JP2010117371A - 姿勢検出装置 - Google Patents

姿勢検出装置 Download PDF

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Publication number
JP2010117371A
JP2010117371A JP2010038471A JP2010038471A JP2010117371A JP 2010117371 A JP2010117371 A JP 2010117371A JP 2010038471 A JP2010038471 A JP 2010038471A JP 2010038471 A JP2010038471 A JP 2010038471A JP 2010117371 A JP2010117371 A JP 2010117371A
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Japan
Prior art keywords
axis
sensor
detection
correction
angular velocity
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Pending
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JP2010038471A
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English (en)
Japanese (ja)
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JP2010117371A5 (enrdf_load_stackoverflow
Inventor
Hirofumi Udagawa
裕文 宇田川
Sachihiro Kobayashi
祥宏 小林
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Miyazaki Epson Corp
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Epson Toyocom Corp
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Application filed by Epson Toyocom Corp filed Critical Epson Toyocom Corp
Priority to JP2010038471A priority Critical patent/JP2010117371A/ja
Publication of JP2010117371A publication Critical patent/JP2010117371A/ja
Publication of JP2010117371A5 publication Critical patent/JP2010117371A5/ja
Pending legal-status Critical Current

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JP2010038471A 2010-02-24 2010-02-24 姿勢検出装置 Pending JP2010117371A (ja)

Priority Applications (1)

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JP2010038471A JP2010117371A (ja) 2010-02-24 2010-02-24 姿勢検出装置

Applications Claiming Priority (1)

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JP2010038471A JP2010117371A (ja) 2010-02-24 2010-02-24 姿勢検出装置

Related Parent Applications (1)

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JP2008291213A Division JP2010117260A (ja) 2008-11-13 2008-11-13 姿勢検出装置の補正パラメーター作成方法、姿勢検出装置の補正パラメーター作成用装置及び姿勢検出装置

Publications (2)

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JP2010117371A true JP2010117371A (ja) 2010-05-27
JP2010117371A5 JP2010117371A5 (enrdf_load_stackoverflow) 2012-01-05

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JP2010038471A Pending JP2010117371A (ja) 2010-02-24 2010-02-24 姿勢検出装置

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JP (1) JP2010117371A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012042261A (ja) * 2010-08-17 2012-03-01 Seiko Epson Corp 集積回路装置及び電子機器
JP2012112789A (ja) * 2010-11-24 2012-06-14 Sony Computer Entertainment Inc キャリブレーション装置、キャリブレーション方法、及び電子機器の製造方法
KR20140075545A (ko) * 2012-12-11 2014-06-19 한국전자통신연구원 회전체의 회전 특성 측정 방법 및 장치
JP2015114285A (ja) * 2013-12-13 2015-06-22 旭化成株式会社 角速度センサの校正装置及びその校正方法
CN113296053A (zh) * 2021-05-27 2021-08-24 维沃移动通信有限公司 Uwb校准方法、装置及电子设备

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08304448A (ja) * 1995-05-11 1996-11-22 Nikon Corp 力学量検出器および力学量検出方法
JPH10267651A (ja) * 1997-03-28 1998-10-09 Data Tec:Kk 傾斜測定方法及び傾斜測定装置
WO2005095998A1 (ja) * 2004-03-31 2005-10-13 National Institute Of Advanced Industrial Science And Technology 加速度を検出するセンサの横感度を計測する方法および加速度計測方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08304448A (ja) * 1995-05-11 1996-11-22 Nikon Corp 力学量検出器および力学量検出方法
JPH10267651A (ja) * 1997-03-28 1998-10-09 Data Tec:Kk 傾斜測定方法及び傾斜測定装置
WO2005095998A1 (ja) * 2004-03-31 2005-10-13 National Institute Of Advanced Industrial Science And Technology 加速度を検出するセンサの横感度を計測する方法および加速度計測方法

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012042261A (ja) * 2010-08-17 2012-03-01 Seiko Epson Corp 集積回路装置及び電子機器
JP2012112789A (ja) * 2010-11-24 2012-06-14 Sony Computer Entertainment Inc キャリブレーション装置、キャリブレーション方法、及び電子機器の製造方法
US9476709B2 (en) 2010-11-24 2016-10-25 Sony Corporation Calibration apparatus, calibration method, and manufacturing method for an electronic device
KR20140075545A (ko) * 2012-12-11 2014-06-19 한국전자통신연구원 회전체의 회전 특성 측정 방법 및 장치
KR101891980B1 (ko) 2012-12-11 2018-08-27 한국전자통신연구원 회전체의 회전 특성 측정 방법 및 장치
JP2015114285A (ja) * 2013-12-13 2015-06-22 旭化成株式会社 角速度センサの校正装置及びその校正方法
CN113296053A (zh) * 2021-05-27 2021-08-24 维沃移动通信有限公司 Uwb校准方法、装置及电子设备

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