JP2017521170A5 - - Google Patents

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Publication number
JP2017521170A5
JP2017521170A5 JP2017502174A JP2017502174A JP2017521170A5 JP 2017521170 A5 JP2017521170 A5 JP 2017521170A5 JP 2017502174 A JP2017502174 A JP 2017502174A JP 2017502174 A JP2017502174 A JP 2017502174A JP 2017521170 A5 JP2017521170 A5 JP 2017521170A5
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JP
Japan
Prior art keywords
grating
segment
ray
ray imaging
imaging apparatus
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Application number
JP2017502174A
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English (en)
Japanese (ja)
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JP2017521170A (ja
JP6475315B2 (ja
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Priority claimed from PCT/EP2015/065405 external-priority patent/WO2016008762A1/en
Publication of JP2017521170A publication Critical patent/JP2017521170A/ja
Publication of JP2017521170A5 publication Critical patent/JP2017521170A5/ja
Application granted granted Critical
Publication of JP6475315B2 publication Critical patent/JP6475315B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2017502174A 2014-07-17 2015-07-07 Ｘ線イメージング装置 Expired - Fee Related JP6475315B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP14177486 2014-07-17
EP14177486.9 2014-07-17
PCT/EP2015/065405 WO2016008762A1 (en) 2014-07-17 2015-07-07 X-ray imaging device

Publications (3)

Publication Number Publication Date
JP2017521170A JP2017521170A (ja) 2017-08-03
JP2017521170A5 true JP2017521170A5 (enExample) 2018-08-09
JP6475315B2 JP6475315B2 (ja) 2019-02-27

Family

ID=51211608

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017502174A Expired - Fee Related JP6475315B2 (ja) 2014-07-17 2015-07-07 Ｘ線イメージング装置

Country Status (6)

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US (1) US10368815B2 (enExample)
EP (1) EP3169239B1 (enExample)
JP (1) JP6475315B2 (enExample)
CN (1) CN106535767B (enExample)
RU (1) RU2695311C2 (enExample)
WO (1) WO2016008762A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107106101B (zh) * 2014-12-22 2020-04-24 株式会社岛津制作所 放射线相位差摄影装置
JP6753342B2 (ja) * 2017-03-15 2020-09-09 株式会社島津製作所 放射線格子検出器およびｘ線検査装置
US10441234B2 (en) * 2017-06-15 2019-10-15 Shimadzu Corporation Radiation-phase-contrast imaging device
US11013482B2 (en) * 2017-10-31 2021-05-25 Shimadzu Corporation Phase contrast X-ray imaging system
CN111089870B (zh) * 2019-12-12 2022-07-19 中国科学院苏州生物医学工程技术研究所 基于两次成像的x射线光栅相衬成像方法及系统、存储介质、设备
EP4029451A1 (en) 2021-01-19 2022-07-20 Koninklijke Philips N.V. An x-ray imaging system and method
US11860319B2 (en) * 2022-03-10 2024-01-02 GE Precision Healthcare LLC High-resolution detector having a reduced number of pixels

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5400379A (en) * 1994-02-25 1995-03-21 General Electric Company Multi-slice x-ray CT using a detector mask
DE102009004702B4 (de) * 2009-01-15 2019-01-31 Paul Scherer Institut Anordnung und Verfahren zur projektiven und/oder tomographischen Phasenkontrastbildgebung mit Röntgenstrahlung
CN102365687B (zh) * 2009-03-27 2015-08-19 皇家飞利浦电子股份有限公司 消色差的相衬成像
BRPI1015157A2 (pt) * 2009-04-01 2016-04-19 Brookhaven Science Ass Llc colimador de múltiplas aberturas entrelaçadas para aplicações em imagiologia por radiação tridimensional.
JP2010253194A (ja) 2009-04-28 2010-11-11 Fujifilm Corp 放射線位相画像撮影装置
EP2442722B1 (en) * 2009-06-16 2017-03-29 Koninklijke Philips N.V. Correction method for differential phase contrast imaging
JP5213923B2 (ja) 2010-01-29 2013-06-19 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
WO2012029005A1 (en) 2010-09-03 2012-03-08 Koninklijke Philips Electronics N.V. Differential phase-contrast imaging with improved sampling
RU2572644C2 (ru) * 2010-10-19 2016-01-20 Конинклейке Филипс Электроникс Н.В. Формирование дифференциальных фазово-контрастных изображений
JP2012166010A (ja) 2011-01-26 2012-09-06 Fujifilm Corp 放射線画像撮影装置および放射線画像検出器
BR112014017853A8 (pt) 2012-01-24 2017-07-11 Koninklijke Philips Nv Sistema de geração de imagens por raios x para a geração de imagens de contraste de fase de um objeto, método para a geração de imagens por de contraste de fase de raios x de um objeto, elemento de programa de computador para o controle de um aparelho, e meio legível por computador
DE102012224258A1 (de) 2012-12-21 2014-06-26 Siemens Aktiengesellschaft Röntgenaufnahmesystem zur differentiellen Phasenkontrast-Bildgebung eines Untersuchungsobjekts mit Phase-Stepping sowie angiographisches Untersuchungsverfahren
JP6411364B2 (ja) * 2012-12-21 2018-10-24 ケアストリーム ヘルス インク 医療用放射線格子ベースの微分位相コントラスト撮像
JP2014142338A (ja) 2012-12-27 2014-08-07 Canon Inc 干渉計及び被検体情報取得システム
EP2943124B1 (en) 2013-09-30 2016-08-31 Koninklijke Philips N.V. Differential phase contrast imaging device with movable grating(s)
JP2014100063A (ja) * 2014-03-03 2014-05-29 Fuji Electric Co Ltd 電源装置

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