JP2011106836A5 - - Google Patents

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Publication number
JP2011106836A5
JP2011106836A5 JP2009259310A JP2009259310A JP2011106836A5 JP 2011106836 A5 JP2011106836 A5 JP 2011106836A5 JP 2009259310 A JP2009259310 A JP 2009259310A JP 2009259310 A JP2009259310 A JP 2009259310A JP 2011106836 A5 JP2011106836 A5 JP 2011106836A5
Authority
JP
Japan
Prior art keywords
reflecting
measuring apparatus
reflecting mirror
shape
axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2009259310A
Other languages
English (en)
Japanese (ja)
Other versions
JP5424826B2 (ja
JP2011106836A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2009259310A priority Critical patent/JP5424826B2/ja
Priority claimed from JP2009259310A external-priority patent/JP5424826B2/ja
Priority to US12/908,405 priority patent/US8437004B2/en
Priority to EP10188359.3A priority patent/EP2345888B1/en
Publication of JP2011106836A publication Critical patent/JP2011106836A/ja
Publication of JP2011106836A5 publication Critical patent/JP2011106836A5/ja
Application granted granted Critical
Publication of JP5424826B2 publication Critical patent/JP5424826B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2009259310A 2009-11-12 2009-11-12 測定装置 Expired - Fee Related JP5424826B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009259310A JP5424826B2 (ja) 2009-11-12 2009-11-12 測定装置
US12/908,405 US8437004B2 (en) 2009-11-12 2010-10-20 Detection apparatus
EP10188359.3A EP2345888B1 (en) 2009-11-12 2010-10-21 Detection apparatus for optical reflectance measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009259310A JP5424826B2 (ja) 2009-11-12 2009-11-12 測定装置

Publications (3)

Publication Number Publication Date
JP2011106836A JP2011106836A (ja) 2011-06-02
JP2011106836A5 true JP2011106836A5 (enExample) 2012-12-27
JP5424826B2 JP5424826B2 (ja) 2014-02-26

Family

ID=43844562

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009259310A Expired - Fee Related JP5424826B2 (ja) 2009-11-12 2009-11-12 測定装置

Country Status (3)

Country Link
US (1) US8437004B2 (enExample)
EP (1) EP2345888B1 (enExample)
JP (1) JP5424826B2 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3130843A1 (de) * 2015-08-13 2017-02-15 Karlsruher Institut für Technologie Vorrichtung zum mischen und leiten elektromagnetischer strahlung
EP3736550A1 (en) * 2019-05-10 2020-11-11 X-Rite Switzerland GmbH Illumination device for a spectrophotometer having integrated mixing optics, and method for illuminating a sample

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3702395A (en) * 1970-10-09 1972-11-07 Us Navy Condenser system for high intensity light source
US4918583A (en) * 1988-04-25 1990-04-17 Nikon Corporation Illuminating optical device
JP2801941B2 (ja) 1990-02-13 1998-09-21 いわき電子株式会社 外観検査装置及びそれに用いる照明装置
JP2878944B2 (ja) * 1993-05-19 1999-04-05 三菱電機株式会社 光源装置及び投写型表示装置
US5642189A (en) * 1995-06-12 1997-06-24 Measurex Corporation Color sensor simulating standard source illuminant
JP3697007B2 (ja) 1997-02-10 2005-09-21 浜松ホトニクス株式会社 マルチタイタープレート分析装置
US6684099B2 (en) 2002-04-04 2004-01-27 Inlight Solutions, Inc. Apparatus and method for reducing spectral complexity in optical sampling
US6788404B2 (en) * 2002-07-17 2004-09-07 Kla-Tencor Technologies Corporation Inspection system with multiple illumination sources
JP4086664B2 (ja) * 2003-01-07 2008-05-14 三菱電機株式会社 照明光学系構造及び投写型表示装置
DE10317615B4 (de) 2003-04-11 2005-10-06 Carl Zeiss Jena Gmbh Fluoreszenzmikroskopanordnung
JP4853823B2 (ja) 2005-12-15 2012-01-11 岩崎電気株式会社 光量モニタとそれを用いた光源装置
DE102006010105A1 (de) 2006-02-28 2007-08-30 Carl Zeiss Meditec Ag Ophthalmologisches Gerät
JP4511563B2 (ja) 2007-02-13 2010-07-28 株式会社林創研 顕微鏡
JP4290209B2 (ja) * 2007-04-05 2009-07-01 三菱電機株式会社 画像表示装置および画像表示方法
JP2008286530A (ja) * 2007-05-15 2008-11-27 Konica Minolta Sensing Inc 反射特性測定装置
JP2009085600A (ja) * 2007-09-27 2009-04-23 Konica Minolta Sensing Inc 光学特性測定装置及び光学特性測定方法

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