JP2010249718A - Photodetector used for testing led - Google Patents

Photodetector used for testing led Download PDF

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JP2010249718A
JP2010249718A JP2009100702A JP2009100702A JP2010249718A JP 2010249718 A JP2010249718 A JP 2010249718A JP 2009100702 A JP2009100702 A JP 2009100702A JP 2009100702 A JP2009100702 A JP 2009100702A JP 2010249718 A JP2010249718 A JP 2010249718A
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light
wiring board
led
support
substrate
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Kenichi Washio
賢一 鷲尾
Masashi Hasegawa
昌志 長谷川
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Micronics Japan Co Ltd
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Micronics Japan Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To test a plenty of LEDs in several times without complexing and increasing a price of an apparatus, thereby reducing a time and labor required for testing. <P>SOLUTION: A photodetector for LEDs includes a support having a top surface and a bottom surface respectively penetrating the support in a vertical direction, and provided with a plurality of light passages allowing light emitted by the LEDs to enter from the downside and advance to the upside; a wiring board disposed above the support and having a plurality of internal wiring; and a plurality of photoreceptors disposed below the wiring board to receive light advancing through the light passages and generate an electric signal, and electrically connected to the internal wiring. The plurality of light passages and the plurality of photoreceptors are disposed at least in one row in the same direction at the same pitches. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

本発明は、複数のLED(発光ダイオード)を試験する装置に用いられる光検出装置に関する。   The present invention relates to a light detection device used in an apparatus for testing a plurality of LEDs (light emitting diodes).

LEDが正しい光を発生するか否かの検査すなわち試験は、一般に、LEDを点灯させて、そのLEDからの光を受光器で検出して良否を決定する試験装置を用いて行われている。この種の試験装置は、種々提案されている(特許文献1,2,3)。   In general, an inspection, that is, a test of whether an LED generates correct light is performed using a test apparatus that turns on an LED and detects light from the LED with a light receiver to determine whether the light is good or bad. Various types of this type of test apparatus have been proposed (Patent Documents 1, 2, and 3).

しかし、上記いずれの従来技術も、LEDからの光を検出する光検出装置が1つのLEDで発光された光を光学系により受光器に導く光学機器として構成されているにすぎないから、LEDを1つずつ試験することができるにすぎない。このため、LEDウエーハや配線基板のようなLED基板に備えられた複数のLEDを試験する場合、LED毎に試験しなければならず、試験に時間と労力を要する。   However, in any of the above prior arts, the light detection device for detecting the light from the LED is merely configured as an optical device that guides the light emitted from one LED to the light receiver by the optical system. You can only test one by one. For this reason, when testing a plurality of LEDs provided on an LED substrate such as an LED wafer or a wiring substrate, the test must be performed for each LED, and the test requires time and labor.

上記課題を解決するために、複数の上記光学機器を用いて、LED基板に備えられた多数のLEDを一回で又は複数回に分けて試験可能の光検出装置とすることが考えられる。しかし、そのような光検出装置では、平面的に見たときの光学系及び受光器の大きさがLEDのそれに比べてきわめて大きいから、光学系を複雑な形状にしなければならず、したがって装置が複雑化し、高価になる。   In order to solve the above-mentioned problem, it is conceivable to use a plurality of the above-described optical devices to make a light detection device capable of testing a large number of LEDs provided on the LED substrate at one time or divided into a plurality of times. However, in such a light detection device, since the size of the optical system and the light receiver when viewed in plan is very large compared to that of the LED, the optical system has to have a complicated shape. Complicated and expensive.

本発明は、装置の複雑化及び高価格化を招くことなく、多数のLEDを複数回に分けて試験することを可能し、それにより試験に要する時間及び労力を低減することを目的とする。   An object of the present invention is to make it possible to test a large number of LEDs in a plurality of times without increasing the complexity and cost of the apparatus, thereby reducing the time and labor required for the test.

本発明に係る、LEDの試験に用いる光検出装置は、上面及び下面を有する支持体であって、それぞれが、該支持体を上下方向に貫通していると共に、LEDで発光された光が下方側から入射しかつ上方へ進むことを許す複数の光通路を備える支持体と、前記支持体の上側に配置された配線基板であって、複数の内部配線を有する配線基板と、前記光通路を進む光を受光して電気信号を発生すべく前記配線基板の下側に配置された複数の受光体であって、前記内部配線に電気的に接続された複数の受光体とを含む。前記複数の光通路及び前記複数の受光体は、同じピッチで同じ方向に少なくとも1列に配置されている。   The light detection device used for testing the LED according to the present invention is a support having an upper surface and a lower surface, each of which penetrates the support in the vertical direction, and light emitted from the LED is downward. A support body having a plurality of light paths that allow light to enter from the side and travel upward, a wiring board disposed on the upper side of the support body, the wiring board having a plurality of internal wirings, and the light path A plurality of light receivers disposed on the lower side of the wiring board to receive the traveling light and generate an electrical signal, the plurality of light receivers being electrically connected to the internal wiring. The plurality of light paths and the plurality of light receivers are arranged in at least one row in the same direction at the same pitch.

前記配線基板は、それぞれが前記内部配線に接続されて、前記内部配線を外部の電気回路に接続する複数の接続端子を備えることができる。   The wiring board may include a plurality of connection terminals that are each connected to the internal wiring and connect the internal wiring to an external electric circuit.

前記受光体は、複数のCCD素子を備えたCCDセンサ含むことができる。また、光検出装置は、さらに、前記配線基板の上側に配置された放熱板を含むことができる。   The photoreceptor may include a CCD sensor having a plurality of CCD elements. In addition, the light detection device may further include a heat radiating plate disposed on the upper side of the wiring board.

前記配線基板は、さらに、前記受光体の熱を前記放熱板に伝達する熱伝導路を備えることができる。また、前記配線基板は、さらに、熱を前記CCDセンサの側の箇所から吸収し、吸収した熱を前記放熱板の側に放出するサーモモジュールを備えることができる。前記配線基板は前記光通路を閉鎖していてもよい。   The wiring board may further include a heat conduction path that transmits heat of the photoreceptor to the heat radiating plate. The wiring board may further include a thermo module that absorbs heat from a location on the CCD sensor side and releases the absorbed heat to the heat radiating plate side. The wiring board may close the optical path.

光検出装置は、さらに、前記支持体の前記下面に配置された複数の接触子であって、前記光通路の下端部に位置された針先を備える複数の接触子を含むことができる。   The photodetecting device may further include a plurality of contacts disposed on the lower surface of the support body, the plurality of contacts including a needle tip positioned at a lower end portion of the light path.

前記支持体は、前記上面を有する主基板であって、該主基板を上下方向に貫通する第1の開口を備える主基板と、前記下面を有すると共に、前記主基板の下側に配置された補助基板であって、該補助基板を上下方向に貫通して、前記第1の開口に対向された第2の開口を備える補助基板とを含むことができる。また、前記補助基板は、複数の第2の内部配線と、それぞれが前記第2の内部配線に接続された複数のプローブランドであって、それぞれに前記接触子が取り付けられたプローブランドとを備えることができる。   The support is a main substrate having the upper surface, the main substrate having a first opening penetrating the main substrate in the vertical direction, the lower surface, and disposed below the main substrate. An auxiliary substrate, which includes a second opening penetrating through the auxiliary substrate in a vertical direction and facing the first opening, may be included. The auxiliary board includes a plurality of second internal wirings and a plurality of probe lands each connected to the second internal wiring, each having the contact attached thereto. be able to.

前記支持体は、さらに、前記第1及び第2の開口を経て前記補助基板の下方へ突出する筒状の複数の遮光部材であって、上下方向へ延びて、前記光通路を形成する内部空間を有する複数の遮光部材を含むことができる。   The support is further a plurality of cylindrical light shielding members that project downward from the auxiliary substrate through the first and second openings, and extend in the vertical direction to form the light path. A plurality of light shielding members having

上記の代わりに、前記支持体は、前記上面を有する主基板であって、該主基板を上下方向に貫通する第1の貫通穴を備える主基板と、前記下面を有すると共に、前記主基板の下側に配置された補助基板であって、該補助基板を上下方向に貫通すると共に、前記第1の貫通穴に対向された複数の第2の貫通穴を備える補助基板と、前記第1の補助基板の下側に配置された遮光板であって、該遮光板を上下方向に貫通して、前記第2の貫通穴に連通された複数の第3の貫通穴を備える遮光板とを含むことができる。また、前記補助基板は、複数の第2の内部配線と、それぞれが前記第2の内部配線に接続された複数のプローブランドであって、それぞれに前記接触子が取り付けられたプローブランドとを備えることができ、前記第1、第2及び第3の貫通穴は、前記光通路を共同して形成していてもよい。   Instead of the above, the support is a main substrate having the upper surface, the main substrate having a first through hole penetrating the main substrate in the vertical direction, the lower surface, and the main substrate. An auxiliary board disposed on the lower side, the auxiliary board penetrating the auxiliary board in the vertical direction, and having a plurality of second through holes opposed to the first through holes, and the first board A light shielding plate disposed below the auxiliary substrate, the light shielding plate having a plurality of third through holes penetrating the light shielding plate in the vertical direction and communicating with the second through holes. be able to. The auxiliary board includes a plurality of second internal wirings and a plurality of probe lands each connected to the second internal wiring, each having the contact attached thereto. The first, second and third through holes may form the light path jointly.

前記支持体は、さらに、前記主基板と前記補助基板との間に配置されたレンズ板であって、光の通過を許すように前記光通路を横切るレンズ板を含むことができる。   The support may further include a lens plate disposed between the main substrate and the auxiliary substrate, the lens plate crossing the light path so as to allow light to pass therethrough.

光検出装置は、さらに、前記配線基板に配置された温度センサを含むことができる。   The light detection device may further include a temperature sensor disposed on the wiring board.

例えば、複数のLEDがLED基板に複数列に配置されている場合、光検出装置とLED基板とは、光通路の配列方向とLEDの配列方向とが一致しかつ各光通路が1つのLEDからの光を受け入れるように、維持される。これにより、各光通路とLEDとが対応される。   For example, when a plurality of LEDs are arranged in a plurality of rows on the LED substrate, the light detection device and the LED substrate are arranged such that the arrangement direction of the light paths coincides with the arrangement direction of the LEDs and each light path is from one LED. Maintained to accept the light. Thereby, each light path and LED correspond.

上記の状態で、LEDが点灯されると、複数のLEDからの光は、対応する光通路を介して、受光体に入射し、各受光体により検出される。各受光体の検出信号は、そのLEDの良否の判定に用いられる。   When the LEDs are turned on in the above state, light from the plurality of LEDs enters the light receiver via the corresponding light path and is detected by each light receiver. The detection signal of each photoreceptor is used to determine the quality of the LED.

平面的に見て、各光通路の配列ピッチがLEDのそれより大きいときは、検出装置による一回の同時検出において、複数おきのLEDからの光を受光体に導くように、LED基板と検出装置とが光通路の配列方向又は該配列方向と交差する方向にLEDの配列ピッチ分ずつ移動され、それにより試験するLEDが変更される。   In plan view, when the arrangement pitch of each light path is larger than that of the LED, the detection with the LED substrate is performed so that light from every other LED is guided to the photoreceptor in one simultaneous detection by the detection device. The device is moved by the arrangement pitch of the LEDs in the arrangement direction of the light path or in the direction crossing the arrangement direction, thereby changing the LED to be tested.

本発明においては、複数の光通路及び複数の受光体を、それぞれ、光検出装置を試験装置すなわち試験装置のフレームに支持させる支持体及び受光体に電気的に接続された内部配線を有する配線基板に、同じピッチで同じ方向に少なくとも1列に配置し、支持体と配線基板とを、LEDで発光された光が光通路に対し、下方側から入射し、その光通路の上方に位置された受光体に入射するように、上下の関係に重ね合わせている。   In the present invention, a wiring board having a plurality of light paths and a plurality of light receiving bodies, a supporting body for supporting the light detection device on a frame of the test apparatus, that is, a test apparatus, and an internal wiring electrically connected to the light receiving body, respectively. In addition, the light emitted from the LED is incident on the light path from the lower side, and the support body and the wiring board are arranged in the same direction at the same pitch and in the same direction, and are positioned above the light path. In order to be incident on the photoreceptor, they are superposed in a vertical relationship.

これにより、多数のLEDを複数回に分けて試験することができるし、同時に試験可能のLEDの数と同数の光通路及び受光体を必要とせず、その上従来の複数の光学機器を用いる従来技術に比べ、装置が簡略化し、廉価になる。   As a result, a large number of LEDs can be tested in a plurality of times, and the same number of light paths and photoreceptors as the number of LEDs that can be tested at the same time are not required. Compared to technology, the device is simplified and inexpensive.

上記の結果として、本発明によれば、装置が簡略化し、廉価になるにもかかわらず、試験に要する時間及び労力が著しく低減する。   As a result of the above, the present invention significantly reduces the time and effort required for testing, despite the simplicity and cost of the apparatus.

本発明に係る光検出装置を用いる試験装置の一実施例を示す平面図である。It is a top view which shows one Example of the testing apparatus using the photon detection apparatus which concerns on this invention. 図1に示す光検出装置の正面図である。It is a front view of the photon detection apparatus shown in FIG. 図1における3−3線に沿って得た断面図である。It is sectional drawing obtained along the 3-3 line in FIG. 光通路の下端部とLEDとの関係を示す拡大断面図である。It is an expanded sectional view which shows the relationship between the lower end part of a light path, and LED. 本発明に係る光検出装置の他の実施例を示す、図3と同様の断面図である。FIG. 4 is a cross-sectional view similar to FIG. 3, showing another embodiment of the photodetecting device according to the present invention. 図5に示す光検出装置における光通路の下端部とLEDとの関係を示す拡大断面図である。FIG. 6 is an enlarged cross-sectional view illustrating a relationship between a lower end portion of a light path and LEDs in the light detection device illustrated in FIG. 5. 図1に示す光検出装置により試験するLED基板の一実施例を示す斜視図である。It is a perspective view which shows one Example of the LED board tested by the photon detection apparatus shown in FIG. 図6に示すLED基板に配置されたLEDアレイの一部を示す斜視図である。It is a perspective view which shows a part of LED array arrange | positioned at the LED board shown in FIG. 図6に示すLEDアレイ中の1つのLEDの一実施例を示す平面図である。It is a top view which shows one Example of one LED in the LED array shown in FIG.

[用語の説明]   [Explanation of terms]

本発明においては、図2において、上下方向を上下方向又はZ方向といい、左右方向を左右方向又はX方向といい、紙面に垂直な方向を前後方向又はY方向という。しかし、これらの方向は、LED基板を光検出装置に配置する姿勢に応じて異なる。   In the present invention, in FIG. 2, the up and down direction is referred to as the up and down direction or the Z direction, the left and right direction is referred to as the left and right direction or the X direction, and the direction perpendicular to the paper surface is referred to as the front and back direction or the Y direction. However, these directions differ depending on the posture in which the LED substrate is arranged in the light detection device.

したがって、上記の方向は、光検出装置による試験時のLED基板の姿勢に応じて、左右方向(X方向)及び前後方向(Y方向)を含む面(XY面)が、水平面、水平面に対し傾斜する傾斜面、及び水平面に垂直の垂直面のいずれかの面内となるように決定される。   Therefore, in the above direction, the plane (XY plane) including the left and right direction (X direction) and the front and rear direction (Y direction) is inclined with respect to the horizontal plane and the horizontal plane according to the posture of the LED substrate at the time of the test by the photodetector. It is determined to be in any one of the inclined surface and the vertical plane perpendicular to the horizontal plane.

[光検出装置の実施例]   [Example of Photodetection Device]

図1から図4を参照するに、光検出装置10は、多数のLED(発光ダイオード)12をLEDウエーハのようなLED基板14にマトリクス状に配置した基板を被検査体16とし、それらLED12を列毎に複数回に分けて試験する。   Referring to FIGS. 1 to 4, the light detection device 10 is a substrate 16 in which a large number of LEDs (light emitting diodes) 12 are arranged in a matrix on an LED substrate 14 such as an LED wafer, and these LEDs 12 are connected to each other. Test multiple times for each row.

LED基板14は、多数のLED12を図7に斜線で示すLED領域18に図8に示すようにマトリクス状に配置している。図8は、XY方向に3列×6個のLEDアレイを示すにすぎないが、実際にはそれよりさらに多いLED12がLED基板14に配置されている。   The LED substrate 14 has a large number of LEDs 12 arranged in a matrix as shown in FIG. 8 in an LED region 18 indicated by hatching in FIG. FIG. 8 shows only 3 rows × 6 LED arrays in the XY direction, but actually more LEDs 12 are arranged on the LED substrate 14.

図4,8及び9に示すように、各LED12は、発光部20と、正側の電極22と、負側の電極24とを、電極22及び24が発光部20の両側に位置する状態に、ベース部26の上面に有しており、またベース部26の下面においてLED基板14に配置されている。   As shown in FIGS. 4, 8, and 9, each LED 12 has the light emitting unit 20, the positive electrode 22, and the negative electrode 24 in a state where the electrodes 22 and 24 are positioned on both sides of the light emitting unit 20. , And is disposed on the LED substrate 14 on the lower surface of the base portion 26.

再度図1から図4を参照するに、光検出装置10は、LED基板16を受ける検査ステージ28(図2参照)及び電気回路(図示せず)と共に、LEDの試験装置に用いられる。   Referring again to FIGS. 1 to 4, the light detection device 10 is used in an LED testing device together with an inspection stage 28 (see FIG. 2) that receives the LED substrate 16 and an electric circuit (not shown).

光検出装置10は、上面及び下面を有する支持体30と、支持体30の上側に複数のねじ部材により組み付けられた配線基板32と、配線基板32の上側に複数のねじ部材により組み付けられた放熱板34と、配線基板32の下面に取り付けられた複数のCCDセンサ36と、検査ステージ28に受けられたLED12の電極22及び24に接触可能に支持体30の下面に配置された複数対の接触子38とを含む。   The photodetecting device 10 includes a support body 30 having an upper surface and a lower surface, a wiring board 32 assembled with a plurality of screw members above the support body 30, and a heat dissipation assembled with a plurality of screw members above the wiring board 32. A plurality of pairs of contacts disposed on the lower surface of the support 30 so as to be in contact with the plate 34, the plurality of CCD sensors 36 attached to the lower surface of the wiring board 32, and the electrodes 22 and 24 of the LED 12 received by the inspection stage 28. Child 38.

検査ステージ28は、LED基板16を上面に解除可能に吸着するチャックトップ40と、チャックトップ40を、XYZの三方向に三次元的に移動させると共に、Z方向へ延びるθ軸線の周りに角度的に回転させるステージ移動機構42とを備える公知のものである。   The inspection stage 28 three-dimensionally moves the chuck top 40 in three directions of XYZ, and chucks the LED substrate 16 releasably on the upper surface, and angularly around the θ axis extending in the Z direction. It is a well-known thing provided with the stage moving mechanism 42 to rotate it.

支持体30は、矩形の主基板44と、主基板44の下側に配置された矩形の補助基板46であって、主基板44及び補助基板46の厚さ方向を上下方向とした補助基板46と、主基板44及び補助基板46を上下方向に貫通して、補助基板46の下方へ突出する筒状の複数の遮光部材48とを含む。   The support 30 is a rectangular main substrate 44 and a rectangular auxiliary substrate 46 disposed below the main substrate 44, and the auxiliary substrate 46 has the thickness direction of the main substrate 44 and the auxiliary substrate 46 set in the vertical direction. And a plurality of cylindrical light shielding members 48 that pass through the main substrate 44 and the auxiliary substrate 46 in the vertical direction and project downward from the auxiliary substrate 46.

主基板44は、ステンレス鋼のような剛性を有する金属材料で製作されており、また主基板44を上下方向に貫通しかつ左右方向に長い矩形の横断面形状を有する開口50(図3参照)を備える。   The main board 44 is made of a metal material having rigidity such as stainless steel, and has an opening 50 (see FIG. 3) that penetrates the main board 44 in the vertical direction and has a rectangular cross section that is long in the horizontal direction. Is provided.

これに対し、補助基板46は、ガラス入りエポキシ、セラミック、ポリイミド樹脂等の電気絶縁材料で多層配線基板の形に形成されており、また補助基板46を上下方向に貫通XY方向に長い開口52と、CCDセンサ36に電気的に接続された複数の内部配線54(図3,4参照)と、補助基板46の前記した内部配線54に電気的に接続されたプローブランド56(図4参照)とを備える。   On the other hand, the auxiliary board 46 is formed in the shape of a multilayer wiring board with an electrically insulating material such as glass-filled epoxy, ceramic, polyimide resin, etc., and the auxiliary board 46 has an opening 52 that extends vertically in the XY direction. A plurality of internal wirings 54 (see FIGS. 3 and 4) electrically connected to the CCD sensor 36, and probe lands 56 (see FIG. 4) electrically connected to the internal wirings 54 of the auxiliary substrate 46, Is provided.

開口52は、主基板44の開口50に整合されており、また開口50と同じ横断面形状を有する。図示の例では、開口50及び52それぞれは、一方向に整列された複数の貫通穴の形に形成されている。補助基板46は、主基板44より小さくされている。   The opening 52 is aligned with the opening 50 of the main substrate 44 and has the same cross-sectional shape as the opening 50. In the illustrated example, each of the openings 50 and 52 is formed in the form of a plurality of through holes aligned in one direction. The auxiliary board 46 is smaller than the main board 44.

各遮光部材48は、開口50及び52の長手方向に整列されて、開口50及び52を上下方向に貫通して延びており、また補助基板46から下方へ突出すると共に、上下に開放すると共に上端を配線基板32の下面に当接させた状態に、主基板44及び補助基板46に支持されている。   Each light shielding member 48 is aligned in the longitudinal direction of the openings 50 and 52, extends through the openings 50 and 52 in the vertical direction, protrudes downward from the auxiliary substrate 46, opens up and down, and opens at the upper end. Is supported by the main board 44 and the auxiliary board 46 in a state of being in contact with the lower surface of the wiring board 32.

各遮光部材48の内部空間は、LED12の発光部20からの光60(図4参照)が下方から入射して上方へ進む光通路58(図3,4参照)として作用する。   The internal space of each light shielding member 48 acts as a light path 58 (see FIGS. 3 and 4) in which light 60 (see FIG. 4) from the light emitting unit 20 of the LED 12 enters from below and travels upward.

図示の例では、4つのCCDセンサ36及び4つの遮光部材48が左右方向に整列されて一列に設けられているように示しているにすぎないが、実際には、より多くの遮光部材48が左右方向に整列されて一列に設けられている。   In the illustrated example, the four CCD sensors 36 and the four light shielding members 48 are merely shown as being arranged in a line in the left-right direction, but in reality, more light shielding members 48 are provided. They are arranged in a line aligned in the left-right direction.

左右方向におけるCCDセンサ36及び遮光部材48の配置ピッチは、図7に示す領域18に形成されたLED12を列毎に一回で又は複数回に分けて同時に試験することができる値、すなわち列方向におけるLED12の配置ピッチの整数倍の値とされている。   The arrangement pitch of the CCD sensor 36 and the light shielding member 48 in the left-right direction is a value that allows the LEDs 12 formed in the region 18 shown in FIG. 7 to be tested once in each row or multiple times, that is, in the row direction. The value is an integer multiple of the arrangement pitch of the LEDs 12 in FIG.

各遮光部材48は、その上端部及び下端部をそれぞれ上方及び下方に向けられて、LED12で発光された光60(図4参照)が下方側から入射して、上方へ通過することを許すが、外部の光が光通路58内に入ることを防止する。   Each light shielding member 48 has its upper end and lower end directed upward and downward, respectively, and allows light 60 (see FIG. 4) emitted from the LED 12 to enter from below and pass upward. , Preventing external light from entering the light path 58.

各遮光部材48の下端部の光入射部分48a(図4参照)は、各遮光部材48の軸線に直角な断面の面積が下端側ほど小さくなる截頭円錐形又は截頭角錐形の形状を有する。   The light incident portion 48a (see FIG. 4) at the lower end portion of each light shielding member 48 has a truncated cone shape or a truncated pyramid shape in which the area of the cross section perpendicular to the axis of each light shielding member 48 decreases toward the lower end side. .

各遮光部材48の下端には、蛇腹状の遮光部62(図4参照)が設けられている。遮光部62は、対応する接触子38が対応する電極22又は24に押圧されたとき、他のLED12の上面に押圧されて、外部の光が光通路58に入ることを防止する。   A bellows-shaped light shielding portion 62 (see FIG. 4) is provided at the lower end of each light shielding member 48. When the corresponding contactor 38 is pressed against the corresponding electrode 22 or 24, the light shielding unit 62 is pressed against the upper surface of the other LED 12 to prevent external light from entering the light path 58.

主基板44及び補助基板46に、それぞれ、互いに連通された複数の貫通穴からなる開口50及び52を設ける代わりに、それぞれが独立した複数の貫通穴を設けてもよい。   Instead of providing the main substrate 44 and the auxiliary substrate 46 with the openings 50 and 52 each having a plurality of through holes communicating with each other, a plurality of independent through holes may be provided.

配線基板32は、ガラス入りエポキシ樹脂のような電気絶縁性材料を有する材料を主成分としており、またそれぞれがCCDセンサ36に接続された複数の内部配線64(図3,4参照)と、CCDセンサ36及び放熱板34の両者に接触する柱状の熱伝導体66(図3,4参照)とを備える。   The wiring board 32 is mainly composed of a material having an electrically insulating material such as glass-filled epoxy resin, and a plurality of internal wirings 64 (see FIGS. 3 and 4) each connected to the CCD sensor 36, and the CCD. A columnar heat conductor 66 (see FIGS. 3 and 4) that contacts both the sensor 36 and the heat radiating plate 34 is provided.

CCDセンサ36は、光通路58を経る光60を受光して、受光量に対応する電気信号を内部配線64に伝達するように、配線基板32に下面に取り付けられている。CCDセンサ36は、この実施例においては受光体として作用するが、CCD素子のような単一の受光素子、若しくは他の単一又は複数の受光素子を受光体として用いてもよい。   The CCD sensor 36 is attached to the lower surface of the wiring board 32 so as to receive the light 60 passing through the light path 58 and transmit an electric signal corresponding to the amount of received light to the internal wiring 64. The CCD sensor 36 functions as a light receiver in this embodiment, but a single light receiving element such as a CCD element, or other single or plural light receiving elements may be used as the light receiving body.

各熱伝導体66は、銅のように熱伝導率の高い材料で形成されており、またCCDセンサ36の熱を放熱板34に伝達する熱伝導路を形成している。   Each heat conductor 66 is made of a material having a high thermal conductivity such as copper, and forms a heat conduction path for transferring the heat of the CCD sensor 36 to the heat radiating plate 34.

放熱板34は、板状のベース34aの上面から上方に突出する複数の放熱フィン34bを備えた既知のものであり、また下面が熱伝導体66の上面に当接させた状態に配線基板32の上面に配置されている。   The heat radiating plate 34 is a known one having a plurality of heat radiating fins 34 b protruding upward from the upper surface of the plate-like base 34 a, and the lower surface of the heat radiating plate 66 is in contact with the upper surface of the heat conductor 66. It is arrange | positioned on the upper surface of.

各接触子38は、LED12の電極22又は24の押圧される針先を有しており、下端部すなわち針先部が前記した遮光部62を外側から光通路58に貫通して、下端すなわち針先が光通路58の下端に位置するように、上端部においてプローブランド56に半田のような導電性結合材により結合されている。   Each contactor 38 has a needle tip to which the electrode 22 or 24 of the LED 12 is pressed, and the lower end portion, that is, the needle tip portion, penetrates the light shielding portion 62 from the outside to the light path 58 from the outside, and the lower end, that is, the needle. At the upper end, the probe land 56 is coupled with a conductive bonding material such as solder so that the tip is located at the lower end of the optical path 58.

配線基板32は、また、複数のコネクタ70を上面に備える。各コネクタ70は、複数の端子(図示せず)を備えており、またそれらの端子が上方に向く状態に複数のビスにより配線基板32に取り付けられている。   The wiring board 32 also includes a plurality of connectors 70 on the upper surface. Each connector 70 includes a plurality of terminals (not shown), and is attached to the wiring board 32 with a plurality of screws so that the terminals face upward.

各コネクタ70の端子は、CCDセンサ36に対し電気信号の授受を行うように、配線基板32の内部配線64に電気的に接続されていると共に、前記した電気回路に電気的に接続される。   The terminals of each connector 70 are electrically connected to the internal wiring 64 of the wiring board 32 and electrically connected to the above-described electric circuit so as to send and receive electrical signals to the CCD sensor 36.

補助基板46も、また、複数のコネクタ72を上面に備える。各コネクタ72は、複数の端子(図示せず)を備えており、またそれらの端子が配線基板32に設けられた開口74を介して上方に露出する状態に複数のビスにより補助基板46に取り付けられている。   The auxiliary board 46 also includes a plurality of connectors 72 on the upper surface. Each connector 72 is provided with a plurality of terminals (not shown), and these terminals are attached to the auxiliary board 46 with a plurality of screws so that the terminals are exposed upward through openings 74 provided in the wiring board 32. It has been.

各コネクタ72の端子は、CCDセンサ36に対し電気信号の授受を接触子38を介して行うように、補助基板46の内部配線54に電気的に接続されていると共に、前記した試験用の電気回路に電気的に接続される。   The terminals of each connector 72 are electrically connected to the internal wiring 54 of the auxiliary substrate 46 so that electrical signals are transmitted to and received from the CCD sensor 36 via the contact 38, and the above-described test electrical circuit is used. Electrically connected to the circuit.

コネクタ70又は72の代わりに、テスターランドのような他の端子部を配線基板32又は補助基板46に設けてもよい。   Instead of the connector 70 or 72, another terminal portion such as a tester land may be provided on the wiring board 32 or the auxiliary board 46.

支持体30(主基板44、補助基板46)、配線基板32及び放熱板34は、それらの厚さ方向が上下方向となる上記の状態に、複数のねじ部材により組み付けられている。支持体30は、主基板44が上側となり、補助基板46が下側となる状態に、主基板44において光検出装置10を用いる試験装置(図示せず)のホルダー76に受けられて、試験装置のフレームに支持されたホルダー76(図2参照)に複数のねじ部材により取り付けられる。   The support 30 (the main board 44 and the auxiliary board 46), the wiring board 32, and the heat radiating plate 34 are assembled by a plurality of screw members in the above state in which the thickness direction thereof is the vertical direction. The support 30 is received by a holder 76 of a test apparatus (not shown) using the light detection device 10 on the main substrate 44 with the main substrate 44 on the upper side and the auxiliary substrate 46 on the lower side. A plurality of screw members are attached to a holder 76 (see FIG. 2) supported by the frame.

光検出装置10において、図示しない温度センサを配線基板32に設けて、配線基板32が許容温度を超えたとき、放熱板34に送風し、放熱板34を冷却するようにしてもよい。   In the light detection device 10, a temperature sensor (not shown) may be provided on the wiring board 32, and when the wiring board 32 exceeds the allowable temperature, the heat radiating plate 34 is blown to cool the heat radiating plate 34.

[光検出装置による試験方法]   [Test method using photodetection device]

被検査体16は、チャックトップ40に配置され、最初の列の複数(CCDセンサ36と同数)のLED12の試験をするために、チャックトップ40がステージ移動機構42によりXY方向に移動されると共に、θ軸線の周りに角度的に回転される(ステップ101)。   The device under test 16 is disposed on the chuck top 40, and the chuck top 40 is moved in the XY directions by the stage moving mechanism 42 in order to test a plurality of LEDs 12 (the same number as the CCD sensor 36) in the first row. , Is rotated angularly about the θ axis (step 101).

これにより、LED12の配列方向がCCDセンサ36の配列方向とされ、また最初の列の最左端(又は、最右端)に位置するLED12の電極22及び24が接触子38の針先に接触可能の状態及び同じ列の他の複数のLED12の電極22及び24が他の複数の接触子38の針先に接触可能の状態に、CCDセンサ36と同数の複数のLED12が光検出装置10に維持される。その結果、各LED12は光通路58の下端に対向される。   Thus, the arrangement direction of the LEDs 12 is the arrangement direction of the CCD sensor 36, and the electrodes 22 and 24 of the LED 12 located at the leftmost end (or rightmost end) of the first row can contact the needle tip of the contact 38. In the state and in a state where the electrodes 22 and 24 of the other LEDs 12 in the same row can contact the needle tips of the other contacts 38, the same number of LEDs 12 as the CCD sensor 36 are maintained in the light detection device 10. The As a result, each LED 12 is opposed to the lower end of the light path 58.

次いで、チャックトップ40がステージ移動機構42により上昇されて、各光通路58に対応する接触子38の針先が所定のLED12の電極22及び24に押圧される(ステップ102)。   Next, the chuck top 40 is raised by the stage moving mechanism 42, and the needle tips of the contact 38 corresponding to the respective light paths 58 are pressed against the electrodes 22 and 24 of the predetermined LED 12 (step 102).

次いで、各光通路58の下端に対向されたLED12用のドライバー(図示せず)に点灯指令信号が供給されて、LED12が点灯される(ステップ103)。これにより、各光通と58に対向されたLED12からの光は、対応する光通路58にその下方から入射し、CCDセンサ36に達する。   Next, a lighting command signal is supplied to a driver (not shown) for the LED 12 facing the lower end of each light path 58, and the LED 12 is turned on (step 103). As a result, the light from the LED 12 facing each light passage 58 enters the corresponding light path 58 from below and reaches the CCD sensor 36.

各CCDセンサ36は、入射した光の色相及び強度にそれぞれ対応する信号を発生し、それらの信号を前記した試験用電気回路に出力する。CCDセンサ36からの電気信号は、その電気回路において、入力した電気信号を基に、対応するLED12が正しい色相及び強度を有する光を発生しているか否か(LED12の正否)の判定に用いられる。   Each CCD sensor 36 generates a signal corresponding to the hue and intensity of the incident light, and outputs these signals to the test electrical circuit described above. The electrical signal from the CCD sensor 36 is used in the electrical circuit to determine whether or not the corresponding LED 12 generates light having the correct hue and intensity based on the input electrical signal (correctness of the LED 12). .

最初の複数のLED12の試験が終了すると、同じ列の次の複数(CCDセンサ36と同数)のLED12の試験をするために、チャックトップ40がステージ移動機構42により下降された後に、LED12のチャックトップ40が配置ピッチ分だけ右方(又は、左方)に移動される(ステップ104)。   When the test of the first plurality of LEDs 12 is finished, the chuck top 40 is lowered by the stage moving mechanism 42 to test the next plurality of LEDs 12 (the same number as the CCD sensor 36) in the same row, and then the chuck of the LEDs 12 is checked. The top 40 is moved to the right (or left) by the arrangement pitch (step 104).

これにより、次の複数のLED12の電極22及び24が接触子38の針先に接触可能の状態に、次の複数のLED12が光検出装置10に維持される。その結果、次の各LED12は光通路58の下端に対向される。   As a result, the electrodes 22 and 24 of the next plurality of LEDs 12 can be brought into contact with the needle tips of the contacts 38, and the next plurality of LEDs 12 are maintained in the light detection device 10. As a result, each next LED 12 is opposed to the lower end of the light path 58.

その後は、同じ列の全てLED12の試験が終了するまで、上記ステップ102から104が繰り返される(ステップ105)。   Thereafter, the above steps 102 to 104 are repeated until the test of all the LEDs 12 in the same row is completed (step 105).

一列中の全てLED12の試験が終了すると、次の列のLED12の試験をするために、チャックトップ40がステージ移動機構42により下降された後に、チャックトップ40がステージ移動機構42によりXY方向に移動される(ステップ106)。   When the test of all the LEDs 12 in one row is completed, the chuck top 40 is moved down in the XY direction by the stage moving mechanism 42 after the chuck top 40 is lowered by the stage moving mechanism 42 in order to test the LEDs 12 in the next row. (Step 106).

これにより、次の複数のLED12の配列方向がCCDセンサ36の配列方向とされ、また2列目の最左端(又は、最右端)に位置するLED12の電極22及び24が接触子38の針先に接触可能の状態及び同じ列の他の複数のLED12の電極22及び24が他の複数の接触子38の針先に接触可能の状態に、CCDセンサ36と同数の複数のLED12が光検出装置10に維持される。その結果、各LED12は光通路58の下端に対向される。   Thereby, the arrangement direction of the next plurality of LEDs 12 is the arrangement direction of the CCD sensor 36, and the electrodes 22 and 24 of the LED 12 located at the leftmost end (or rightmost end) of the second row are the needle tips of the contactor 38. And the electrodes 22 and 24 of the other plurality of LEDs 12 in the same row can contact the needle tips of the other plurality of contacts 38, and the same number of LEDs 12 as the CCD sensor 36 is provided as the light detection device. 10 is maintained. As a result, each LED 12 is opposed to the lower end of the light path 58.

その後は、全てLED12の試験が終了するまで、上記ステップ102から106が繰り返される。前記した電気回路における、LED12の正否の判定結果は、被検査体16、特にLED12の良否の区別に用いられる。   Thereafter, the above steps 102 to 106 are repeated until the test of all the LEDs 12 is completed. The determination result of whether the LED 12 is correct or not in the above-described electric circuit is used to determine whether the test object 16, particularly the LED 12, is good or bad.

上記のように被検査体16をCCDセンサ36に対し検査ステージ28によりXYZ方向に移動させる代わりに、CCDセンサ36を被検査体16に対し他の移動機構によりXYZ方向に移動させるようにしてもよい。   As described above, instead of moving the inspection object 16 in the XYZ directions with respect to the CCD sensor 36 by the inspection stage 28, the CCD sensor 36 may be moved in the XYZ directions with respect to the inspection object 16 by another moving mechanism. Good.

上記のように、各遮光部材48の上端が配線基板32の下面に当接されていると、外部の光が光り通路に入ることが確実に防止されるから、LED12の正否をより正確に確認することができる。   As described above, when the upper end of each light shielding member 48 is in contact with the lower surface of the wiring board 32, it is reliably prevented that external light enters the light path. can do.

しかし、LED12からの光が支持体30と配線基板32とを上下方向に離間させてもよい。特に、各遮光部材48の上端が配線基板32の下面に当接されている場合には、支持体30と配線基板32とを上下方向に離間させてもよい。後者の場合、支持体30と配線基板32との間にスペーサや支柱等の介在物を配置してもよい。   However, the light from the LED 12 may separate the support 30 and the wiring board 32 in the vertical direction. In particular, when the upper end of each light shielding member 48 is in contact with the lower surface of the wiring board 32, the support 30 and the wiring board 32 may be separated in the vertical direction. In the latter case, inclusions such as spacers and columns may be arranged between the support 30 and the wiring board 32.

[光検出装置の他の実施例]   [Other Embodiments of Photodetection Device]

図5及び6に示す光検出装置80は、図7から図9に示すLEDウエーハのようなLED基板14にマトリクス状に配置した基板を被検査体16とし、それらLED12を列毎に複数回に分けて試験する。   5 and 6, the substrate 16 arranged in a matrix on the LED substrate 14 such as the LED wafer shown in FIGS. 7 to 9 is used as the inspected object 16, and the LEDs 12 are arranged multiple times for each row. Test separately.

光検出装置80は、支持体82及び配線基板84が光検出装置10の支持体30及び配線基板32と異なる。   In the light detection device 80, the support 82 and the wiring substrate 84 are different from the support 30 and the wiring substrate 32 of the light detection device 10.

支持体82は、主基板86と、レンズ支持板88と、補助基板90と、遮光板92とをそれらの厚さ方向(上下方向)に重ねて配置している。   In the support 82, a main substrate 86, a lens support plate 88, an auxiliary substrate 90, and a light shielding plate 92 are arranged so as to overlap each other in the thickness direction (vertical direction).

主基板86は、主基板86を厚さ方向に貫通する複数の貫通穴94を備える。貫通穴94は、光検出装置10の遮光部材48と同様に、左右方向に一列に整列されている。   The main board 86 includes a plurality of through holes 94 that penetrate the main board 86 in the thickness direction. The through holes 94 are aligned in a line in the left-right direction, like the light blocking member 48 of the light detection device 10.

レンズ支持板88は、主基板86と補助基板90との間に配置されており、またレンズ支持板88を厚さ方向に貫通して、前記した貫通穴94の下端部に整合された複数の貫通穴96を備える。   The lens support plate 88 is disposed between the main substrate 86 and the auxiliary substrate 90, and penetrates the lens support plate 88 in the thickness direction and is aligned with the lower end portion of the through hole 94 described above. A through hole 96 is provided.

補助基板90は、主基板86の下側にレンズ支持板88を介して配置されており、また補助基板90を上下方向に貫通すると共に主基板86の貫通穴94にレンズ支持板88の貫通穴96を介して整合された複数の貫通穴98と、それぞれが前記した内部配線54に接続された前記した複数のプローブランド56とを備える。   The auxiliary substrate 90 is disposed below the main substrate 86 via a lens support plate 88. The auxiliary substrate 90 penetrates the auxiliary substrate 90 in the vertical direction, and the through hole 94 of the lens support plate 88 is inserted into the through hole 94 of the main substrate 86. A plurality of through holes 98 aligned via 96 and the above-described plurality of probe lands 56 each connected to the internal wiring 54 described above are provided.

遮光板92は、補助基板90の下面に配置されており、また遮光板92を上下方向に貫通すると共に補助基板90の貫通穴98に整合された複数の貫通穴100を備える。   The light shielding plate 92 is disposed on the lower surface of the auxiliary substrate 90, and includes a plurality of through holes 100 that vertically penetrate the light shielding plate 92 and are aligned with the through holes 98 of the auxiliary substrate 90.

互いに整合された貫通穴94,96,98及び100の各対は、LED12の発光部20からの光60が下方から入射して上方へ進む、前記した光通路として作用する。   Each pair of the through holes 94, 96, 98 and 100 aligned with each other acts as the above-described light path through which light 60 from the light emitting unit 20 of the LED 12 enters from below and travels upward.

レンズ支持板88には、レンズ板102がレンズ支持板88の貫通穴96をそれらの上端部で閉塞するように、主基板86と補助基板90との間にあって、レンズ支持板88の上端部に配置されている。レンズ板102は、貫通穴96に対応する各箇所に、集光レンズ部102aを有する。各集光レンズ部102aは、対応する貫通穴96を経る光の通過を許す。   The lens support plate 88 is located between the main substrate 86 and the auxiliary substrate 90 so that the lens plate 102 closes the through holes 96 of the lens support plate 88 at their upper end portions, and at the upper end portion of the lens support plate 88. Has been placed. The lens plate 102 has a condensing lens portion 102 a at each location corresponding to the through hole 96. Each condensing lens portion 102 a allows light to pass through the corresponding through hole 96.

配線基板84は、前記した複数の内部配線64に加え、配線基板84の温度を検出する温度センサ104と、CCDセンサ36の側の熱を吸収し、吸収した熱を放熱板34の側に放出するサーモモジュール106とを備える。   The wiring board 84 absorbs heat from the temperature sensor 104 that detects the temperature of the wiring board 84 and the CCD sensor 36 in addition to the plurality of internal wirings 64 described above, and releases the absorbed heat to the heat radiating plate 34 side. And a thermo module 106.

温度センサ104の出力信号は、前記した電気回路に供給される。電気回路は、温度センサ104の出力信号を基に、配線基板84が所定の温度になるように、サーモモジュール106を作動させる駆動信号をサーモモジュール106に出力するように、ドライバー(図示せず)に供給する。サーモモジュール106は、ドライバーから供給される駆動信号により駆動されて、CCDセンサ36の側の熱を吸収し、吸収した熱を放熱板34の側に放出する。   The output signal of the temperature sensor 104 is supplied to the electric circuit described above. Based on the output signal of the temperature sensor 104, the electric circuit is a driver (not shown) so as to output a drive signal for operating the thermo module 106 so that the wiring board 84 reaches a predetermined temperature. To supply. The thermo module 106 is driven by a drive signal supplied from a driver, absorbs heat on the CCD sensor 36 side, and releases the absorbed heat to the heat radiating plate 34 side.

各CCDセンサ36は、主基板82の貫通穴94に位置するように、配線基板84の下面に配置されている。上記レンズ支持板100を備えなくてもよい。   Each CCD sensor 36 is disposed on the lower surface of the wiring board 84 so as to be positioned in the through hole 94 of the main board 82. The lens support plate 100 may not be provided.

光検出装置80も、光検出装置10と同様に動作して、LED12を試験する。   The light detection device 80 operates in the same manner as the light detection device 10 to test the LED 12.

上記いずれの実施例においても、CCDセンサ36及び光通路をLED12と同様にマトリクス状に配置して、LED基板14に備えられた多数のLED12を一回で、又は複数回の分けて、同時に試験するようにしてもよい。   In any of the above-described embodiments, the CCD sensor 36 and the light path are arranged in a matrix like the LEDs 12, and a large number of LEDs 12 provided on the LED substrate 14 are tested at a time or in a plurality of times. You may make it do.

本発明は、上記した形状を有しかつLED基板14に配置されたLED12の試験のみならず、配線基板のような他の基板に配置された複数のLEDや、両電極22及び24をベース部26の同じ又は異なる側面や、下面等に備えたLED等、他の形状を有するLEDにも適用することができる。   In the present invention, not only the test of the LED 12 having the above-described shape and disposed on the LED substrate 14 but also a plurality of LEDs disposed on another substrate such as a wiring substrate, and both electrodes 22 and 24 are included in the base portion. The present invention can also be applied to LEDs having other shapes, such as LEDs provided on the same or different side surfaces of 26 or the lower surface.

また、本発明は、一方の電極をベース部の上面に備え、他方の電極をベース部の下面に有するLEDや、両電極をベース部の下面に配置して、両電極に電気信号を基板の側から供給するLED等、他のLEDの試験にも適用することができる。前者のLEDの場合、他方の電極用の接触子は不要である。また、後者のLEDの場合、両電極用の接触子及び接触子を取り付けている補助基板は不要である。   In addition, the present invention provides an LED having one electrode on the upper surface of the base portion and the other electrode on the lower surface of the base portion, and both electrodes are disposed on the lower surface of the base portion, and an electric signal is sent to both electrodes on the substrate. It can also be applied to other LED tests such as LEDs supplied from the side. In the case of the former LED, the contact for the other electrode is unnecessary. Further, in the case of the latter LED, a contact for both electrodes and an auxiliary substrate to which the contact is attached are unnecessary.

さらに、本発明は、上記のように被検査体16をCCDセンサ36に対し検査ステージ28によりXYZ方向に移動させる代わりに、CCDセンサ36を被検査体16に対し他の移動機構によりXYZ方向に移動させるようにしてもよい。   Further, in the present invention, instead of moving the object 16 to be inspected in the XYZ direction by the inspection stage 28 with respect to the CCD sensor 36 as described above, the CCD sensor 36 is moved in the XYZ direction by another moving mechanism. You may make it move.

上記のように、本発明は、上記実施例に限定されず、特許請求の範囲に記載された趣旨を逸脱しない限り、種々に変更することができる。   As described above, the present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the spirit described in the claims.

10,80 光検出装置
12 LED
14 LED基板
16 被検査体
18 LED領域
20 発光部
22,24 電極
26ベース部
28 検査ステージ
30,82 支持体
32,84 配線基板
34 放熱板
36 CCDセンサ
38 接触子
40 チャックトップ
42 ステージ移動機構
44,86 主基板
46,90 補助基板
48 遮光部材
50,52 開口
54,64 内部配線
56 プローブランド
58 光通路
60 LEDからの光
62 遮光部
66 熱伝導体
70,72 コネクタ
74 開口
76 ホルダー
88 レンズ支持板
92 遮光板
94,96,98,100 貫通穴
102 レンズ板
102a 集光レンズ部
104 温度センサ
106 サーモモジュール
10, 80 Photodetector 12 LED
DESCRIPTION OF SYMBOLS 14 LED board 16 Test object 18 LED area 20 Light emission part 22,24 Electrode 26 Base part 28 Inspection stage 30,82 Support body 32,84 Wiring board 34 Heat sink 36 CCD sensor 38 Contact 40 Chuck top 42 Stage moving mechanism 44 , 86 Main board 46, 90 Auxiliary board 48 Light shielding member 50, 52 Opening 54, 64 Internal wiring 56 Probe land 58 Light path 60 Light from LED 62 Light shielding part 66 Thermal conductor 70, 72 Connector 74 Opening 76 Holder 88 Lens support Plate 92 Light-shielding plate 94, 96, 98, 100 Through hole 102 Lens plate 102a Condensing lens part 104 Temperature sensor 106 Thermo module

特開2006−234497号公報JP 2006-234497 A 特開2006−30153号公報JP 2006-30153 A 特許第31008646号公報Japanese Patent No. 31008646

Claims (13)

上面及び下面を有する支持体であって、それぞれが、該支持体を上下方向に貫通していると共に、LEDで発光された光が下方側から入射しかつ上方へ進むことを許す複数の光通路を備える支持体と、
前記支持体の上側に配置された配線基板であって、複数の内部配線を有する配線基板と、
前記光通路を進む光を受光して電気信号を発生すべく前記配線基板の下側に配置された複数の受光体であって、前記内部配線に電気的に接続された複数の受光体とを含み、
前記複数の光通路及び前記複数の受光体は、同じピッチで同じ方向に少なくとも1列に配置されている、LEDの試験に用いる光検出装置。
A plurality of light paths, each having a top surface and a bottom surface, each passing through the support body in the vertical direction and allowing light emitted from the LED to enter from below and travel upward. A support comprising:
A wiring board disposed above the support, wherein the wiring board has a plurality of internal wirings;
A plurality of light receivers disposed on the lower side of the wiring board to receive light traveling through the light path and generate an electrical signal, the light receivers being electrically connected to the internal wiring; Including
The plurality of light paths and the plurality of light receivers are arranged in at least one row in the same direction at the same pitch, and are used for LED testing.
前記配線基板は、さらに、それぞれが、前記内部配線に接続されて、前記内部配線を外部の電気回路に接続する複数の接続端子を備える、請求項1に記載の   2. The wiring board according to claim 1, further comprising a plurality of connection terminals each connected to the internal wiring and connecting the internal wiring to an external electric circuit. 各受光体は、複数のCCD素子を備えたCCDセンサ含む、請求項1及び2のいずれか1項に記載の装置.   The apparatus according to claim 1, wherein each photoreceptor includes a CCD sensor having a plurality of CCD elements. さらに、前記配線基板の上側に配置された放熱板を含む、請求項1から3のいずれか1項に記載の装置。   Furthermore, the apparatus of any one of Claim 1 to 3 containing the heat sink arrange | positioned above the said wiring board. 前記配線基板は、さらに、前記受光体の熱を前記放熱板に伝達する熱伝導路を備える、請求項4に記載の装置。   The apparatus according to claim 4, wherein the wiring board further includes a heat conduction path that transfers heat of the photoreceptor to the heat radiating plate. 前記配線基板は、さらに、熱を前記CCDセンサの側の箇所から吸収し、吸収した熱を前記放熱板の側に放出するサーモモジュールを備える、請求項4に記載の装置。   The apparatus according to claim 4, wherein the wiring board further includes a thermo module that absorbs heat from a location on the CCD sensor side and releases the absorbed heat to the heat radiating plate side. 前記配線基板は前記光通路を閉鎖している、請求項1から6のいずれか1項に記載の装置。   The device according to claim 1, wherein the wiring board closes the optical path. さらに、前記支持体の前記下面に配置された複数の接触子であって、前記光通路の下端部に位置された針先を備える複数の接触子を含む、請求項1から7のいずれか1項に記載の装置。   Furthermore, it is several contactors arrange | positioned at the said lower surface of the said support body, Comprising: The contactor of any one of Claim 1 to 7 provided with the needle tip located in the lower end part of the said optical path. The device according to item. 前記支持体は、前記上面を有する主基板であって、該主基板を上下方向に貫通する第1の開口を備える主基板と、前記下面を有すると共に、前記主基板の下側に配置された補助基板であって、該補助基板を上下方向に貫通して、前記第1の開口に対向された第2の開口を備える補助基板とを含み、
前記補助基板は、複数の第2の内部配線と、それぞれが前記第2の内部配線に接続された複数のプローブランドであって、それぞれに前記接触子が取り付けられたプローブランドとを備える、請求項8に記載の装置。
The support is a main substrate having the upper surface, the main substrate having a first opening penetrating the main substrate in the vertical direction, the lower surface, and disposed below the main substrate. An auxiliary substrate comprising a second opening penetrating the auxiliary substrate in the vertical direction and facing the first opening,
The auxiliary board includes a plurality of second internal wirings, and a plurality of probe lands each connected to the second internal wiring, each having a probe land attached thereto. Item 9. The apparatus according to Item 8.
前記支持体は、さらに、前記第1及び第2の開口を経て前記補助基板の下方へ突出する筒状の複数の遮光部材であって、上下方向へ延びて、前記光通路を形成する内部空間を有する複数の遮光部材を含む、請求項9に記載の装置。   The support is further a plurality of cylindrical light shielding members that project downward from the auxiliary substrate through the first and second openings, and extend in the vertical direction to form the light path. The apparatus according to claim 9, comprising a plurality of light shielding members having the following. 前記支持体は、前記上面を有する主基板であって、該主基板を上下方向に貫通する第1の貫通穴を備える主基板と、前記下面を有すると共に、前記主基板の下側に配置された補助基板であって、該補助基板を上下方向に貫通すると共に、前記第1の貫通穴に対向された複数の第2の貫通穴を備える補助基板と、前記補助基板の下側に配置された遮光板であって、該遮光板を上下方向に貫通して、前記第2の貫通穴に連通された複数の第3の貫通穴を備える遮光板とを含み、
前記補助基板は、複数の第2の内部配線と、それぞれが前記第2の内部配線に接続された複数のプローブランドであって、それぞれに前記接触子が取り付けられたプローブランドとを備え、
前記第1、第2及び第3の貫通穴は、前記光通路を共同して形成している、請求項8に記載の装置。
The support is a main substrate having the upper surface, the main substrate having a first through hole penetrating the main substrate in the vertical direction, the lower surface, and disposed below the main substrate. An auxiliary board that penetrates the auxiliary board in the vertical direction and includes a plurality of second through holes opposed to the first through holes, and is disposed below the auxiliary board. A light shielding plate comprising a plurality of third through holes penetrating the light shielding plate in the vertical direction and communicating with the second through holes,
The auxiliary board includes a plurality of second internal wirings and a plurality of probe lands each connected to the second internal wiring, each having the contact attached thereto.
9. The apparatus of claim 8, wherein the first, second and third through holes jointly form the light path.
前記支持体は、さらに、光の通過を許すように前記光通路を横切るレンズ板を含む、請求項1から11のいずれか1項に記載の装置。   12. The apparatus according to any one of claims 1 to 11, wherein the support further comprises a lens plate that traverses the light path to allow light to pass therethrough. さらに、前記配線基板に配置された温度センサを含む、請求項1から12のいずれか1項に記載の装置。   Furthermore, the apparatus of any one of Claim 1 to 12 containing the temperature sensor arrange | positioned at the said wiring board.
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