|
JP5631013B2
(ja)
|
2010-01-28 |
2014-11-26 |
キヤノン株式会社 |
Ｘ線撮像装置
|
|
EP2630476B1
(en)
*
|
2010-10-19 |
2017-12-13 |
Koninklijke Philips N.V. |
Differential phase-contrast imaging
|
|
JP6228457B2
(ja)
*
|
2010-10-19 |
2017-11-08 |
コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． |
微分位相コントラスト画像形成
|
|
GB201112506D0
(en)
|
2011-07-21 |
2011-08-31 |
Ucl Business Plc |
Phase imaging
|
|
US20150117599A1
(en)
*
|
2013-10-31 |
2015-04-30 |
Sigray, Inc. |
X-ray interferometric imaging system
|
|
US9826949B2
(en)
*
|
2012-03-05 |
2017-11-28 |
University Of Rochester |
Methods and apparatus for differential phase-contrast cone-beam CT and hybrid cone-beam CT
|
|
US9757081B2
(en)
*
|
2012-06-27 |
2017-09-12 |
Koninklijke Philips N.V. |
Grating-based differential phase contrast imaging
|
|
JP2014140632A
(ja)
*
|
2012-12-27 |
2014-08-07 |
Canon Inc |
演算装置、画像取得方法、プログラム、及びｘ線撮像システム
|
|
JP6191136B2
(ja)
*
|
2013-01-10 |
2017-09-06 |
コニカミノルタ株式会社 |
画像生成方法
|
|
KR101370964B1
(ko)
|
2013-01-23 |
2014-03-12 |
주식회사 미르기술 |
모아레 프로젝터의 격자 간격 조정방법
|
|
US10297359B2
(en)
|
2013-09-19 |
2019-05-21 |
Sigray, Inc. |
X-ray illumination system with multiple target microstructures
|
|
US10269528B2
(en)
|
2013-09-19 |
2019-04-23 |
Sigray, Inc. |
Diverging X-ray sources using linear accumulation
|
|
US10416099B2
(en)
|
2013-09-19 |
2019-09-17 |
Sigray, Inc. |
Method of performing X-ray spectroscopy and X-ray absorption spectrometer system
|
|
US10295485B2
(en)
|
2013-12-05 |
2019-05-21 |
Sigray, Inc. |
X-ray transmission spectrometer system
|
|
US10304580B2
(en)
|
2013-10-31 |
2019-05-28 |
Sigray, Inc. |
Talbot X-ray microscope
|
|
USRE48612E1
(en)
|
2013-10-31 |
2021-06-29 |
Sigray, Inc. |
X-ray interferometric imaging system
|
|
EP3066670B1
(en)
*
|
2013-11-05 |
2017-06-28 |
Koninklijke Philips N.V. |
X-ray imaging device with fast spatial modulation of photon flux
|
|
JP2015166676A
(ja)
*
|
2014-03-03 |
2015-09-24 |
キヤノン株式会社 |
Ｘ線撮像システム
|
|
US10401309B2
(en)
|
2014-05-15 |
2019-09-03 |
Sigray, Inc. |
X-ray techniques using structured illumination
|
|
JP6667215B2
(ja)
*
|
2014-07-24 |
2020-03-18 |
キヤノン株式会社 |
Ｘ線遮蔽格子、構造体、トールボット干渉計、ｘ線遮蔽格子の製造方法
|
|
US10352880B2
(en)
|
2015-04-29 |
2019-07-16 |
Sigray, Inc. |
Method and apparatus for x-ray microscopy
|
|
US10295486B2
(en)
|
2015-08-18 |
2019-05-21 |
Sigray, Inc. |
Detector for X-rays with high spatial and high spectral resolution
|
|
JP6422123B2
(ja)
*
|
2015-08-27 |
2018-11-14 |
国立大学法人東北大学 |
放射線画像生成装置
|
|
CN105067117B
(zh)
*
|
2015-09-18 |
2017-04-12 |
中国工程物理研究院激光聚变研究中心 |
一种高谱分辨与宽谱测量范围的透射光栅谱仪
|
|
WO2017176976A1
(en)
*
|
2016-04-08 |
2017-10-12 |
Rensselaer Polytechnic Institute |
Rapid filtration methods for dual-energy x-ray ct
|
|
US10247683B2
(en)
|
2016-12-03 |
2019-04-02 |
Sigray, Inc. |
Material measurement techniques using multiple X-ray micro-beams
|
|
US10578566B2
(en)
|
2018-04-03 |
2020-03-03 |
Sigray, Inc. |
X-ray emission spectrometer system
|
|
WO2019236384A1
(en)
|
2018-06-04 |
2019-12-12 |
Sigray, Inc. |
Wavelength dispersive x-ray spectrometer
|
|
CN112470245B
(zh)
|
2018-07-26 |
2025-03-18 |
斯格瑞公司 |
高亮度x射线反射源
|
|
US10656105B2
(en)
|
2018-08-06 |
2020-05-19 |
Sigray, Inc. |
Talbot-lau x-ray source and interferometric system
|
|
WO2020051061A1
(en)
|
2018-09-04 |
2020-03-12 |
Sigray, Inc. |
System and method for x-ray fluorescence with filtering
|
|
US11056308B2
(en)
|
2018-09-07 |
2021-07-06 |
Sigray, Inc. |
System and method for depth-selectable x-ray analysis
|
|
EP3922179A1
(en)
*
|
2020-06-08 |
2021-12-15 |
Koninklijke Philips N.V. |
Stepping strategy for defect compensation in dax imaging
|