JP2011189118A5 - - Google Patents

Download PDF

Info

Publication number
JP2011189118A5
JP2011189118A5 JP2011004533A JP2011004533A JP2011189118A5 JP 2011189118 A5 JP2011189118 A5 JP 2011189118A5 JP 2011004533 A JP2011004533 A JP 2011004533A JP 2011004533 A JP2011004533 A JP 2011004533A JP 2011189118 A5 JP2011189118 A5 JP 2011189118A5
Authority
JP
Japan
Prior art keywords
shielding
grating
ray
relative position
interference pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2011004533A
Other languages
English (en)
Japanese (ja)
Other versions
JP2011189118A (ja
JP5725870B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2011004533A priority Critical patent/JP5725870B2/ja
Priority claimed from JP2011004533A external-priority patent/JP5725870B2/ja
Publication of JP2011189118A publication Critical patent/JP2011189118A/ja
Publication of JP2011189118A5 publication Critical patent/JP2011189118A5/ja
Application granted granted Critical
Publication of JP5725870B2 publication Critical patent/JP5725870B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2011004533A 2010-02-22 2011-01-13 Ｘ線撮像装置およびｘ線撮像方法 Expired - Fee Related JP5725870B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011004533A JP5725870B2 (ja) 2010-02-22 2011-01-13 Ｘ線撮像装置およびｘ線撮像方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2010035746 2010-02-22
JP2010035746 2010-02-22
JP2011004533A JP5725870B2 (ja) 2010-02-22 2011-01-13 Ｘ線撮像装置およびｘ線撮像方法

Publications (3)

Publication Number Publication Date
JP2011189118A JP2011189118A (ja) 2011-09-29
JP2011189118A5 true JP2011189118A5 (enExample) 2014-02-27
JP5725870B2 JP5725870B2 (ja) 2015-05-27

Family

ID=44279245

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011004533A Expired - Fee Related JP5725870B2 (ja) 2010-02-22 2011-01-13 Ｘ線撮像装置およびｘ線撮像方法

Country Status (3)

Country Link
US (1) US8831174B2 (enExample)
JP (1) JP5725870B2 (enExample)
WO (1) WO2011102247A2 (enExample)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5631013B2 (ja) 2010-01-28 2014-11-26 キヤノン株式会社 Ｘ線撮像装置
EP2630477B1 (en) * 2010-10-19 2020-03-18 Koninklijke Philips N.V. Differential phase-contrast imaging
US9861330B2 (en) * 2010-10-19 2018-01-09 Koninklijke Philips N.V. Differential phase-contrast imaging
GB201112506D0 (en) * 2011-07-21 2011-08-31 Ucl Business Plc Phase imaging
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
EP2822468B1 (en) * 2012-03-05 2017-11-01 University Of Rochester Methods and apparatus for differential phase-contrast cone-beam ct and hybrid cone-beam ct
CN104394770B (zh) * 2012-06-27 2018-06-08 皇家飞利浦有限公司 基于光栅的差分相位对比成像
JP2014140632A (ja) * 2012-12-27 2014-08-07 Canon Inc 演算装置、画像取得方法、プログラム、及びｘ線撮像システム
JP6191136B2 (ja) * 2013-01-10 2017-09-06 コニカミノルタ株式会社 画像生成方法
KR101370964B1 (ko) 2013-01-23 2014-03-12 주식회사 미르기술 모아레 프로젝터의 격자 간격 조정방법
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
CN105745718B (zh) * 2013-11-05 2017-12-19 皇家飞利浦有限公司 具有对光子通量的快速空间调制的x射线成像设备
JP2015166676A (ja) * 2014-03-03 2015-09-24 キヤノン株式会社 Ｘ線撮像システム
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
JP6667215B2 (ja) * 2014-07-24 2020-03-18 キヤノン株式会社 Ｘ線遮蔽格子、構造体、トールボット干渉計、ｘ線遮蔽格子の製造方法
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
JP6422123B2 (ja) * 2015-08-27 2018-11-14 国立大学法人東北大学 放射線画像生成装置
CN105067117B (zh) * 2015-09-18 2017-04-12 中国工程物理研究院激光聚变研究中心 一种高谱分辨与宽谱测量范围的透射光栅谱仪
US11337663B2 (en) * 2016-04-08 2022-05-24 Rensselaer Polytechnic Institute Rapid filtration methods for dual-energy X-ray CT
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
WO2018175570A1 (en) 2017-03-22 2018-09-27 Sigray, Inc. Method of performing x-ray spectroscopy and x-ray absorption spectrometer system
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
JP7195341B2 (ja) 2018-06-04 2022-12-23 シグレイ、インコーポレイテッド 波長分散型ｘ線分光計
JP7117452B2 (ja) 2018-07-26 2022-08-12 シグレイ、インコーポレイテッド 高輝度反射型ｘ線源
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
CN112638261B (zh) 2018-09-04 2025-06-27 斯格瑞公司 利用滤波的x射线荧光的系统和方法
WO2020051221A2 (en) 2018-09-07 2020-03-12 Sigray, Inc. System and method for depth-selectable x-ray analysis
EP3922179A1 (en) * 2020-06-08 2021-12-15 Koninklijke Philips N.V. Stepping strategy for defect compensation in dax imaging

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3548664B2 (ja) * 1996-03-29 2004-07-28 株式会社日立製作所 位相コントラストｘ線撮像装置
DE102006037254B4 (de) * 2006-02-01 2017-08-03 Paul Scherer Institut Fokus-Detektor-Anordnung zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen mit röntgenoptischen Gittern, sowie Röntgen-System, Röntgen-C-Bogen-System und Röntgen-Computer-Tomographie-System
EP1879020A1 (en) * 2006-07-12 2008-01-16 Paul Scherrer Institut X-ray interferometer for phase contrast imaging
WO2008102685A1 (ja) * 2007-02-21 2008-08-28 Konica Minolta Medical & Graphic, Inc. 放射線画像撮影装置及び放射線画像撮影システム
JP2008200360A (ja) * 2007-02-21 2008-09-04 Konica Minolta Medical & Graphic Inc Ｘ線撮影システム
JP2010035746A (ja) 2008-08-04 2010-02-18 Fujifilm Corp カプセル内視鏡システム、カプセル内視鏡及びカプセル内視鏡の動作制御方法
JP2010063646A (ja) * 2008-09-11 2010-03-25 Fujifilm Corp 放射線位相画像撮影装置
WO2010050483A1 (ja) * 2008-10-29 2010-05-06 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP2010236986A (ja) * 2009-03-31 2010-10-21 Fujifilm Corp 放射線位相画像撮影装置
JP5631013B2 (ja) 2010-01-28 2014-11-26 キヤノン株式会社 Ｘ線撮像装置

Similar Documents

Publication Publication Date Title
JP2011189118A5 (enExample)
JP2012005820A5 (enExample)
JP5725870B2 (ja) Ｘ線撮像装置およびｘ線撮像方法
JP2011174715A5 (enExample)
JP2015519091A5 (enExample)
JP5796976B2 (ja) Ｘ線撮像装置
JP2016501630A5 (enExample)
CN102365687B (zh) 消色差的相衬成像
JP2012037352A5 (enExample)
JP2014171799A (ja) Ｘ線撮像装置及びｘ線撮像システム
US9006656B2 (en) Imaging apparatus using talbot interference and adjusting method for imaging apparatus
JP2012507690A5 (enExample)
JP2012085995A5 (enExample)
JP2011153969A5 (enExample)
JP2012108098A5 (enExample)
JP2012208114A5 (enExample)
FI20126119A7 (fi) Interferometrinen dynaamihila-kuvannusmenetelmä, diffraktiohila ja kuvannuslaitteisto
JP2010117172A5 (enExample)
RU2013122887A (ru) Формирование изображений методом дифференциального фазового контраста
JP2013541699A5 (enExample)
JP2011174715A (ja) Ｘ線撮像装置
JP2018519866A5 (enExample)
RU2017103455A (ru) Устройство рентгеновской визуализации
JP2013116270A (ja) Ｘ線撮像装置
JP2013138836A5 (enExample)