JP2011174715A5 - - Google Patents

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Publication number
JP2011174715A5
JP2011174715A5 JP2010036909A JP2010036909A JP2011174715A5 JP 2011174715 A5 JP2011174715 A5 JP 2011174715A5 JP 2010036909 A JP2010036909 A JP 2010036909A JP 2010036909 A JP2010036909 A JP 2010036909A JP 2011174715 A5 JP2011174715 A5 JP 2011174715A5
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JP
Japan
Prior art keywords
light
region
ray
pattern
imaging apparatus
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Application number
JP2010036909A
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English (en)
Japanese (ja)
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JP2011174715A (ja
JP5586986B2 (ja
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Priority to JP2010036909A priority Critical patent/JP5586986B2/ja
Priority claimed from JP2010036909A external-priority patent/JP5586986B2/ja
Priority to PCT/JP2011/053585 priority patent/WO2011105306A1/en
Priority to US13/518,233 priority patent/US8995613B2/en
Publication of JP2011174715A publication Critical patent/JP2011174715A/ja
Publication of JP2011174715A5 publication Critical patent/JP2011174715A5/ja
Application granted granted Critical
Publication of JP5586986B2 publication Critical patent/JP5586986B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2010036909A 2010-02-23 2010-02-23 X線撮像装置 Expired - Fee Related JP5586986B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2010036909A JP5586986B2 (ja) 2010-02-23 2010-02-23 X線撮像装置
PCT/JP2011/053585 WO2011105306A1 (en) 2010-02-23 2011-02-14 X-ray imaging apparatus
US13/518,233 US8995613B2 (en) 2010-02-23 2011-02-14 X-ray imaging apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010036909A JP5586986B2 (ja) 2010-02-23 2010-02-23 X線撮像装置

Publications (3)

Publication Number Publication Date
JP2011174715A JP2011174715A (ja) 2011-09-08
JP2011174715A5 true JP2011174715A5 (enExample) 2013-04-11
JP5586986B2 JP5586986B2 (ja) 2014-09-10

Family

ID=44168061

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010036909A Expired - Fee Related JP5586986B2 (ja) 2010-02-23 2010-02-23 X線撮像装置

Country Status (3)

Country Link
US (1) US8995613B2 (enExample)
JP (1) JP5586986B2 (enExample)
WO (1) WO2011105306A1 (enExample)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5631013B2 (ja) 2010-01-28 2014-11-26 キヤノン株式会社 X線撮像装置
JP5796976B2 (ja) 2010-05-27 2015-10-21 キヤノン株式会社 X線撮像装置
BR112013009248A2 (pt) * 2010-10-19 2019-09-24 Koninl Philips Electronics Nv difração de reticulação para a geração de imagens por contraste de fase diferencial de raios x, disposição de detector de um sistema de raios x para a geração de imagens por contraste de fase de um objeto, sistema de geração de umagens médica de raios x para a geração de imagens por contraste de fase diferencial, método para a geração de imagens por contraste de fase diferencial, elemento de programa de computador para o controle de um aparelho e meio legível por computador
CN103168228B (zh) * 2010-10-19 2015-11-25 皇家飞利浦电子股份有限公司 微分相位对比成像
JP5208224B2 (ja) * 2011-01-12 2013-06-12 富士フイルム株式会社 放射線撮影装置、及び放射線撮影システム
CN104066375B (zh) * 2012-01-24 2017-08-11 皇家飞利浦有限公司 多方向相衬x射线成像
WO2013187012A1 (en) * 2012-06-15 2013-12-19 Canon Kabushiki Kaisha X-ray apparatus and x-ray measurement method
EP2968792B1 (en) 2013-03-11 2019-05-15 Antares Pharma, Inc. Dosage injector with pinion system
DE102013221818A1 (de) * 2013-10-28 2015-04-30 Siemens Aktiengesellschaft Bildgebendes System und Verfahren zur Bildgebung
KR101690122B1 (ko) * 2013-11-26 2017-01-09 한국전기연구원 X―ray 다중에너지 필터를 이용한 플라즈마 이온 분포 측정 방법 및 그 시스템
WO2017063156A1 (en) * 2015-10-14 2017-04-20 Shenzhen Xpectvision Technology Co., Ltd. X-ray detectors of high spatial resolution
US11058375B2 (en) 2016-06-02 2021-07-13 Koninklijke Philips N.V. X-ray imaging apparatus for compact (quasi-)isotropic multi source x-ray imaging
JP6680356B2 (ja) * 2016-06-15 2020-04-15 株式会社島津製作所 放射線撮影装置
IL251636B (en) 2017-04-06 2018-02-28 Yoav Berlatzky Coherence camera system and method thereof
EP3498171A1 (en) * 2017-12-15 2019-06-19 Koninklijke Philips N.V. Single shot x-ray phase-contrast and dark field imaging
EP3534376A1 (de) 2018-02-28 2019-09-04 Siemens Healthcare GmbH Verfahren zur herstellung eines mikrostrukturbauteils, mikrostrukturbauteil und röntgengerät
EP3534377B1 (de) 2018-02-28 2021-11-17 Siemens Healthcare GmbH Verfahren zur herstellung eines mikrostrukturbauteils
DE102018124175A1 (de) * 2018-10-01 2020-04-02 Sikora Ag Verfahren und Vorrichtung zum Steuern einer Produktionsanlage für plattenförmige oder strangförmige Körper
FR3092398B1 (fr) * 2019-01-31 2021-02-26 Imagine Optic Procédés et systèmes pour l’imagerie de contraste phase

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2441578A (en) 2006-09-08 2008-03-12 Ucl Business Plc Phase Contrast X-Ray Imaging
JP4864052B2 (ja) 2008-07-31 2012-01-25 アース製薬株式会社 温水洗浄便座の洗浄ノズル洗浄用泡吐出式ポンプ製品
JP5675169B2 (ja) 2009-06-18 2015-02-25 キヤノン株式会社 X線撮像装置およびx線撮像方法
JP5631013B2 (ja) 2010-01-28 2014-11-26 キヤノン株式会社 X線撮像装置
US9066704B2 (en) 2011-03-14 2015-06-30 Canon Kabushiki Kaisha X-ray imaging apparatus

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