JP5586986B2 - Ｘ線撮像装置 - Google Patents

Ｘ線撮像装置 Download PDF

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Publication number
JP5586986B2
JP5586986B2 JP2010036909A JP2010036909A JP5586986B2 JP 5586986 B2 JP5586986 B2 JP 5586986B2 JP 2010036909 A JP2010036909 A JP 2010036909A JP 2010036909 A JP2010036909 A JP 2010036909A JP 5586986 B2 JP5586986 B2 JP 5586986B2
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Japan
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light
ray
grating
pixel
pattern
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Expired - Fee Related
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JP2010036909A
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English (en)
Japanese (ja)
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JP2011174715A5 (enExample
JP2011174715A (ja
Inventor
千種 大内
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Canon Inc
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Canon Inc
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Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2010036909A priority Critical patent/JP5586986B2/ja
Priority to US13/518,233 priority patent/US8995613B2/en
Priority to PCT/JP2011/053585 priority patent/WO2011105306A1/en
Publication of JP2011174715A publication Critical patent/JP2011174715A/ja
Publication of JP2011174715A5 publication Critical patent/JP2011174715A5/ja
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    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20075—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring interferences of X-rays, e.g. Borrmann effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/064—Investigating materials by wave or particle radiation by diffraction, scatter or reflection interference of radiation, e.g. Borrmann effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Medical Informatics (AREA)
  • Radiology & Medical Imaging (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Biophysics (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Biomedical Technology (AREA)
  • General Engineering & Computer Science (AREA)
  • Surgery (AREA)
  • Pulmonology (AREA)
  • Animal Behavior & Ethology (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
JP2010036909A 2010-02-23 2010-02-23 Ｘ線撮像装置 Expired - Fee Related JP5586986B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2010036909A JP5586986B2 (ja) 2010-02-23 2010-02-23 Ｘ線撮像装置
US13/518,233 US8995613B2 (en) 2010-02-23 2011-02-14 X-ray imaging apparatus
PCT/JP2011/053585 WO2011105306A1 (en) 2010-02-23 2011-02-14 X-ray imaging apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010036909A JP5586986B2 (ja) 2010-02-23 2010-02-23 Ｘ線撮像装置

Publications (3)

Publication Number Publication Date
JP2011174715A JP2011174715A (ja) 2011-09-08
JP2011174715A5 JP2011174715A5 (enExample) 2013-04-11
JP5586986B2 true JP5586986B2 (ja) 2014-09-10

Family

ID=44168061

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010036909A Expired - Fee Related JP5586986B2 (ja) 2010-02-23 2010-02-23 Ｘ線撮像装置

Country Status (3)

Country Link
US (1) US8995613B2 (enExample)
JP (1) JP5586986B2 (enExample)
WO (1) WO2011105306A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20150060383A (ko) * 2013-11-26 2015-06-03 한국전기연구원 Ｘ―ｒａｙ 다중에너지 필터를 이용한 플라즈마 이온 분포 측정 방법 및 그 시스템

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5631013B2 (ja) 2010-01-28 2014-11-26 キヤノン株式会社 Ｘ線撮像装置
JP5796976B2 (ja) 2010-05-27 2015-10-21 キヤノン株式会社 Ｘ線撮像装置
JP6228457B2 (ja) * 2010-10-19 2017-11-08 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 微分位相コントラスト画像形成
EP2630476B1 (en) * 2010-10-19 2017-12-13 Koninklijke Philips N.V. Differential phase-contrast imaging
JP5208224B2 (ja) * 2011-01-12 2013-06-12 富士フイルム株式会社 放射線撮影装置、及び放射線撮影システム
US9597050B2 (en) * 2012-01-24 2017-03-21 Koninklijke Philips N.V. Multi-directional phase contrast X-ray imaging
WO2013187012A1 (en) * 2012-06-15 2013-12-19 Canon Kabushiki Kaisha X-ray apparatus and x-ray measurement method
DE102013221818A1 (de) * 2013-10-28 2015-04-30 Siemens Aktiengesellschaft Bildgebendes System und Verfahren zur Bildgebung
WO2017063156A1 (en) * 2015-10-14 2017-04-20 Shenzhen Xpectvision Technology Co., Ltd. X-ray detectors of high spatial resolution
WO2017207734A1 (en) 2016-06-02 2017-12-07 Koninklijke Philips N.V. X-ray imaging apparatus for compact (quasi-)isotropic multi source x-ray imaging
US10859512B2 (en) * 2016-06-15 2020-12-08 Shimadzu Corporation X-ray phase contrast imaging apparatus
IL251636B (en) 2017-04-06 2018-02-28 Yoav Berlatzky Coherence camera system and method thereof
EP3498171A1 (en) * 2017-12-15 2019-06-19 Koninklijke Philips N.V. Single shot x-ray phase-contrast and dark field imaging
EP3534377B1 (de) * 2018-02-28 2021-11-17 Siemens Healthcare GmbH Verfahren zur herstellung eines mikrostrukturbauteils
EP3534376A1 (de) 2018-02-28 2019-09-04 Siemens Healthcare GmbH Verfahren zur herstellung eines mikrostrukturbauteils, mikrostrukturbauteil und röntgengerät
DE102018124175A1 (de) * 2018-10-01 2020-04-02 Sikora Ag Verfahren und Vorrichtung zum Steuern einer Produktionsanlage für plattenförmige oder strangförmige Körper
FR3092398B1 (fr) * 2019-01-31 2021-02-26 Imagine Optic Procédés et systèmes pour l’imagerie de contraste phase

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2441578A (en) * 2006-09-08 2008-03-12 Ucl Business Plc Phase Contrast X-Ray Imaging
JP4864052B2 (ja) 2008-07-31 2012-01-25 アース製薬株式会社 温水洗浄便座の洗浄ノズル洗浄用泡吐出式ポンプ製品
JP5675169B2 (ja) * 2009-06-18 2015-02-25 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP5631013B2 (ja) 2010-01-28 2014-11-26 キヤノン株式会社 Ｘ線撮像装置
US9066704B2 (en) 2011-03-14 2015-06-30 Canon Kabushiki Kaisha X-ray imaging apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20150060383A (ko) * 2013-11-26 2015-06-03 한국전기연구원 Ｘ―ｒａｙ 다중에너지 필터를 이용한 플라즈마 이온 분포 측정 방법 및 그 시스템
KR101690122B1 (ko) 2013-11-26 2017-01-09 한국전기연구원 Ｘ―ｒａｙ 다중에너지 필터를 이용한 플라즈마 이온 분포 측정 방법 및 그 시스템

Also Published As

Publication number Publication date
WO2011105306A4 (en) 2011-10-27
JP2011174715A (ja) 2011-09-08
US20120263274A1 (en) 2012-10-18
WO2011105306A1 (en) 2011-09-01
US8995613B2 (en) 2015-03-31

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