JP2012505406A5 - - Google Patents

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JP2012505406A5
JP2012505406A5 JP2011531085A JP2011531085A JP2012505406A5 JP 2012505406 A5 JP2012505406 A5 JP 2012505406A5 JP 2011531085 A JP2011531085 A JP 2011531085A JP 2011531085 A JP2011531085 A JP 2011531085A JP 2012505406 A5 JP2012505406 A5 JP 2012505406A5
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signal
events
event
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JP2011531085A
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JP2012505406A (ja
JP5557842B2 (ja
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Priority claimed from US12/249,473 external-priority patent/US8154273B2/en
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JP2011531085A 2008-10-10 2009-10-02 粒子分析における同時発生の検出および処理 Active JP5557842B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/249,473 2008-10-10
US12/249,473 US8154273B2 (en) 2008-10-10 2008-10-10 Detecting and handling coincidence in particle analysis
PCT/US2009/059363 WO2010042401A1 (en) 2008-10-10 2009-10-02 Detecting and handling coincidence in particle analysis

Publications (3)

Publication Number Publication Date
JP2012505406A JP2012505406A (ja) 2012-03-01
JP2012505406A5 true JP2012505406A5 (enExample) 2012-09-20
JP5557842B2 JP5557842B2 (ja) 2014-07-23

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JP2011531085A Active JP5557842B2 (ja) 2008-10-10 2009-10-02 粒子分析における同時発生の検出および処理

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US (1) US8154273B2 (enExample)
EP (1) EP2350611B1 (enExample)
JP (1) JP5557842B2 (enExample)
CN (1) CN102177427B (enExample)
ES (1) ES2717843T3 (enExample)
TR (1) TR201904506T4 (enExample)
WO (1) WO2010042401A1 (enExample)

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CN108037060B (zh) * 2018-01-26 2019-11-08 中国人民解放军总医院 粒子计数方法、实现所述方法的粒子计数装置和粒子分析仪
CN119334856A (zh) * 2018-04-26 2025-01-21 贝克顿·迪金森公司 颗粒分析仪的表征和分选
KR102094373B1 (ko) * 2018-09-05 2020-03-27 주식회사 마하테크 미세플라스틱 검출장치
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CN109323975B (zh) * 2018-11-07 2021-05-25 中国科学院合肥物质科学研究院 一种基于回波阈值比较的opc计数校正方法
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CN112730408B (zh) * 2020-12-24 2024-07-09 贝克曼库尔特生物科技（苏州）有限公司 液流检测系统和液流检测方法以及分选装置
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