JP2012505406A5 - - Google Patents

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JP2012505406A5
JP2012505406A5 JP2011531085A JP2011531085A JP2012505406A5 JP 2012505406 A5 JP2012505406 A5 JP 2012505406A5 JP 2011531085 A JP2011531085 A JP 2011531085A JP 2011531085 A JP2011531085 A JP 2011531085A JP 2012505406 A5 JP2012505406 A5 JP 2012505406A5
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concurrent
signal
events
event
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JP2011531085A
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JP5557842B2 (ja
JP2012505406A (ja
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JP2011531085A 2008-10-10 2009-10-02 粒子分析における同時発生の検出および処理 Active JP5557842B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/249,473 2008-10-10
US12/249,473 US8154273B2 (en) 2008-10-10 2008-10-10 Detecting and handling coincidence in particle analysis
PCT/US2009/059363 WO2010042401A1 (en) 2008-10-10 2009-10-02 Detecting and handling coincidence in particle analysis

Publications (3)

Publication Number Publication Date
JP2012505406A JP2012505406A (ja) 2012-03-01
JP2012505406A5 true JP2012505406A5 (enExample) 2012-09-20
JP5557842B2 JP5557842B2 (ja) 2014-07-23

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JP2011531085A Active JP5557842B2 (ja) 2008-10-10 2009-10-02 粒子分析における同時発生の検出および処理

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US (1) US8154273B2 (enExample)
EP (1) EP2350611B1 (enExample)
JP (1) JP5557842B2 (enExample)
CN (1) CN102177427B (enExample)
ES (1) ES2717843T3 (enExample)
TR (1) TR201904506T4 (enExample)
WO (1) WO2010042401A1 (enExample)

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CN112154317B (zh) * 2018-04-26 2024-11-08 贝克顿·迪金森公司 颗粒分析仪的表征和分选
KR102094373B1 (ko) * 2018-09-05 2020-03-27 주식회사 마하테크 미세플라스틱 검출장치
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CN109323975B (zh) * 2018-11-07 2021-05-25 中国科学院合肥物质科学研究院 一种基于回波阈值比较的opc计数校正方法
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JP7660123B2 (ja) 2019-12-27 2025-04-10 ベックマン コールター， インコーポレイテッド サンプル調製器具
CN111751864B (zh) * 2020-06-30 2022-07-05 北京卫星环境工程研究所 粒子探测器指令处理方法和系统
CN112730408B (zh) * 2020-12-24 2024-07-09 贝克曼库尔特生物科技（苏州）有限公司 液流检测系统和液流检测方法以及分选装置
CN119072620A (zh) * 2022-02-24 2024-12-03 贝克顿·迪金森公司 用于针对重合事件的存在评估流式细胞仪数据的方法和系统

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