JP2011518951A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2011518951A5 JP2011518951A5 JP2011506454A JP2011506454A JP2011518951A5 JP 2011518951 A5 JP2011518951 A5 JP 2011518951A5 JP 2011506454 A JP2011506454 A JP 2011506454A JP 2011506454 A JP2011506454 A JP 2011506454A JP 2011518951 A5 JP2011518951 A5 JP 2011518951A5
- Authority
- JP
- Japan
- Prior art keywords
- reactant
- reaction chamber
- precursor
- gas phase
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000376 reactant Substances 0.000 claims 47
- 238000000034 method Methods 0.000 claims 37
- 239000012071 phase Substances 0.000 claims 22
- 239000007789 gas Substances 0.000 claims 20
- 229910052714 tellurium Inorganic materials 0.000 claims 20
- 239000002243 precursor Substances 0.000 claims 18
- 229910052711 selenium Inorganic materials 0.000 claims 16
- 238000000151 deposition Methods 0.000 claims 13
- 230000008021 deposition Effects 0.000 claims 13
- 239000000758 substrate Substances 0.000 claims 13
- 239000010409 thin film Substances 0.000 claims 9
- 239000012808 vapor phase Substances 0.000 claims 7
- 125000000217 alkyl group Chemical group 0.000 claims 6
- 239000010408 film Substances 0.000 claims 6
- 125000005843 halogen group Chemical group 0.000 claims 6
- 125000004429 atom Chemical group 0.000 claims 5
- 229910052736 halogen Inorganic materials 0.000 claims 5
- 239000002356 single layer Substances 0.000 claims 5
- 238000000231 atomic layer deposition Methods 0.000 claims 4
- 239000006227 byproduct Substances 0.000 claims 3
- 125000004432 carbon atom Chemical group C* 0.000 claims 3
- 229910002909 Bi-Te Inorganic materials 0.000 claims 2
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 claims 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 2
- 150000001875 compounds Chemical class 0.000 claims 2
- 125000004435 hydrogen atom Chemical class [H]* 0.000 claims 2
- 239000002184 metal Substances 0.000 claims 2
- 229910052751 metal Inorganic materials 0.000 claims 2
- 239000000047 product Substances 0.000 claims 2
- 229910052710 silicon Inorganic materials 0.000 claims 2
- 229910017932 Cu—Sb Inorganic materials 0.000 claims 1
- 239000006096 absorbing agent Substances 0.000 claims 1
- 125000003342 alkenyl group Chemical group 0.000 claims 1
- 125000000304 alkynyl group Chemical group 0.000 claims 1
- 229910052787 antimony Inorganic materials 0.000 claims 1
- 229910052785 arsenic Inorganic materials 0.000 claims 1
- 125000003118 aryl group Chemical group 0.000 claims 1
- 229910052797 bismuth Inorganic materials 0.000 claims 1
- 229910052794 bromium Inorganic materials 0.000 claims 1
- 239000003054 catalyst Substances 0.000 claims 1
- 229910052801 chlorine Inorganic materials 0.000 claims 1
- 125000004122 cyclic group Chemical group 0.000 claims 1
- 239000002019 doping agent Substances 0.000 claims 1
- 229910052731 fluorine Inorganic materials 0.000 claims 1
- 229910052732 germanium Inorganic materials 0.000 claims 1
- 229910052737 gold Inorganic materials 0.000 claims 1
- 150000002367 halogens Chemical class 0.000 claims 1
- 229910052739 hydrogen Inorganic materials 0.000 claims 1
- 239000001257 hydrogen Substances 0.000 claims 1
- 229910052738 indium Inorganic materials 0.000 claims 1
- 229910052740 iodine Inorganic materials 0.000 claims 1
- 229910052748 manganese Inorganic materials 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 229910052757 nitrogen Inorganic materials 0.000 claims 1
- 229910052760 oxygen Inorganic materials 0.000 claims 1
- 229910052709 silver Inorganic materials 0.000 claims 1
- 239000002904 solvent Substances 0.000 claims 1
- 229910052717 sulfur Inorganic materials 0.000 claims 1
- 229910052718 tin Inorganic materials 0.000 claims 1
- 229910052725 zinc Inorganic materials 0.000 claims 1
Applications Claiming Priority (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US4807708P | 2008-04-25 | 2008-04-25 | |
| US61/048,077 | 2008-04-25 | ||
| US11212808P | 2008-11-06 | 2008-11-06 | |
| US61/112,128 | 2008-11-06 | ||
| US11789608P | 2008-11-25 | 2008-11-25 | |
| US61/117,896 | 2008-11-25 | ||
| PCT/US2009/041561 WO2009132207A2 (en) | 2008-04-25 | 2009-04-23 | Synthesis and use of precursors for ald of tellurium and selenium thin films |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011518951A JP2011518951A (ja) | 2011-06-30 |
| JP2011518951A5 true JP2011518951A5 (enExample) | 2012-06-07 |
| JP5718808B2 JP5718808B2 (ja) | 2015-05-13 |
Family
ID=41217422
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011506454A Active JP5718808B2 (ja) | 2008-04-25 | 2009-04-23 | テルルおよびセレン薄膜のaldのための前駆体の合成および使用 |
Country Status (7)
| Country | Link |
|---|---|
| US (5) | US9175390B2 (enExample) |
| EP (2) | EP2860279A1 (enExample) |
| JP (1) | JP5718808B2 (enExample) |
| KR (2) | KR101580575B1 (enExample) |
| CN (1) | CN102076882B (enExample) |
| TW (1) | TWI481739B (enExample) |
| WO (1) | WO2009132207A2 (enExample) |
Families Citing this family (43)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8318252B2 (en) * | 2008-01-28 | 2012-11-27 | Air Products And Chemicals, Inc. | Antimony precursors for GST films in ALD/CVD processes |
| JP5718808B2 (ja) | 2008-04-25 | 2015-05-13 | エーエスエム インターナショナル エヌ.ヴェー.Asm International N.V. | テルルおよびセレン薄膜のaldのための前駆体の合成および使用 |
| US8507040B2 (en) * | 2008-05-08 | 2013-08-13 | Air Products And Chemicals, Inc. | Binary and ternary metal chalcogenide materials and method of making and using same |
| US8765223B2 (en) * | 2008-05-08 | 2014-07-01 | Air Products And Chemicals, Inc. | Binary and ternary metal chalcogenide materials and method of making and using same |
| CN102046838A (zh) | 2008-05-29 | 2011-05-04 | 乔治洛德方法研究和开发液化空气有限公司 | 用于膜沉积的碲前体 |
| US8802194B2 (en) | 2008-05-29 | 2014-08-12 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | Tellurium precursors for film deposition |
| US20110180905A1 (en) * | 2008-06-10 | 2011-07-28 | Advanced Technology Materials, Inc. | GeSbTe MATERIAL INCLUDING SUPERFLOW LAYER(S), AND USE OF Ge TO PREVENT INTERACTION OF Te FROM SbXTeY AND GeXTeY RESULTING IN HIGH Te CONTENT AND FILM CRYSTALLINITY |
| US8636845B2 (en) | 2008-06-25 | 2014-01-28 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | Metal heterocyclic compounds for deposition of thin films |
| US8697486B2 (en) | 2009-04-15 | 2014-04-15 | Micro Technology, Inc. | Methods of forming phase change materials and methods of forming phase change memory circuitry |
| JP2010287615A (ja) * | 2009-06-09 | 2010-12-24 | Tokyo Electron Ltd | Ge−Sb−Te膜の成膜方法および記憶媒体 |
| KR101805211B1 (ko) | 2009-09-02 | 2017-12-05 | 레르 리키드 쏘시에떼 아노님 뿌르 레드 에렉스뿔라따시옹 데 프로세데 조르즈 클로드 | 게르마늄 함유 막 침착을 위한 디할라이드 게르마늄(ⅱ) 전구체 |
| WO2011056519A2 (en) | 2009-10-26 | 2011-05-12 | Asm International N.V. | Synthesis and use of precursors for ald of group va element containing thin films |
| WO2011095849A1 (en) | 2010-02-03 | 2011-08-11 | L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude | Chalcogenide-containing precursors, methods of making, and methods of using the same for thin film deposition |
| US8193027B2 (en) | 2010-02-23 | 2012-06-05 | Air Products And Chemicals, Inc. | Method of making a multicomponent film |
| TWI452167B (zh) * | 2011-06-09 | 2014-09-11 | Air Prod & Chem | 二元及三元金屬硫族化合物材料及其製造與使用方法 |
| US10707082B2 (en) * | 2011-07-06 | 2020-07-07 | Asm International N.V. | Methods for depositing thin films comprising indium nitride by atomic layer deposition |
| WO2013027682A1 (ja) * | 2011-08-19 | 2013-02-28 | 東京エレクトロン株式会社 | Ge-Sb-Te膜の成膜方法、Ge-Te膜の成膜方法、Sb-Te膜の成膜方法及びプログラム |
| KR101950370B1 (ko) * | 2011-09-29 | 2019-02-20 | 엘지이노텍 주식회사 | 코어-쉘 구조의 나노 열전 분말을 통한 열전 효율 향상 방법 |
| CN102605334B (zh) * | 2012-03-13 | 2014-01-01 | 宁波大学 | 一种用于全光器件的Ge-Sb-Se非晶薄膜的制备方法 |
| US9496491B2 (en) | 2012-05-21 | 2016-11-15 | Micron Technology, Inc. | Methods of forming a metal chalcogenide material and related methods of forming a memory cell |
| KR20130142518A (ko) | 2012-06-19 | 2013-12-30 | 에스케이하이닉스 주식회사 | 저항성 메모리 소자와 이를 포함하는 메모리 장치 및 데이터 처리 시스템 |
| US8741688B2 (en) | 2012-07-24 | 2014-06-03 | Micron Technology, Inc. | Methods of forming a metal chalcogenide material |
| JP5905858B2 (ja) * | 2012-08-13 | 2016-04-20 | エア プロダクツ アンド ケミカルズ インコーポレイテッドAir Products And Chemicals Incorporated | Ald/cvdプロセスにおけるgst膜のための前駆体 |
| US9428842B2 (en) | 2012-12-20 | 2016-08-30 | Asm Ip Holding B.V. | Methods for increasing growth rate during atomic layer deposition of thin films |
| US9214630B2 (en) | 2013-04-11 | 2015-12-15 | Air Products And Chemicals, Inc. | Method of making a multicomponent film |
| JP6306386B2 (ja) * | 2014-03-20 | 2018-04-04 | 株式会社日立国際電気 | 基板処理方法、基板処理装置およびプログラム |
| KR101952729B1 (ko) * | 2016-04-29 | 2019-02-27 | 세종대학교산학협력단 | 원자층 증착을 이용한 칼코겐-함유 막의 제조 방법 |
| US10062568B2 (en) * | 2016-05-13 | 2018-08-28 | Nanoco Technologies, Ltd. | Chemical vapor deposition method for fabricating two-dimensional materials |
| US10580978B2 (en) | 2017-01-08 | 2020-03-03 | Intermolecular, Inc. | Current compliance layers and memory arrays comprising thereof |
| CN107142459B (zh) * | 2017-04-19 | 2019-04-23 | 江南大学 | 一种热原子层沉积技术生长GeTe合金薄膜的方法 |
| WO2020011637A1 (en) * | 2018-07-12 | 2020-01-16 | Basf Se | Process for the generation of metal- or semimetal-containing films |
| CN109817807A (zh) * | 2018-12-26 | 2019-05-28 | 江苏理工学院 | 一种类超晶格ZnSb/SiO2纳米相变薄膜材料及其制备方法 |
| EP3947400A1 (en) * | 2019-04-02 | 2022-02-09 | Gelest, Inc. | Chalcogenosilacyclopentanes |
| US12356873B2 (en) * | 2020-05-18 | 2025-07-08 | Seoul National University R&DBFoundation | Method of forming chalcogenide-based thin film using atomic layer deposition process, method of forming phase change material layer and switching device, and method of fabricating memory device using the same |
| CN113699506B (zh) * | 2020-05-20 | 2022-08-30 | 中国科学院微电子研究所 | 一种碘化亚铜薄膜的制备方法 |
| CN113699505B (zh) * | 2020-05-20 | 2022-08-30 | 中国科学院微电子研究所 | 一种掺杂的碘化亚铜薄膜的制备方法 |
| CN111725399A (zh) * | 2020-06-24 | 2020-09-29 | 清华大学 | 一种基于氧族化合物薄膜的选通器及其制备方法 |
| CN112501583B (zh) * | 2020-11-26 | 2023-01-24 | 北京大学深圳研究生院 | 一种过渡金属二硒化物薄膜的制备方法 |
| US11716861B2 (en) | 2020-12-15 | 2023-08-01 | Micron Technology, Inc. | Electrically formed memory array using single element materials |
| CN113072915B (zh) * | 2021-03-24 | 2022-03-11 | 华中科技大学 | 基于氧掺杂的Sb2Te3相变材料、相变存储器及制备方法 |
| US12207573B2 (en) | 2021-09-15 | 2025-01-21 | International Business Machines Corporation | Phase change memory cell with superlattice based thermal barrier |
| KR20230111521A (ko) | 2022-01-18 | 2023-07-25 | 삼성전자주식회사 | GeSbTe 막을 형성하는 방법 |
| KR102819579B1 (ko) * | 2022-12-06 | 2025-06-12 | 한국화학연구원 | 신규한 저마늄 전구체, 이를 포함하는 박막증착용 조성물 및 이를 채용하는 박막의 제조방법 |
Family Cites Families (60)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0457022B1 (fr) * | 1990-05-16 | 1994-08-03 | Firmenich Sa | Alcools aliphatiques optiquement actifs nouveaux et leur utilisation à titre d'ingrédients parfumants |
| DE4214281A1 (de) | 1992-04-30 | 1993-11-04 | Consortium Elektrochem Ind | Verfahren zur herstellung von germaniumdihalogenid-ether-addukten |
| JP3361922B2 (ja) | 1994-09-13 | 2003-01-07 | 株式会社東芝 | 半導体装置 |
| JP3007971B1 (ja) | 1999-03-01 | 2000-02-14 | 東京大学長 | 単結晶薄膜の形成方法 |
| EP1266054B1 (en) * | 2000-03-07 | 2006-12-20 | Asm International N.V. | Graded thin films |
| WO2002009187A2 (en) | 2000-07-24 | 2002-01-31 | Motorola, Inc. | Heterojunction tunneling diodes and process for fabricating same |
| JP4866534B2 (ja) | 2001-02-12 | 2012-02-01 | エーエスエム アメリカ インコーポレイテッド | 半導体膜の改良された堆積方法 |
| FI109770B (fi) | 2001-03-16 | 2002-10-15 | Asm Microchemistry Oy | Menetelmä metallinitridiohutkalvojen valmistamiseksi |
| JP2002322181A (ja) | 2001-04-23 | 2002-11-08 | Sankyo Co Ltd | キノリン誘導体の製造方法 |
| JP4560245B2 (ja) * | 2001-06-29 | 2010-10-13 | キヤノン株式会社 | 光起電力素子 |
| US20030024471A1 (en) | 2001-08-06 | 2003-02-06 | Motorola, Inc. | Fabrication of semiconductor structures and devices forms by utilizing laser assisted deposition |
| US7045430B2 (en) | 2002-05-02 | 2006-05-16 | Micron Technology Inc. | Atomic layer-deposited LaAlO3 films for gate dielectrics |
| JP2006514681A (ja) * | 2002-05-20 | 2006-05-11 | コーザン バイオサイエンシス インコーポレイテッド | エポチロンdの投与方法 |
| US7115304B2 (en) | 2004-02-19 | 2006-10-03 | Nanosolar, Inc. | High throughput surface treatment on coiled flexible substrates |
| US7098150B2 (en) | 2004-03-05 | 2006-08-29 | Air Liquide America L.P. | Method for novel deposition of high-k MSiON dielectric films |
| US7670758B2 (en) | 2004-04-15 | 2010-03-02 | Api Nanofabrication And Research Corporation | Optical films and methods of making the same |
| US20050252449A1 (en) | 2004-05-12 | 2005-11-17 | Nguyen Son T | Control of gas flow and delivery to suppress the formation of particles in an MOCVD/ALD system |
| KR100585175B1 (ko) * | 2005-01-31 | 2006-05-30 | 삼성전자주식회사 | 화학 기상 증착법에 의한 GeSbTe 박막의 제조방법 |
| KR100688532B1 (ko) * | 2005-02-14 | 2007-03-02 | 삼성전자주식회사 | 텔루르 전구체, 이를 이용하여 제조된 Te-함유 칼코게나이드(chalcogenide) 박막, 상기 박막의 제조방법 및 상변화 메모리 소자 |
| JP4994599B2 (ja) | 2005-03-23 | 2012-08-08 | Hoya株式会社 | InP微粒子の製造方法およびその方法で得られたInP微粒子分散液 |
| WO2007000186A1 (en) | 2005-06-29 | 2007-01-04 | L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude | Deposition method of ternary films |
| DE102006038885B4 (de) | 2005-08-24 | 2013-10-10 | Wonik Ips Co., Ltd. | Verfahren zum Abscheiden einer Ge-Sb-Te-Dünnschicht |
| KR100962623B1 (ko) | 2005-09-03 | 2010-06-11 | 삼성전자주식회사 | 상변화 물질층 형성 방법, 이를 이용한 상변화 메모리 유닛및 상변화 메모리 장치의 제조 방법 |
| KR101216381B1 (ko) | 2005-12-21 | 2012-12-28 | 주성엔지니어링(주) | 박막 형성 방법 |
| KR100695168B1 (ko) | 2006-01-10 | 2007-03-14 | 삼성전자주식회사 | 상변화 물질 박막의 형성방법, 이를 이용한 상변화 메모리소자의 제조방법 |
| US20070249086A1 (en) * | 2006-04-19 | 2007-10-25 | Philipp Jan B | Phase change memory |
| DE102006020404A1 (de) | 2006-05-03 | 2007-11-08 | Cognis Ip Management Gmbh | Verdickungsmittel |
| US8288198B2 (en) | 2006-05-12 | 2012-10-16 | Advanced Technology Materials, Inc. | Low temperature deposition of phase change memory materials |
| KR100782482B1 (ko) | 2006-05-19 | 2007-12-05 | 삼성전자주식회사 | GeBiTe막을 상변화 물질막으로 채택하는 상변화 기억 셀, 이를 구비하는 상변화 기억소자, 이를 구비하는 전자 장치 및 그 제조방법 |
| KR100807223B1 (ko) * | 2006-07-12 | 2008-02-28 | 삼성전자주식회사 | 상변화 물질층, 상변화 물질층 형성 방법 및 이를 이용한상변화 메모리 장치의 제조 방법 |
| US7531458B2 (en) * | 2006-07-31 | 2009-05-12 | Rohm And Haas Electronics Materials Llp | Organometallic compounds |
| US20080074652A1 (en) | 2006-09-15 | 2008-03-27 | Fouquet Julie E | Retroreflector-based system and method for detecting intrusion into a restricted area |
| KR100858083B1 (ko) | 2006-10-18 | 2008-09-10 | 삼성전자주식회사 | 하부전극 콘택층과 상변화층 사이에 넓은 접촉면적을 갖는상변화 메모리 소자 및 그 제조 방법 |
| KR100829602B1 (ko) | 2006-10-20 | 2008-05-14 | 삼성전자주식회사 | 상변화 물질층 형성 방법 및 상변화 메모리 장치의 제조방법 |
| KR101263822B1 (ko) * | 2006-10-20 | 2013-05-13 | 삼성전자주식회사 | 상변화 메모리 소자의 제조 방법 및 이에 적용된상변화층의 형성방법 |
| JP5320295B2 (ja) * | 2006-11-02 | 2013-10-23 | アドバンスド テクノロジー マテリアルズ,インコーポレイテッド | 金属薄膜のcvd/aldに有用なアンチモンおよびゲルマニウム錯体 |
| US8377341B2 (en) | 2007-04-24 | 2013-02-19 | Air Products And Chemicals, Inc. | Tellurium (Te) precursors for making phase change memory materials |
| KR20100084157A (ko) * | 2007-09-17 | 2010-07-23 | 레르 리키드 쏘시에떼 아노님 뿌르 레드 에렉스뿔라따시옹 데 프로세데 조르즈 클로드 | Gst 필름 증착용 텔루륨 전구체 |
| US7772073B2 (en) | 2007-09-28 | 2010-08-10 | Tokyo Electron Limited | Semiconductor device containing a buried threshold voltage adjustment layer and method of forming |
| JP5650880B2 (ja) | 2007-10-31 | 2015-01-07 | アドバンスド テクノロジー マテリアルズ,インコーポレイテッド | 非晶質Ge/Te蒸着方法 |
| US7960205B2 (en) * | 2007-11-27 | 2011-06-14 | Air Products And Chemicals, Inc. | Tellurium precursors for GST films in an ALD or CVD process |
| US8318252B2 (en) | 2008-01-28 | 2012-11-27 | Air Products And Chemicals, Inc. | Antimony precursors for GST films in ALD/CVD processes |
| US20130210217A1 (en) * | 2008-01-28 | 2013-08-15 | Air Products And Chemicals, Inc. | Precursors for GST Films in ALD/CVD Processes |
| US20090215225A1 (en) | 2008-02-24 | 2009-08-27 | Advanced Technology Materials, Inc. | Tellurium compounds useful for deposition of tellurium containing materials |
| US7659158B2 (en) | 2008-03-31 | 2010-02-09 | Applied Materials, Inc. | Atomic layer deposition processes for non-volatile memory devices |
| US8193388B2 (en) * | 2008-04-15 | 2012-06-05 | American Air Liquide, Inc. | Compounds for depositing tellurium-containing films |
| JP5718808B2 (ja) | 2008-04-25 | 2015-05-13 | エーエスエム インターナショナル エヌ.ヴェー.Asm International N.V. | テルルおよびセレン薄膜のaldのための前駆体の合成および使用 |
| US8765223B2 (en) | 2008-05-08 | 2014-07-01 | Air Products And Chemicals, Inc. | Binary and ternary metal chalcogenide materials and method of making and using same |
| US8507040B2 (en) * | 2008-05-08 | 2013-08-13 | Air Products And Chemicals, Inc. | Binary and ternary metal chalcogenide materials and method of making and using same |
| US8357435B2 (en) | 2008-05-09 | 2013-01-22 | Applied Materials, Inc. | Flowable dielectric equipment and processes |
| US8802194B2 (en) | 2008-05-29 | 2014-08-12 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | Tellurium precursors for film deposition |
| US8372483B2 (en) * | 2008-06-27 | 2013-02-12 | Asm International N.V. | Methods for forming thin films comprising tellurium |
| US8674142B2 (en) | 2009-03-12 | 2014-03-18 | Pmc Organometallix, Inc. | Naphthenic hydrocarbon additives for diaryl phosphide salt formation |
| WO2011056519A2 (en) | 2009-10-26 | 2011-05-12 | Asm International N.V. | Synthesis and use of precursors for ald of group va element containing thin films |
| US8148197B2 (en) | 2010-07-27 | 2012-04-03 | Micron Technology, Inc. | Methods of forming germanium-antimony-tellurium materials and a method of forming a semiconductor device structure including the same |
| TWI452167B (zh) | 2011-06-09 | 2014-09-11 | Air Prod & Chem | 二元及三元金屬硫族化合物材料及其製造與使用方法 |
| US9496491B2 (en) | 2012-05-21 | 2016-11-15 | Micron Technology, Inc. | Methods of forming a metal chalcogenide material and related methods of forming a memory cell |
| US9543144B2 (en) | 2014-12-31 | 2017-01-10 | L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude | Vapor deposition of chalcogenide-containing films |
| US9711396B2 (en) | 2015-06-16 | 2017-07-18 | Asm Ip Holding B.V. | Method for forming metal chalcogenide thin films on a semiconductor device |
| US20190006586A1 (en) | 2017-06-29 | 2019-01-03 | Asm Ip Holding B.V. | Chalcogenide films for selector devices |
-
2009
- 2009-04-23 JP JP2011506454A patent/JP5718808B2/ja active Active
- 2009-04-23 EP EP15150242.4A patent/EP2860279A1/en active Pending
- 2009-04-23 CN CN2009801243328A patent/CN102076882B/zh active Active
- 2009-04-23 US US12/429,133 patent/US9175390B2/en active Active
- 2009-04-23 KR KR1020107026375A patent/KR101580575B1/ko active Active
- 2009-04-23 EP EP09735227.2A patent/EP2279285B1/en active Active
- 2009-04-23 KR KR1020157026510A patent/KR101604864B1/ko active Active
- 2009-04-23 WO PCT/US2009/041561 patent/WO2009132207A2/en not_active Ceased
- 2009-04-24 TW TW098113682A patent/TWI481739B/zh active
-
2015
- 2015-10-13 US US14/882,083 patent/US9783563B2/en active Active
-
2017
- 2017-09-21 US US15/711,690 patent/US10308673B2/en active Active
-
2019
- 2019-05-08 US US16/406,532 patent/US11072622B2/en active Active
-
2021
- 2021-07-23 US US17/383,825 patent/US11814400B2/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2011518951A5 (enExample) | ||
| EP2130942B1 (en) | Method for making binary and ternary metal chalcogenide materials | |
| EP2532767B1 (en) | Process for making a ternary metal chalcogenide film, | |
| JP2013508555A5 (enExample) | ||
| CN101367756B (zh) | 用于制造相变存储器材料的碲(Te)前驱体 | |
| US8507040B2 (en) | Binary and ternary metal chalcogenide materials and method of making and using same | |
| JP5350819B2 (ja) | ゲルマニウム−アンチモン−テルル合金膜を製造するための原子層堆積(ald)方法 | |
| KR100618879B1 (ko) | 게르마늄 전구체, 이를 이용하여 형성된 gst 박막,상기 박막의 제조 방법 및 상변화 메모리 소자 | |
| KR100688532B1 (ko) | 텔루르 전구체, 이를 이용하여 제조된 Te-함유 칼코게나이드(chalcogenide) 박막, 상기 박막의 제조방법 및 상변화 메모리 소자 | |
| CN102076882B (zh) | 用于碲和硒薄膜的ald的前体的合成和应用 | |
| US8454928B2 (en) | Tellurium precursors for GST deposition | |
| JP2008311664A5 (enExample) | ||
| JP6251300B2 (ja) | Ald/cvdプロセスにおけるgst膜のための前駆体 | |
| EP2444407A1 (en) | Metal compounds for deposition of chalcogenide films at low temperature | |
| CN104447839A (zh) | 一种氨基吡啶基硅化合物及其应用 |