JP2012208114A - Ｘ線撮像装置 - Google Patents

Ｘ線撮像装置 Download PDF

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Publication number
JP2012208114A
JP2012208114A JP2012053972A JP2012053972A JP2012208114A JP 2012208114 A JP2012208114 A JP 2012208114A JP 2012053972 A JP2012053972 A JP 2012053972A JP 2012053972 A JP2012053972 A JP 2012053972A JP 2012208114 A JP2012208114 A JP 2012208114A
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Japan
Prior art keywords
shielding
ray
grating
grid
center
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Pending
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JP2012053972A
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English (en)
Japanese (ja)
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JP2012208114A5 (enExample
Inventor
Toru Den
透 田
Masaaki Yamaguchi
公明 山口
Chigusa Ouchi
千種 大内
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Canon Inc
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Canon Inc
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Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2012053972A priority Critical patent/JP2012208114A/ja
Publication of JP2012208114A publication Critical patent/JP2012208114A/ja
Publication of JP2012208114A5 publication Critical patent/JP2012208114A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G21K1/067—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators using surface reflection, e.g. grazing incidence mirrors, gratings
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20075—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring interferences of X-rays, e.g. Borrmann effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

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  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Medical Informatics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Radiology & Medical Imaging (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Biomedical Technology (AREA)
  • Animal Behavior & Ethology (AREA)
  • Biophysics (AREA)
  • Optics & Photonics (AREA)
  • General Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Molecular Biology (AREA)
  • Surgery (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Pulmonology (AREA)
  • Theoretical Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
JP2012053972A 2011-03-14 2012-03-12 Ｘ線撮像装置 Pending JP2012208114A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012053972A JP2012208114A (ja) 2011-03-14 2012-03-12 Ｘ線撮像装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2011055990 2011-03-14
JP2011055990 2011-03-14
JP2012053972A JP2012208114A (ja) 2011-03-14 2012-03-12 Ｘ線撮像装置

Publications (2)

Publication Number Publication Date
JP2012208114A true JP2012208114A (ja) 2012-10-25
JP2012208114A5 JP2012208114A5 (enExample) 2015-04-30

Family

ID=46828451

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012053972A Pending JP2012208114A (ja) 2011-03-14 2012-03-12 Ｘ線撮像装置

Country Status (2)

Country Link
US (2) US9066704B2 (enExample)
JP (1) JP2012208114A (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5631013B2 (ja) 2010-01-28 2014-11-26 キヤノン株式会社 Ｘ線撮像装置
JP5586986B2 (ja) 2010-02-23 2014-09-10 キヤノン株式会社 Ｘ線撮像装置
JP5796976B2 (ja) 2010-05-27 2015-10-21 キヤノン株式会社 Ｘ線撮像装置
RU2572644C2 (ru) * 2010-10-19 2016-01-20 Конинклейке Филипс Электроникс Н.В. Формирование дифференциальных фазово-контрастных изображений
EP2630477B1 (en) * 2010-10-19 2020-03-18 Koninklijke Philips N.V. Differential phase-contrast imaging
US9066704B2 (en) * 2011-03-14 2015-06-30 Canon Kabushiki Kaisha X-ray imaging apparatus
JP2013024731A (ja) 2011-07-21 2013-02-04 Canon Inc 放射線検出装置
CN104095645A (zh) * 2013-04-03 2014-10-15 中国科学院高能物理研究所 高分辨率和高信噪比的x射线成像系统和成像方法
CN104095646B (zh) * 2013-04-03 2017-03-08 中国科学院高能物理研究所 高分辨率和高信噪比的双旋ct成像系统和成像方法
US10393681B2 (en) * 2014-02-14 2019-08-27 Canon Kabushiki Kaisha X-ray Talbot interferometer and X-ray Talbot interferometer system
JP6667215B2 (ja) * 2014-07-24 2020-03-18 キヤノン株式会社 Ｘ線遮蔽格子、構造体、トールボット干渉計、ｘ線遮蔽格子の製造方法
JP2016050891A (ja) * 2014-09-01 2016-04-11 キヤノン株式会社 Ｘ線撮像装置
US20160086681A1 (en) * 2014-09-24 2016-03-24 Carl Zeiss X-ray Microscopy, Inc. Zone Plate and Method for Fabricating Same Using Conformal Coating
CN107106101B (zh) * 2014-12-22 2020-04-24 株式会社岛津制作所 放射线相位差摄影装置
EP3509492B1 (en) 2016-09-08 2021-12-15 Koninklijke Philips N.V. Source grating for x-ray imaging
CN107677693B (zh) * 2017-09-26 2020-06-09 同方威视技术股份有限公司 用于物品安全检查的扫描成像系统及其成像方法
CN107703168A (zh) * 2017-10-13 2018-02-16 中国工程物理研究院材料研究所 一种晶体衍射信号获取方法

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59207551A (ja) * 1983-04-29 1984-11-24 トムソン−セエスエフ Ｘ線像増倍管
JPH01276050A (ja) * 1988-03-18 1989-11-06 Philips Gloeilampenfab:Nv Ｘ線検査装置
JP2007206075A (ja) * 2006-02-01 2007-08-16 Siemens Ag Ｘ線装置の焦点−検出器装置
JP2008197593A (ja) * 2007-02-16 2008-08-28 Konica Minolta Medical & Graphic Inc Ｘ線用透過型回折格子、ｘ線タルボ干渉計およびｘ線撮像装置
WO2009101569A2 (en) * 2008-02-14 2009-08-20 Koninklijke Philips Electronics N.V. X-ray detector for phase contrast imaging
JP2010190777A (ja) * 2009-02-19 2010-09-02 Konica Minolta Medical & Graphic Inc Ｘ線撮影装置
US20110052800A1 (en) * 2009-08-31 2011-03-03 Canon Kabushiki Kaisha Process of producing grating for x-ray image pickup apparatus

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2002352821A1 (en) * 2001-11-21 2003-06-10 U.S. Government As Represented By The Secretary Of The Army Portable medical digital radiography assembly
JP4624118B2 (ja) 2005-01-26 2011-02-02 ユニバーサル製缶株式会社 缶の製造方法
DE102006037254B4 (de) 2006-02-01 2017-08-03 Paul Scherer Institut Fokus-Detektor-Anordnung zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen mit röntgenoptischen Gittern, sowie Röntgen-System, Röntgen-C-Bogen-System und Röntgen-Computer-Tomographie-System
DE102006037281A1 (de) 2006-02-01 2007-08-09 Siemens Ag Röntgenoptisches Durchstrahlungsgitter einer Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen von einem Untersuchungsobjekt
US9066704B2 (en) * 2011-03-14 2015-06-30 Canon Kabushiki Kaisha X-ray imaging apparatus

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59207551A (ja) * 1983-04-29 1984-11-24 トムソン−セエスエフ Ｘ線像増倍管
US4645971A (en) * 1983-04-29 1987-02-24 Thomson-Csf X-ray image intensifier and application to a digital radiology system
JPH01276050A (ja) * 1988-03-18 1989-11-06 Philips Gloeilampenfab:Nv Ｘ線検査装置
JP2007206075A (ja) * 2006-02-01 2007-08-16 Siemens Ag Ｘ線装置の焦点−検出器装置
JP2008197593A (ja) * 2007-02-16 2008-08-28 Konica Minolta Medical & Graphic Inc Ｘ線用透過型回折格子、ｘ線タルボ干渉計およびｘ線撮像装置
WO2009101569A2 (en) * 2008-02-14 2009-08-20 Koninklijke Philips Electronics N.V. X-ray detector for phase contrast imaging
JP2010190777A (ja) * 2009-02-19 2010-09-02 Konica Minolta Medical & Graphic Inc Ｘ線撮影装置
US20110052800A1 (en) * 2009-08-31 2011-03-03 Canon Kabushiki Kaisha Process of producing grating for x-ray image pickup apparatus

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Publication number Publication date
US9066704B2 (en) 2015-06-30
US20150279497A1 (en) 2015-10-01
US20120236988A1 (en) 2012-09-20

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