JP2011526876A - アンバランス磁場及び同方向回転を用いた成長シリコン結晶の融液−固体界面形状の制御方法 - Google Patents
アンバランス磁場及び同方向回転を用いた成長シリコン結晶の融液−固体界面形状の制御方法 Download PDFInfo
- Publication number
- JP2011526876A JP2011526876A JP2011516769A JP2011516769A JP2011526876A JP 2011526876 A JP2011526876 A JP 2011526876A JP 2011516769 A JP2011516769 A JP 2011516769A JP 2011516769 A JP2011516769 A JP 2011516769A JP 2011526876 A JP2011526876 A JP 2011526876A
- Authority
- JP
- Japan
- Prior art keywords
- magnetic field
- melt
- solid interface
- crystal
- crucible
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000013078 crystal Substances 0.000 claims abstract description 146
- 239000007787 solid Substances 0.000 claims abstract description 76
- 238000000034 method Methods 0.000 claims abstract description 62
- 239000000155 melt Substances 0.000 claims abstract description 56
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 13
- 239000004065 semiconductor Substances 0.000 claims abstract description 13
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 13
- 239000010703 silicon Substances 0.000 claims abstract description 13
- 230000008569 process Effects 0.000 claims description 29
- 230000007547 defect Effects 0.000 claims description 18
- 238000004519 manufacturing process Methods 0.000 claims description 7
- 230000000994 depressogenic effect Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 16
- 238000004088 simulation Methods 0.000 description 13
- 230000001965 increasing effect Effects 0.000 description 11
- 230000007704 transition Effects 0.000 description 8
- 239000000498 cooling water Substances 0.000 description 6
- 238000005339 levitation Methods 0.000 description 6
- 230000015572 biosynthetic process Effects 0.000 description 5
- 238000001816 cooling Methods 0.000 description 5
- 239000007789 gas Substances 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 4
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 229920005591 polysilicon Polymers 0.000 description 2
- 241000272168 Laridae Species 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 230000003466 anti-cipated effect Effects 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 230000009643 growth defect Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 238000005728 strengthening Methods 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/30—Mechanisms for rotating or moving either the melt or the crystal
- C30B15/305—Stirring of the melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B30/00—Production of single crystals or homogeneous polycrystalline material with defined structure characterised by the action of electric or magnetic fields, wave energy or other specific physical conditions
- C30B30/04—Production of single crystals or homogeneous polycrystalline material with defined structure characterised by the action of electric or magnetic fields, wave energy or other specific physical conditions using magnetic fields
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US7708208P | 2008-06-30 | 2008-06-30 | |
| US61/077,082 | 2008-06-30 | ||
| PCT/US2009/049069 WO2010002795A1 (en) | 2008-06-30 | 2009-06-29 | Controlling a melt-solid interface shape of a growing silicon crystal using an unbalanced magnetic field and iso-rotation |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2011526876A true JP2011526876A (ja) | 2011-10-20 |
| JP2011526876A5 JP2011526876A5 (https=) | 2012-08-09 |
Family
ID=40886307
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011516769A Pending JP2011526876A (ja) | 2008-06-30 | 2009-06-29 | アンバランス磁場及び同方向回転を用いた成長シリコン結晶の融液−固体界面形状の制御方法 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US8398765B2 (https=) |
| EP (1) | EP2318574A1 (https=) |
| JP (1) | JP2011526876A (https=) |
| KR (1) | KR20110037985A (https=) |
| CN (1) | CN102076890A (https=) |
| MY (1) | MY150565A (https=) |
| TW (1) | TW201005134A (https=) |
| WO (1) | WO2010002795A1 (https=) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7959732B1 (en) * | 2005-06-17 | 2011-06-14 | Saint-Gobain Ceramics & Plastics, Inc. | Apparatus and method for monitoring and controlling crystal growth |
| KR101285935B1 (ko) | 2011-01-19 | 2013-07-12 | 주식회사 엘지실트론 | 저항 가열 사파이어 단결정 잉곳 성장장치, 저항 가열 사파이어 단결정 잉곳 제조방법, 사파이어 단결정 잉곳 및 사파이어 웨이퍼 |
| JP5782323B2 (ja) * | 2011-07-22 | 2015-09-24 | グローバルウェーハズ・ジャパン株式会社 | 単結晶引上方法 |
| WO2013087199A1 (en) | 2011-12-16 | 2013-06-20 | Saudi Basic Industries Corporation (Sabic) | Process for synthesizing a new catalyst complex for the production of polyethylene terephthlate |
| KR101680213B1 (ko) * | 2015-04-06 | 2016-11-28 | 주식회사 엘지실트론 | 실리콘 단결정 잉곳의 성장 방법 |
| US10415149B2 (en) * | 2017-03-31 | 2019-09-17 | Silfex, Inc. | Growth of a shaped silicon ingot by feeding liquid onto a shaped ingot |
| WO2018198606A1 (ja) * | 2017-04-25 | 2018-11-01 | 株式会社Sumco | n型シリコン単結晶の製造方法、n型シリコン単結晶のインゴット、シリコンウェーハ、およびエピタキシャルシリコンウェーハ |
| CN109811403A (zh) * | 2017-11-22 | 2019-05-28 | 上海新昇半导体科技有限公司 | 一种拉晶系统和拉晶方法 |
| CN112095154B (zh) * | 2019-06-18 | 2021-05-14 | 上海新昇半导体科技有限公司 | 一种半导体晶体生长装置 |
| US11873574B2 (en) * | 2019-12-13 | 2024-01-16 | Globalwafers Co., Ltd. | Systems and methods for production of silicon using a horizontal magnetic field |
| CN113046833A (zh) * | 2019-12-27 | 2021-06-29 | 上海新昇半导体科技有限公司 | 一种半导体晶体生长装置 |
| CN114130993A (zh) * | 2021-11-29 | 2022-03-04 | 上海大学 | 一种控制单晶高温合金铸件中缺陷的方法、其应用和熔铸装置 |
| US12486594B2 (en) | 2022-08-29 | 2025-12-02 | Globalwafers Co., Ltd. | Ingot puller apparatus that axially position magnetic poles |
| US12486593B2 (en) | 2022-08-29 | 2025-12-02 | Globalwafers Co., Ltd. | Axial positioning of magnetic poles while producing a silicon ingot |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003055092A (ja) * | 2001-08-16 | 2003-02-26 | Sumitomo Mitsubishi Silicon Corp | シリコン単結晶の引上げ方法 |
| US20060144321A1 (en) * | 2004-12-30 | 2006-07-06 | Memc Electronic Materials, Inc. | Controlling melt-solid interface shape of a growing silicon crystal using a variable magnetic field |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19529481A1 (de) | 1995-08-10 | 1997-02-13 | Wacker Siltronic Halbleitermat | Verfahren und Vorrichtung zur Herstellung von Einkristallen |
| JPH10114597A (ja) * | 1996-08-20 | 1998-05-06 | Komatsu Electron Metals Co Ltd | 単結晶シリコンの製造方法およびその装置 |
| JP2000044387A (ja) * | 1998-07-27 | 2000-02-15 | Nippon Steel Corp | シリコン単結晶製造方法 |
| JP3783495B2 (ja) * | 1999-11-30 | 2006-06-07 | 株式会社Sumco | 高品質シリコン単結晶の製造方法 |
| US7291221B2 (en) | 2004-12-30 | 2007-11-06 | Memc Electronic Materials, Inc. | Electromagnetic pumping of liquid silicon in a crystal growing process |
| JP2007031274A (ja) | 2005-07-27 | 2007-02-08 | Siltron Inc | シリコン単結晶インゴット、ウエハ、その成長装置、及びその成長方法 |
| JP2007284260A (ja) * | 2006-04-12 | 2007-11-01 | Sumco Techxiv株式会社 | シリコン単結晶の製造方法 |
-
2009
- 2009-06-29 JP JP2011516769A patent/JP2011526876A/ja active Pending
- 2009-06-29 US US12/493,766 patent/US8398765B2/en active Active
- 2009-06-29 EP EP09774246A patent/EP2318574A1/en not_active Ceased
- 2009-06-29 KR KR1020107029635A patent/KR20110037985A/ko not_active Ceased
- 2009-06-29 MY MYPI20105394 patent/MY150565A/en unknown
- 2009-06-29 CN CN2009801253194A patent/CN102076890A/zh active Pending
- 2009-06-29 WO PCT/US2009/049069 patent/WO2010002795A1/en not_active Ceased
- 2009-06-30 TW TW098122118A patent/TW201005134A/zh unknown
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003055092A (ja) * | 2001-08-16 | 2003-02-26 | Sumitomo Mitsubishi Silicon Corp | シリコン単結晶の引上げ方法 |
| US20060144321A1 (en) * | 2004-12-30 | 2006-07-06 | Memc Electronic Materials, Inc. | Controlling melt-solid interface shape of a growing silicon crystal using a variable magnetic field |
| WO2006073614A1 (en) * | 2004-12-30 | 2006-07-13 | Memc Electronic Materials, Inc. | Controlling melt-solid interface shape of a growing silicon crystal using a variable magnetic field |
Also Published As
| Publication number | Publication date |
|---|---|
| US20090320743A1 (en) | 2009-12-31 |
| WO2010002795A1 (en) | 2010-01-07 |
| TW201005134A (en) | 2010-02-01 |
| US8398765B2 (en) | 2013-03-19 |
| MY150565A (en) | 2014-01-30 |
| CN102076890A (zh) | 2011-05-25 |
| EP2318574A1 (en) | 2011-05-11 |
| KR20110037985A (ko) | 2011-04-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2011526876A (ja) | アンバランス磁場及び同方向回転を用いた成長シリコン結晶の融液−固体界面形状の制御方法 | |
| US10513796B2 (en) | Methods for producing low oxygen silicon ingots | |
| CN101133193B (zh) | 使用可变磁场控制生长的硅晶体的熔体-固体界面形状 | |
| CN101400834B (zh) | 硅单晶提拉装置 | |
| TWI865685B (zh) | 使用水平磁場生產矽碇之系統及方法 | |
| US5851283A (en) | Method and apparatus for production of single crystal | |
| JP6958632B2 (ja) | シリコン単結晶及びその製造方法並びにシリコンウェーハ | |
| US7282095B2 (en) | Silicon single crystal pulling method | |
| JP2688137B2 (ja) | シリコン単結晶の引上げ方法 | |
| KR100991088B1 (ko) | 커스프 자기장을 이용한 반도체 단결정 잉곳 제조장치 및제조방법 | |
| JP4951186B2 (ja) | 単結晶成長方法 | |
| WO2007013148A1 (ja) | シリコン単結晶引上装置及びその方法 | |
| JP7732403B2 (ja) | シリコン単結晶の製造方法 | |
| JP2011051805A (ja) | 単結晶シリコンの製造方法 | |
| JP2005306669A (ja) | シリコン単結晶の引上げ装置及びその方法 | |
| TW202613369A (zh) | 單晶矽成長過程之磁體升降曲線 | |
| KR20080025418A (ko) | 실리콘 단결정 인상 장치 및 그 방법 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20120619 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20120619 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20130709 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20130716 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20140107 |