JP2017521170A5 - - Google Patents

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Publication number
JP2017521170A5
JP2017521170A5 JP2017502174A JP2017502174A JP2017521170A5 JP 2017521170 A5 JP2017521170 A5 JP 2017521170A5 JP 2017502174 A JP2017502174 A JP 2017502174A JP 2017502174 A JP2017502174 A JP 2017502174A JP 2017521170 A5 JP2017521170 A5 JP 2017521170A5
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JP
Japan
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grating
segment
ray
ray imaging
imaging apparatus
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JP2017502174A
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English (en)
Japanese (ja)
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JP6475315B2 (ja
JP2017521170A (ja
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Priority claimed from PCT/EP2015/065405 external-priority patent/WO2016008762A1/en
Publication of JP2017521170A publication Critical patent/JP2017521170A/ja
Publication of JP2017521170A5 publication Critical patent/JP2017521170A5/ja
Application granted granted Critical
Publication of JP6475315B2 publication Critical patent/JP6475315B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2017502174A 2014-07-17 2015-07-07 X線イメージング装置 Expired - Fee Related JP6475315B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP14177486 2014-07-17
EP14177486.9 2014-07-17
PCT/EP2015/065405 WO2016008762A1 (en) 2014-07-17 2015-07-07 X-ray imaging device

Publications (3)

Publication Number Publication Date
JP2017521170A JP2017521170A (ja) 2017-08-03
JP2017521170A5 true JP2017521170A5 (enExample) 2018-08-09
JP6475315B2 JP6475315B2 (ja) 2019-02-27

Family

ID=51211608

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017502174A Expired - Fee Related JP6475315B2 (ja) 2014-07-17 2015-07-07 X線イメージング装置

Country Status (6)

Country Link
US (1) US10368815B2 (enExample)
EP (1) EP3169239B1 (enExample)
JP (1) JP6475315B2 (enExample)
CN (1) CN106535767B (enExample)
RU (1) RU2695311C2 (enExample)
WO (1) WO2016008762A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107106101B (zh) * 2014-12-22 2020-04-24 株式会社岛津制作所 放射线相位差摄影装置
JP6753342B2 (ja) * 2017-03-15 2020-09-09 株式会社島津製作所 放射線格子検出器およびx線検査装置
US10441234B2 (en) * 2017-06-15 2019-10-15 Shimadzu Corporation Radiation-phase-contrast imaging device
JP6743983B2 (ja) * 2017-10-31 2020-08-19 株式会社島津製作所 X線位相差撮像システム
CN111089870B (zh) * 2019-12-12 2022-07-19 中国科学院苏州生物医学工程技术研究所 基于两次成像的x射线光栅相衬成像方法及系统、存储介质、设备
EP4029451A1 (en) 2021-01-19 2022-07-20 Koninklijke Philips N.V. An x-ray imaging system and method
US11860319B2 (en) * 2022-03-10 2024-01-02 GE Precision Healthcare LLC High-resolution detector having a reduced number of pixels

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5400379A (en) * 1994-02-25 1995-03-21 General Electric Company Multi-slice x-ray CT using a detector mask
DE102009004702B4 (de) * 2009-01-15 2019-01-31 Paul Scherer Institut Anordnung und Verfahren zur projektiven und/oder tomographischen Phasenkontrastbildgebung mit Röntgenstrahlung
RU2543994C2 (ru) * 2009-03-27 2015-03-10 Конинклейке Филипс Электроникс Н.В. Формирование ахроматического фазоконтрастного изображения
US20120039446A1 (en) * 2009-04-01 2012-02-16 Brookhaven Science Associates, Llc Interwoven multi-aperture collimator for 3-dimensional radiation imaging applications
JP2010253194A (ja) 2009-04-28 2010-11-11 Fujifilm Corp 放射線位相画像撮影装置
US8855265B2 (en) * 2009-06-16 2014-10-07 Koninklijke Philips N.V. Correction method for differential phase contrast imaging
JP5213923B2 (ja) * 2010-01-29 2013-06-19 キヤノン株式会社 X線撮像装置およびx線撮像方法
CN103079469B (zh) * 2010-09-03 2016-02-24 皇家飞利浦电子股份有限公司 利用改善的采样的微分相位对比成像
CN103168228B (zh) * 2010-10-19 2015-11-25 皇家飞利浦电子股份有限公司 微分相位对比成像
JP2012166010A (ja) 2011-01-26 2012-09-06 Fujifilm Corp 放射線画像撮影装置および放射線画像検出器
CN104066375B (zh) * 2012-01-24 2017-08-11 皇家飞利浦有限公司 多方向相衬x射线成像
CN104869905B (zh) * 2012-12-21 2019-08-06 卡尔斯特里姆保健公司 基于微分相衬成像的医疗放射照相光栅
DE102012224258A1 (de) 2012-12-21 2014-06-26 Siemens Aktiengesellschaft Röntgenaufnahmesystem zur differentiellen Phasenkontrast-Bildgebung eines Untersuchungsobjekts mit Phase-Stepping sowie angiographisches Untersuchungsverfahren
JP2014142338A (ja) * 2012-12-27 2014-08-07 Canon Inc 干渉計及び被検体情報取得システム
RU2663176C2 (ru) 2013-09-30 2018-08-01 Конинклейке Филипс Н.В. Устройство получения дифференциального фазоконтрастного изображения с подвижной решеткой(ами)
JP2014100063A (ja) * 2014-03-03 2014-05-29 Fuji Electric Co Ltd 電源装置

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