウレタンアクリレート系オリゴマーを主剤とし、比較的嵩高い基を有するアクリレートモノマーを希釈剤とし、必要に応じて光重合開始剤を配合した樹脂組成物が用いられる。   The 1st film 11 and the 2nd film 12 will not be specifically limited if it is a resin film which has moderate softness | flexibility, Various resin films can be used. Examples of such resin films include polyolefins such as low density polyethylene, linear low density polyethylene, polypropylene, and polybutene, ethylene vinyl acetate copolymers, ethylene (meth) acrylic acid copolymers, and ethylene (meth) acrylic acid. Examples thereof include ethylene copolymers such as ester copolymers, polyesters such as polyethylene terephthalate and polyethylene naphthalate, and resin films such as polyvinyl chloride, acrylic rubber, polyamide, urethane, and polyimide. In addition, each of the film 11 and the film 12 may be a single layer or a laminate. Moreover, the film which gave the process of bridge | crosslinking etc. may be sufficient. Further, the first film 11 and the second film 12 may be a film obtained by forming a thermoplastic resin into a sheet by extrusion molding, or a film obtained by thinning and curing a curable resin by a predetermined means. May be used. Examples of the curable resin include a resin composition in which an energy ray-curable urethane acrylate oligomer is a main component, an acrylate monomer having a relatively bulky group is a diluent, and a photopolymerization initiator is blended as necessary. Used.

第1のフィルム11と第2のフィルム12とは、同種の樹脂フィルムから形成されていてもよく、また結着し密着一体化できる限りにおいて異種の樹脂フィルムから形成されていてもよい。   The first film 11 and the second film 12 may be formed of the same type of resin film, or may be formed of different types of resin films as long as they can be bonded and closely integrated.

第1のフィルム11および第2のフィルム12の厚さは、それぞれ好ましくは5〜200μm、さらに好ましくは10〜150μm、特に好ましくは20〜100μmである。したがって、第1のフィルム11と第2のフィルム12との合計厚さは、好ましくは10〜400μm、さらに好ましくは20〜300μm、特に好ましくは40〜200μmである。   The thickness of each of the first film 11 and the second film 12 is preferably 5 to 200 μm, more preferably 10 to 150 μm, and particularly preferably 20 to 100 μm. Therefore, the total thickness of the first film 11 and the second film 12 is preferably 10 to 400 μm, more preferably 20 to 300 μm, and particularly preferably 40 to 200 μm.

第1のフィルムと第2のフィルムとの結着は、熱による融着であってもよく、また接着剤による接着であってもよい。接着剤を用いる場合には、アクリル系等の強力な接着剤を使用することが好ましい。   The binding between the first film and the second film may be fusion by heat or adhesion by an adhesive. When using an adhesive, it is preferable to use a strong adhesive such as acrylic.

積層フィルム基材10は、たとえば第1のフィルム11と第2のフィルム12とを重ね、リング状加熱部を備えた熱圧着装置で第1のフィルム11と第2のフィルム12とを熱圧着して得られる。また、一方のフィルム表面にリング状に接着剤層を形成し、他方のフィルムを積層することで、積層フィルム基材10を得ることもできる。積層フィルム基材10の製造後に、結着部の外径に沿って、基材を切断してもよい。   The laminated film substrate 10 is formed by, for example, stacking the first film 11 and the second film 12 and thermocompression bonding the first film 11 and the second film 12 with a thermocompression bonding apparatus including a ring-shaped heating unit. Obtained. Moreover, the laminated film base material 10 can also be obtained by forming an adhesive layer in a ring shape on one film surface and laminating the other film. After manufacturing the laminated film substrate 10, the substrate may be cut along the outer diameter of the binding portion.

第1のフィルム11と第2のフィルム12との結着部13は、図2に平面図(第1のフィルム11と第2のフィルム12との接触面における平面図)を示すように、積層フィルム基材10の周縁部に設けられる。結着部13は、積層フィルム基材10の周縁部の全周に連続的に設けられていても良く、不連続に設けられていても良い。結着部13に囲繞された内部領域では、第1のフィルム11と第2のフィルム12とが気密的に密着一体化してなる。   The binding portion 13 between the first film 11 and the second film 12 is laminated as shown in a plan view (a plan view at the contact surface between the first film 11 and the second film 12) in FIG. Provided at the peripheral edge of the film substrate 10. The binding part 13 may be provided continuously on the entire periphery of the peripheral part of the laminated film substrate 10 or may be provided discontinuously. In the inner region surrounded by the binding portion 13, the first film 11 and the second film 12 are airtightly closely integrated.

本発明における脆質部材2の処理が、半導体ウエハの裏面研削である場合には、半導体ウエハには剪断方向(横方向)に応力が加えられ、同時に積層フィルム基材10にも剪断方向への応力が伝搬する。この結果、第1のフィルム11と第2のフィルム12との接触面でフィルムが滑り、フィルムの位置ズレが起こることがある。このようなフィルムの位置ズレが発生すると、裏面研削が不可能になる。   When the processing of the brittle member 2 in the present invention is back grinding of a semiconductor wafer, stress is applied to the semiconductor wafer in the shear direction (lateral direction), and at the same time, the laminated film substrate 10 is also subjected to the shear direction. Stress propagates. As a result, the film may slip on the contact surface between the first film 11 and the second film 12, and the film may be misaligned. When such a positional deviation of the film occurs, back surface grinding becomes impossible.

上記のようなフィルムの位置ズレを防止するため、第1のフィルム11と第2のフィルム12との接触面、すなわち、積層フィルム基材10の内側表面同士の静摩擦係数は、好ましくは0.1以上、さらに好ましくは0.15以上、特に好ましくは0.2以上である。ここで、積層フィルム基材10の内側表面同士の静摩擦係数とは、第1のフィルム11と第2のフィルム12との接触面においてJIS K 7125に準じて測定された値である。静摩擦とは、滑り開始時に「しきい値」を超えるときの摩擦を意味し、静摩擦係数は「しきい値」から求めた係数であり、μ=F/Fで定義される。ここで、μは静摩擦係数、Fは静摩擦力、Fは滑り片の質量によって生じる法線力をしめす。静摩擦係数の測定条件について、図6に示す静摩擦係数測定装置を参照してさらに具体的に説明する。 In order to prevent the positional displacement of the film as described above, the coefficient of static friction between the contact surfaces of the first film 11 and the second film 12, that is, the inner surfaces of the laminated film substrate 10, is preferably 0.1. Above, more preferably 0.15 or more, particularly preferably 0.2 or more. Here, the coefficient of static friction between the inner surfaces of the laminated film substrate 10 is a value measured in accordance with JIS K 7125 at the contact surface between the first film 11 and the second film 12. Static friction means the friction when exceeding the “threshold value” at the start of sliding, and the static friction coefficient is a coefficient obtained from the “threshold value” and is defined by μ S = F s / F p . Here, μ S is a static friction coefficient, F s is a static friction force, and F p is a normal force generated by the mass of the sliding piece. The measurement conditions for the static friction coefficient will be described more specifically with reference to the static friction coefficient measuring apparatus shown in FIG.

図6に示す静摩擦係数測定装置20は、水平なテーブル21と、滑り片22およびテーブル21を水平方向に動かす駆動機構(図示せず)からなる。滑り片22は、接触面積(底面積)40cm2(一辺の長さ63 mm)で底面がフェルト22aで覆われてなり、全質量は200±2gである。試験フィルム23,24は、それぞれ第1のフィルム11、第2のフィルム12の何れか一方であり、試験フィルム23は、前記滑り片22の底面を覆うようにセットされる。試験フィルム23のサイズは63 mm×80 mmであり、試験フィルム24のサイズは80 mm×100 mmである。試験フィルム23,24は、積層フィルム基材10を構成した際に、第1のフィルム11と第2のフィルム12との接触面となる表面同士が接触するようにセットされる。試験フィルム23がセットされた滑り片22は、バネ25を介してロードセル26に接続される。なおバネ25のバネ定数は、0.2N/mmである。静摩擦係数測定装置20を上記のように構成した後、100mm/minでテーブル21を水平移動させて、ロードセル26で荷重を読み取る。測定値から、JIS K 7125に準拠して静摩擦係数を算出する。 The static friction coefficient measuring device 20 shown in FIG. 6 includes a horizontal table 21, a sliding piece 22, and a drive mechanism (not shown) that moves the table 21 in the horizontal direction. The sliding piece 22 has a contact area (bottom area) of 40 cm 2 (length of one side of 63 mm) and a bottom surface covered with a felt 22a, and has a total mass of 200 ± 2 g. The test films 23 and 24 are each one of the first film 11 and the second film 12, and the test film 23 is set so as to cover the bottom surface of the sliding piece 22. The size of the test film 23 is 63 mm × 80 mm, and the size of the test film 24 is 80 mm × 100 mm. The test films 23 and 24 are set so that the surfaces that are the contact surfaces of the first film 11 and the second film 12 come into contact with each other when the laminated film substrate 10 is configured. The sliding piece 22 on which the test film 23 is set is connected to a load cell 26 via a spring 25. The spring constant of the spring 25 is 0.2 N / mm. After the static friction coefficient measuring device 20 is configured as described above, the table 21 is moved horizontally at 100 mm / min, and the load is read by the load cell 26. From the measured value, the coefficient of static friction is calculated according to JIS K 7125.

第1のフィルム11と第2のフィルム12の表面は目的の静摩擦係数を得るために、ブラスト処理、コロナ処理、コート処理、プラズマ処理、電子線処理などを行ってもよい。   The surfaces of the first film 11 and the second film 12 may be subjected to blast treatment, corona treatment, coating treatment, plasma treatment, electron beam treatment, etc. in order to obtain a desired coefficient of static friction.

脆質部材加工用粘着シート1は、図1に示したように、第1のフィルム11と第2のフィルム12とからなる積層フィルム基材10と、その両外側の面に粘着剤層11a、12aが設けられた構成からなる。粘着剤層11a、12aとしては、再剥離可能であれば、特に限定はされず、従来公知の粘着剤が使用できる。たとえば通常の弱粘着剤であってもよく、また、剥離力を紫外線照射により制御できる紫外線硬化型粘着剤であってもよい。粘着剤層11a、12aの厚みは特に限定はされず、通常は1〜300μm程度であり、好ましくは5〜50μmである。   As shown in FIG. 1, the adhesive sheet 1 for processing a brittle member includes a laminated film base material 10 composed of a first film 11 and a second film 12, and adhesive layers 11 a on both outer surfaces thereof. 12a is provided. The pressure-sensitive adhesive layers 11a and 12a are not particularly limited as long as they can be removed again, and conventionally known pressure-sensitive adhesives can be used. For example, it may be a normal weak pressure-sensitive adhesive, or an ultraviolet curable pressure-sensitive adhesive whose peeling force can be controlled by ultraviolet irradiation. The thickness of the pressure-sensitive adhesive layers 11a and 12a is not particularly limited, and is usually about 1 to 300 μm, preferably 5 to 50 μm.

積層フィルム基材10の両外側の面に設けられる粘着剤層11a、12aは、どちらも同じものであってもよいが、両側が異なる材質のものでもよい。後述する工程において、第1のフィルム11は、脆質部材2に貼着された状態で硬質板3から分離される。その後の第1のフィルム11の除去を容易にするために、粘着剤層11aは、弱粘着剤または紫外線硬化型粘着剤からなることが好ましい。   The pressure-sensitive adhesive layers 11a and 12a provided on both outer surfaces of the laminated film base material 10 may be the same, but may be made of different materials on both sides. In the process to be described later, the first film 11 is separated from the hard plate 3 in a state of being attached to the brittle member 2. In order to facilitate the subsequent removal of the first film 11, the pressure-sensitive adhesive layer 11a is preferably made of a weak pressure-sensitive adhesive or an ultraviolet curable pressure-sensitive adhesive.

なお、本発明においては、脆質部材2上に、さらに保護テープなどを貼り合わせ、脆質部材2を補強してもよい。   In the present invention, the brittle member 2 may be reinforced by further bonding a protective tape or the like on the brittle member 2.

本発明の処理方法では、上述したように、硬質板3上に、脆質部材加工用粘着シート1を介して脆質部材2を固定する。この際の順序は特に限定はされず、予め脆質部材加工用粘着シート1が貼着された硬質板3に脆質部材2を貼着してもよく、この逆でもよい。脆質部材2が、表面に回路が形成された半導体ウエハの場合には、回路面側を脆質部材加工用粘着シート1に貼り合わせて、回路面の保護を行う。   In the processing method of the present invention, as described above, the brittle member 2 is fixed on the hard plate 3 via the brittle member processing adhesive sheet 1. The order in this case is not particularly limited, and the brittle member 2 may be pasted on the hard plate 3 on which the brittle member processing pressure-sensitive adhesive sheet 1 has been pasted in advance, or vice versa. When the brittle member 2 is a semiconductor wafer having a circuit formed on the surface, the circuit surface side is bonded to the brittle member processing adhesive sheet 1 to protect the circuit surface.

次いで、脆質部材2に任意の処理を行う。この処理は、脆質部材2の用途に応じて様々であり、種々の加工処理、あるいは搬送や保管等をも含む。たとえば脆質部材2が表面に回路が形成された半導体ウエハの場合には、加工処理としては、ウエハ裏面に対するエッチング処理、ポリッシング処理、スパッタ処理、蒸着処理、研削処理等である。なお、脆質部材2に施される処理が、保管、搬送である場合には、かかる処理に先立ち、脆質部材2上に、さらに保護テープなどを貼り合わせ、脆質部材2を補強してもよい。   Next, an arbitrary treatment is performed on the brittle member 2. This process varies depending on the use of the brittle member 2, and includes various processing processes, conveyance, storage, and the like. For example, in the case where the brittle member 2 is a semiconductor wafer having a circuit formed on the surface, the processing includes etching, polishing, sputtering, vapor deposition, and grinding on the wafer back surface. If the processing applied to the brittle member 2 is storage or transportation, a protective tape or the like is further bonded to the brittle member 2 to reinforce the brittle member 2 prior to such processing. Also good.

その後、前記硬質板3から脆質部材2を分離する。この際に、図3に示すように、第1のフィルム11を、脆質部材2の外縁形状と略同形状に完全に切断する。第1のフィルムの切断は、カッターやレーザー光を用いて行う。第1のフィルム11を切断することでフィルム端部における第1のフィルム11と第2のフィルム12との間の気密性が解除されるため、フィルム端部を起点として、第1のフィルム11と第2のフィルム12とを分離できるようになる。   Thereafter, the brittle member 2 is separated from the hard plate 3. At this time, as shown in FIG. 3, the first film 11 is completely cut into substantially the same shape as the outer edge shape of the brittle member 2. The cutting of the first film is performed using a cutter or laser light. Since the airtightness between the first film 11 and the second film 12 at the film end is released by cutting the first film 11, the first film 11 starts from the film end. The second film 12 can be separated.

第1のフィルム11の切断と同時に、第2のフィルム12も切断してもよいが、第2のフィルム12を切断しなくてもよい。第2のフィルム12を切断しない場合には、第2のフィルム12の端部を折り返したり、あるいは引き延ばすことで、第1のフィルムと第2のフィルムとの間の気密性を容易に解除できる。   The second film 12 may be cut simultaneously with the cutting of the first film 11, but the second film 12 may not be cut. In the case where the second film 12 is not cut, the airtightness between the first film and the second film can be easily released by folding or stretching the end of the second film 12.

また、硬質板3の径は、前述したように、脆質部材2の径と同一またはこれよりも若干大きめである。結着部13の内径は、図1に示したように、硬質板3の径よりも小さくても良く、また図4に示したように、硬質板3の径よりも大きくても良い。図4に示す構成においては、第1のフィルムと第2のフィルムとを同時に切断する。   Moreover, the diameter of the hard plate 3 is the same as or slightly larger than the diameter of the brittle member 2 as described above. The inner diameter of the binding portion 13 may be smaller than the diameter of the hard plate 3 as shown in FIG. 1, or may be larger than the diameter of the hard plate 3 as shown in FIG. In the configuration shown in FIG. 4, the first film and the second film are cut simultaneously.

上記工程により、第1のフィルム11と第2のフィルム12との間の気密性が解除される。この結果、図5に示すように、脆質部材2と第1のフィルム11との積層体を硬質板3から分離できる。   The airtightness between the 1st film 11 and the 2nd film 12 is cancelled | released by the said process. As a result, the laminate of the brittle member 2 and the first film 11 can be separated from the hard plate 3 as shown in FIG.

その後、脆質部材2から第1のフィルム11を剥離する。なお、粘着剤層11a、を紫外線硬化型粘着剤で形成した場合には、第1のフィルム11を脆質部材2から剥離する前に、粘着剤層11aに紫外線照射を行うことで、粘着力が低減するため、脆質部材2の剥離がさらに容易になる。   Thereafter, the first film 11 is peeled from the brittle member 2. When the pressure-sensitive adhesive layer 11a is formed of an ultraviolet curable pressure-sensitive adhesive, the pressure-sensitive adhesive layer 11a is irradiated with ultraviolet light before the first film 11 is peeled off from the brittle member 2 so that the adhesive strength is increased. Therefore, peeling of the brittle member 2 is further facilitated.

本発明においては、周縁部においてのみ結着された積層フィルム基材を有する脆質部材加工用粘着シートを介して脆質部材を硬質板に固定して保護している。脆質部材を硬質板に固定して保護しているため、脆質部材の搬送・保管・加工時において脆質部材を変形することなく保持できる。また、所要の処理の後には、積層フィルム基材を切断することで脆質部材を硬質板から容易に分離できるため、脆質部材の剥離が容易になり、脆質部材の破損が防止される。   In the present invention, a brittle member is fixed to a hard plate for protection through a brittle member processing adhesive sheet having a laminated film base material bonded only at the peripheral edge. Since the brittle member is fixed and protected on the hard plate, the brittle member can be held without being deformed during transportation, storage, and processing of the brittle member. Further, after the required treatment, the brittle member can be easily separated from the hard plate by cutting the laminated film substrate, so that the brittle member can be easily peeled off and the brittle member is prevented from being damaged. .

本発明の脆質部材の処理方法の一工程を示す。One process of the processing method of the brittle member of this invention is shown. 本発明の脆質部材の処理方法の一工程を示す。One process of the processing method of the brittle member of this invention is shown. 本発明の脆質部材の処理方法の一工程を示す。One process of the processing method of the brittle member of this invention is shown. 本発明の脆質部材の処理方法の一工程における変形例を示す。The modification in one process of the processing method of a brittle member of the present invention is shown. 本発明の脆質部材の処理方法の一工程を示す。One process of the processing method of the brittle member of this invention is shown. 静摩擦係数測定装置を示す。1 shows a static friction coefficient measuring device.

1・・・脆質部材加工用粘着シート
10・・・積層フィルム基材
11・・・第1のフィルム
11a・・・粘着剤層
12・・・第2のフィルム
12a・・・粘着剤層
13・・・結着部
2・・・脆質部材
3・・・硬質板
20・・・静摩擦係数測定装置
21・・・テーブル
22・・・滑り片
22a・・・フェルト
23・・・試験フィルム
24・・・試験フィルム
25・・・バネ
26・・・ロードセル
DESCRIPTION OF SYMBOLS 1 ... Adhesive sheet 10 for brittle member processing ... Laminated film base material 11 ... 1st film 11a ... Adhesive layer 12 ... 2nd film 12a ... Adhesive layer 13 ... Binding part 2 ... brittle member 3 ... hard plate 20 ... static coefficient of friction measuring device 21 ... table 22 ... sliding piece 22a ... felt 23 ... test film 24 ... Test film 25 ... Spring 26 ... Load cell

Claims (2)

第1のフィルムと第2のフィルムとを有し、これらの周縁部が結着され、結着部に囲繞された内部領域で2枚のフィルムが気密的に密着一体化してなる積層フィルム基材と、
該積層フィルム基材の両外表面に形成された粘着剤層とからなる粘着シート。
A laminated film base material comprising a first film and a second film, the peripheral edges of which are bound together, and two films being tightly and tightly integrated in an inner region surrounded by the binding part When,
A pressure-sensitive adhesive sheet comprising a pressure-sensitive adhesive layer formed on both outer surfaces of the laminated film substrate.
前記積層フィルム基材の内側表面同士の静摩擦係数が0.1以上である請求項1に記載の粘着シート。   The pressure-sensitive adhesive sheet according to claim 1, wherein the coefficient of static friction between the inner surfaces of the laminated film base material is 0.1 or more.
JP2012266663A 2012-12-05 2012-12-05 Adhesive sheet for fragile member processing and processing method of fragile member Pending JP2013058800A (en)

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JP2015005742A (en) * 2013-05-24 2015-01-08 タツモ株式会社 Peeling device
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Cited By (7)

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Publication number Priority date Publication date Assignee Title
JP5422767B1 (en) * 2013-05-09 2014-02-19 信越エンジニアリング株式会社 Bonding separation method and separation apparatus
CN104143499A (en) * 2013-05-09 2014-11-12 信越工程株式会社 Bonding separation method and separation device
KR20140133450A (en) * 2013-05-09 2014-11-19 신에츠 엔지니어링 가부시키가이샤 Separating apparatus and separating method
TWI621535B (en) * 2013-05-09 2018-04-21 Shin Etsu Engineering Co Ltd Lamination separation method and separation device
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JP2015005742A (en) * 2013-05-24 2015-01-08 タツモ株式会社 Peeling device
JP2017028218A (en) * 2015-07-28 2017-02-02 豊田合成株式会社 Semiconductor element manufacturing method

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