JP2006345196A - Holding structure for solid-state imaging element - Google Patents

Holding structure for solid-state imaging element Download PDF

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JP2006345196A
JP2006345196A JP2005168565A JP2005168565A JP2006345196A JP 2006345196 A JP2006345196 A JP 2006345196A JP 2005168565 A JP2005168565 A JP 2005168565A JP 2005168565 A JP2005168565 A JP 2005168565A JP 2006345196 A JP2006345196 A JP 2006345196A
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solid
state imaging
opening
imaging device
chip
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Eiji Watanabe
英治 渡辺
Takashi Misawa
岳志 三沢
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Fujifilm Holdings Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors

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  • Transforming Light Signals Into Electric Signals (AREA)
  • Studio Devices (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
  • Solid State Image Pick-Up Elements (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To efficiently radiate heat from a solid-state imaging element package. <P>SOLUTION: The solid-state imaging element 22 comprises a solid-state imaging element chip 29, a frame member 32, and a cover glass 33. A wiring board 34 is fixed to the reverse side of the frame member 32. The frame member 32 has a back opening 41 and the wiring board 34 has an opening 49 to expose the back 30b of a chip substrate 30. The solid-state imaging element package 22 is fixed to a frame 26 by making an abutting surface 26b abut against the back 30b through the back opening 41 and opening 49. A fitting surface 26a for a lens barrel 21 and the abutting surface 26b are formed nearly in parallel and the top surface 30a of the chip substrate 30 where a solid-state imaging element is formed and the optical axis L of a taking lens 20 are nearly perpendicular to each other. Excellent picture quality can, therefore, be obtained. Further, heat from the solid-state imaging chip 29 is conducted to the entire frame 26 through the abutting surface 26b, so the heat radiation is efficiently carried out. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、固体撮像素子チップを収容した固体撮像素子パッケージの保持構造に関するものである。   The present invention relates to a holding structure for a solid-state image pickup device package containing a solid-state image pickup device chip.

CCDやCMOSセンサ等の固体撮像素子チップがセラミックス等に収容された固体撮像素子パッケージが組み込まれた電子機器として、デジタルカメラやビデオカメラが普及している。また、パーソナルコンピュータや携帯電話機、電子手帳等などにも、この固体撮像素子パッケージとメモリとを組み込み、撮影機能を付加することも行なわれている。   Digital cameras and video cameras are widely used as electronic devices in which a solid-state imaging device package in which a solid-state imaging device chip such as a CCD or CMOS sensor is housed in ceramics or the like is incorporated. In addition, a solid-state imaging device package and a memory are incorporated into a personal computer, a mobile phone, an electronic notebook, and the like to add a photographing function.

固体撮像素子パッケージを備えた電子機器で撮像を行うと、固体撮像素子チップや固体撮像素子チップの駆動回路等の温度が上昇する。これは、固体撮像素子チップに設けられた多数の受光素子に蓄積された電荷を転送路で転送する際に起こる発熱が原因であり、撮像時間に比例して温度の上昇が大きくなる。そのため、特許文献1では、中空樹脂パッケージに搭載された半導体素子の下面に絶縁層を介して放熱部材が設けられており、この放熱部材の下面を中空樹脂パッケージから露呈させることで、半導体素子からの熱を放熱している。また、特許文献2の半導体装置では、パッケージされたCCD素子チップが搭載されている搭載ランドが、ベースフレームに形成された窓を通して露呈されており、CCD素子チップからの熱は搭載ランドを介して窓から放熱している。
特開2000−158226号 特開2000−223603号
When imaging is performed with an electronic device including a solid-state imaging device package, the temperature of a solid-state imaging device chip, a driving circuit for the solid-state imaging device chip, and the like rise. This is due to heat generation that occurs when charges accumulated in a large number of light receiving elements provided in the solid-state imaging element chip are transferred through a transfer path, and the temperature rises in proportion to the imaging time. Therefore, in Patent Document 1, a heat dissipation member is provided on the lower surface of the semiconductor element mounted on the hollow resin package via an insulating layer. By exposing the lower surface of the heat dissipation member from the hollow resin package, The heat is dissipated. In the semiconductor device disclosed in Patent Document 2, the mounting land on which the packaged CCD element chip is mounted is exposed through a window formed in the base frame, and heat from the CCD element chip is transmitted through the mounting land. Heat is radiated from the window.
JP 2000-158226 A JP 2000-223603 A

しかしながら、近年、固体撮像素子の高画素化が進んでおり、この高画素化に伴って固体撮像素子に蓄積された電荷の読み出しも高速で行われるので、固体撮像素子チップからの発熱量も大きい。そのため、特許文献1のように中空樹脂パッケージから放熱部材を露呈させた部分だけでは、固体撮像素子チップからの熱を十分に放熱することが困難である。また、特許文献2では、フレームベースに形成された矩形の窓部分から放熱しているが、空気の熱伝導率は悪いので、窓部分(開口内)に暖かい空気が停滞してしまうため、十分に放熱を行うには窓部分の空気を対流させるファンを設ける必要がある。   However, in recent years, the number of pixels of a solid-state image sensor has been increased, and the charge accumulated in the solid-state image sensor is also read at a high speed with the increase in the number of pixels, so that the amount of heat generated from the solid-state image sensor chip is large. . Therefore, it is difficult to sufficiently dissipate the heat from the solid-state imaging device chip only by the portion where the heat dissipation member is exposed from the hollow resin package as in Patent Document 1. Further, in Patent Document 2, heat is radiated from a rectangular window portion formed on the frame base, but since the thermal conductivity of air is poor, warm air stagnates in the window portion (inside the opening). In order to radiate heat, it is necessary to provide a fan that convects the air in the window portion.

本発明は、上記問題点を解決するためになされたものであり、固体撮像素子チップからの熱を効率良く放熱する固体撮像素子パッケージの保持構造を提供することを目的とする。   The present invention has been made to solve the above-described problems, and an object of the present invention is to provide a solid-state image sensor package holding structure that efficiently dissipates heat from the solid-state image sensor chip.

本発明の固体撮像素子パッケージの保持構造は、複数の受光素子が表面に形成された固体撮像素子チップを収容した固体撮像素子パッケージを保持する保持構造において、前記固体撮像素子パッケージには前記固体撮像素子チップの背面を露呈させる第1開口が形成されており、熱伝導性を有し、少なくとも一部が前記第1開口を通して前記背面と当接する保持部材によって、前記固体撮像素子パッケージが保持されることを特徴とするものである。さらに、前記当接面には放熱用グリスを塗布することや、放熱シートを挟むことが好ましい。   The solid-state imaging device package holding structure of the present invention is a holding structure for holding a solid-state imaging device package containing a solid-state imaging device chip on which a plurality of light receiving elements are formed. The solid-state imaging device package includes the solid-state imaging device package. A first opening for exposing the back surface of the element chip is formed, the solid-state imaging device package is held by a holding member that has thermal conductivity and at least a part of which contacts the back surface through the first opening. It is characterized by this. Furthermore, it is preferable to apply a heat-dissipating grease to the contact surface or to sandwich a heat-dissipating sheet.

また、前記背面側で前記固体撮像素子パッケージに固定され、前記固体撮像素子チップと電気的に接続される電極を有し、前記背面を露呈させる第2開口が形成された配線基板を備え、前記第2開口を通して前記保持部材を前記背面に当接させ、前記保持部材と前記配線基板とを固定してもよい。また。前記保持部材は、レンズ鏡筒を取り付ける取付面が形成されており、前記背面に当接させた前記保持部材の当接面と前記取付面とを略平行となるように形成することが好ましい。また、前記保持部材には、前記当接面及び前記取付面と異なる位置に放熱フィンが設けることが好ましい。   In addition, the wiring board is fixed to the solid-state imaging device package on the back side, has an electrode electrically connected to the solid-state imaging device chip, and has a wiring board formed with a second opening that exposes the back surface, The holding member may be brought into contact with the back surface through the second opening to fix the holding member and the wiring board. Also. The holding member is preferably provided with an attachment surface to which the lens barrel is attached, and the abutment surface of the holding member abutted on the back surface and the attachment surface are substantially parallel to each other. Moreover, it is preferable that the holding member is provided with a radiation fin at a position different from the contact surface and the mounting surface.

本発明によれば、固体撮像素子パッケージには固体撮像素子チップの背面を露呈させる第1開口が形成されており、熱伝導性を有し、少なくとも一部が第1開口を通して背面と当接する保持部材によって、固体撮像素子パッケージが保持されるようにしたので、固体撮像素子チップからの熱が効率良く放熱される。よって、熱により固体撮像素子チップの性能の劣化を防止することができる。   According to the present invention, the solid-state imaging device package is formed with the first opening that exposes the back surface of the solid-state imaging device chip, has thermal conductivity, and holds at least partly in contact with the back surface through the first opening. Since the solid-state image sensor package is held by the member, the heat from the solid-state image sensor chip is efficiently radiated. Therefore, deterioration of the performance of the solid-state image sensor chip due to heat can be prevented.

また、背面側で固体撮像素子パッケージに固定され、固体撮像素子チップと電気的に接続される電極を有し、背面を露呈させる第2開口が形成された配線基板を備え、第2開口を通して保持部材を背面に当接させ、保持部材と配線基板とを固定したので、固体撮像素子チップの背面に確実に当接面を当接させ、固体撮像素子パッケージがしっかり固定されるので、さらに放熱効率が良くなる。また、良好な撮影画像が得られる。   In addition, a wiring board is provided that is fixed to the solid-state imaging device package on the back side, has an electrode that is electrically connected to the solid-state imaging device chip, has a second opening that exposes the back side, and is held through the second opening. Since the member is brought into contact with the back surface and the holding member and the wiring board are fixed, the contact surface is securely brought into contact with the back surface of the solid-state image sensor chip, and the solid-state image sensor package is firmly fixed. Will be better. In addition, a good captured image can be obtained.

また、レンズ鏡筒と取り付ける取付面と当接面とを略平行に形成したので、レンズ鏡筒に保持された撮影レンズの光軸に対して受光素子が垂直となるように固体撮像素子パッケージが保持されるから、撮影によって良好な画質を得ることができる。また、保持部材には放熱フィンが設けられているので、より効率よく放熱を行うことができる。   In addition, since the mounting surface and the contact surface to be attached to the lens barrel are formed substantially in parallel, the solid-state imaging device package is arranged so that the light receiving element is perpendicular to the optical axis of the photographing lens held by the lens barrel. Since it is held, good image quality can be obtained by photographing. Moreover, since the heat radiating fin is provided on the holding member, heat can be radiated more efficiently.

図1は、本発明の固体撮像素子パッケージの保持構造を用いた携帯電話機の構成を示す外観斜視図である。携帯電話機2は、ヒンジ部4により折り畳み自在に連結された受話部5と送話部6と、受話部5内に組み込まれているカメラ部8とから構成されている。受話部5の外面には、撮像レンズ20(図2参照)を保護する透明な保護板10と伸縮式のアンテナ11が設けられている。   FIG. 1 is an external perspective view showing a configuration of a mobile phone using the solid-state imaging device package holding structure of the present invention. The mobile phone 2 includes a receiving unit 5, a transmitting unit 6, and a camera unit 8 incorporated in the receiving unit 5 that are foldably connected by a hinge unit 4. A transparent protective plate 10 and a telescopic antenna 11 for protecting the imaging lens 20 (see FIG. 2) are provided on the outer surface of the receiver 5.

受話部5の内面側には、住所録や電話番号などの電話に関する各種情報や、カメラ部8で撮影した画像などが表示される液晶表示(LCD)パネルと、受話スピーカーとが組み込まれている。送話部6の内面側には送話マイク12のほか、送話時のダイヤル操作を行うためのダイヤルボタンや各種設定ボタン、撮影時に操作されるシャッタボタンやズームボタンなどからなる操作部13が設けられている。送話部6の側面に設けられたカードスロット15に図示しないメモリーカードを装填したときは、カメラ部8で撮影した画像を画像データとしてメモリーカードに保存することができる。   A liquid crystal display (LCD) panel on which various information related to the telephone such as an address book and a telephone number, an image taken by the camera unit 8, and the like and a receiving speaker are incorporated on the inner surface of the receiving unit 5. . On the inner surface of the transmitter 6, in addition to the transmitter microphone 12, there is an operation unit 13 including a dial button and various setting buttons for performing dial operation during transmission, a shutter button and a zoom button operated during photographing, and the like. Is provided. When a memory card (not shown) is loaded in the card slot 15 provided on the side surface of the transmitter section 6, an image photographed by the camera section 8 can be stored in the memory card as image data.

図2に示すように、カメラ部8は、撮像レンズ20を保持したレンズ鏡筒21、固体撮像素子パッケージ22などから構成される。受話部5の外装カバー24には、撮影用の開口25が形成されており、この開口25には、レンズ鏡筒21の一方の端部21aが外装カバー24から露呈している。レンズ鏡筒21の他方の端部21bは、フランジ形状になっており、後述する携帯電話機2の機器本体の一部を構成するフレーム26(保持部材)の取付面26aにネジ27で固定されている。撮像レンズ20は、レンズ鏡筒21に設けられた保持部28によって保持されており、撮像レンズ20の前面には保護板10が設けられている。   As shown in FIG. 2, the camera unit 8 includes a lens barrel 21 that holds an imaging lens 20, a solid-state imaging device package 22, and the like. An opening 25 for photographing is formed in the exterior cover 24 of the receiver 5, and one end 21 a of the lens barrel 21 is exposed from the exterior cover 24 in this opening 25. The other end 21b of the lens barrel 21 has a flange shape, and is fixed to a mounting surface 26a of a frame 26 (holding member) constituting a part of a device main body of the cellular phone 2 described later with a screw 27. Yes. The imaging lens 20 is held by a holding unit 28 provided in the lens barrel 21, and a protective plate 10 is provided on the front surface of the imaging lens 20.

図3及び図4にも示すように、固体撮像素子パッケージ22は、固体撮像素子チップ29、枠部材32、カバーガラス33から構成されている。   As shown in FIGS. 3 and 4, the solid-state image sensor package 22 includes a solid-state image sensor chip 29, a frame member 32, and a cover glass 33.

固体撮像素子チップ29は、矩形のチップ基板30と、このチップ基板30上に形成された固体撮像素子31と、複数の電極37とからなる。この固体撮像素子チップ29は、
チップ用ウエハ上に多数の固体撮像素子31及び電極37を形成し、ウエハを各固体撮像素子31毎にダイシングして形成される。固体撮像素子31は、例えば、マトリクス形状に配列された複数の受光素子31aとこれら受光素子31aに蓄積された電荷を水平及び垂直方向に搬送する電荷結合素子からなるCCDイメージセンサであり、各受光素子31aの上にはRGBのカラーフィルムやマイクロレンズなどが積層されている。さらに、電極37(ボンディングパット)は、チップ基板30の縁辺付近に形成されており、電極37はチップ基板30の内部に形成された配線層(図示省略)を介して固体撮像素子31と接続されている。この複数の電極37は、後述する配線基板34と電気信号の入出力を行う。
The solid-state image sensor chip 29 includes a rectangular chip substrate 30, a solid-state image sensor 31 formed on the chip substrate 30, and a plurality of electrodes 37. This solid-state image sensor chip 29 is
A large number of solid-state imaging elements 31 and electrodes 37 are formed on a chip wafer, and the wafer is diced for each solid-state imaging element 31. The solid-state imaging device 31 is a CCD image sensor including, for example, a plurality of light receiving elements 31a arranged in a matrix shape and charge coupled elements that transport charges accumulated in the light receiving elements 31a in the horizontal and vertical directions. An RGB color film, a microlens, or the like is laminated on the element 31a. Furthermore, the electrode 37 (bonding pad) is formed in the vicinity of the edge of the chip substrate 30, and the electrode 37 is connected to the solid-state imaging device 31 via a wiring layer (not shown) formed inside the chip substrate 30. ing. The plurality of electrodes 37 perform input / output of electric signals with a wiring board 34 described later.

枠部材32は、セラミックで形成されており、前面開口40及び背面開口41(第1開口)が連通した枠形状である。枠部材32の内部には、チップ基板30の背面30b(図3参照)の周縁部を接着剤で固着する第1内底面42が設けられている。さらに、枠部材32の内面には、第1内底面42より外側に第2内底面43が設けられている。第2内底面43には、外側面32aにかけて貫通する複数の貫通穴(図示せず)が形成されている。この貫通穴には、銅合金などからなる導電性を有するリードフレーム45が貫入されている。リードフレーム45の一端は、第2内底面43に配置されて露出しており、枠部材32の外側面32aに突出したリードフレーム45は、外側面32aに沿って下方に折り曲げられており、リードフレーム45の他端は枠部材32の下面とほぼ同じ位置となっている。このように、リードフレーム45は略L字形状になっている。   The frame member 32 is made of ceramic and has a frame shape in which the front opening 40 and the rear opening 41 (first opening) communicate with each other. Inside the frame member 32, a first inner bottom surface 42 is provided to fix the peripheral edge portion of the back surface 30b (see FIG. 3) of the chip substrate 30 with an adhesive. Furthermore, a second inner bottom surface 43 is provided on the inner surface of the frame member 32 outside the first inner bottom surface 42. The second inner bottom surface 43 has a plurality of through holes (not shown) penetrating through the outer surface 32a. A conductive lead frame 45 made of a copper alloy or the like is inserted into the through hole. One end of the lead frame 45 is arranged and exposed on the second inner bottom surface 43, and the lead frame 45 protruding from the outer surface 32a of the frame member 32 is bent downward along the outer surface 32a, The other end of the frame 45 is substantially at the same position as the lower surface of the frame member 32. Thus, the lead frame 45 is substantially L-shaped.

図3に示すように、チップ基板30は、その背面30bの周縁部が第1内底面42に接着剤で固着される。そして、各リードフレーム45は、金などの金属細線からなるボンディングワイヤ47によって結線される。この時、枠部材32の背面開口41からは、チップ基板30の背面30bが露呈している。   As shown in FIG. 3, the peripheral portion of the back surface 30 b of the chip substrate 30 is fixed to the first inner bottom surface 42 with an adhesive. Each lead frame 45 is connected by a bonding wire 47 made of a fine metal wire such as gold. At this time, the back surface 30 b of the chip substrate 30 is exposed from the back surface opening 41 of the frame member 32.

カバーガラス33は、ガラス材で形成された透光性部材である。チップ基板30の表面に形成された固体撮像素子31に対向し、かつ前面開口40を覆うようにカバーガラス33が枠部材32の上面に配置されており、カバーガラス33の周縁部は、枠部材32の上面に接着材で固着される。よって、枠部材32の前面開口40はカバーガラス33によって塞がれ、背面開口41はチップ基板30の背面30bによって塞がれているので、枠部材32の内部に塵芥や水分が侵入することが防止されている。なお、カバーガラス33の代わりに、透明な樹脂部材を用いてもよい。   The cover glass 33 is a translucent member formed of a glass material. A cover glass 33 is disposed on the upper surface of the frame member 32 so as to face the solid-state imaging element 31 formed on the surface of the chip substrate 30 and cover the front opening 40, and the peripheral portion of the cover glass 33 is formed of a frame member. The upper surface of 32 is fixed with an adhesive. Therefore, since the front opening 40 of the frame member 32 is closed by the cover glass 33 and the back opening 41 is closed by the back surface 30b of the chip substrate 30, dust and moisture may enter the inside of the frame member 32. It is prevented. A transparent resin member may be used instead of the cover glass 33.

固体撮像素子パッケージ22の下部には、配線基板34が固定されている。配線基板34の中央部には、枠部材32の背面開口41と略同形状の開口49(第2開口)が形成されている。枠部材32は、背面開口41と開口49とを一致させて配線基板34に固定される。これにより、配線基板34の下方からは、背面開口41及び開口49を介してチップ基板30の背面30bが露呈している。そして、配線基板34の表面で、かつ枠部材32に設けられたリードフレーム45の他端と対応する位置には、電極であるフットパターン50が形成されており、その他の部分は絶縁されている。フットパターン50とリードフレーム45は半田によって電気的に接続される。これにより、固体撮像素子31と配線基板34は電気的に接続され、配線基板34は固体撮像素子パッケージ22に固定される。なお、図示しないが、フットパターン50は、フレキシブルケーブルなどを介して信号処理部に電気的に接続されており、この信号処理部は固体撮像素子31から送られた画像情報信号(電気信号)の処理を行う。   A wiring board 34 is fixed to the lower part of the solid-state imaging device package 22. An opening 49 (second opening) having substantially the same shape as the back opening 41 of the frame member 32 is formed at the center of the wiring board 34. The frame member 32 is fixed to the wiring board 34 with the back surface opening 41 and the opening 49 aligned. As a result, the back surface 30 b of the chip substrate 30 is exposed from below the wiring substrate 34 through the back surface opening 41 and the opening 49. A foot pattern 50 as an electrode is formed on the surface of the wiring board 34 and at a position corresponding to the other end of the lead frame 45 provided on the frame member 32, and other portions are insulated. . The foot pattern 50 and the lead frame 45 are electrically connected by solder. As a result, the solid-state imaging element 31 and the wiring board 34 are electrically connected, and the wiring board 34 is fixed to the solid-state imaging element package 22. Although not shown, the foot pattern 50 is electrically connected to a signal processing unit via a flexible cable or the like, and this signal processing unit receives an image information signal (electric signal) sent from the solid-state imaging device 31. Process.

以上のように構成された固体撮像素子パッケージ22は、受話部5で携帯電話機2の一部を構成するフレーム26に固定される。保持部材であるフレーム26は、例えばアルミによって形成されている。フレーム26には、前述したレンズ鏡筒21を取り付ける取付面26a、チップ基板30の背面30bに当接させる当接面26b、及び凹部26cが形成されている。取付面26aと当接面26bは、略平行となるように形成されており、取付面26aと当接面26bの間には凹部26cが形成されている。当接面26bとチップ基板30の背面30bの間には、絶縁性を有する放熱シート51が設けられており、フレーム26と固体撮像素子チップ29は絶縁されている。なお、フレーム26にはアルミを用いたが、これに限らず、熱伝導率の高い金属を用いてもよい。また、当接面26bと背面30bの間に放熱シート51を設けたが、これに代えて、放熱用グリスを塗布したり、当接面26bにアルマイト処理を行ってもよい。   The solid-state image pickup device package 22 configured as described above is fixed to the frame 26 constituting a part of the mobile phone 2 by the receiver 5. The frame 26 as a holding member is made of, for example, aluminum. The frame 26 is formed with a mounting surface 26a for attaching the lens barrel 21 described above, a contact surface 26b for contacting the back surface 30b of the chip substrate 30, and a recess 26c. The attachment surface 26a and the contact surface 26b are formed to be substantially parallel, and a recess 26c is formed between the attachment surface 26a and the contact surface 26b. An insulating heat dissipation sheet 51 is provided between the contact surface 26b and the back surface 30b of the chip substrate 30, and the frame 26 and the solid-state imaging device chip 29 are insulated. Although aluminum is used for the frame 26, the present invention is not limited to this, and a metal having high thermal conductivity may be used. Moreover, although the heat radiating sheet 51 is provided between the contact surface 26b and the back surface 30b, instead of this, heat radiating grease may be applied or an alumite treatment may be performed on the contact surface 26b.

固体撮像素子パッケージ22をフレーム26に取り付ける際には、当接面34aを枠部材34に形成された背面開口41及び配線基板34に形成された開口49から通して、チップ基板30の背面30bに当接面34aを当接させて、撮影レンズ20の光軸L(図2参照)と固体撮像素子31の中心とが一致するように位置決めが行われる。この時、凹部26cには、取付面26a及び当接面26bより下方に配置される枠部材32の一部と配線基板34とが入り込む。そして、凹部26cと配線基板34の下面とをUV硬化型接着剤52で固着することで、固体撮像素子パッケージ22がフレーム26に固定される。   When the solid-state image pickup device package 22 is attached to the frame 26, the contact surface 34 a passes through the back opening 41 formed in the frame member 34 and the opening 49 formed in the wiring substrate 34, and passes through the back surface 30 b of the chip substrate 30. Positioning is performed so that the optical axis L (see FIG. 2) of the photographing lens 20 coincides with the center of the solid-state imaging device 31 by bringing the contact surface 34a into contact. At this time, a part of the frame member 32 disposed below the attachment surface 26a and the contact surface 26b and the wiring board 34 enter the recess 26c. Then, the solid-state imaging device package 22 is fixed to the frame 26 by fixing the recess 26 c and the lower surface of the wiring board 34 with the UV curable adhesive 52.

次に上記実施形態の作用について説明する。携帯電話機2によって撮影を行うと、固体撮像素子チップ29が発熱する。この固体撮像素子チップ29の熱は、放熱シート51を介してチップ基板30の背面30bに当接している当接面26bからフレーム26全体に伝導される。これにより、フレーム26に伝導された熱は、フレーム26全体から空気中に放熱されるとともに、フレーム26と接続している外装カバー24など機器本体にも伝導されるので、効率的に放熱が行われる。従って、熱により固体撮像素子チップ29の性能が劣化することを防止できる。   Next, the operation of the above embodiment will be described. When photographing is performed by the mobile phone 2, the solid-state image sensor chip 29 generates heat. The heat of the solid-state imaging device chip 29 is conducted to the entire frame 26 from the contact surface 26 b that is in contact with the back surface 30 b of the chip substrate 30 via the heat dissipation sheet 51. As a result, the heat conducted to the frame 26 is dissipated from the entire frame 26 into the air, and is also conducted to the device body such as the exterior cover 24 connected to the frame 26, so that heat is efficiently dissipated. Is called. Therefore, it is possible to prevent the performance of the solid-state imaging device chip 29 from being deteriorated by heat.

また、フレーム26は、略平行になるように取付面26aと当接面26bとを形成したので、撮像レンズ20の光軸Lに対して固体撮像素子31が設けられた表面30aが略垂直となる。これにより、撮影した画質が劣化することを防止でき、良好な撮影画像を得ることができる。   Further, since the frame 26 is formed with the mounting surface 26a and the contact surface 26b so as to be substantially parallel, the surface 30a on which the solid-state imaging device 31 is provided with respect to the optical axis L of the imaging lens 20 is substantially vertical. Become. Thereby, it is possible to prevent the photographed image quality from being deteriorated and to obtain a good photographed image.

また、上記実施形態では、枠部材32を配線基板34に直接固定したが、これに代えて、図5に示すように、リードフレーム55によって枠部材32と配線基板34とを離間させて固定してもよい。なお、上記実施形態と同一の構成部材には同一の符号を付して重複した説明は省略する。   In the above embodiment, the frame member 32 is directly fixed to the wiring board 34. Instead, as shown in FIG. 5, the frame member 32 and the wiring board 34 are fixed by being separated by a lead frame 55. May be. In addition, the same code | symbol is attached | subjected to the same structural member as the said embodiment, and the overlapping description is abbreviate | omitted.

固体撮像素子パッケージ54に設けられたリードフレーム55の一端は、枠部材32の第2内底面43に露呈して固定されており、固体撮像素子チップ29の電極37とボンディングワイヤ47によって接続されている。リードフレーム55は、他端を枠部材32に形成された貫通穴から外部に突出させ、リードフレーム55を枠部材32に外側面32aに沿って折り曲げている。これにより、リードフレーム55の他端は、枠部材32の下面より下方に配置されている。リードフレーム55の他端は、枠部材32の下方に配された配線基板34のフットパターン50に半田で接続される。これにより、リードフレーム55は、配線基板34を固体撮像素子パッケージ22に固定するとともに、固体撮像素子31と配線基板34とを電気的に接続している。   One end of the lead frame 55 provided in the solid-state image pickup device package 54 is exposed and fixed to the second inner bottom surface 43 of the frame member 32, and is connected to the electrode 37 of the solid-state image pickup device chip 29 by the bonding wire 47. Yes. The other end of the lead frame 55 protrudes from a through hole formed in the frame member 32, and the lead frame 55 is bent along the outer surface 32 a to the frame member 32. Thus, the other end of the lead frame 55 is disposed below the lower surface of the frame member 32. The other end of the lead frame 55 is connected to the foot pattern 50 of the wiring board 34 disposed below the frame member 32 by solder. Thereby, the lead frame 55 fixes the wiring board 34 to the solid-state imaging device package 22 and electrically connects the solid-state imaging device 31 and the wiring board 34.

固体撮像素子パッケージ54がフレーム26に固定される際には、当接面26bを枠部材32の背面開口41及び配線基板34の開口49から通し、放熱シート51を介してチップ基板30の背面30bに当接させ、配線基板34の下面とフレーム36の凹部26cとをUV硬化型接着剤52で固着する。これにより、固体撮像素子パッケージ54は、フレーム26に位置決めされるとともに、当接面26bを背面30bに確実に当接させた状態で固定される。なお、リードフレーム55によって枠部材32と配線基板34を離間させて固定するタイプの固体撮像素子パッケージ54を用いたが、これに代えて、リードフレーム55を使用しないLCCタイプの固体撮像素子パッケージを用いてもよく、この場合は、配線基板34を枠部材に直接固定することが好ましい。   When the solid-state imaging device package 54 is fixed to the frame 26, the contact surface 26 b is passed through the back opening 41 of the frame member 32 and the opening 49 of the wiring substrate 34, and the back surface 30 b of the chip substrate 30 is interposed via the heat dissipation sheet 51. Then, the lower surface of the wiring board 34 and the recess 26 c of the frame 36 are fixed by the UV curable adhesive 52. Thereby, the solid-state imaging device package 54 is positioned in the frame 26 and fixed in a state where the contact surface 26b is securely in contact with the back surface 30b. Although the solid-state image pickup device package 54 of the type in which the frame member 32 and the wiring board 34 are separated and fixed by the lead frame 55 is used, instead of this, an LCC type solid-state image pickup device package that does not use the lead frame 55 is used. In this case, it is preferable to fix the wiring board 34 directly to the frame member.

また、レンズ鏡筒21及び固体撮像素子パッケージ22を固定するフレーム26を、より放熱効率の高い形状に代えても良い。この場合は、図6に示すように、フレーム60の取付面26a及び当接面26bの反対側の面に、複数の凹凸部からなる放熱フィン61を形成する。このような構成により、固体撮像素子チップ29からの熱が当接面26bからフレーム60全体に伝導されると、放熱フィン61により効率的に放熱が行われる。なお、放熱フィン61は、取付面26a及び当接面26bと異なる位置であればどこに設けてもよい。   Further, the frame 26 for fixing the lens barrel 21 and the solid-state imaging device package 22 may be replaced with a shape with higher heat dissipation efficiency. In this case, as shown in FIG. 6, the heat dissipating fins 61 including a plurality of concave and convex portions are formed on the surface opposite to the mounting surface 26 a and the contact surface 26 b of the frame 60. With such a configuration, when heat from the solid-state imaging element chip 29 is conducted from the contact surface 26 b to the entire frame 60, heat radiation is efficiently performed by the radiation fins 61. The heat dissipating fins 61 may be provided anywhere as long as the positions are different from the attachment surface 26a and the contact surface 26b.

また、上記実施形態では、枠部材32をセラミックで形成したが、これに限られるものではなく、プラスチック等の樹脂で形成するようにしてもよい。また、レンズ鏡筒21をフレーム26にネジ27で固定したが接着剤で固定してもよい。   Moreover, in the said embodiment, although the frame member 32 was formed with ceramic, it is not restricted to this, You may make it form with resin, such as a plastics. Further, although the lens barrel 21 is fixed to the frame 26 with the screws 27, it may be fixed with an adhesive.

また、上記各実施形態では、チップ基板30の背面30bを露呈させるために、枠部材32に背面開口41を、配線基板34には開口46を設けたが、背面開口41及び開口49の形状及び個数はこれに限るものではなく、格子状や円形等の形状をした開口を形成してもよく、開口の個数も複数設けてもよい。このような場合は、枠部材32に形成された開口の形状及び個数に合わせて、フレーム26の当接面26bの形状や数を適宜に変更することが好ましい。   Further, in each of the above embodiments, in order to expose the back surface 30 b of the chip substrate 30, the back opening 41 is provided in the frame member 32 and the opening 46 is provided in the wiring board 34, but the shape of the back opening 41 and the opening 49 The number of openings is not limited to this, and openings having a lattice shape or a circular shape may be formed, and a plurality of openings may be provided. In such a case, it is preferable to appropriately change the shape and number of the contact surfaces 26b of the frame 26 in accordance with the shape and number of openings formed in the frame member 32.

なお、本実施形態では、固体撮像素子パッケージ22を携帯電話機2に取り付けたが、これに限らず、デジタルカメラ、パソコン、電子手帳、PDAなどの電子機器に取り付けてもよい。   In the present embodiment, the solid-state imaging device package 22 is attached to the mobile phone 2, but the present invention is not limited to this and may be attached to an electronic device such as a digital camera, a personal computer, an electronic notebook, or a PDA.

本発明を実施した携帯電話機の外観斜視図である。1 is an external perspective view of a mobile phone embodying the present invention. カメラ部の構成を示す断面図である。It is sectional drawing which shows the structure of a camera part. 固体撮像素子パッケージの取り付け部近傍の構成を示す断面図である。It is sectional drawing which shows the structure of the attachment part vicinity of a solid-state image sensor package. 固体撮像素子パッケージの構成を示す分解斜視図である。It is a disassembled perspective view which shows the structure of a solid-state image sensor package. 配線基板が離間して固定された固体撮像素子パッケージの取り付けを説明する断面図である。It is sectional drawing explaining attachment of the solid-state image sensor package with which the wiring board was spaced apart and fixed. フレームに放熱フィンを形成した実施形態を説明する断面図である。It is sectional drawing explaining embodiment which formed the radiation fin in the flame | frame.

符号の説明Explanation of symbols

2 携帯電話機
20 撮像レンズ
21 レンズ鏡筒
22 固体撮像素子パッケージ
26 フレーム
26a 取付面
26b 当接面
29 固体撮像素子チップ
31 固体撮像素子
31a 受光素子
32 枠部材
33 カバーガラス
34 配線基板
41 背面開口
49 開口
50 フットパターン
61 放熱フィン

2 Cellular phone 20 Imaging lens 21 Lens barrel 22 Solid imaging device package 26 Frame 26a Mounting surface 26b Abutting surface 29 Solid imaging device chip 31 Solid imaging device 31a Light receiving device 32 Frame member 33 Cover glass 34 Wiring board 41 Rear opening 49 Opening 50 Foot pattern 61 Radiation fin

Claims (4)

複数の受光素子が表面に形成された固体撮像素子チップを収容した固体撮像素子パッケージを保持する保持構造において、
前記固体撮像素子パッケージには前記固体撮像素子チップの背面を露呈させる第1開口が形成されており、
熱伝導性を有し、少なくとも一部が前記第1開口を通して前記背面と当接する保持部材によって、前記固体撮像素子パッケージが保持されることを特徴とする固体撮像素子パッケージの保持構造。
In a holding structure for holding a solid-state imaging device package containing a solid-state imaging device chip having a plurality of light receiving elements formed on the surface,
The solid-state imaging device package has a first opening that exposes the back surface of the solid-state imaging device chip,
A structure for holding a solid-state image pickup device package, wherein the solid-state image pickup device package is held by a holding member having thermal conductivity and at least a part of which is in contact with the back surface through the first opening.
前記背面側で前記固体撮像素子パッケージに固定され、前記固体撮像素子チップと電気的に接続される電極を有し、前記背面を露呈させる第2開口が形成された配線基板を備え、
前記第2開口を通して前記保持部材を前記背面に当接させ、前記保持部材と前記配線基板とを固定したことを特徴とする請求項1記載の固体撮像素子パッケージの保持構造。
A wiring board that is fixed to the solid-state image sensor package on the back surface side, has an electrode that is electrically connected to the solid-state image sensor chip, and has a second opening that exposes the back surface;
2. The solid-state imaging device package holding structure according to claim 1, wherein the holding member is brought into contact with the back surface through the second opening to fix the holding member and the wiring board.
前記保持部材は、レンズ鏡筒を取り付ける取付面が形成されており、
前記背面に当接させた前記保持部材の当接面と前記取付面とを略平行となるように形成したことを特徴とする請求項1または2記載の固体撮像素子パッケージの保持構造。
The holding member has a mounting surface on which a lens barrel is attached,
3. The solid-state image pickup device holding structure according to claim 1, wherein an abutting surface of the holding member abutted on the back surface and the mounting surface are formed to be substantially parallel.
前記保持部材には、前記当接面及び前記取付面と異なる位置に放熱フィンが設けられたことを特徴とする請求項1ないし3いずれか記載の固体撮像素子パッケージ置の保持構造。

The solid-state image pickup device package holding structure according to any one of claims 1 to 3, wherein the holding member is provided with heat radiation fins at positions different from the contact surface and the mounting surface.

JP2005168565A 2005-06-08 2005-06-08 Holding structure for solid-state imaging element Pending JP2006345196A (en)

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