JP2011238217A - メモリ中のプログラム・フェイルを示すための信号線 - Google Patents
メモリ中のプログラム・フェイルを示すための信号線 Download PDFInfo
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- JP2011238217A JP2011238217A JP2011093507A JP2011093507A JP2011238217A JP 2011238217 A JP2011238217 A JP 2011238217A JP 2011093507 A JP2011093507 A JP 2011093507A JP 2011093507 A JP2011093507 A JP 2011093507A JP 2011238217 A JP2011238217 A JP 2011238217A
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- memory
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1048—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0004—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising amorphous/crystalline phase transition cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0021—Auxiliary circuits
- G11C13/0064—Verifying circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0021—Auxiliary circuits
- G11C13/0069—Writing or programming circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/02—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using elements whose operation depends upon chemical change
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/38—Response verification devices
- G11C29/42—Response verification devices using error correcting codes [ECC] or parity check
Abstract
【解決手段】メモリ・システム100は、読取りプログラム・コマンド等の命令および情報を外部ホストから受け取り、コントローラ150またはプロセッサ160により提供される情報を記憶するためのNVMデバイス110を有する。NVMデバイス110は、不揮発性メモリ・セルのアレイと直前の待ち状態のプログラム動作のパスをモニタするための書込み状態マシン115とを備える。
【選択図】図1
Description
Claims (20)
- 1つまたは複数のメモリ・アレイの待ち状態のプログラム動作を示すための第1の信号を維持するステップと、
前記待ち状態のプログラム動作中、前記1つまたは複数のメモリ・アレイの少なくとも1つについてプログラム-フェイル・イベントを判定するステップと、
前記プログラム動作が失敗であったことを示すための電子信号を生成するステップと、
を含む方法。 - 前記プログラム動作が失敗であったことを示すための前記電子信号を生成する前記ステップの後、前記第1の信号を、前記1つまたは複数のメモリ・アレイの前記プログラム動作の終了を示すように遷移させるステップ
を更に含む請求項1に記載の方法。 - 前記1つまたは複数のメモリ・アレイが、相変化メモリ(PCM)を含む、
請求項1に記載の方法。 - 前記失敗の動作に応じて、前記1つまたは複数のメモリ・アレイのうちどのメモリ・アレイが前記プログラム-フェイル・イベントを引き起こしたかを判定するステップ
を更に含む請求項1に記載の方法。 - 前記プログラム動作が失敗であったことを示すための前記電子信号を生成する前記ステップの前に、前記プログラム-フェイル・イベントを発生させた1つまたは複数の誤りの訂正を試みるために、誤り訂正符号(ECC)を適用するステップ
を更に含む請求項1に記載の方法。 - 1つまたは複数のメモリ・アレイと、
書込み動作が待ち状態であるかどうかを示すためのレディ-ビジー(R/B)信号を運ぶためのレディ-ビジー(R/B)信号線、および、前記待ち状態の書込み動作が前記1つまたは複数のメモリ・アレイの少なくとも一部分への情報の書込みを失敗したかどうかを示すためのフェイル信号を運ぶためのフェイル信号線と、
を備えるメモリ・デバイス。 - 前記R/B信号線および前記フェイル信号線が、前記1つまたは複数のメモリ・アレイに接続される、
請求項6に記載のメモリ・デバイス。 - 前記R/B信号および前記フェイル信号を、それぞれ前記R/B信号線および前記フェイル信号線から受け取るためのメモリ・コントローラを更に備える、
請求項6に記載のメモリ・デバイス。 - 前記R/B信号および前記フェイル信号を、それぞれ前記R/B信号線および前記フェイル信号線から受け取るためのプロセッサを更に備える、
請求項6に記載のメモリ・デバイス。 - 前記1つまたは複数のメモリ・アレイと関連し、前記フェイル信号を生成する状態マシンを更に備える、
請求項6に記載のメモリ・デバイス。 - 前記1つまたは複数のメモリ・アレイが、相変化メモリ(PCM)を含む、
請求項6に記載のメモリ・デバイス。 - 前記フェイル信号が生成される前に、1つまたは複数の書込み誤りの訂正を試みるための誤り訂正符号(ECC)部分を更に備える、
請求項6に記載のメモリ・デバイス。 - 前記R/B信号および前記フェイル信号が、オープン-ドレイン信号を含む、
請求項6に記載のメモリ・デバイス。 - 前記1つまたは複数のメモリ・アレイが、前記書込み動作のために前記1つまたは複数のメモリ・アレイを選択するための共通のチップ選択線を有するグループに配置される、
請求項6に記載のメモリ・デバイス。 - メモリ・デバイスであって、
1つまたは複数のメモリ・アレイ、ならびに
書込み動作が待ち状態であるかどうかを示すためのR/B信号を運ぶためのレディ-ビジー(R/B)信号線、および、前記待ち状態の書込み動作が前記1つまたは複数のメモリ・アレイの少なくとも一部分への情報の書込みを失敗したかどうかを示すためのフェイル信号を運ぶためのフェイル信号線
を備えるメモリ・デバイスと、
前記R/B信号および前記フェイル信号を受け取るためのメモリ・コントローラと、
1つまたは複数のアプリケーションのホストをつとめるとともに前記書込み動作を開始するためのプロセッサと、
を備えるシステム。 - 前記プロセッサが、前記メモリ・コントローラと並行して、前記R/B信号および前記フェイル信号を受け取る、
請求項15に記載のシステム。 - 前記1つまたは複数のメモリ・アレイと関連し、前記フェイル信号を生成する状態マシンを更に備える、
請求項15に記載のシステム。 - 前記フェイル信号が生成される前に、1つまたは複数の書込み誤りの訂正を試みるための誤り訂正符号(ECC)部分を更に備える、
請求項15に記載のシステム。 - 前記1つまたは複数のメモリ・アレイが、相変化メモリ(PCM)を含む、
請求項15に記載のシステム。 - 前記1つまたは複数のメモリ・アレイが、前記書込み動作のために前記1つまたは複数のメモリ・アレイを選択するための共通のチップ選択線を有するグループに配置される、
請求項15に記載のシステム。
Applications Claiming Priority (2)
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US12/770,599 | 2010-04-29 | ||
US12/770,599 US8683270B2 (en) | 2010-04-29 | 2010-04-29 | Signal line to indicate program-fail in memory |
Publications (2)
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JP2011238217A true JP2011238217A (ja) | 2011-11-24 |
JP5376344B2 JP5376344B2 (ja) | 2013-12-25 |
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JP2011093507A Active JP5376344B2 (ja) | 2010-04-29 | 2011-04-19 | メモリ中のプログラム・フェイルを示すための信号線 |
Country Status (6)
Country | Link |
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US (1) | US8683270B2 (ja) |
JP (1) | JP5376344B2 (ja) |
KR (1) | KR101274413B1 (ja) |
CN (1) | CN102324251B (ja) |
DE (1) | DE102011017634B4 (ja) |
TW (1) | TWI493558B (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8880778B2 (en) * | 2010-05-13 | 2014-11-04 | Micron Technology, Inc. | Memory buffer having accessible information after a program-fail |
CN104025198B (zh) * | 2011-12-30 | 2017-06-13 | 英特尔公司 | 相变存储器与开关(pcms)写错误检测 |
KR20160032910A (ko) | 2014-09-17 | 2016-03-25 | 에스케이하이닉스 주식회사 | 메모리 시스템 및 메모리 시스템의 동작 방법 |
FR3041806B1 (fr) | 2015-09-25 | 2017-10-20 | Stmicroelectronics Rousset | Dispositif de memoire non volatile, par exemple du type eeprom, ayant une capacite memoire importante, par exemple 16mbits |
TWI585769B (zh) * | 2015-10-23 | 2017-06-01 | 慧榮科技股份有限公司 | 資料儲存裝置以及快閃記憶體之偵測方法 |
US20230030168A1 (en) * | 2021-07-27 | 2023-02-02 | Dell Products L.P. | Protection of i/o paths against network partitioning and component failures in nvme-of environments |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002197898A (ja) * | 2000-12-04 | 2002-07-12 | Samsung Electronics Co Ltd | 不揮発性半導体メモリ装置及びそれのフェイルビット数検出方法 |
JP2006012367A (ja) * | 2004-06-29 | 2006-01-12 | Toshiba Corp | 不揮発性半導体記憶装置 |
JP2006048783A (ja) * | 2004-08-02 | 2006-02-16 | Renesas Technology Corp | 不揮発性メモリおよびメモリカード |
JP2006079695A (ja) * | 2004-09-08 | 2006-03-23 | Toshiba Corp | 不揮発性半導体記憶装置 |
JP2010040144A (ja) * | 2008-08-07 | 2010-02-18 | Toshiba Corp | 不揮発性半導体記憶システム |
Family Cites Families (43)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0823859B2 (ja) * | 1990-09-28 | 1996-03-06 | インターナショナル・ビジネス・マシーンズ・コーポレイション | データ処理システム |
US5598531A (en) * | 1991-05-13 | 1997-01-28 | William Stanley Hill | Method and apparatus for preventing "disease" damage in computer systems |
JP3424901B2 (ja) * | 1997-12-05 | 2003-07-07 | 株式会社日立製作所 | 多重系制御装置の同期方式および同期方法 |
US6560734B1 (en) * | 1998-06-19 | 2003-05-06 | Texas Instruments Incorporated | IC with addressable test port |
US6505306B1 (en) * | 1999-09-15 | 2003-01-07 | International Business Machines Corporation | Redundant bit steering mechanism with delayed switchover of fetch operations during redundant device initialization |
US20080320209A1 (en) * | 2000-01-06 | 2008-12-25 | Super Talent Electronics, Inc. | High Performance and Endurance Non-volatile Memory Based Storage Systems |
US20030191876A1 (en) * | 2000-02-03 | 2003-10-09 | Fallon James J. | Data storewidth accelerator |
US6681358B1 (en) * | 2000-02-22 | 2004-01-20 | Lsi Logic Corporation | Parallel testing of a multiport memory |
US20020046251A1 (en) * | 2001-03-09 | 2002-04-18 | Datacube, Inc. | Streaming memory controller |
US7363389B2 (en) * | 2001-03-29 | 2008-04-22 | Intel Corporation | Apparatus and method for enhanced channel adapter performance through implementation of a completion queue engine and address translation engine |
US6925540B2 (en) * | 2002-05-02 | 2005-08-02 | Intel Corporation | Systems and methods for chassis identification |
US20040212405A1 (en) * | 2002-05-28 | 2004-10-28 | Deas Alexander Roger | Pull up for high speed structures |
JP2004348801A (ja) * | 2003-05-20 | 2004-12-09 | Sharp Corp | 半導体記憶装置、予め定められたメモリ素子を保護するための方法及び携帯電子機器 |
US6983359B2 (en) * | 2003-08-13 | 2006-01-03 | Via-Cyrix, Inc. | Processor and method for pre-fetching out-of-order instructions |
KR20050039256A (ko) * | 2003-10-24 | 2005-04-29 | 삼성전자주식회사 | 스캔 테스트 장치 |
FI20040418A (fi) * | 2004-03-18 | 2005-09-19 | Nokia Corp | Digitaalijärjestelmän kellokontrolli |
US7315912B2 (en) * | 2004-04-01 | 2008-01-01 | Nvidia Corporation | Deadlock avoidance in a bus fabric |
DE102004021267B4 (de) * | 2004-04-30 | 2008-04-17 | Infineon Technologies Ag | Verfahren zum Testen eines Speicherbausteins und Prüfanordnung |
JP2006107546A (ja) * | 2004-09-30 | 2006-04-20 | Toshiba Corp | 不揮発性半導体記憶装置及びその動作方法 |
KR100680473B1 (ko) * | 2005-04-11 | 2007-02-08 | 주식회사 하이닉스반도체 | 액세스 시간이 감소된 플래시 메모리 장치 |
DE102005020808B3 (de) * | 2005-05-04 | 2006-07-20 | Micronas Gmbh | Nichtflüchtige Speichereinrichtung mit einer Programmier- und Löschkontrolle |
KR100719368B1 (ko) * | 2005-06-27 | 2007-05-17 | 삼성전자주식회사 | 플래시 메모리 장치의 적응적 프로그램 방법 및 장치 |
KR100687424B1 (ko) * | 2005-08-29 | 2007-02-26 | 주식회사 하이닉스반도체 | 비휘발성 메모리 장치 |
US20070258298A1 (en) * | 2006-05-04 | 2007-11-08 | Westell Technologies, Inc. | Parallel programming of flash memory during in-circuit test |
US7355892B2 (en) * | 2006-06-30 | 2008-04-08 | Sandisk Corporation | Partial page fail bit detection in flash memory devices |
US7711889B2 (en) * | 2006-07-31 | 2010-05-04 | Kabushiki Kaisha Toshiba | Nonvolatile memory system, and data read/write method for nonvolatile memory system |
WO2008050285A2 (en) * | 2006-10-25 | 2008-05-02 | Freescale Semiconductor, Inc. | Integrated circuit with synchronous and non-clocked intelligent logic having a microcontroller unit and method of operation therefor |
KR100877701B1 (ko) * | 2006-11-23 | 2009-01-08 | 삼성전자주식회사 | 반도체 메모리 장치 및 이 장치의 리던던시 방법 |
US7600077B2 (en) * | 2007-01-10 | 2009-10-06 | Arm Limited | Cache circuitry, data processing apparatus and method for handling write access requests |
JP4160625B1 (ja) * | 2007-04-04 | 2008-10-01 | シャープ株式会社 | 誤り検出制御システム |
US8351262B2 (en) * | 2007-04-23 | 2013-01-08 | Samsung Electronics Co., Ltd. | Flash memory device and program method thereof |
US7606111B2 (en) * | 2007-04-26 | 2009-10-20 | Super Talent Electronics, Inc. | Synchronous page-mode phase-change memory with ECC and RAM cache |
TWI343577B (en) * | 2007-08-28 | 2011-06-11 | Novatek Microelectronics Corp | Program and read method and program apparatus of nand type flash memory |
US8127181B1 (en) * | 2007-11-02 | 2012-02-28 | Nvidia Corporation | Hardware warning protocol for processing units |
US7945825B2 (en) * | 2007-11-25 | 2011-05-17 | Spansion Isreal, Ltd | Recovery while programming non-volatile memory (NVM) |
KR100933859B1 (ko) * | 2007-11-29 | 2009-12-24 | 주식회사 하이닉스반도체 | 플래시 메모리 소자 및 그것의 프로그램 방법 |
TWI375962B (en) * | 2008-06-09 | 2012-11-01 | Phison Electronics Corp | Data writing method for flash memory and storage system and controller using the same |
KR20100001547A (ko) * | 2008-06-27 | 2010-01-06 | 삼성전자주식회사 | 수직형 비휘발성 메모리 소자 및 이의 제조 방법 |
US8756486B2 (en) * | 2008-07-02 | 2014-06-17 | Micron Technology, Inc. | Method and apparatus for repairing high capacity/high bandwidth memory devices |
KR20100091379A (ko) * | 2009-02-10 | 2010-08-19 | 삼성전자주식회사 | 반도체 디스크 장치 및 그것의 프로그램 페일 처리 방법 |
KR20100096616A (ko) * | 2009-02-25 | 2010-09-02 | 삼성전자주식회사 | 저항성 메모리 장치 및 저항성 메모리 장치에서의 입출력 제어 방법 |
US20100250828A1 (en) * | 2009-03-27 | 2010-09-30 | Brent Ahlquist | Control signal output pin to indicate memory interface control flow |
CN101859235B (zh) * | 2009-04-01 | 2013-09-18 | 精工爱普生株式会社 | 具有多个存储装置的系统以及用于该系统的数据传输方法 |
-
2010
- 2010-04-29 US US12/770,599 patent/US8683270B2/en active Active
-
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- 2011-04-19 JP JP2011093507A patent/JP5376344B2/ja active Active
- 2011-04-27 DE DE102011017634.9A patent/DE102011017634B4/de active Active
- 2011-04-28 CN CN201110113612.8A patent/CN102324251B/zh active Active
- 2011-04-28 KR KR1020110040067A patent/KR101274413B1/ko active IP Right Grant
- 2011-04-29 TW TW100115212A patent/TWI493558B/zh active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002197898A (ja) * | 2000-12-04 | 2002-07-12 | Samsung Electronics Co Ltd | 不揮発性半導体メモリ装置及びそれのフェイルビット数検出方法 |
JP2006012367A (ja) * | 2004-06-29 | 2006-01-12 | Toshiba Corp | 不揮発性半導体記憶装置 |
JP2006048783A (ja) * | 2004-08-02 | 2006-02-16 | Renesas Technology Corp | 不揮発性メモリおよびメモリカード |
JP2006079695A (ja) * | 2004-09-08 | 2006-03-23 | Toshiba Corp | 不揮発性半導体記憶装置 |
JP2010040144A (ja) * | 2008-08-07 | 2010-02-18 | Toshiba Corp | 不揮発性半導体記憶システム |
Also Published As
Publication number | Publication date |
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CN102324251A (zh) | 2012-01-18 |
TWI493558B (zh) | 2015-07-21 |
US8683270B2 (en) | 2014-03-25 |
KR20110120829A (ko) | 2011-11-04 |
CN102324251B (zh) | 2014-12-10 |
DE102011017634B4 (de) | 2016-04-28 |
TW201201217A (en) | 2012-01-01 |
JP5376344B2 (ja) | 2013-12-25 |
DE102011017634A1 (de) | 2012-02-09 |
KR101274413B1 (ko) | 2013-06-17 |
US20110271165A1 (en) | 2011-11-03 |
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