JP2012532342A - フォトマスクの修復方法 - Google Patents
フォトマスクの修復方法 Download PDFInfo
- Publication number
- JP2012532342A JP2012532342A JP2012517867A JP2012517867A JP2012532342A JP 2012532342 A JP2012532342 A JP 2012532342A JP 2012517867 A JP2012517867 A JP 2012517867A JP 2012517867 A JP2012517867 A JP 2012517867A JP 2012532342 A JP2012532342 A JP 2012532342A
- Authority
- JP
- Japan
- Prior art keywords
- ink
- sol
- gel composition
- molybdenum
- photomask
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/72—Repair or correction of mask defects
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/06—Coating on selected surface areas, e.g. using masks
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/1204—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material inorganic material, e.g. non-oxide and non-metallic such as sulfides, nitrides based compounds
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/125—Process of deposition of the inorganic material
- C23C18/1254—Sol or sol-gel processing
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/14—Decomposition by irradiation, e.g. photolysis, particle radiation or by mixed irradiation sources
- C23C18/143—Radiation by light, e.g. photolysis or pyrolysis
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Metallurgy (AREA)
- Mechanical Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Nanotechnology (AREA)
- Thermal Sciences (AREA)
- General Physics & Mathematics (AREA)
- Inorganic Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Dispersion Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Inks, Pencil-Leads, Or Crayons (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US22209609P | 2009-06-30 | 2009-06-30 | |
| US61/222,096 | 2009-06-30 | ||
| PCT/US2010/040470 WO2011002806A1 (en) | 2009-06-30 | 2010-06-29 | Advanced photomask repair |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2012532342A true JP2012532342A (ja) | 2012-12-13 |
| JP2012532342A5 JP2012532342A5 (enExample) | 2013-08-15 |
Family
ID=42799670
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012517867A Pending JP2012532342A (ja) | 2009-06-30 | 2010-06-29 | フォトマスクの修復方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20120164564A1 (enExample) |
| EP (1) | EP2449427A1 (enExample) |
| JP (1) | JP2012532342A (enExample) |
| KR (1) | KR20120104966A (enExample) |
| AU (1) | AU2010266375A1 (enExample) |
| CA (1) | CA2766589A1 (enExample) |
| WO (1) | WO2011002806A1 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9665000B1 (en) | 2015-11-16 | 2017-05-30 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and system for EUV mask cleaning with non-thermal solution |
| FR3061210B1 (fr) * | 2016-12-22 | 2021-12-24 | Electricite De France | Procede sol-gel de fabrication d'un revetement anticorrosion sur substrat metallique |
| TWI799494B (zh) | 2018-01-19 | 2023-04-21 | 荷蘭商Asm 智慧財產控股公司 | 沈積方法 |
| KR102083308B1 (ko) | 2018-05-23 | 2020-04-23 | 한국표준과학연구원 | 탐침형 원자 현미경을 이용한 리소그래피 방법 |
| KR102092653B1 (ko) * | 2019-06-28 | 2020-06-01 | (주)네프코 | 방오코팅 포토마스크의 패턴 유실 결함 수리 방법 |
| CN111165904B (zh) * | 2020-01-07 | 2024-11-15 | 云南中烟工业有限责任公司 | 一种低表面能镍铬加热丝、其制备方法及用途 |
| CN111812357B (zh) * | 2020-07-10 | 2021-05-25 | 浙江大学 | 一种用于微纳米制造的自填料三臂式热扫描探针 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07165413A (ja) * | 1993-09-13 | 1995-06-27 | Dow Corning Corp | Si−O含有皮膜の形成方法 |
| JPH1079381A (ja) * | 1996-09-03 | 1998-03-24 | Toshiba Corp | 絶縁膜パターンの形成方法および感光性組成物 |
| JPH10258252A (ja) * | 1997-01-18 | 1998-09-29 | Tokyo Ohka Kogyo Co Ltd | Bi系強誘電体薄膜形成用塗布液およびこれを用いて形成した強誘電体薄膜、強誘電体メモリ |
| JP2000010293A (ja) * | 1998-06-17 | 2000-01-14 | Jsr Corp | 反射防止膜形成用組成物および反射防止膜 |
| JP2005513768A (ja) * | 2001-12-17 | 2005-05-12 | ノースウエスタン ユニバーシティ | 直接書込みナノリソグラフィック印刷による固体フィーチャのパターニング |
| JP2006504136A (ja) * | 2002-10-21 | 2006-02-02 | ナノインク インコーポレーティッド | ナノメートル・スケール設計構造、その製造方法および装置、マスク修復、強化、および製造への適用 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59213660A (ja) * | 1983-05-13 | 1984-12-03 | 鐘淵化学工業株式会社 | 多孔性セラミツクス薄膜およびその製造法 |
| JPH11512474A (ja) | 1995-09-12 | 1999-10-26 | ゲレスト インコーポレーテツド | ベータ−置換オルガノシルセスキオキサンおよびその使用法 |
| US6635311B1 (en) | 1999-01-07 | 2003-10-21 | Northwestern University | Methods utilizing scanning probe microscope tips and products therefor or products thereby |
| US7011910B2 (en) | 2002-04-26 | 2006-03-14 | Hoya Corporation | Halftone-type phase-shift mask blank, and halftone-type phase-shift mask |
| US7491422B2 (en) | 2002-10-21 | 2009-02-17 | Nanoink, Inc. | Direct-write nanolithography method of transporting ink with an elastomeric polymer coated nanoscopic tip to form a structure having internal hollows on a substrate |
-
2010
- 2010-06-29 WO PCT/US2010/040470 patent/WO2011002806A1/en not_active Ceased
- 2010-06-29 EP EP10732565A patent/EP2449427A1/en not_active Withdrawn
- 2010-06-29 KR KR1020127001510A patent/KR20120104966A/ko not_active Withdrawn
- 2010-06-29 AU AU2010266375A patent/AU2010266375A1/en not_active Abandoned
- 2010-06-29 CA CA2766589A patent/CA2766589A1/en not_active Abandoned
- 2010-06-29 JP JP2012517867A patent/JP2012532342A/ja active Pending
- 2010-06-29 US US13/381,590 patent/US20120164564A1/en not_active Abandoned
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07165413A (ja) * | 1993-09-13 | 1995-06-27 | Dow Corning Corp | Si−O含有皮膜の形成方法 |
| JPH1079381A (ja) * | 1996-09-03 | 1998-03-24 | Toshiba Corp | 絶縁膜パターンの形成方法および感光性組成物 |
| JPH10258252A (ja) * | 1997-01-18 | 1998-09-29 | Tokyo Ohka Kogyo Co Ltd | Bi系強誘電体薄膜形成用塗布液およびこれを用いて形成した強誘電体薄膜、強誘電体メモリ |
| JP2000010293A (ja) * | 1998-06-17 | 2000-01-14 | Jsr Corp | 反射防止膜形成用組成物および反射防止膜 |
| JP2005513768A (ja) * | 2001-12-17 | 2005-05-12 | ノースウエスタン ユニバーシティ | 直接書込みナノリソグラフィック印刷による固体フィーチャのパターニング |
| JP2006504136A (ja) * | 2002-10-21 | 2006-02-02 | ナノインク インコーポレーティッド | ナノメートル・スケール設計構造、その製造方法および装置、マスク修復、強化、および製造への適用 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2449427A1 (en) | 2012-05-09 |
| CA2766589A1 (en) | 2011-01-06 |
| US20120164564A1 (en) | 2012-06-28 |
| AU2010266375A1 (en) | 2012-02-09 |
| WO2011002806A1 (en) | 2011-01-06 |
| KR20120104966A (ko) | 2012-09-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5584745B2 (ja) | 基板ホルダ、リソグラフィ装置、デバイス製造方法、及び基板ホルダ製造方法 | |
| JP2012532342A (ja) | フォトマスクの修復方法 | |
| US7691541B2 (en) | Methods for additive repair of phase shift masks by selectively depositing nanometer-scale engineered structures on defective phase shifters | |
| JP5136647B2 (ja) | Euvリソグラフィ用反射型マスクブランクおよびその製造方法 | |
| CN102203906B (zh) | Euv光刻用反射型掩模坯料 | |
| EP2010963A1 (en) | Reflective mask blank for euv lithography | |
| TW200848952A (en) | Multilayer-film reflective mirror, exposure device, device manufacturing method, and manufacturing method for a multilayer-film reflective mirror | |
| WO2013031863A1 (ja) | 反射型マスクブランク、反射型マスクブランクの製造方法、及び反射型マスクブランクの品質管理方法 | |
| JP7208163B2 (ja) | 導電膜付き基板、多層反射膜付き基板、反射型マスクブランク、反射型マスク及び半導体装置の製造方法 | |
| Dauksher et al. | Characterization of and imprint results using indium tin oxide-based step and flash imprint lithography templates | |
| KR20190012564A (ko) | 포토마스크용 펠리클 조성물, 이로부터 형성된 포토마스크용 펠리클, 그 제조방법, 펠리클을 함유한 레티클 및 레티클을 포함하는 리소그래피용 노광장치 | |
| US9927693B2 (en) | Reflective mask blank and process for producing the reflective mask blank | |
| Tao et al. | Durable diamond-like carbon templates for UV nanoimprint lithography | |
| US8216746B2 (en) | Method of correcting defect in EUV mask | |
| JP5381226B2 (ja) | 露光量制御方法及び露光装置 | |
| JP6864952B2 (ja) | 導電膜付き基板、多層反射膜付き基板、反射型マスクブランク、反射型マスク及び半導体装置の製造方法 | |
| Houle et al. | Adhesion between template materials and UV-cured nanoimprint resists | |
| JP2005321623A (ja) | 光学素子、光学素子の製造方法、及び極端紫外線露光装置 | |
| Salmassi et al. | Spin-on-glass smoothing of diamond turned optics for use in the extreme ultraviolet regime | |
| Sugiyama et al. | Development of EUVL mask blank in AGC | |
| Luca et al. | Advanced Optical Coating | |
| Soufli et al. | Substrate smoothing for high-temperature condenser operation in EUVL source environments |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20130625 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20130625 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20140219 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20140224 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20140716 |