JP2017521170A5 - - Google Patents

Download PDF

Info

Publication number
JP2017521170A5
JP2017521170A5 JP2017502174A JP2017502174A JP2017521170A5 JP 2017521170 A5 JP2017521170 A5 JP 2017521170A5 JP 2017502174 A JP2017502174 A JP 2017502174A JP 2017502174 A JP2017502174 A JP 2017502174A JP 2017521170 A5 JP2017521170 A5 JP 2017521170A5
Authority
JP
Japan
Prior art keywords
grating
segment
ray
ray imaging
imaging apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2017502174A
Other languages
English (en)
Japanese (ja)
Other versions
JP2017521170A (ja
JP6475315B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/EP2015/065405 external-priority patent/WO2016008762A1/en
Publication of JP2017521170A publication Critical patent/JP2017521170A/ja
Publication of JP2017521170A5 publication Critical patent/JP2017521170A5/ja
Application granted granted Critical
Publication of JP6475315B2 publication Critical patent/JP6475315B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2017502174A 2014-07-17 2015-07-07 X線イメージング装置 Expired - Fee Related JP6475315B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP14177486 2014-07-17
EP14177486.9 2014-07-17
PCT/EP2015/065405 WO2016008762A1 (en) 2014-07-17 2015-07-07 X-ray imaging device

Publications (3)

Publication Number Publication Date
JP2017521170A JP2017521170A (ja) 2017-08-03
JP2017521170A5 true JP2017521170A5 (enExample) 2018-08-09
JP6475315B2 JP6475315B2 (ja) 2019-02-27

Family

ID=51211608

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017502174A Expired - Fee Related JP6475315B2 (ja) 2014-07-17 2015-07-07 X線イメージング装置

Country Status (6)

Country Link
US (1) US10368815B2 (enExample)
EP (1) EP3169239B1 (enExample)
JP (1) JP6475315B2 (enExample)
CN (1) CN106535767B (enExample)
RU (1) RU2695311C2 (enExample)
WO (1) WO2016008762A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107106101B (zh) * 2014-12-22 2020-04-24 株式会社岛津制作所 放射线相位差摄影装置
JP6753342B2 (ja) * 2017-03-15 2020-09-09 株式会社島津製作所 放射線格子検出器およびx線検査装置
US10441234B2 (en) * 2017-06-15 2019-10-15 Shimadzu Corporation Radiation-phase-contrast imaging device
CN110832309B (zh) * 2017-10-31 2022-08-23 株式会社岛津制作所 X射线相位差摄像系统
CN111089870B (zh) * 2019-12-12 2022-07-19 中国科学院苏州生物医学工程技术研究所 基于两次成像的x射线光栅相衬成像方法及系统、存储介质、设备
EP4029451A1 (en) 2021-01-19 2022-07-20 Koninklijke Philips N.V. An x-ray imaging system and method
US11860319B2 (en) * 2022-03-10 2024-01-02 GE Precision Healthcare LLC High-resolution detector having a reduced number of pixels

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5400379A (en) * 1994-02-25 1995-03-21 General Electric Company Multi-slice x-ray CT using a detector mask
DE102009004702B4 (de) * 2009-01-15 2019-01-31 Paul Scherer Institut Anordnung und Verfahren zur projektiven und/oder tomographischen Phasenkontrastbildgebung mit Röntgenstrahlung
RU2543994C2 (ru) * 2009-03-27 2015-03-10 Конинклейке Филипс Электроникс Н.В. Формирование ахроматического фазоконтрастного изображения
BRPI1015157A2 (pt) * 2009-04-01 2016-04-19 Brookhaven Science Ass Llc colimador de múltiplas aberturas entrelaçadas para aplicações em imagiologia por radiação tridimensional.
JP2010253194A (ja) 2009-04-28 2010-11-11 Fujifilm Corp 放射線位相画像撮影装置
WO2010146503A1 (en) * 2009-06-16 2010-12-23 Koninklijke Philips Electronics N. V. Correction method for differential phase contrast imaging
JP5213923B2 (ja) * 2010-01-29 2013-06-19 キヤノン株式会社 X線撮像装置およびx線撮像方法
US9105369B2 (en) * 2010-09-03 2015-08-11 Koninklijke Philips N.V. Differential phase-contrast imaging with improved sampling
BR112013009253A2 (pt) 2010-10-19 2019-09-24 Koninl Philips Electronics Nv grade difração para obtenção de imagem por contraste da fase diferencial, disposição de detector de um sistema de raios x para gerar imagens por contraste de fase de um objeto, sistema de obtenção de imagem de clínica por raios x, método para obtenção de umagem de contraste de fase diferencial, elemento de programa de computador e meio legível em computador
JP2012166010A (ja) 2011-01-26 2012-09-06 Fujifilm Corp 放射線画像撮影装置および放射線画像検出器
CN104066375B (zh) * 2012-01-24 2017-08-11 皇家飞利浦有限公司 多方向相衬x射线成像
JP6411364B2 (ja) * 2012-12-21 2018-10-24 ケアストリーム ヘルス インク 医療用放射線格子ベースの微分位相コントラスト撮像
DE102012224258A1 (de) 2012-12-21 2014-06-26 Siemens Aktiengesellschaft Röntgenaufnahmesystem zur differentiellen Phasenkontrast-Bildgebung eines Untersuchungsobjekts mit Phase-Stepping sowie angiographisches Untersuchungsverfahren
JP2014142338A (ja) * 2012-12-27 2014-08-07 Canon Inc 干渉計及び被検体情報取得システム
CN104837409B (zh) 2013-09-30 2019-08-13 皇家飞利浦有限公司 具有可移动光栅的微分相位衬度成像装置
JP2014100063A (ja) 2014-03-03 2014-05-29 Fuji Electric Co Ltd 電源装置

Similar Documents

Publication Publication Date Title
JP2017521170A5 (enExample)
JP2012005820A5 (enExample)
JP2015529510A5 (enExample)
RU2017103455A (ru) Устройство рентгеновской визуализации
JP2016501630A5 (enExample)
JP2017500160A5 (enExample)
JP2011189118A5 (enExample)
JP2013050441A5 (ja) 波面測定装置、波面測定方法、及びプログラム並びにx線コンピュータ断層撮影装置
JP2015519091A5 (enExample)
JP2011174715A5 (enExample)
JP2014115264A5 (enExample)
RU2018103191A (ru) Сканирующее рентгеновское устройство с полноформатным детектором
JP2013522595A5 (enExample)
SE0400347D0 (sv) Method and arrangement relating to x-ray imaging
JP2016003889A5 (enExample)
WO2014114737A3 (de) Verfahren und vorrichtung zur bestimmung der geometrie von strukturen mittels computertomografie
RU2016115730A (ru) Устройство и способ визуализации
JP2016540587A5 (enExample)
JP2018026064A5 (enExample)
JP2016010657A5 (enExample)
JP2013138836A5 (enExample)
JP2012110472A5 (enExample)
JP2016533789A5 (enExample)
WO2013135888A3 (de) Detektoranordnung zum aufnehmen von röntgenbildern eines abzubildenden objekts
JP2010151713A5 (enExample)