JP2009535788A5 - - Google Patents
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- JP2009535788A5 JP2009535788A5 JP2009509743A JP2009509743A JP2009535788A5 JP 2009535788 A5 JP2009535788 A5 JP 2009535788A5 JP 2009509743 A JP2009509743 A JP 2009509743A JP 2009509743 A JP2009509743 A JP 2009509743A JP 2009535788 A5 JP2009535788 A5 JP 2009535788A5
- Authority
- JP
- Japan
- Prior art keywords
- collimator
- anode
- ray
- ray beam
- rotating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000003384 imaging method Methods 0.000 claims 2
- 238000000034 method Methods 0.000 claims 1
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US74648106P | 2006-05-04 | 2006-05-04 | |
| US60/746,481 | 2006-05-04 | ||
| US11/744,115 US7529343B2 (en) | 2006-05-04 | 2007-05-03 | System and method for improved field of view X-ray imaging using a non-stationary anode |
| US11/744,115 | 2007-05-03 | ||
| PCT/US2007/010843 WO2007130576A2 (en) | 2006-05-04 | 2007-05-04 | System and method for improved field of view x-ray imaging using a non-stationary anode |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009535788A JP2009535788A (ja) | 2009-10-01 |
| JP2009535788A5 true JP2009535788A5 (enExample) | 2010-07-01 |
| JP5175841B2 JP5175841B2 (ja) | 2013-04-03 |
Family
ID=38668332
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009509743A Active JP5175841B2 (ja) | 2006-05-04 | 2007-05-04 | 非静止陽極を使用するx線結像の視野を改良するシステム及び方法 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US7529343B2 (enExample) |
| EP (1) | EP2013643B2 (enExample) |
| JP (1) | JP5175841B2 (enExample) |
| AT (1) | ATE534921T1 (enExample) |
| AU (1) | AU2007248520B2 (enExample) |
| CA (1) | CA2650479C (enExample) |
| ES (1) | ES2374316T5 (enExample) |
| WO (1) | WO2007130576A2 (enExample) |
Families Citing this family (59)
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| US10297359B2 (en) | 2013-09-19 | 2019-05-21 | Sigray, Inc. | X-ray illumination system with multiple target microstructures |
| USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
| US10304580B2 (en) | 2013-10-31 | 2019-05-28 | Sigray, Inc. | Talbot X-ray microscope |
| US9594036B2 (en) | 2014-02-28 | 2017-03-14 | Sigray, Inc. | X-ray surface analysis and measurement apparatus |
| US9823203B2 (en) | 2014-02-28 | 2017-11-21 | Sigray, Inc. | X-ray surface analysis and measurement apparatus |
| US9305344B2 (en) | 2014-04-22 | 2016-04-05 | The Boeing Company | Method for improving linear feature detectability in digital images |
| US9398676B2 (en) | 2014-05-05 | 2016-07-19 | The Boeing Company | System and method for quantifying X-ray backscatter system performance |
| US9851312B2 (en) | 2014-05-07 | 2017-12-26 | The Boeing Company | Backscatter inspection systems, and related methods |
| US10401309B2 (en) | 2014-05-15 | 2019-09-03 | Sigray, Inc. | X-ray techniques using structured illumination |
| US9658173B2 (en) | 2014-07-30 | 2017-05-23 | The Boeing Company | Portable x-ray backscattering imaging system including a radioactive source |
| US10535491B2 (en) | 2015-01-20 | 2020-01-14 | American Science And Engineering, Inc. | Dynamically adjustable focal spot |
| US9739727B2 (en) | 2015-01-21 | 2017-08-22 | The Boeing Company | Systems and methods for aligning an aperture |
| US10352880B2 (en) | 2015-04-29 | 2019-07-16 | Sigray, Inc. | Method and apparatus for x-ray microscopy |
| US10295486B2 (en) | 2015-08-18 | 2019-05-21 | Sigray, Inc. | Detector for X-rays with high spatial and high spectral resolution |
| US9501838B1 (en) | 2015-08-24 | 2016-11-22 | The Boeing Company | Systems and methods for determining boundaries of features in digital images |
| US10317349B2 (en) | 2015-11-30 | 2019-06-11 | The Boeing Company | X-ray scatter systems and methods for detecting structural variations |
| US10247683B2 (en) | 2016-12-03 | 2019-04-02 | Sigray, Inc. | Material measurement techniques using multiple X-ray micro-beams |
| US10983074B2 (en) | 2017-05-11 | 2021-04-20 | The Boeing Company | Visual light calibrator for an x-ray backscattering imaging system |
| US10578566B2 (en) | 2018-04-03 | 2020-03-03 | Sigray, Inc. | X-ray emission spectrometer system |
| CN108419356B (zh) * | 2018-05-16 | 2023-09-22 | 中国工程物理研究院流体物理研究所 | 用于提升回旋加速器内离子源寿命的方法及离子源设备 |
| JP7195341B2 (ja) | 2018-06-04 | 2022-12-23 | シグレイ、インコーポレイテッド | 波長分散型x線分光計 |
| CN112470245B (zh) | 2018-07-26 | 2025-03-18 | 斯格瑞公司 | 高亮度x射线反射源 |
| US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
| DE112019004433B4 (de) | 2018-09-04 | 2024-09-12 | Sigray, Inc. | System und verfahren für röntgenstrahlfluoreszenz mit filterung |
| WO2020051221A2 (en) | 2018-09-07 | 2020-03-12 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
| US11315751B2 (en) * | 2019-04-25 | 2022-04-26 | The Boeing Company | Electromagnetic X-ray control |
| US11152183B2 (en) | 2019-07-15 | 2021-10-19 | Sigray, Inc. | X-ray source with rotating anode at atmospheric pressure |
| US11554544B2 (en) * | 2019-09-20 | 2023-01-17 | The Boeing Company | Additive manufacturing system with x-ray backscatter imaging system and method of inspecting a structure during additive manufacturing of the structure |
| US11293884B2 (en) | 2020-01-07 | 2022-04-05 | The Boeing Company | Multi source backscattering |
| US11257653B2 (en) * | 2020-03-27 | 2022-02-22 | The Boeing Company | Integrated aperture shield for x-ray tubes |
| US11169098B2 (en) | 2020-04-02 | 2021-11-09 | The Boeing Company | System, method, and apparatus for x-ray backscatter inspection of parts |
| US12163903B2 (en) * | 2021-05-12 | 2024-12-10 | The Boeing Company | System, method, and apparatus for x-ray backscatter inspection of parts |
| US12253479B1 (en) * | 2021-12-08 | 2025-03-18 | Jaywant Philip Parmar | Space-based x-ray imaging system |
| DE112023000574T5 (de) | 2022-01-13 | 2024-10-24 | Sigray, Inc. | Mikrofokus-röntgenquelle zur erzeugung von röntgenstrahlen mit hohem fluss und niedriger energie |
| US12360067B2 (en) | 2022-03-02 | 2025-07-15 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
| US12209977B2 (en) | 2023-02-16 | 2025-01-28 | Sigray, Inc. | X-ray detector system with at least two stacked flat Bragg diffractors |
| US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
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-
2007
- 2007-05-03 US US11/744,115 patent/US7529343B2/en active Active
- 2007-05-04 AU AU2007248520A patent/AU2007248520B2/en active Active
- 2007-05-04 EP EP07756210.6A patent/EP2013643B2/en active Active
- 2007-05-04 AT AT07756210T patent/ATE534921T1/de active
- 2007-05-04 ES ES07756210.6T patent/ES2374316T5/es active Active
- 2007-05-04 JP JP2009509743A patent/JP5175841B2/ja active Active
- 2007-05-04 CA CA2650479A patent/CA2650479C/en active Active
- 2007-05-04 WO PCT/US2007/010843 patent/WO2007130576A2/en not_active Ceased
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