JP2010043348A - 斜め堆積を用いて生成されたナノ構造薄膜およびその方法 - Google Patents
斜め堆積を用いて生成されたナノ構造薄膜およびその方法 Download PDFInfo
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
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- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/225—Oblique incidence of vaporised material on substrate
- C23C14/226—Oblique incidence of vaporised material on substrate in order to form films with columnar structure
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/08—Oxides
- C23C14/086—Oxides of zinc, germanium, cadmium, indium, tin, thallium or bismuth
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- H10F71/138—Manufacture of transparent electrodes, e.g. transparent conductive oxides [TCO] or indium tin oxide [ITO] electrodes
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- H10F77/20—Electrodes
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- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
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Abstract
【解決手段】電子ビームシステム100を用いて、ターゲットソースが斜め堆積法により蒸着される。複数の調整可能な試料ステージ104上に蒸着基板114が配置される。プロセスチャンバー101内でガスの流量および温度を制御するため、熱源と複数のガス制御弁107および108が備えられる。蒸着後、薄膜構造と光電子特性を向上させるため、アニール工程が行われる。
【選択図】図1a
Description
アルミ亜鉛酸化物(AZO)、ZnO、および、透明導電性膜を生成可能なその他の物質が含まれる。本発明での蒸着基板には、Si基板、GaAs基板、ガラス基板、フレキシブル基板等が含まれる。この工程中、蒸着基板は特定の角度に調整され、望ましい透明電極構造を得るため、基板の法線方向とターゲット微粒子の入射方向との間に挟まれる角度は0°から90°内に制御されるが、図1bの挟まれ角117に示されるように、望ましい角度は50°から90°である。一般に、窒素、酸素、あるいはアセチレン等、プロセスガスが蒸着時に導入される場合には、ガスのタイプと流量の両方が、蒸着される薄膜の電気的特性と光学的特性に影響を及ぼす。本発明の実施例では、蒸着工程時、チャンバーには、酸素、窒素、またはこれらを組み合わせたもの、が導入される。ガスの流量は0sccmから50sccmの間で構成される。蒸着システムは、望ましい電気的特性と光学的特性を得るため、同時にチャンバーの圧力を103トルから106トルの間に維持する。その結果を、次の実施例で説明する。蒸着工程の前に、プロセスチャンバーはプロセス温度まで予熱される。本発明の実施例では、電子ビーム蒸着システム内の温度は、約100°Cから450°Cに構成される。蒸着が完了すると、透明導電性薄膜が蒸着基板上に生成される。望ましい薄膜電極構造を得るため、蒸着後、熱アニールの工程が適用される(203)。アニールの工程中に酸素が導入され、温度は200°Cから900°Cに構成され、本工程の持続時間は約1分から60分である。本発明における熱アニールの工程により、薄膜の微細構造の透過率がさらに増大し、その抵抗率はさらに減少する。
101:外部チャンバー
102:中央ディスク
103:支持シャフト
104:試料ステージ
105:回転部品
106:カンチレバー
107、108:ガス制御弁
109:ターゲットソース
110:坩堝
111:熱源
112:熱電対
114:堆積基板
115:入射方向
116:法線方向
117:115と116間の角度
118:ターゲット微粒子
119:ナノロッド構造
Claims (6)
- 斜め堆積による薄膜構造の生成方法であって、
電子ビーム堆積システムにより、チャンバー内でターゲットソースを堆積するステップと、
斜め堆積により蒸着基板上に薄膜を生成するため、前記チャンバーにプロセスガスを導入し、前記蒸着基板の傾斜角を調整し、蒸着時、前記チャンバー内のプロセス温度を制御しておくステップと、
多孔質のナノロッド微細構造をもつ薄膜を生成するため、前記蒸着基板をアニールするステップとを含むことを特徴とする方法。 - 前記の導入されるプロセスガスが酸素、窒素、およびそれを組み合わせたものを含み、
前記の導入されるプロセスガスの流量が0sccmから50sccmまでである、請求項1に記載の方法。 - 前記のターゲットソースの入射方向と前記蒸着基板の法線方向との間に挟まれる角度が0゜から90゜である、請求項1に記載の方法。
- 前記アニールが1分から60分程度持続し、アニール温度が200゜Cから900゜Cに制御される、請求項1に記載の方法。
- 勾配型屈折率と良好な透過率とを備えた単層構造を生成するため、前記膜が、縁部が細くなった、多孔質のナノロッドを含む、電子ビーム斜め堆積により生成される膜。
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW097131039A TWI372418B (en) | 2008-08-14 | 2008-08-14 | Nanostructured thin-film formed by utilizing oblique-angle deposition and method of the same |
| TW097131039 | 2008-08-14 |
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| Publication Number | Publication Date |
|---|---|
| JP2010043348A true JP2010043348A (ja) | 2010-02-25 |
| JP5621955B2 JP5621955B2 (ja) | 2014-11-12 |
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| JP2008297210A Expired - Fee Related JP5621955B2 (ja) | 2008-08-14 | 2008-11-20 | 斜め堆積を用いて生成されたナノ構造薄膜およびその方法 |
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| Country | Link |
|---|---|
| US (2) | US7998539B2 (ja) |
| JP (1) | JP5621955B2 (ja) |
| TW (1) | TWI372418B (ja) |
Cited By (4)
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| WO2011105239A1 (ja) | 2010-02-26 | 2011-09-01 | 日本曹達株式会社 | テトラゾリルオキシム誘導体またはその塩、ならびに殺菌剤 |
| CN103409723A (zh) * | 2013-06-29 | 2013-11-27 | 电子科技大学 | 薄膜沉积制备方法以及纳米纤维结构柔性缓冲层制备方法 |
| JP2015529854A (ja) * | 2012-08-27 | 2015-10-08 | エーブリー デニソン コーポレイションAvery Dennison Corporation | 低屈折率基材を備えた再帰反射体 |
| JP2016079486A (ja) * | 2014-10-21 | 2016-05-16 | 株式会社日立製作所 | ナノオーダ構造体の製造方法および製造装置、並びにナノオーダ構造体を有する基板構造体 |
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| JP2016079486A (ja) * | 2014-10-21 | 2016-05-16 | 株式会社日立製作所 | ナノオーダ構造体の製造方法および製造装置、並びにナノオーダ構造体を有する基板構造体 |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI372418B (en) | 2012-09-11 |
| US20100261001A1 (en) | 2010-10-14 |
| US20100040859A1 (en) | 2010-02-18 |
| TW201007818A (en) | 2010-02-16 |
| JP5621955B2 (ja) | 2014-11-12 |
| US7998539B2 (en) | 2011-08-16 |
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