JP2012070272A - Heat radiation structure for image pickup element - Google Patents

Heat radiation structure for image pickup element Download PDF

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JP2012070272A
JP2012070272A JP2010214268A JP2010214268A JP2012070272A JP 2012070272 A JP2012070272 A JP 2012070272A JP 2010214268 A JP2010214268 A JP 2010214268A JP 2010214268 A JP2010214268 A JP 2010214268A JP 2012070272 A JP2012070272 A JP 2012070272A
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image sensor
image pickup
pickup element
heat dissipation
image
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一真 ▲高▼畑
Kazuma Takahata
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Canon Inc
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Canon Inc
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Abstract

PROBLEM TO BE SOLVED: To provide a heat radiation structure for an image pickup element which can effectively radiate heat without generating noise.SOLUTION: An image pickup element 11 mounted on an image pickup element mounting substrate 12 is positioned in a rectangular opening of an image pickup element holding plate 13, where an inclination adjustment relative to the image pickup element holding plate 13 is made such that an imaging plane faces an optical axis perpendicularly, and is then fixedly bonded with an adhesive filling the surrounding spacing. The image pickup element mounting substrate 12 has a hole 12d formed in a position corresponding to a rear surface of the image pickup element 11, and a radiation member 18 is brought in contact with the rear surface of the image pickup element 11 via the hole 12d. The radiation member 18 is an elastic member held on a radiation plate 19, and the image pickup element 11 is thermally connected to the radiation plate 19 of high thermal conductivity via the radiation member 18.

Description

本発明は、基板に実装された撮像素子の放熱構造に関する。   The present invention relates to a heat dissipation structure for an image sensor mounted on a substrate.

高画素対応の撮像素子は発熱量が高く、効率の高い放熱構造が必要となる。また、撮像素子の高画素化が進むと、傾き調整構造が必要となり、撮像素子の位置が確定しないため、放熱部品との接続が困難である。   An image sensor for high pixels generates a large amount of heat and requires a highly efficient heat dissipation structure. Further, when the number of pixels of the image sensor increases, an inclination adjustment structure is required, and the position of the image sensor is not fixed, so that connection with a heat radiating component is difficult.

図6は従来の撮像素子ユニットを示す斜視図である。従来の撮像素子ユニットでは、撮像素子が実装された撮像素子実装基板61が撮像素子保持板62にビスで締結される。そして、撮像素子保持板62はレンズ鏡筒63の後部の撮像素子ホルダ64にビス65a、65b、65cで締結される。   FIG. 6 is a perspective view showing a conventional image sensor unit. In the conventional image sensor unit, the image sensor mounting substrate 61 on which the image sensor is mounted is fastened to the image sensor holding plate 62 with screws. The image sensor holding plate 62 is fastened to the image sensor holder 64 at the rear part of the lens barrel 63 with screws 65a, 65b, 65c.

上述したように高画素化により撮像素子の発熱量が高くなると、発生した熱を積極的に放熱する対策をとる必要がある。例えば撮像素子保持板62と不図示の放熱板とを圧接し、撮像素子で発生した熱を撮像素子実装基板61、撮像素子保持板62を通じて放熱板へと導く構成が考えられる。   As described above, when the amount of heat generated by the image sensor increases due to the increase in the number of pixels, it is necessary to take measures to actively dissipate the generated heat. For example, a configuration in which the image sensor holding plate 62 and a heat sink (not shown) are pressed against each other and heat generated by the image sensor is guided to the heat sink through the image sensor mounting substrate 61 and the image sensor holding plate 62 can be considered.

一方で、撮像素子の大型化により、撮像素子の撮像面を精度良く光軸に対して垂直に向けることが求められるようになっている。大型の撮像素子は、小型の撮像素子と比較して焦点深度が浅くなる。そのため、撮像素子の撮像面が光軸に対して傾いた状態で組み付けられた場合、光軸方向の変位量が大きくなる撮像面の周辺部において撮像ボケが生じやすくなる。特に周辺部における光軸方向の変位量が大きい大型の撮像素子の場合、撮像ボケは顕著なものになる。したがって、大型の撮像素子の場合は撮像面の光軸方向の位置ずれの許容量が小さくなる。   On the other hand, with an increase in the size of the image sensor, it is required to accurately orient the image pickup surface of the image sensor with respect to the optical axis. A large image sensor has a shallower depth of focus than a small image sensor. Therefore, when the image pickup surface of the image pickup device is assembled in a state where the image pickup surface is inclined with respect to the optical axis, imaging blur tends to occur in the peripheral portion of the image pickup surface where the amount of displacement in the optical axis direction increases. In particular, in the case of a large-sized image sensor with a large amount of displacement in the optical axis direction in the peripheral part, the imaging blur becomes noticeable. Therefore, in the case of a large image sensor, the allowable amount of positional deviation in the optical axis direction of the imaging surface is reduced.

このように撮像素子ユニットを組み付ける際には、撮像素子の撮像面を光軸に対して垂直な方向に設定するための構成が必要とされている。一般に、例えば図6に示す従来例では、撮像素子の傾き調整は撮像素子保持板62を撮像素子ホルダ64に固定している3点の締結部(ビス65a、65b、65c)において、ワッシャを介在させたり、ばねで付勢したりする等して撮像面を光軸に対して垂直な方向に向ける構造をとっている。   When the image sensor unit is assembled in this way, a configuration for setting the image pickup surface of the image sensor in a direction perpendicular to the optical axis is required. In general, for example, in the conventional example shown in FIG. 6, the inclination of the image sensor is adjusted by interposing a washer at three fastening portions (screws 65a, 65b, 65c) that fix the image sensor holding plate 62 to the image sensor holder 64. The imaging surface is oriented in a direction perpendicular to the optical axis by, for example, biasing with a spring.

ところが、このような構成で撮像素子の傾きを調整すると、撮像素子保持板62の周囲の部品に対する傾きが製品ごとにばらつくことになり、その結果、放熱板と熱的に接続させることが困難となる。   However, when the tilt of the image sensor is adjusted with such a configuration, the tilt of the image sensor holding plate 62 with respect to the surrounding components varies from product to product, and as a result, it is difficult to thermally connect to the heat sink. Become.

効果的な放熱を行うには、撮像素子保持板62と放熱板をビスによる締結等の手段を用いて圧接させる必要がある。しかしながら、撮像素子実装基板61と撮像素子保持板62は締結によって一体化されているため、傾きのばらつきの大きい撮像素子保持板62と放熱板を締結すると、撮像素子保持板62に負荷がかかり、撮像素子の位置精度に影響を与えて光学性能を著しく損なうおそれがある。   In order to effectively dissipate heat, it is necessary to press-contact the image sensor holding plate 62 and the heat radiating plate using means such as fastening with screws. However, since the image sensor mounting substrate 61 and the image sensor holding plate 62 are integrated by fastening, when the image sensor holding plate 62 and the heat radiating plate having a large variation in inclination are fastened, a load is applied to the image sensor holding plate 62. There is a possibility that the optical performance is remarkably impaired by affecting the positional accuracy of the image sensor.

上記のような課題に対して、さまざまな解決手段が開示されている。例えば特許文献1では、傾き調整手段を備えた撮像素子の実装手段が開示されている。これは、傾きが調整された撮像素子パッケージが基準板に接着され、該接着剤は熱伝導性の高い接着剤を使用して放熱効果を高めている。   Various means for solving the above problems are disclosed. For example, Patent Document 1 discloses a mounting unit for an image sensor including a tilt adjusting unit. This is because the image pickup device package whose inclination is adjusted is bonded to the reference plate, and the adhesive uses a highly heat conductive adhesive to enhance the heat dissipation effect.

また、特許文献2では、撮像素子パッケージ内の撮像素子が形成された半導体基板の傾き調整手段が開示されている。これは、板ばねのような押さえ部材によって付勢された半導体基板と傾き調整部材(例えばビス)によって半導体基板の傾きを調整するものであり、パッケージにフィンを設けて放熱効果を得る実施例が開示されている。   Japanese Patent Application Laid-Open No. 2004-228561 discloses a tilt adjustment unit for a semiconductor substrate on which an image sensor in an image sensor package is formed. In this embodiment, the inclination of the semiconductor substrate is adjusted by a semiconductor substrate urged by a pressing member such as a leaf spring and an inclination adjusting member (for example, a screw). It is disclosed.

特開2005−051518号公報JP 2005-051518 A 特開2006−340299号公報JP 2006-340299 A

上述の特許文献1に開示された従来技術では、熱伝導性の高い接着剤を使用しているが、一般に熱伝導性の高い接着剤にはカーボンや金属が含有されている。このように接着剤にカーボンや金属のような電気伝導性の高い物質が含まれていると、ノイズを発生させる原因となるため、撮像素子を接着する手段として熱伝導性の高い接着剤を使用することは好ましくない。   In the prior art disclosed in Patent Document 1 described above, an adhesive having high thermal conductivity is used. Generally, an adhesive having high thermal conductivity contains carbon or metal. If a material with high electrical conductivity such as carbon or metal is contained in the adhesive in this way, it will cause noise, so use an adhesive with high thermal conductivity as a means to bond the image sensor. It is not preferable to do.

また、特許文献2に開示された従来技術では、撮像素子パッケージの調整手段、及び放熱構造が示されているが、パッケージ構造であるため、汎用の撮像素子の実装に適用できない。   Further, in the prior art disclosed in Patent Document 2, an adjustment unit for an image sensor package and a heat dissipation structure are shown. However, since the package has a package structure, it cannot be applied to mounting a general-purpose image sensor.

本発明は上記のような点に鑑みてなされたものであり、ノイズを発生させることなく効果的に放熱できる撮像素子の放熱構造を提供することを目的とする。   The present invention has been made in view of the above points, and an object of the present invention is to provide a heat dissipation structure for an image sensor that can effectively dissipate heat without generating noise.

本発明の撮像素子の放熱構造は、撮像素子が実装されるとともに、前記撮像素子の裏面に対向する位置に穴又は切欠きが形成された基板と、前記穴又は前記切欠きを通って前記撮像素子の裏面に接触する放熱部材とを備えたことを特徴とする。   The heat dissipation structure for an image pickup device according to the present invention includes a substrate on which an image pickup device is mounted and a hole or notch formed at a position facing the back surface of the image pickup device, and the image pickup through the hole or the notch. And a heat dissipating member in contact with the back surface of the element.

本発明によれば、撮像素子の裏面に放熱部材を接触させるようにしたので、熱伝導性の高い接着剤を使用しなくてもよく、ノイズを発生させることなく効果的に放熱できる撮像素子の放熱構造を提供することができる。   According to the present invention, since the heat dissipation member is brought into contact with the back surface of the image sensor, it is not necessary to use an adhesive with high thermal conductivity, and the image sensor that can effectively dissipate heat without generating noise. A heat dissipation structure can be provided.

実施形態に係る撮像素子の放熱構造を有する撮像素子ユニットの分解斜視図である。It is a disassembled perspective view of the image sensor unit which has the heat dissipation structure of the image sensor concerning an embodiment. 撮像素子ユニットをレンズ鏡筒の後部の撮像素子ホルダに組み付けた状態を示す斜視図である。It is a perspective view which shows the state which assembled | attached the image pick-up element unit to the image pick-up element holder of the rear part of a lens-barrel. 撮像素子ユニット及びその周辺の断面図である。It is sectional drawing of an image pick-up element unit and its periphery. 撮像素子ユニットの外観図であり、(a)は撮像素子ユニットの正面図、(b)は撮像素子ユニットの背面側斜視図である。It is an external view of an image sensor unit, (a) is a front view of the image sensor unit, (b) is a rear perspective view of the image sensor unit. 他の実施形態に係る撮像素子の放熱構造を有する撮像素子ユニットの分解斜視図である。It is a disassembled perspective view of the image pick-up element unit which has the thermal radiation structure of the image pick-up element which concerns on other embodiment. 従来の撮像素子ユニットを説明するための図である。It is a figure for demonstrating the conventional image pick-up element unit.

以下、添付図面を参照して、本発明の好適な実施形態について説明する。
(第1の実施形態)
図1は第1の実施形態に係る撮像素子の放熱構造を有する撮像素子ユニット2の分解斜視図である。図2は撮像素子ユニット2をレンズ鏡筒1の後部の撮像素子ホルダ16に組み付けた状態を示す斜視図である。図3は撮像素子ユニット2及びその周辺の断面図である。図4は撮像素子ユニット2の外観図であり、(a)は撮像素子ユニット2の正面図、(b)は撮像素子ユニット2の背面側斜視図である。
Preferred embodiments of the present invention will be described below with reference to the accompanying drawings.
(First embodiment)
FIG. 1 is an exploded perspective view of an image sensor unit 2 having a heat dissipation structure for an image sensor according to the first embodiment. FIG. 2 is a perspective view showing a state in which the image sensor unit 2 is assembled to the image sensor holder 16 at the rear of the lens barrel 1. FIG. 3 is a cross-sectional view of the image sensor unit 2 and its periphery. 4A and 4B are external views of the image sensor unit 2. FIG. 4A is a front view of the image sensor unit 2, and FIG. 4B is a rear perspective view of the image sensor unit 2. FIG.

図1に示すように、撮像素子11は撮像素子実装基板12に実装されている。また、撮像素子実装基板12に実装された撮像素子11は、撮像面を光軸に対して垂直に向けるように、撮像素子保持板13に対して傾き調整が施される。その上で、撮像素子11は撮像素子保持板13の矩形開口内に位置し、その周辺の空隙部を埋めるように接着剤により接着、固定される。   As shown in FIG. 1, the image sensor 11 is mounted on an image sensor mounting substrate 12. In addition, the image sensor 11 mounted on the image sensor mounting substrate 12 is tilt-adjusted with respect to the image sensor holding plate 13 so that the imaging surface is directed perpendicular to the optical axis. In addition, the image pickup device 11 is positioned in the rectangular opening of the image pickup device holding plate 13 and is bonded and fixed with an adhesive so as to fill the surrounding gap.

撮像素子11が固定された撮像素子保持板13は、撮像素子ホルダ16に対してビス17a、17b、17cで固定される。撮像素子11の前には開口を有するラバー15、更にその前にはローパスフィルタ14が配置され、これらラバー15、ローパスフィルタ14が撮像素子11とホルダ16との間で挟持されるかたちとなる。   The image sensor holding plate 13 to which the image sensor 11 is fixed is fixed to the image sensor holder 16 with screws 17a, 17b, and 17c. A rubber 15 having an opening is disposed in front of the image sensor 11, and a low-pass filter 14 is disposed in front of the rubber 15. The rubber 15 and the low-pass filter 14 are sandwiched between the image sensor 11 and the holder 16.

また、撮像素子実装基板12の後方には放熱板19が配置されている。   A heat radiating plate 19 is disposed behind the imaging element mounting substrate 12.

ここで、図1では撮像素子実装基板12を簡略化して図示しているが、図2〜図4に示すように、撮像素子実装基板12としてリジッドフレキシブル基板を用いている。リジッドフレキシブル基板はフレキシブルプリント基板とリジッド基板を一体化したものであり、ガラスエポキシ等の硬い材質からなるリジッド部と、ポリイミド等のフレキシブル部からなる。図2、図3に示すように、撮像素子11が実装される基板部分12aと、放熱板19の裏側に配置された基板部分12bとがフレキシブル部12cを介して繋がっている。このようなリジッドフレキシブル基板を用いることで、撮像素子実装基板12の大型化を回避することができる。更に、図4(b)に示すように、基板部分12bに設けられているコネクタ44a、44b、44cにケーブルが差し込まれる際の負荷を撮像素子11の接着部に伝えない効果がある。   Here, in FIG. 1, the image pickup device mounting substrate 12 is illustrated in a simplified manner, but as shown in FIGS. 2 to 4, a rigid flexible substrate is used as the image pickup device mounting substrate 12. The rigid flexible substrate is an integration of a flexible printed circuit board and a rigid substrate, and includes a rigid portion made of a hard material such as glass epoxy and a flexible portion such as polyimide. As shown in FIGS. 2 and 3, the substrate portion 12a on which the image sensor 11 is mounted and the substrate portion 12b disposed on the back side of the heat radiating plate 19 are connected via a flexible portion 12c. By using such a rigid flexible substrate, it is possible to avoid an increase in the size of the image sensor mounting substrate 12. Further, as shown in FIG. 4B, there is an effect that the load when the cable is inserted into the connectors 44a, 44b, 44c provided on the board portion 12b is not transmitted to the bonded portion of the image sensor 11.

撮像素子実装基板12(基板部分12a)には、撮像素子11の裏面(すなわち、撮像面とは反対側の面である非撮像面)に対向する位置に穴12dが形成されている。撮像素子11が撮像素子保持板13に接着される段階では、該穴12dを挿通して吸引ノズルの先端が撮像素子11の裏面に接触し、撮像素子実装基板12を支持する。撮像素子保持板13は治具のしかるべき位置に固定される。この状態で、吸引ノズルに吸引された撮像素子11を図1に示すX-Y方向の位置調整を行った後、撮像素子保持板13に接着する。このとき、吸引ノズルの先端面と撮像素子保持板13が据え付けられる面は高い精度で同一平面に設定されており、撮像素子11と撮像素子保持板13とを高い精度で位置決め、接着することができる。   A hole 12d is formed in the image sensor mounting substrate 12 (substrate portion 12a) at a position facing the back surface of the image sensor 11 (that is, the non-imaging surface opposite to the imaging surface). At the stage where the image pickup device 11 is bonded to the image pickup device holding plate 13, the tip of the suction nozzle is brought into contact with the back surface of the image pickup device 11 through the hole 12 d to support the image pickup device mounting substrate 12. The image sensor holding plate 13 is fixed at an appropriate position of the jig. In this state, the image sensor 11 sucked by the suction nozzle is adjusted in the position in the XY direction shown in FIG. 1 and then adhered to the image sensor holding plate 13. At this time, the tip surface of the suction nozzle and the surface on which the image sensor holding plate 13 is installed are set on the same plane with high accuracy, and the image sensor 11 and the image sensor holding plate 13 can be positioned and bonded with high accuracy. it can.

撮像素子実装基板12の穴12dを通って放熱部材18が撮像素子11の裏面に接触する。放熱部材18は弾性部材であり、放熱板19に保持されている。これにより、撮像素子11は放熱部材18を介して熱伝導性の高い放熱板19と熱的に接続される。   The heat dissipation member 18 comes into contact with the back surface of the image sensor 11 through the hole 12 d of the image sensor mounting substrate 12. The heat radiating member 18 is an elastic member and is held by the heat radiating plate 19. Thereby, the image sensor 11 is thermally connected to the heat radiating plate 19 having high thermal conductivity via the heat radiating member 18.

以上の構成により、撮像素子11の裏面に直接放熱部材18を接触させ、撮像素子11で発生した熱を放熱板19に導くことで高い放熱効果を得ることができる。   With the above configuration, a high heat dissipation effect can be obtained by bringing the heat dissipation member 18 into direct contact with the back surface of the image sensor 11 and guiding the heat generated in the image sensor 11 to the heat sink 19.

また、傾き調整によって放熱板19に対する撮像素子11の裏面の傾きにはバラつきがあるが、撮像素子11に接触している放熱部材18の弾性によって、その傾きのバラつきを吸収することができる。また、放熱部材18が接触する撮像素子11の背面は、傾き調整時の回転中心に近いため、傾きの影響を受けにくい。   In addition, the inclination of the back surface of the image sensor 11 with respect to the heat radiating plate 19 varies due to the tilt adjustment. However, the variation in inclination can be absorbed by the elasticity of the heat radiation member 18 in contact with the image sensor 11. Further, the back surface of the image sensor 11 with which the heat radiating member 18 contacts is close to the center of rotation at the time of tilt adjustment, and thus is not easily affected by tilt.

また、熱伝導性の高い接着剤を使用する必要がないので、信号にノイズを与えるおそれがない。   Further, since it is not necessary to use an adhesive with high thermal conductivity, there is no possibility of giving noise to the signal.

以上、本発明の好ましい実施形態について説明したが、本発明はこれらの実施形態に限定されず、その要旨の範囲内で種々の変形及び変更が可能である。例えば、上記実施形態では撮像素子実装基板12には、撮像素子11の裏面に対向する位置に穴12dを形成したが、図5に示すように切欠き12eを形成するようにしても良い。   As mentioned above, although preferable embodiment of this invention was described, this invention is not limited to these embodiment, A various deformation | transformation and change are possible within the range of the summary. For example, in the above embodiment, the hole 12d is formed in the image sensor mounting substrate 12 at a position facing the back surface of the image sensor 11, but a notch 12e may be formed as shown in FIG.

1:レンズ鏡筒、2:撮像素子ユニット、11:撮像素子、12:撮像素子実装基板、12d:穴、12e:切欠き、13:撮像素子保持板、16」撮像素子ホルダ、18:放熱部材、19:放熱板 1: lens barrel, 2: imaging element unit, 11: imaging element, 12: imaging element mounting substrate, 12d: hole, 12e: notch, 13: imaging element holding plate, 16 ”imaging element holder, 18: heat dissipation member , 19: Heat sink

Claims (5)

撮像素子が実装されるとともに、前記撮像素子の裏面に対向する位置に穴又は切欠きが形成された基板と、
前記穴又は前記切欠きを通って前記撮像素子の裏面に接触する放熱部材とを備えたことを特徴とする撮像素子の放熱構造。
A substrate on which an image sensor is mounted and a hole or notch is formed at a position facing the back surface of the image sensor;
A heat dissipation structure for an image sensor, comprising: a heat dissipating member that contacts the back surface of the image sensor through the hole or notch.
前記放熱部材は放熱板に保持されていることを特徴とする請求項1に記載の撮像素子の放熱構造。   The heat dissipation structure for an image sensor according to claim 1, wherein the heat dissipation member is held by a heat dissipation plate. 前記放熱部材は弾性部材であることを特徴とする請求項1又は2に記載の撮像素子の放熱構造。   The heat dissipation structure for an image sensor according to claim 1, wherein the heat dissipation member is an elastic member. 前記穴又は前記切欠きは、前記撮像素子を吸引する吸引ノズルが挿通可能な大きさであることを特徴とする請求項1乃至3のいずれか1項に記載の撮像素子の放熱構造。   4. The heat dissipation structure for an image sensor according to claim 1, wherein the hole or the notch has a size allowing a suction nozzle for sucking the image sensor to be inserted. 5. 前記撮像素子の傾き調整が施された上で、前記撮像素子の周辺が接着される撮像素子保持板を備えたことを特徴とする請求項1乃至4のいずれか1項に記載の撮像素子の放熱構造。   The image pickup device according to claim 1, further comprising an image pickup device holding plate to which a periphery of the image pickup device is bonded after the inclination of the image pickup device is adjusted. Heat dissipation structure.
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