JP2005513768A - 直接書込みナノリソグラフィック印刷による固体フィーチャのパターニング - Google Patents
直接書込みナノリソグラフィック印刷による固体フィーチャのパターニング Download PDFInfo
- Publication number
- JP2005513768A JP2005513768A JP2003553339A JP2003553339A JP2005513768A JP 2005513768 A JP2005513768 A JP 2005513768A JP 2003553339 A JP2003553339 A JP 2003553339A JP 2003553339 A JP2003553339 A JP 2003553339A JP 2005513768 A JP2005513768 A JP 2005513768A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- metal oxide
- sol
- nanostructure
- precursor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000007639 printing Methods 0.000 title claims description 36
- 238000000059 patterning Methods 0.000 title claims description 16
- 239000007787 solid Substances 0.000 title claims description 15
- 239000000758 substrate Substances 0.000 claims abstract description 81
- 239000002086 nanomaterial Substances 0.000 claims abstract description 30
- 239000002243 precursor Substances 0.000 claims abstract description 22
- 238000004519 manufacturing process Methods 0.000 claims abstract description 9
- 238000000034 method Methods 0.000 claims description 58
- 239000000203 mixture Substances 0.000 claims description 34
- 229910044991 metal oxide Inorganic materials 0.000 claims description 23
- 150000004706 metal oxides Chemical class 0.000 claims description 23
- 239000012702 metal oxide precursor Substances 0.000 claims description 22
- 239000004094 surface-active agent Substances 0.000 claims description 17
- 239000000523 sample Substances 0.000 claims description 15
- 239000011343 solid material Substances 0.000 claims description 14
- 238000000151 deposition Methods 0.000 claims description 12
- 238000010438 heat treatment Methods 0.000 claims description 12
- 239000000463 material Substances 0.000 claims description 11
- 238000005329 nanolithography Methods 0.000 claims description 11
- 238000006243 chemical reaction Methods 0.000 claims description 7
- 229920000642 polymer Polymers 0.000 claims description 4
- 239000012703 sol-gel precursor Substances 0.000 claims description 4
- 229920000620 organic polymer Polymers 0.000 claims description 3
- 229910003471 inorganic composite material Inorganic materials 0.000 claims 2
- 239000002131 composite material Substances 0.000 abstract description 9
- 238000003491 array Methods 0.000 abstract description 8
- 229920001400 block copolymer Polymers 0.000 abstract description 4
- 238000000979 dip-pen nanolithography Methods 0.000 abstract description 3
- 230000008569 process Effects 0.000 description 15
- 229920002415 Pluronic P-123 Polymers 0.000 description 9
- 239000010410 layer Substances 0.000 description 9
- 229910052751 metal Inorganic materials 0.000 description 9
- 239000002184 metal Substances 0.000 description 9
- 229910004298 SiO 2 Inorganic materials 0.000 description 8
- 238000000576 coating method Methods 0.000 description 8
- 230000008021 deposition Effects 0.000 description 8
- 238000006460 hydrolysis reaction Methods 0.000 description 8
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 7
- 238000002474 experimental method Methods 0.000 description 7
- 229910052710 silicon Inorganic materials 0.000 description 7
- 238000003980 solgel method Methods 0.000 description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- 229920001577 copolymer Polymers 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 6
- 239000010703 silicon Substances 0.000 description 6
- 229910052814 silicon oxide Inorganic materials 0.000 description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 6
- 239000000919 ceramic Substances 0.000 description 5
- 125000000524 functional group Chemical group 0.000 description 5
- 239000011521 glass Substances 0.000 description 5
- 230000007062 hydrolysis Effects 0.000 description 5
- 239000012071 phase Substances 0.000 description 5
- 238000012546 transfer Methods 0.000 description 5
- 229910006404 SnO 2 Inorganic materials 0.000 description 4
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 239000003054 catalyst Substances 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 4
- 230000005499 meniscus Effects 0.000 description 4
- 239000011148 porous material Substances 0.000 description 4
- 229920000469 amphiphilic block copolymer Polymers 0.000 description 3
- 238000000089 atomic force micrograph Methods 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 239000010408 film Substances 0.000 description 3
- 230000002209 hydrophobic effect Effects 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 230000037452 priming Effects 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 3
- 229910001887 tin oxide Inorganic materials 0.000 description 3
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 2
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 2
- 239000006117 anti-reflective coating Substances 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 239000008199 coating composition Substances 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 238000009833 condensation Methods 0.000 description 2
- 230000005494 condensation Effects 0.000 description 2
- 238000006482 condensation reaction Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000007598 dipping method Methods 0.000 description 2
- 238000005755 formation reaction Methods 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 229910010272 inorganic material Inorganic materials 0.000 description 2
- 239000011147 inorganic material Substances 0.000 description 2
- 239000007791 liquid phase Substances 0.000 description 2
- 229920002521 macromolecule Polymers 0.000 description 2
- 238000002493 microarray Methods 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- -1 monoliths Substances 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 229920000233 poly(alkylene oxides) Polymers 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- 238000003786 synthesis reaction Methods 0.000 description 2
- 229910052718 tin Inorganic materials 0.000 description 2
- 239000011135 tin Substances 0.000 description 2
- 239000004408 titanium dioxide Substances 0.000 description 2
- ULIKDJVNUXNQHS-UHFFFAOYSA-N 2-Propene-1-thiol Chemical compound SCC=C ULIKDJVNUXNQHS-UHFFFAOYSA-N 0.000 description 1
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 description 1
- 229920000742 Cotton Polymers 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 1
- 229920003171 Poly (ethylene oxide) Polymers 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 229910003902 SiCl 4 Inorganic materials 0.000 description 1
- 229910000577 Silicon-germanium Inorganic materials 0.000 description 1
- 238000003917 TEM image Methods 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 238000001015 X-ray lithography Methods 0.000 description 1
- GEIAQOFPUVMAGM-UHFFFAOYSA-N ZrO Inorganic materials [Zr]=O GEIAQOFPUVMAGM-UHFFFAOYSA-N 0.000 description 1
- JLCPHMBAVCMARE-UHFFFAOYSA-N [3-[[3-[[3-[[3-[[3-[[3-[[3-[[3-[[3-[[3-[[3-[[5-(2-amino-6-oxo-1H-purin-9-yl)-3-[[3-[[3-[[3-[[3-[[3-[[5-(2-amino-6-oxo-1H-purin-9-yl)-3-[[5-(2-amino-6-oxo-1H-purin-9-yl)-3-hydroxyoxolan-2-yl]methoxy-hydroxyphosphoryl]oxyoxolan-2-yl]methoxy-hydroxyphosphoryl]oxy-5-(5-methyl-2,4-dioxopyrimidin-1-yl)oxolan-2-yl]methoxy-hydroxyphosphoryl]oxy-5-(6-aminopurin-9-yl)oxolan-2-yl]methoxy-hydroxyphosphoryl]oxy-5-(6-aminopurin-9-yl)oxolan-2-yl]methoxy-hydroxyphosphoryl]oxy-5-(6-aminopurin-9-yl)oxolan-2-yl]methoxy-hydroxyphosphoryl]oxy-5-(6-aminopurin-9-yl)oxolan-2-yl]methoxy-hydroxyphosphoryl]oxyoxolan-2-yl]methoxy-hydroxyphosphoryl]oxy-5-(5-methyl-2,4-dioxopyrimidin-1-yl)oxolan-2-yl]methoxy-hydroxyphosphoryl]oxy-5-(4-amino-2-oxopyrimidin-1-yl)oxolan-2-yl]methoxy-hydroxyphosphoryl]oxy-5-(5-methyl-2,4-dioxopyrimidin-1-yl)oxolan-2-yl]methoxy-hydroxyphosphoryl]oxy-5-(5-methyl-2,4-dioxopyrimidin-1-yl)oxolan-2-yl]methoxy-hydroxyphosphoryl]oxy-5-(6-aminopurin-9-yl)oxolan-2-yl]methoxy-hydroxyphosphoryl]oxy-5-(6-aminopurin-9-yl)oxolan-2-yl]methoxy-hydroxyphosphoryl]oxy-5-(4-amino-2-oxopyrimidin-1-yl)oxolan-2-yl]methoxy-hydroxyphosphoryl]oxy-5-(4-amino-2-oxopyrimidin-1-yl)oxolan-2-yl]methoxy-hydroxyphosphoryl]oxy-5-(4-amino-2-oxopyrimidin-1-yl)oxolan-2-yl]methoxy-hydroxyphosphoryl]oxy-5-(6-aminopurin-9-yl)oxolan-2-yl]methoxy-hydroxyphosphoryl]oxy-5-(4-amino-2-oxopyrimidin-1-yl)oxolan-2-yl]methyl [5-(6-aminopurin-9-yl)-2-(hydroxymethyl)oxolan-3-yl] hydrogen phosphate Chemical class Cc1cn(C2CC(OP(O)(=O)OCC3OC(CC3OP(O)(=O)OCC3OC(CC3O)n3cnc4c3nc(N)[nH]c4=O)n3cnc4c3nc(N)[nH]c4=O)C(COP(O)(=O)OC3CC(OC3COP(O)(=O)OC3CC(OC3COP(O)(=O)OC3CC(OC3COP(O)(=O)OC3CC(OC3COP(O)(=O)OC3CC(OC3COP(O)(=O)OC3CC(OC3COP(O)(=O)OC3CC(OC3COP(O)(=O)OC3CC(OC3COP(O)(=O)OC3CC(OC3COP(O)(=O)OC3CC(OC3COP(O)(=O)OC3CC(OC3COP(O)(=O)OC3CC(OC3COP(O)(=O)OC3CC(OC3COP(O)(=O)OC3CC(OC3COP(O)(=O)OC3CC(OC3COP(O)(=O)OC3CC(OC3COP(O)(=O)OC3CC(OC3CO)n3cnc4c(N)ncnc34)n3ccc(N)nc3=O)n3cnc4c(N)ncnc34)n3ccc(N)nc3=O)n3ccc(N)nc3=O)n3ccc(N)nc3=O)n3cnc4c(N)ncnc34)n3cnc4c(N)ncnc34)n3cc(C)c(=O)[nH]c3=O)n3cc(C)c(=O)[nH]c3=O)n3ccc(N)nc3=O)n3cc(C)c(=O)[nH]c3=O)n3cnc4c3nc(N)[nH]c4=O)n3cnc4c(N)ncnc34)n3cnc4c(N)ncnc34)n3cnc4c(N)ncnc34)n3cnc4c(N)ncnc34)O2)c(=O)[nH]c1=O JLCPHMBAVCMARE-UHFFFAOYSA-N 0.000 description 1
- 239000002250 absorbent Substances 0.000 description 1
- 230000002745 absorbent Effects 0.000 description 1
- 239000012190 activator Substances 0.000 description 1
- 239000003905 agrochemical Substances 0.000 description 1
- 150000001356 alkyl thiols Chemical class 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 239000003945 anionic surfactant Substances 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000003851 biochemical process Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000003093 cationic surfactant Substances 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 239000012707 chemical precursor Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000013256 coordination polymer Substances 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000012377 drug delivery Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 238000000609 electron-beam lithography Methods 0.000 description 1
- 238000002149 energy-dispersive X-ray emission spectroscopy Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000000802 evaporation-induced self-assembly Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 238000001879 gelation Methods 0.000 description 1
- 229910052735 hafnium Inorganic materials 0.000 description 1
- 239000004009 herbicide Substances 0.000 description 1
- IXCSERBJSXMMFS-UHFFFAOYSA-N hydrogen chloride Substances Cl.Cl IXCSERBJSXMMFS-UHFFFAOYSA-N 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 239000000411 inducer Substances 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 229910001504 inorganic chloride Inorganic materials 0.000 description 1
- 229910052809 inorganic oxide Inorganic materials 0.000 description 1
- 229910017053 inorganic salt Inorganic materials 0.000 description 1
- 229910003480 inorganic solid Inorganic materials 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 239000002563 ionic surfactant Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 239000013335 mesoporous material Substances 0.000 description 1
- 229910001510 metal chloride Inorganic materials 0.000 description 1
- 229910001507 metal halide Inorganic materials 0.000 description 1
- 150000005309 metal halides Chemical class 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000000693 micelle Substances 0.000 description 1
- 238000001053 micromoulding Methods 0.000 description 1
- 238000000908 micropen lithography Methods 0.000 description 1
- 239000012229 microporous material Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 239000002114 nanocomposite Substances 0.000 description 1
- 239000002071 nanotube Substances 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 239000000615 nonconductor Substances 0.000 description 1
- 239000002736 nonionic surfactant Substances 0.000 description 1
- 125000000962 organic group Chemical class 0.000 description 1
- 239000012044 organic layer Substances 0.000 description 1
- 230000008520 organization Effects 0.000 description 1
- 125000002524 organometallic group Chemical group 0.000 description 1
- 150000001282 organosilanes Chemical class 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 102000004169 proteins and genes Human genes 0.000 description 1
- 108090000623 proteins and genes Proteins 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 238000001338 self-assembly Methods 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 230000002269 spontaneous effect Effects 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- QHGNHLZPVBIIPX-UHFFFAOYSA-N tin(ii) oxide Chemical group [Sn]=O QHGNHLZPVBIIPX-UHFFFAOYSA-N 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82B—NANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
- B82B3/00—Manufacture or treatment of nanostructures by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/855—Manufacture, treatment, or detection of nanostructure with scanning probe for manufacture of nanostructure
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/855—Manufacture, treatment, or detection of nanostructure with scanning probe for manufacture of nanostructure
- Y10S977/857—Manufacture, treatment, or detection of nanostructure with scanning probe for manufacture of nanostructure including coating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24802—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24802—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]
- Y10T428/24926—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.] including ceramic, glass, porcelain or quartz layer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/26—Web or sheet containing structurally defined element or component, the element or component having a specified physical dimension
- Y10T428/263—Coating layer not in excess of 5 mils thick or equivalent
- Y10T428/264—Up to 3 mils
- Y10T428/265—1 mil or less
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Composite Materials (AREA)
- Theoretical Computer Science (AREA)
- Mathematical Physics (AREA)
- Materials Engineering (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Inks, Pencil-Leads, Or Crayons (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Formation Of Insulating Films (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
- Oxygen, Ozone, And Oxides In General (AREA)
- Laminated Bodies (AREA)
- Manufacture Or Reproduction Of Printing Formes (AREA)
Abstract
本発明は、ディップペン・ナノリソグラフィを用いて、ブロックコポリマーおよび無機前駆体を有する溶液を基板上に付着させる段階を含む、基板上に有機/無機複合ナノ構造を製造する方法を含む。ナノ構造は、1ミクロン未満の幅/直径を有するラインおよび/またはドットのアレイを含む。本発明は、高さ以外のナノスケール直径を有する無機/有機複合ナノスケール領域を含む装置を含む。
Description
この出願は、完全な開示が参照として全体的に本明細書に組み入れられる、2001年12月17日に出願された仮出願第60/341,614号の恩典を主張する。
DIP-PEN NANOLITHOGRAPHY(商標)印刷(DPM(商標)印刷)は、たとえば、走査型プローブ電子顕微鏡(SPM)チップや原子間力電子顕微鏡(AFM)チップを含む従来のナノスコピックチップを用いてインクが基板に移される高解像度直接パターニング技術である。たとえば、1999年1月7日に出願された米国特許出願第60/115,133号、1999年10月4日に出願された米国特許出願第60/157,633号、2000年1月5日に出願された米国特許出願第09/477,997号、2000年5月26日に出願された米国特許出願第60/207,711号、2000年5月26日に出願された米国特許出願第60/207,713号、2001年5月24日に出願された米国特許出願第09/866,533号、2001年10月2日に出願された米国特許出願第60/326,767号、2000年1月7日に出願されたPCT出願第PCT/US00/00319号(国際公開公報第00/41213号)、2001年5月25日に出願されたPCT出願第PCT/US01/17067号を参照されたい。これらの出願の完全な開示は参照として本明細書に組み入れられる。
この節では、本発明について概略的に説明する。ただし、この概要は、以下に詳しく記載されかつ請求される本発明を制限すべきではない。
DPN印刷を含むナノリソグラフィを用いて本発明を実施することができる。たとえば、2001年5月24日に出願された特許出願第09/866,533号(2002年5月30日に公開されたMirkinらの米国特許公開第US2002/0063212 A1号)には、たとえば以下を含む様々な態様をカバーするDPN印刷の背景および手順が詳しく記載されている。
−背景(1〜3ページ)
−概要(3〜4ページ)
−図面の簡単な説明(4〜10ページ)
−走査型プローブ顕微鏡チップの使用(10〜12ページ)
−基板(12〜13ページ)
−パターニング化合物(13〜17ページ)
−たとえば、チップのコーティングを含む実施方法(18〜20ページ)
−ナノプロッタを含む計装(20〜24ページ)
−複数の層ならびに関連する印刷方法およびリソグラフィ方法の使用(24〜26ページ)
−解像度(ページ26〜27)
−アレイおよび組合せアレイ(27〜30ページ)
−ソフトウェアおよび較正(30〜35ページ、68〜70ページ)
−疎水性化合物で被覆されたチップを含むキットおよびその他の製品(35〜37ページ)
−実施例(38〜67ページ)
−対応する特許請求の範囲および要約(71〜82ページ)ならびに
−図1〜28
M-O-R+H2O→M-OH+R-OH(加水分解)
M-OH+HO-M→M-O-M+H2O(水凝縮)
M-O-R+HO-M→M-O-M+R-OH(アルコール凝縮)
実験
ThermoMicroscopes CP AFMおよび従来の窒化ケイ素マイクロカンチレバー(力の定数0.05N/m)をすべてのパターニング実験に用いた。各実験で、チップを、作製したままのゾルに室温で20秒間浸漬させることによって被覆した。すべてのパターニング実験は、チップ−表面接触力を0.5nNにして湿度(〜40%)および温度(〜20℃)を厳しく調節せずに周囲条件の下で行った。ピエゾチューブのドリフトを最低限に抑えるために、閉ループ走査制御を含む90μmスキャナをすべてのパターニング実験に用いた、その後、インクで被覆されたチップを、パターニングに用いられるのと同じ条件で、かつより速い走査速度(6Hz)で、生成されたパターンを撮像した。
酸化すずおよび酸化アルミニウムで構成されたドット、ライン、および複雑なパターンを、図2に示されているように、シリコンおよび酸化ケイ素(>600nm酸化層)基板上に生成した。たとえば、複合インク(SnCl4およびP-123)で被覆されたチップを基板を横切って移動させる(0.2μm/秒)ことによって、酸化すずで作られた155nm幅の互いに平行なラインをSiO2上に形成した。同様に、(AlCl3およびP-123)で被覆されたチップを用いて、チップを1s/ドット間隔で連続的に基板に接触させることによって、Al2O3から成るドットをSi基板上に生成した。これらの構造は、撮像を繰り返した(5回)後でもその形状を維持し、周囲条件の下で無期限に安定する(>1ヶ月)。
Siゾル(SiCl4およびP-123で構成されている)を酸化ケイ素基板上に互いに平行なラインの形にパターニングした。各ラインの組成は、SiOxとポリマーの混合物になると予想される。空気中で400℃で2時間にわたって加熱すると、
コポリマー界面活性剤が燃焼してSiO2ナノ構造が残ると予想される。この仮説どおり、同じ領域の後熱によって収集されたAFM画像は、パターン高さが8nmから5nmまで低くなることを示した(図2cおよび2d)。
形成できる酸化物構造の種類は、ゾル前駆体が一般に得られるときには特に制限される問題ではなかった。実際、SiO2上にSnCl4およびP-123で酸化すず構造を作製し、インクで被覆されたチップを30秒間保持することによって形成された4μm SnO2をエネルギー拡散X線(EDX)分析したところ、すず、シリコン、および酸素の予想されるピークが示され、マイクロ構造の化学的組成が確認された(図3a〜3c)。本明細書で使用されるコポリマーは、メソ顕微鏡オーダーの固体用の構造誘導剤として知られている。作製されたままのバルク生成物(対照として用いられる)を400℃で2時間加熱した後の透過電子顕微鏡(TEM)画像は、SiO2の孔径が約10nmであることを示している(図3d)。これらの構造は、下にある基板に化学吸着されると考えられる。実際、他の画像は、ゾルを酸化物基板上で加水分解すると、シリコン−酸素−金属結合を通じて基板に吸着される薄膜を形成することを示している(参考文献8を参照されたい)。
Claims (36)
- 以下の段階を含む、ナノリソグラフィ方法:
基板を備える段階;
少なくとも1つの金属酸化物前駆体を含むインク組成を有するナノスコピックチップをその上に備える段階;および
インク組成をナノスコピックチップから基板に移して、少なくとも1つの金属酸化物前駆体を含む基板上で付着物を形成する段階。 - 基板上の金属酸化物前駆体を変換して、金属酸化物を形成する段階をさらに含む、請求項1記載の方法。
- 変換段階が、金属酸化物前駆体を加熱する段階を含む、請求項2記載の方法。
- ナノスコピックチップが、走査型プローブ顕微鏡チップである、請求項1記載の方法。
- ナノスコピックチップが、原子間力顕微鏡チップである、請求項1記載の方法。
- ナノスコピックチップが、中空チップである、請求項1記載の方法。
- インク組成が、ゾルである、請求項1記載の方法。
- インク組成が、ゾル−ゲル前駆体である、請求項1記載の方法。
- 金属酸化物前駆体が、加水分解性の金属酸化物前駆体である、請求項1記載の方法。
- インク組成が、少なくとも1つの界面活性剤をさらに含む、請求項1記載の方法。
- インク組成が、少なくとも1つの両親媒性ポリマーをさらに含む、請求項1記載の方法。
- インク組成が、メゾスコピックオーダーの固体を形成するためのSDAである少なくとも1つの界面活性剤を含む、請求項1記載の方法。
- 付着物が、約1,000nm以下の少なくとも1つの横寸法を有する、請求項1記載の方法。
- 付着物が、約200nm以下の少なくとも1つの横寸法を有する、請求項1記載の方法。
- 以下の段階を含む、ナノリソグラフィ方法:
反応性インクがゾル−ゲル反応を受けることができるゾル−ゲル前駆体であって、反応性インク組成がナノスコピックチップから基板に移されて基板上で付着物を形成するように、反応性インク組成を有する走査型プローブ顕微鏡チップを基板に対して位置付ける段階。 - 基板上に固体材料前駆体を含むナノスコピック付着物をパターニングする段階、および、固体材料前駆体を固体材料に変換する段階を含むナノリソグラフィ方法。
- 直接書込みナノリソグラフィによって基板上にインクを付着させて付着物を形成する段階を含み、インクが、無機前駆体および少なくとも1つの有機ポリマーを含む、無機/有機ナノ構造を製造する方法。
- 請求項1による方法によって用意される少なくとも1つの付着物を基板表面上に含むナノスコピックにパターニングされた基板。
- 以下を含む、装置:
基板;および
直接書込みナノリソグラフィ印刷によって用意され、約1,000nm以下の少なくとも1つの横寸法を有し、かつ金属酸化物前駆体または金属酸化物を含む、基板上の少なくとも1つのナノ構造。 - ナノ構造が、金属酸化物前駆体を含む、請求項19記載の装置。
- ナノ構造が、金属酸化物を含む、請求項19記載の装置。
- ナノ構造が、有機/無機複合物質を含む、請求項19記載の装置。
- ナノ構造が、少なくとも1つのポリマーを含む、請求項19記載の装置。
- ナノ構造が、ゾル−ゲル構造を含む、請求項19記載の装置。
- ナノ構造が、固体材料を含む、請求項19記載の装置。
- ナノ構造が、メソポーラス金属酸化物を含む、請求項19記載の装置。
- ナノ構造が、メソポーラスである、請求項19記載の装置。
- ナノ構造が、ドットである、請求項19記載の装置。
- ナノ構造が、線である、請求項19記載の装置。
- 横寸法が、約500nm以下である、請求項19記載の装置。
- 横寸法が、約200nm以下である、請求項19記載の装置。
- ナノ構造の高さが、約50nm以下である、請求項19記載の装置。
- 以下を含む、装置:
基板;および
直接書込みナノリソグラフィによって用意され、約1,000nm以下の少なくとも1つの横寸法を有し、かつゾル−ゲル材料を含む、基板上の少なくとも1つのナノスケールフィーチャ。 - ナノフィーチャが、ゾル−ゲル金属酸化物前駆体を含む、請求項33記載の装置。
- ナノフィーチャが、ゾル−ゲル金属酸化物を含む、請求項33記載の装置。
- ナノフィーチャが、ゾル−ゲル有機/無機複合物質を含む、請求項33記載の装置。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US34161401P | 2001-12-17 | 2001-12-17 | |
PCT/US2002/040118 WO2003052514A2 (en) | 2001-12-17 | 2002-12-17 | Patterning of solid state features by direct write nanolithographic printing |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009282559A Division JP4999913B2 (ja) | 2001-12-17 | 2009-12-14 | 直接書込みナノリソグラフィック印刷による固体フィーチャのパターニング |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2005513768A true JP2005513768A (ja) | 2005-05-12 |
Family
ID=23338292
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003553339A Withdrawn JP2005513768A (ja) | 2001-12-17 | 2002-12-17 | 直接書込みナノリソグラフィック印刷による固体フィーチャのパターニング |
JP2009282559A Expired - Fee Related JP4999913B2 (ja) | 2001-12-17 | 2009-12-14 | 直接書込みナノリソグラフィック印刷による固体フィーチャのパターニング |
JP2011242635A Withdrawn JP2012060146A (ja) | 2001-12-17 | 2011-11-04 | 直接書込みナノリソグラフィック印刷による固体フィーチャのパターニング |
Family Applications After (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009282559A Expired - Fee Related JP4999913B2 (ja) | 2001-12-17 | 2009-12-14 | 直接書込みナノリソグラフィック印刷による固体フィーチャのパターニング |
JP2011242635A Withdrawn JP2012060146A (ja) | 2001-12-17 | 2011-11-04 | 直接書込みナノリソグラフィック印刷による固体フィーチャのパターニング |
Country Status (11)
Country | Link |
---|---|
US (3) | US7273636B2 (ja) |
EP (1) | EP1502154B1 (ja) |
JP (3) | JP2005513768A (ja) |
KR (1) | KR100936599B1 (ja) |
CN (1) | CN100345059C (ja) |
AT (1) | ATE423336T1 (ja) |
AU (1) | AU2002364001B2 (ja) |
CA (1) | CA2470823C (ja) |
DE (1) | DE60231252D1 (ja) |
TW (1) | TWI287170B (ja) |
WO (1) | WO2003052514A2 (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007516071A (ja) * | 2003-11-12 | 2007-06-21 | ユニバシテ デ シオンス エ テクノロジ ド リール | カリグラフィー用ペン形式の平面エレクトロスプレー・ソース及びその製造 |
JP2010531977A (ja) * | 2007-06-20 | 2010-09-30 | ノースウエスタン ユニバーシティ | 脂質を含む組成物を用いたパターニング |
JP2012532342A (ja) * | 2009-06-30 | 2012-12-13 | ナノインク インコーポレーティッド | フォトマスクの修復方法 |
JP2021534325A (ja) * | 2018-08-16 | 2021-12-09 | ノースウェスタン ユニバーシティ | 多元素ヘテロ構造ナノ粒子およびその製造方法 |
Families Citing this family (63)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100345059C (zh) * | 2001-12-17 | 2007-10-24 | 西北大学 | 采用直写纳米刻蚀印刷的固态部件的图案化 |
US7998528B2 (en) * | 2002-02-14 | 2011-08-16 | Massachusetts Institute Of Technology | Method for direct fabrication of nanostructures |
WO2004033480A2 (en) * | 2002-05-21 | 2004-04-22 | Northwestern University | Peptide and protein arrays and direct-write lithographic printing of peptides and proteins |
US7199305B2 (en) * | 2002-08-08 | 2007-04-03 | Nanoink, Inc. | Protosubstrates |
US7098056B2 (en) * | 2002-08-09 | 2006-08-29 | Nanoink, Inc. | Apparatus, materials, and methods for fabrication and catalysis |
US7005378B2 (en) * | 2002-08-26 | 2006-02-28 | Nanoink, Inc. | Processes for fabricating conductive patterns using nanolithography as a patterning tool |
US8071168B2 (en) * | 2002-08-26 | 2011-12-06 | Nanoink, Inc. | Micrometric direct-write methods for patterning conductive material and applications to flat panel display repair |
US7223438B2 (en) * | 2002-09-17 | 2007-05-29 | Northwestern University | Patterning magnetic nanostructures |
US20040226620A1 (en) | 2002-09-26 | 2004-11-18 | Daniel Therriault | Microcapillary networks |
KR101101698B1 (ko) * | 2002-10-21 | 2011-12-30 | 나노잉크, 인크. | 나노미터-수준으로 제어된 구조, 이의 제작을 위한 방법 및장치, 및 마스크 복구, 강화, 및 제작에의 적용 |
US7141617B2 (en) * | 2003-06-17 | 2006-11-28 | The Board Of Trustees Of The University Of Illinois | Directed assembly of three-dimensional structures with micron-scale features |
CN1654230B (zh) * | 2004-02-10 | 2010-05-12 | 中国科学院上海应用物理研究所 | 以动态组合模式“蘸笔”纳米刻蚀技术制造纳米图形的方法 |
TWI288294B (en) * | 2004-03-19 | 2007-10-11 | Hon Hai Prec Ind Co Ltd | A manufacturing method of a cavity of a light guide plate |
CN100389344C (zh) * | 2004-03-27 | 2008-05-21 | 鸿富锦精密工业(深圳)有限公司 | 导光板模仁制造方法 |
US8235302B2 (en) * | 2004-04-20 | 2012-08-07 | Nanolnk, Inc. | Identification features |
WO2005115630A2 (en) * | 2004-04-30 | 2005-12-08 | Bioforce Nanosciences, Inc. | Method and apparatus for depositing material onto a surface |
US20060242740A1 (en) * | 2004-08-11 | 2006-10-26 | California Institute Of Technology | Method and device for surfactant activated Dip-Pen Nanolithography |
US8261662B1 (en) | 2004-11-08 | 2012-09-11 | Nanolnk, Inc. | Active pen nanolithography |
US20100294147A1 (en) * | 2004-12-20 | 2010-11-25 | Nanoink, Inc. | Apparatus and methods for preparing identification features including pharmaceutical applications |
US20100297027A1 (en) * | 2004-12-20 | 2010-11-25 | Nanolnk, Inc. | Overt authentication features for compositions and objects and methods of fabrication and verification thereof |
US7875426B2 (en) * | 2005-02-04 | 2011-01-25 | University Of South Florida | DNA biochip and methods of use |
US20060183342A1 (en) * | 2005-02-15 | 2006-08-17 | Eastman Kodak Company | Metal and metal oxide patterned device |
US20100294927A1 (en) * | 2005-09-12 | 2010-11-25 | Nanolnk, Inc. | High throughput inspecting |
KR100913997B1 (ko) * | 2006-04-06 | 2009-08-26 | 재단법인서울대학교산학협력재단 | 표면유체 원리를 이용한 잉크의 형성방법 및 이를 이용하여패터닝하는 방법 |
JP2009534200A (ja) | 2006-04-19 | 2009-09-24 | ノースウエスタン ユニバーシティ | 2次元ペン配列を有する並列リソグラフィのための物品 |
US8192794B2 (en) * | 2006-04-19 | 2012-06-05 | Northwestern University | Massively parallel lithography with two-dimensional pen arrays |
JP2009542448A (ja) | 2006-06-28 | 2009-12-03 | ノースウエスタン ユニバーシティ | エッチングおよびホールアレイ |
CA2678943A1 (en) * | 2007-03-13 | 2008-09-18 | Nanoink, Inc. | Nanolithography with use of viewports |
US7956102B2 (en) * | 2007-04-09 | 2011-06-07 | The Board Of Trustees Of The University Of Illinois | Sol-gel inks |
WO2008141048A1 (en) * | 2007-05-09 | 2008-11-20 | Nanoink, Inc. | Compact nanofabrication apparatus |
US20090004231A1 (en) | 2007-06-30 | 2009-01-01 | Popp Shane M | Pharmaceutical dosage forms fabricated with nanomaterials for quality monitoring |
US7954166B2 (en) * | 2007-08-08 | 2011-05-31 | Northwestern University | Independently-addressable, self-correcting inking for cantilever arrays |
CA2701889A1 (en) * | 2007-10-15 | 2009-04-23 | Nanoink, Inc. | Lithography of nanoparticle based inks |
US20100297228A1 (en) * | 2007-10-29 | 2010-11-25 | Nanolnk, Inc. | Universal coating for imprinting identification features |
US8205268B2 (en) * | 2007-11-26 | 2012-06-19 | Nanoink, Inc. | Cantilever with pivoting actuation |
CA2714005A1 (en) * | 2008-02-05 | 2009-08-13 | Nanoink, Inc. | Array and cantilever array leveling |
US8068328B2 (en) * | 2008-03-12 | 2011-11-29 | Intel Corporation | Nanolithographic method of manufacturing an embedded passive device for a microelectronic application, and microelectronic device containing same |
US7452570B1 (en) * | 2008-04-09 | 2008-11-18 | International Business Machines Corporation | Probe-based lithography utilizing thermomechanically activated polymers |
WO2010011397A2 (en) * | 2008-05-13 | 2010-01-28 | Northwestern University | Scanning probe epitaxy |
US7922939B2 (en) * | 2008-10-03 | 2011-04-12 | The Board Of Trustees Of The University Of Illinois | Metal nanoparticle inks |
US8187500B2 (en) * | 2008-10-17 | 2012-05-29 | The Board Of Trustees Of The University Of Illinois | Biphasic inks |
KR20100043542A (ko) * | 2008-10-20 | 2010-04-29 | 삼성전자주식회사 | 딥펜 나노리소그래피 공정을 이용하여 패터닝하는 장치 및 방법 |
US20100196661A1 (en) * | 2009-01-30 | 2010-08-05 | Duerig Urs T | Method for patterning nano-scale patterns of molecules on a surface of a material |
AU2010236563A1 (en) * | 2009-04-14 | 2011-09-22 | Nanoink, Inc. | Conducting lines, nanoparticles, inks, and patterning |
KR20120099476A (ko) * | 2009-12-02 | 2012-09-10 | 노오쓰웨스턴 유니버시티 | 블록 공중합체-보조 나노리소그래피 |
KR100974288B1 (ko) | 2010-01-13 | 2010-08-05 | 한국기계연구원 | 나노임프린트를 이용한 금속 산화박막 패턴 형성방법 및 이를 이용한 led 소자의 제조방법 |
US8763525B2 (en) * | 2010-12-15 | 2014-07-01 | Carestream Health, Inc. | Gravure printing of transparent conductive films containing networks of metal nanoparticles |
CN102092678B (zh) * | 2010-12-31 | 2013-07-10 | 上海交通大学 | 基于力调制模式的蘸笔纳米刻蚀方法 |
WO2012135768A1 (en) * | 2011-03-30 | 2012-10-04 | Rolandi Marco | Inorganic nanostructure reactive direct-write and growth |
TW201250845A (en) | 2011-05-17 | 2012-12-16 | Nanoink Inc | High density, hard tip arrays |
CN102344115B (zh) * | 2011-09-28 | 2015-04-15 | 清华大学 | 基于蘸笔原理的微纳尺度连接方法 |
WO2013059670A2 (en) | 2011-10-21 | 2013-04-25 | Nanoink, Inc. | Octahedral and pyramid-on-post tips for microscopy and lithography |
US20150210868A1 (en) * | 2012-09-10 | 2015-07-30 | Northwestern University | Method for synthesizing nanoparticles on surfaces |
US10265694B2 (en) | 2013-06-28 | 2019-04-23 | President And Fellows Of Harvard College | High-surface area functional material coated structures |
US10364141B2 (en) | 2013-12-23 | 2019-07-30 | Washington State University | Block copolymer nanostructures formed by disturbed self-assembly and uses thereof |
CN103878227B (zh) * | 2014-03-06 | 2015-08-12 | 京东方科技集团股份有限公司 | 模仁网点冲压装置 |
WO2017106199A1 (en) * | 2015-12-16 | 2017-06-22 | The Regents Of The University Of California | Technique for three-dimensional nanoprinting |
WO2017151139A1 (en) * | 2016-03-04 | 2017-09-08 | Intel Corporation | Multi-component reactive inks for 3d-printed electronics |
RU2018137681A (ru) | 2016-04-01 | 2020-05-12 | Президент Энд Феллоуз Оф Гарвард Колледж | Изготовление высококачественных материалов матричной сборки из оксида титана, оксида алюминия и других оксидов металлов путем совместной сборки |
US11590483B2 (en) | 2017-09-29 | 2023-02-28 | President And Fellows Of Harvard College | Enhanced catalytic materials with partially embedded catalytic nanoparticles |
US11884830B2 (en) | 2018-03-23 | 2024-01-30 | Lawrence Livermore National Security, Llc | Base-catalyzed sol-gel inks for direct ink writing of high resolution hierarchically porous carbon aerogels |
CN110143568B (zh) * | 2019-05-22 | 2022-03-29 | 季华实验室 | 在衬底材料的钝化层上形成三维图形结构的方法 |
CN110962220B (zh) * | 2019-12-18 | 2021-08-13 | 厦门大学 | 一种聚合物前驱体陶瓷薄膜的直写装置和制作方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11160874A (ja) * | 1997-08-14 | 1999-06-18 | Mitsubishi Materials Corp | 貯蔵安定性のある金属アリールケトンアルコレート溶液と薄膜の光開始パターン化におけるその用途 |
JPH11202143A (ja) * | 1998-01-16 | 1999-07-30 | Furukawa Electric Co Ltd:The | 光導波路部品およびその製造方法 |
JP2000174012A (ja) * | 1998-12-03 | 2000-06-23 | Mitsubishi Materials Corp | 表面モフォロジーに優れたパターン化誘電体薄膜の形成方法 |
WO2000041213A1 (en) * | 1999-01-07 | 2000-07-13 | Northwestern University | Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
JP2000327311A (ja) * | 1999-05-26 | 2000-11-28 | Ngk Spark Plug Co Ltd | 金属酸化物薄膜を有する基板の製造方法 |
WO2001091855A1 (en) * | 2000-05-26 | 2001-12-06 | Northwestern University | Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10174012A (ja) * | 1996-12-06 | 1998-06-26 | Fujitsu General Ltd | 文字表示装置 |
US20020122873A1 (en) * | 2000-01-05 | 2002-09-05 | Mirkin Chad A. | Nanolithography methods and products therefor and produced thereby |
EP1059266A3 (en) * | 1999-06-11 | 2000-12-20 | Iljin Nanotech Co., Ltd. | Mass synthesis method of high purity carbon nanotubes vertically aligned over large-size substrate using thermal chemical vapor deposition |
US6890640B2 (en) * | 1999-12-03 | 2005-05-10 | Caterpillar Inc | Patterned hydrophilic-oleophilic metal oxide coating and method of forming |
US6365266B1 (en) * | 1999-12-07 | 2002-04-02 | Air Products And Chemicals, Inc. | Mesoporous films having reduced dielectric constants |
US6592980B1 (en) * | 1999-12-07 | 2003-07-15 | Air Products And Chemicals, Inc. | Mesoporous films having reduced dielectric constants |
US6508979B1 (en) * | 2000-02-08 | 2003-01-21 | University Of Southern California | Layered nanofabrication |
IL134631A0 (en) * | 2000-02-20 | 2001-04-30 | Yeda Res & Dev | Constructive nanolithography |
JP2001340755A (ja) * | 2000-03-31 | 2001-12-11 | Toyota Central Res & Dev Lab Inc | ガス吸着分離用多孔体及びそれを用いたガス吸着分離方法 |
US6471761B2 (en) * | 2000-04-21 | 2002-10-29 | University Of New Mexico | Prototyping of patterned functional nanostructures |
US6986818B2 (en) * | 2000-06-02 | 2006-01-17 | The Regents Of The University Of California | Method for producing nanostructured metal-oxides |
CN1139535C (zh) * | 2001-05-28 | 2004-02-25 | 东南大学 | 用探针转移微粒制造纳米线结构的方法 |
CN100345059C (zh) * | 2001-12-17 | 2007-10-24 | 西北大学 | 采用直写纳米刻蚀印刷的固态部件的图案化 |
US7223438B2 (en) * | 2002-09-17 | 2007-05-29 | Northwestern University | Patterning magnetic nanostructures |
-
2002
- 2002-12-17 CN CNB028272803A patent/CN100345059C/zh not_active Expired - Fee Related
- 2002-12-17 TW TW091136422A patent/TWI287170B/zh not_active IP Right Cessation
- 2002-12-17 EP EP02798520A patent/EP1502154B1/en not_active Expired - Lifetime
- 2002-12-17 AT AT02798520T patent/ATE423336T1/de not_active IP Right Cessation
- 2002-12-17 AU AU2002364001A patent/AU2002364001B2/en not_active Ceased
- 2002-12-17 KR KR1020047009448A patent/KR100936599B1/ko not_active IP Right Cessation
- 2002-12-17 DE DE60231252T patent/DE60231252D1/de not_active Expired - Lifetime
- 2002-12-17 WO PCT/US2002/040118 patent/WO2003052514A2/en active Application Filing
- 2002-12-17 CA CA2470823A patent/CA2470823C/en not_active Expired - Fee Related
- 2002-12-17 US US10/320,721 patent/US7273636B2/en not_active Expired - Fee Related
- 2002-12-17 JP JP2003553339A patent/JP2005513768A/ja not_active Withdrawn
-
2007
- 2007-08-29 US US11/847,263 patent/US7811635B2/en not_active Expired - Fee Related
-
2009
- 2009-12-14 JP JP2009282559A patent/JP4999913B2/ja not_active Expired - Fee Related
-
2010
- 2010-10-05 US US12/898,416 patent/US20110081526A1/en not_active Abandoned
-
2011
- 2011-11-04 JP JP2011242635A patent/JP2012060146A/ja not_active Withdrawn
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11160874A (ja) * | 1997-08-14 | 1999-06-18 | Mitsubishi Materials Corp | 貯蔵安定性のある金属アリールケトンアルコレート溶液と薄膜の光開始パターン化におけるその用途 |
JPH11202143A (ja) * | 1998-01-16 | 1999-07-30 | Furukawa Electric Co Ltd:The | 光導波路部品およびその製造方法 |
JP2000174012A (ja) * | 1998-12-03 | 2000-06-23 | Mitsubishi Materials Corp | 表面モフォロジーに優れたパターン化誘電体薄膜の形成方法 |
WO2000041213A1 (en) * | 1999-01-07 | 2000-07-13 | Northwestern University | Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
JP2000327311A (ja) * | 1999-05-26 | 2000-11-28 | Ngk Spark Plug Co Ltd | 金属酸化物薄膜を有する基板の製造方法 |
WO2001091855A1 (en) * | 2000-05-26 | 2001-12-06 | Northwestern University | Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
Non-Patent Citations (1)
Title |
---|
YAN LI, ET.AL.: "Electrochemical AFM "Dip-Pen" Nanolithography", J.AM.CHEM.SOC., vol. 123, no. 9, JPN6008062255, 6 February 2001 (2001-02-06), pages 2105 - 2106, XP002958443, ISSN: 0001199491, DOI: 10.1021/ja005654m * |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007516071A (ja) * | 2003-11-12 | 2007-06-21 | ユニバシテ デ シオンス エ テクノロジ ド リール | カリグラフィー用ペン形式の平面エレクトロスプレー・ソース及びその製造 |
JP4800218B2 (ja) * | 2003-11-12 | 2011-10-26 | ユニバシテ デ シオンス エ テクノロジ ド リール | カリグラフィー用ペン形式の平面エレクトロスプレー・ソース及びその製造 |
JP2010531977A (ja) * | 2007-06-20 | 2010-09-30 | ノースウエスタン ユニバーシティ | 脂質を含む組成物を用いたパターニング |
JP2010532267A (ja) * | 2007-06-20 | 2010-10-07 | ノースウエスタン ユニバーシティ | ナノ材料とポリマーとを含む組成物によるパターン形成 |
JP2012532342A (ja) * | 2009-06-30 | 2012-12-13 | ナノインク インコーポレーティッド | フォトマスクの修復方法 |
JP2021534325A (ja) * | 2018-08-16 | 2021-12-09 | ノースウェスタン ユニバーシティ | 多元素ヘテロ構造ナノ粒子およびその製造方法 |
JP7365069B2 (ja) | 2018-08-16 | 2023-10-19 | ノースウェスタン ユニバーシティ | 多元素ヘテロ構造ナノ粒子およびその製造方法 |
Also Published As
Publication number | Publication date |
---|---|
EP1502154A2 (en) | 2005-02-02 |
WO2003052514A9 (en) | 2004-06-03 |
JP2012060146A (ja) | 2012-03-22 |
CN1615457A (zh) | 2005-05-11 |
WO2003052514A3 (en) | 2004-11-18 |
CA2470823C (en) | 2012-03-20 |
US7273636B2 (en) | 2007-09-25 |
KR100936599B1 (ko) | 2010-01-13 |
CA2470823A1 (en) | 2003-06-26 |
AU2002364001B2 (en) | 2008-09-11 |
TWI287170B (en) | 2007-09-21 |
KR20050026376A (ko) | 2005-03-15 |
TW200305057A (en) | 2003-10-16 |
WO2003052514A2 (en) | 2003-06-26 |
EP1502154B1 (en) | 2009-02-18 |
ATE423336T1 (de) | 2009-03-15 |
AU2002364001A1 (en) | 2003-06-30 |
DE60231252D1 (de) | 2009-04-02 |
US20110081526A1 (en) | 2011-04-07 |
JP4999913B2 (ja) | 2012-08-15 |
US20030162004A1 (en) | 2003-08-28 |
US20080044575A1 (en) | 2008-02-21 |
CN100345059C (zh) | 2007-10-24 |
JP2010080977A (ja) | 2010-04-08 |
US7811635B2 (en) | 2010-10-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4999913B2 (ja) | 直接書込みナノリソグラフィック印刷による固体フィーチャのパターニング | |
Fan et al. | Rapid prototyping of patterned functional nanostructures | |
EP1850972B1 (en) | Thermal control of deposition in dip pen nanolithography | |
KR101165484B1 (ko) | 기판 표면에 잉크를 전달하는 방법, 도전성 금속을 기입하는 방법, 나노리소그래피 또는 마이크로리소그래피용 잉크 제형, 금속 트레이스를 침착시키기 위한 방법, 평판 표시 장치 기판의 수리 방법 및 장치 | |
Xia et al. | Pattern transfer: Self-assembled monolayers as ultrathin resists | |
US7691541B2 (en) | Methods for additive repair of phase shift masks by selectively depositing nanometer-scale engineered structures on defective phase shifters | |
AU2008312607A1 (en) | Lithography of nanoparticle based inks | |
JP2007503725A (ja) | パターニングツールとしてナノリソグラフィを使用する、導体パターンを製造する方法 | |
KR20120099476A (ko) | 블록 공중합체-보조 나노리소그래피 | |
Sangeeta et al. | Inorganic materials chemistry desk reference | |
Liao et al. | High throughput synthesis of multifunctional oxide nanostructures within nanoreactors defined by beam pen lithography | |
Stevenson et al. | High resolution assembly of patterned metal oxide thin films via microtransfer molding and electrochemical deposition techniques | |
Cho et al. | Development of Direct Ink Writing Technology for Micro-Structures | |
DE60132892T2 (de) | Verfahren mittels abtastenden mikroskopspritzen und produkte dafür oder dadurch erzeugt | |
Lee et al. | Additive Fabrication of Patterned Multi-Layered Thin Films of Ta~ 2O~ 5 and CdS on ITO Using Microcontact Printing Technique | |
KR20230127514A (ko) | 4d 단분자 단일나노구조 제어 자기조립 리소그래피(4d 모나리자) | |
Jeon | Additive fabrication of microstructures using self-assembled organic thin-film templates |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
RD04 | Notification of resignation of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7424 Effective date: 20050510 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20051214 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20081204 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20090303 |
|
A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20090310 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20090602 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20090813 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20091214 |
|
A761 | Written withdrawal of application |
Free format text: JAPANESE INTERMEDIATE CODE: A761 Effective date: 20100129 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A821 Effective date: 20100129 |