JP2011518951A5 - - Google Patents

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JP2011518951A5
JP2011518951A5 JP2011506454A JP2011506454A JP2011518951A5 JP 2011518951 A5 JP2011518951 A5 JP 2011518951A5 JP 2011506454 A JP2011506454 A JP 2011506454A JP 2011506454 A JP2011506454 A JP 2011506454A JP 2011518951 A5 JP2011518951 A5 JP 2011518951A5
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reaction chamber
precursor
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substrate
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JP2011506454A 2008-04-25 2009-04-23 テルルおよびセレン薄膜のaldのための前駆体の合成および使用 Active JP5718808B2 (ja)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US4807708P 2008-04-25 2008-04-25
US61/048,077 2008-04-25
US11212808P 2008-11-06 2008-11-06
US61/112,128 2008-11-06
US11789608P 2008-11-25 2008-11-25
US61/117,896 2008-11-25
PCT/US2009/041561 WO2009132207A2 (en) 2008-04-25 2009-04-23 Synthesis and use of precursors for ald of tellurium and selenium thin films

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JP2011518951A JP2011518951A (ja) 2011-06-30
JP2011518951A5 true JP2011518951A5 (enExample) 2012-06-07
JP5718808B2 JP5718808B2 (ja) 2015-05-13

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US (5) US9175390B2 (enExample)
EP (2) EP2860279A1 (enExample)
JP (1) JP5718808B2 (enExample)
KR (2) KR101580575B1 (enExample)
CN (1) CN102076882B (enExample)
TW (1) TWI481739B (enExample)
WO (1) WO2009132207A2 (enExample)

Families Citing this family (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8318252B2 (en) * 2008-01-28 2012-11-27 Air Products And Chemicals, Inc. Antimony precursors for GST films in ALD/CVD processes
JP5718808B2 (ja) 2008-04-25 2015-05-13 エーエスエム インターナショナル エヌ.ヴェー.Asm International N.V. テルルおよびセレン薄膜のaldのための前駆体の合成および使用
US8507040B2 (en) * 2008-05-08 2013-08-13 Air Products And Chemicals, Inc. Binary and ternary metal chalcogenide materials and method of making and using same
US8765223B2 (en) * 2008-05-08 2014-07-01 Air Products And Chemicals, Inc. Binary and ternary metal chalcogenide materials and method of making and using same
CN102046838A (zh) 2008-05-29 2011-05-04 乔治洛德方法研究和开发液化空气有限公司 用于膜沉积的碲前体
US8802194B2 (en) 2008-05-29 2014-08-12 L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude Tellurium precursors for film deposition
US20110180905A1 (en) * 2008-06-10 2011-07-28 Advanced Technology Materials, Inc. GeSbTe MATERIAL INCLUDING SUPERFLOW LAYER(S), AND USE OF Ge TO PREVENT INTERACTION OF Te FROM SbXTeY AND GeXTeY RESULTING IN HIGH Te CONTENT AND FILM CRYSTALLINITY
US8636845B2 (en) 2008-06-25 2014-01-28 L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude Metal heterocyclic compounds for deposition of thin films
US8697486B2 (en) 2009-04-15 2014-04-15 Micro Technology, Inc. Methods of forming phase change materials and methods of forming phase change memory circuitry
JP2010287615A (ja) * 2009-06-09 2010-12-24 Tokyo Electron Ltd Ge−Sb−Te膜の成膜方法および記憶媒体
KR101805211B1 (ko) 2009-09-02 2017-12-05 레르 리키드 쏘시에떼 아노님 뿌르 레드 에렉스뿔라따시옹 데 프로세데 조르즈 클로드 게르마늄 함유 막 침착을 위한 디할라이드 게르마늄(ⅱ) 전구체
WO2011056519A2 (en) 2009-10-26 2011-05-12 Asm International N.V. Synthesis and use of precursors for ald of group va element containing thin films
WO2011095849A1 (en) 2010-02-03 2011-08-11 L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude Chalcogenide-containing precursors, methods of making, and methods of using the same for thin film deposition
US8193027B2 (en) 2010-02-23 2012-06-05 Air Products And Chemicals, Inc. Method of making a multicomponent film
TWI452167B (zh) * 2011-06-09 2014-09-11 Air Prod & Chem 二元及三元金屬硫族化合物材料及其製造與使用方法
US10707082B2 (en) * 2011-07-06 2020-07-07 Asm International N.V. Methods for depositing thin films comprising indium nitride by atomic layer deposition
WO2013027682A1 (ja) * 2011-08-19 2013-02-28 東京エレクトロン株式会社 Ge-Sb-Te膜の成膜方法、Ge-Te膜の成膜方法、Sb-Te膜の成膜方法及びプログラム
KR101950370B1 (ko) * 2011-09-29 2019-02-20 엘지이노텍 주식회사 코어-쉘 구조의 나노 열전 분말을 통한 열전 효율 향상 방법
CN102605334B (zh) * 2012-03-13 2014-01-01 宁波大学 一种用于全光器件的Ge-Sb-Se非晶薄膜的制备方法
US9496491B2 (en) 2012-05-21 2016-11-15 Micron Technology, Inc. Methods of forming a metal chalcogenide material and related methods of forming a memory cell
KR20130142518A (ko) 2012-06-19 2013-12-30 에스케이하이닉스 주식회사 저항성 메모리 소자와 이를 포함하는 메모리 장치 및 데이터 처리 시스템
US8741688B2 (en) 2012-07-24 2014-06-03 Micron Technology, Inc. Methods of forming a metal chalcogenide material
JP5905858B2 (ja) * 2012-08-13 2016-04-20 エア プロダクツ アンド ケミカルズ インコーポレイテッドAir Products And Chemicals Incorporated Ald/cvdプロセスにおけるgst膜のための前駆体
US9428842B2 (en) 2012-12-20 2016-08-30 Asm Ip Holding B.V. Methods for increasing growth rate during atomic layer deposition of thin films
US9214630B2 (en) 2013-04-11 2015-12-15 Air Products And Chemicals, Inc. Method of making a multicomponent film
JP6306386B2 (ja) * 2014-03-20 2018-04-04 株式会社日立国際電気 基板処理方法、基板処理装置およびプログラム
KR101952729B1 (ko) * 2016-04-29 2019-02-27 세종대학교산학협력단 원자층 증착을 이용한 칼코겐-함유 막의 제조 방법
US10062568B2 (en) * 2016-05-13 2018-08-28 Nanoco Technologies, Ltd. Chemical vapor deposition method for fabricating two-dimensional materials
US10580978B2 (en) 2017-01-08 2020-03-03 Intermolecular, Inc. Current compliance layers and memory arrays comprising thereof
CN107142459B (zh) * 2017-04-19 2019-04-23 江南大学 一种热原子层沉积技术生长GeTe合金薄膜的方法
WO2020011637A1 (en) * 2018-07-12 2020-01-16 Basf Se Process for the generation of metal- or semimetal-containing films
CN109817807A (zh) * 2018-12-26 2019-05-28 江苏理工学院 一种类超晶格ZnSb/SiO2纳米相变薄膜材料及其制备方法
EP3947400A1 (en) * 2019-04-02 2022-02-09 Gelest, Inc. Chalcogenosilacyclopentanes
US12356873B2 (en) * 2020-05-18 2025-07-08 Seoul National University R&DBFoundation Method of forming chalcogenide-based thin film using atomic layer deposition process, method of forming phase change material layer and switching device, and method of fabricating memory device using the same
CN113699506B (zh) * 2020-05-20 2022-08-30 中国科学院微电子研究所 一种碘化亚铜薄膜的制备方法
CN113699505B (zh) * 2020-05-20 2022-08-30 中国科学院微电子研究所 一种掺杂的碘化亚铜薄膜的制备方法
CN111725399A (zh) * 2020-06-24 2020-09-29 清华大学 一种基于氧族化合物薄膜的选通器及其制备方法
CN112501583B (zh) * 2020-11-26 2023-01-24 北京大学深圳研究生院 一种过渡金属二硒化物薄膜的制备方法
US11716861B2 (en) 2020-12-15 2023-08-01 Micron Technology, Inc. Electrically formed memory array using single element materials
CN113072915B (zh) * 2021-03-24 2022-03-11 华中科技大学 基于氧掺杂的Sb2Te3相变材料、相变存储器及制备方法
US12207573B2 (en) 2021-09-15 2025-01-21 International Business Machines Corporation Phase change memory cell with superlattice based thermal barrier
KR20230111521A (ko) 2022-01-18 2023-07-25 삼성전자주식회사 GeSbTe 막을 형성하는 방법
KR102819579B1 (ko) * 2022-12-06 2025-06-12 한국화학연구원 신규한 저마늄 전구체, 이를 포함하는 박막증착용 조성물 및 이를 채용하는 박막의 제조방법

Family Cites Families (60)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0457022B1 (fr) * 1990-05-16 1994-08-03 Firmenich Sa Alcools aliphatiques optiquement actifs nouveaux et leur utilisation à titre d'ingrédients parfumants
DE4214281A1 (de) 1992-04-30 1993-11-04 Consortium Elektrochem Ind Verfahren zur herstellung von germaniumdihalogenid-ether-addukten
JP3361922B2 (ja) 1994-09-13 2003-01-07 株式会社東芝 半導体装置
JP3007971B1 (ja) 1999-03-01 2000-02-14 東京大学長 単結晶薄膜の形成方法
EP1266054B1 (en) * 2000-03-07 2006-12-20 Asm International N.V. Graded thin films
WO2002009187A2 (en) 2000-07-24 2002-01-31 Motorola, Inc. Heterojunction tunneling diodes and process for fabricating same
JP4866534B2 (ja) 2001-02-12 2012-02-01 エーエスエム アメリカ インコーポレイテッド 半導体膜の改良された堆積方法
FI109770B (fi) 2001-03-16 2002-10-15 Asm Microchemistry Oy Menetelmä metallinitridiohutkalvojen valmistamiseksi
JP2002322181A (ja) 2001-04-23 2002-11-08 Sankyo Co Ltd キノリン誘導体の製造方法
JP4560245B2 (ja) * 2001-06-29 2010-10-13 キヤノン株式会社 光起電力素子
US20030024471A1 (en) 2001-08-06 2003-02-06 Motorola, Inc. Fabrication of semiconductor structures and devices forms by utilizing laser assisted deposition
US7045430B2 (en) 2002-05-02 2006-05-16 Micron Technology Inc. Atomic layer-deposited LaAlO3 films for gate dielectrics
JP2006514681A (ja) * 2002-05-20 2006-05-11 コーザン バイオサイエンシス インコーポレイテッド エポチロンdの投与方法
US7115304B2 (en) 2004-02-19 2006-10-03 Nanosolar, Inc. High throughput surface treatment on coiled flexible substrates
US7098150B2 (en) 2004-03-05 2006-08-29 Air Liquide America L.P. Method for novel deposition of high-k MSiON dielectric films
US7670758B2 (en) 2004-04-15 2010-03-02 Api Nanofabrication And Research Corporation Optical films and methods of making the same
US20050252449A1 (en) 2004-05-12 2005-11-17 Nguyen Son T Control of gas flow and delivery to suppress the formation of particles in an MOCVD/ALD system
KR100585175B1 (ko) * 2005-01-31 2006-05-30 삼성전자주식회사 화학 기상 증착법에 의한 GeSbTe 박막의 제조방법
KR100688532B1 (ko) * 2005-02-14 2007-03-02 삼성전자주식회사 텔루르 전구체, 이를 이용하여 제조된 Te-함유 칼코게나이드(chalcogenide) 박막, 상기 박막의 제조방법 및 상변화 메모리 소자
JP4994599B2 (ja) 2005-03-23 2012-08-08 Hoya株式会社 InP微粒子の製造方法およびその方法で得られたInP微粒子分散液
WO2007000186A1 (en) 2005-06-29 2007-01-04 L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude Deposition method of ternary films
DE102006038885B4 (de) 2005-08-24 2013-10-10 Wonik Ips Co., Ltd. Verfahren zum Abscheiden einer Ge-Sb-Te-Dünnschicht
KR100962623B1 (ko) 2005-09-03 2010-06-11 삼성전자주식회사 상변화 물질층 형성 방법, 이를 이용한 상변화 메모리 유닛및 상변화 메모리 장치의 제조 방법
KR101216381B1 (ko) 2005-12-21 2012-12-28 주성엔지니어링(주) 박막 형성 방법
KR100695168B1 (ko) 2006-01-10 2007-03-14 삼성전자주식회사 상변화 물질 박막의 형성방법, 이를 이용한 상변화 메모리소자의 제조방법
US20070249086A1 (en) * 2006-04-19 2007-10-25 Philipp Jan B Phase change memory
DE102006020404A1 (de) 2006-05-03 2007-11-08 Cognis Ip Management Gmbh Verdickungsmittel
US8288198B2 (en) 2006-05-12 2012-10-16 Advanced Technology Materials, Inc. Low temperature deposition of phase change memory materials
KR100782482B1 (ko) 2006-05-19 2007-12-05 삼성전자주식회사 GeBiTe막을 상변화 물질막으로 채택하는 상변화 기억 셀, 이를 구비하는 상변화 기억소자, 이를 구비하는 전자 장치 및 그 제조방법
KR100807223B1 (ko) * 2006-07-12 2008-02-28 삼성전자주식회사 상변화 물질층, 상변화 물질층 형성 방법 및 이를 이용한상변화 메모리 장치의 제조 방법
US7531458B2 (en) * 2006-07-31 2009-05-12 Rohm And Haas Electronics Materials Llp Organometallic compounds
US20080074652A1 (en) 2006-09-15 2008-03-27 Fouquet Julie E Retroreflector-based system and method for detecting intrusion into a restricted area
KR100858083B1 (ko) 2006-10-18 2008-09-10 삼성전자주식회사 하부전극 콘택층과 상변화층 사이에 넓은 접촉면적을 갖는상변화 메모리 소자 및 그 제조 방법
KR100829602B1 (ko) 2006-10-20 2008-05-14 삼성전자주식회사 상변화 물질층 형성 방법 및 상변화 메모리 장치의 제조방법
KR101263822B1 (ko) * 2006-10-20 2013-05-13 삼성전자주식회사 상변화 메모리 소자의 제조 방법 및 이에 적용된상변화층의 형성방법
JP5320295B2 (ja) * 2006-11-02 2013-10-23 アドバンスド テクノロジー マテリアルズ,インコーポレイテッド 金属薄膜のcvd/aldに有用なアンチモンおよびゲルマニウム錯体
US8377341B2 (en) 2007-04-24 2013-02-19 Air Products And Chemicals, Inc. Tellurium (Te) precursors for making phase change memory materials
KR20100084157A (ko) * 2007-09-17 2010-07-23 레르 리키드 쏘시에떼 아노님 뿌르 레드 에렉스뿔라따시옹 데 프로세데 조르즈 클로드 Gst 필름 증착용 텔루륨 전구체
US7772073B2 (en) 2007-09-28 2010-08-10 Tokyo Electron Limited Semiconductor device containing a buried threshold voltage adjustment layer and method of forming
JP5650880B2 (ja) 2007-10-31 2015-01-07 アドバンスド テクノロジー マテリアルズ,インコーポレイテッド 非晶質Ge/Te蒸着方法
US7960205B2 (en) * 2007-11-27 2011-06-14 Air Products And Chemicals, Inc. Tellurium precursors for GST films in an ALD or CVD process
US8318252B2 (en) 2008-01-28 2012-11-27 Air Products And Chemicals, Inc. Antimony precursors for GST films in ALD/CVD processes
US20130210217A1 (en) * 2008-01-28 2013-08-15 Air Products And Chemicals, Inc. Precursors for GST Films in ALD/CVD Processes
US20090215225A1 (en) 2008-02-24 2009-08-27 Advanced Technology Materials, Inc. Tellurium compounds useful for deposition of tellurium containing materials
US7659158B2 (en) 2008-03-31 2010-02-09 Applied Materials, Inc. Atomic layer deposition processes for non-volatile memory devices
US8193388B2 (en) * 2008-04-15 2012-06-05 American Air Liquide, Inc. Compounds for depositing tellurium-containing films
JP5718808B2 (ja) 2008-04-25 2015-05-13 エーエスエム インターナショナル エヌ.ヴェー.Asm International N.V. テルルおよびセレン薄膜のaldのための前駆体の合成および使用
US8765223B2 (en) 2008-05-08 2014-07-01 Air Products And Chemicals, Inc. Binary and ternary metal chalcogenide materials and method of making and using same
US8507040B2 (en) * 2008-05-08 2013-08-13 Air Products And Chemicals, Inc. Binary and ternary metal chalcogenide materials and method of making and using same
US8357435B2 (en) 2008-05-09 2013-01-22 Applied Materials, Inc. Flowable dielectric equipment and processes
US8802194B2 (en) 2008-05-29 2014-08-12 L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude Tellurium precursors for film deposition
US8372483B2 (en) * 2008-06-27 2013-02-12 Asm International N.V. Methods for forming thin films comprising tellurium
US8674142B2 (en) 2009-03-12 2014-03-18 Pmc Organometallix, Inc. Naphthenic hydrocarbon additives for diaryl phosphide salt formation
WO2011056519A2 (en) 2009-10-26 2011-05-12 Asm International N.V. Synthesis and use of precursors for ald of group va element containing thin films
US8148197B2 (en) 2010-07-27 2012-04-03 Micron Technology, Inc. Methods of forming germanium-antimony-tellurium materials and a method of forming a semiconductor device structure including the same
TWI452167B (zh) 2011-06-09 2014-09-11 Air Prod & Chem 二元及三元金屬硫族化合物材料及其製造與使用方法
US9496491B2 (en) 2012-05-21 2016-11-15 Micron Technology, Inc. Methods of forming a metal chalcogenide material and related methods of forming a memory cell
US9543144B2 (en) 2014-12-31 2017-01-10 L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude Vapor deposition of chalcogenide-containing films
US9711396B2 (en) 2015-06-16 2017-07-18 Asm Ip Holding B.V. Method for forming metal chalcogenide thin films on a semiconductor device
US20190006586A1 (en) 2017-06-29 2019-01-03 Asm Ip Holding B.V. Chalcogenide films for selector devices

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