ATE534921T1 - System und verfahren für verbesserte sichtfeld- röntgenbildgebung mittels nicht-stationärer anode - Google Patents

System und verfahren für verbesserte sichtfeld- röntgenbildgebung mittels nicht-stationärer anode

Info

Publication number
ATE534921T1
ATE534921T1 AT07756210T AT07756210T ATE534921T1 AT E534921 T1 ATE534921 T1 AT E534921T1 AT 07756210 T AT07756210 T AT 07756210T AT 07756210 T AT07756210 T AT 07756210T AT E534921 T1 ATE534921 T1 AT E534921T1
Authority
AT
Austria
Prior art keywords
ray imaging
view
improved field
stationary anode
stationary
Prior art date
Application number
AT07756210T
Other languages
English (en)
Inventor
Morteza Safai
Gary Georgeson
W Edwards
Original Assignee
Boeing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=38668332&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE534921(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Boeing Co filed Critical Boeing Co
Application granted granted Critical
Publication of ATE534921T1 publication Critical patent/ATE534921T1/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/10—Rotary anodes; Arrangements for rotating anodes; Cooling rotary anodes
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
    • G21K1/043—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers changing time structure of beams by mechanical means, e.g. choppers, spinning filter wheels

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • X-Ray Techniques (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AT07756210T 2006-05-04 2007-05-04 System und verfahren für verbesserte sichtfeld- röntgenbildgebung mittels nicht-stationärer anode ATE534921T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US74648106P 2006-05-04 2006-05-04
US11/744,115 US7529343B2 (en) 2006-05-04 2007-05-03 System and method for improved field of view X-ray imaging using a non-stationary anode
PCT/US2007/010843 WO2007130576A2 (en) 2006-05-04 2007-05-04 System and method for improved field of view x-ray imaging using a non-stationary anode

Publications (1)

Publication Number Publication Date
ATE534921T1 true ATE534921T1 (de) 2011-12-15

Family

ID=38668332

Family Applications (1)

Application Number Title Priority Date Filing Date
AT07756210T ATE534921T1 (de) 2006-05-04 2007-05-04 System und verfahren für verbesserte sichtfeld- röntgenbildgebung mittels nicht-stationärer anode

Country Status (8)

Country Link
US (1) US7529343B2 (de)
EP (1) EP2013643B2 (de)
JP (1) JP5175841B2 (de)
AT (1) ATE534921T1 (de)
AU (1) AU2007248520B2 (de)
CA (1) CA2650479C (de)
ES (1) ES2374316T5 (de)
WO (1) WO2007130576A2 (de)

Families Citing this family (54)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7609816B2 (en) * 2006-05-19 2009-10-27 Colorado State University Research Foundation Renewable laser target
US7599471B2 (en) * 2007-10-24 2009-10-06 The Boeing Company Method and apparatus for rotating an anode in an x-ray system
DE102008050102B4 (de) * 2008-10-06 2010-11-04 Phoenix Contact Gmbh & Co. Kg Kommunikationsentität zur Kommunikation über ein busorientiertes Kommunikationsnetzwerk
US8033724B2 (en) * 2009-06-30 2011-10-11 The Boeing Company Rapid assembly and operation of an X-ray imaging system
US8094781B1 (en) 2009-08-12 2012-01-10 The Boeing Company Portable X-ray back scattering imaging systems
US8213571B2 (en) * 2010-03-29 2012-07-03 The Boeing Company Small diameter X-ray tube
US8503610B1 (en) * 2010-11-23 2013-08-06 The Boeing Company X-ray inspection tool
US8396187B2 (en) 2010-12-10 2013-03-12 The Boeing Company X-ray inspection tool
US8761338B2 (en) 2011-06-20 2014-06-24 The Boeing Company Integrated backscatter X-ray system
US9151721B2 (en) 2011-06-20 2015-10-06 The Boeing Company Integrated backscatter X-ray system
US8588262B1 (en) 2011-09-07 2013-11-19 The Boeing Company Quantum dot detection
US8855268B1 (en) 2011-11-01 2014-10-07 The Boeing Company System for inspecting objects underwater
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
US9099279B2 (en) 2012-04-26 2015-08-04 American Science And Engineering, Inc. X-ray tube with rotating anode aperture
US8879688B2 (en) 2012-05-22 2014-11-04 The Boeing Company Reconfigurable detector system
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US9449781B2 (en) 2013-12-05 2016-09-20 Sigray, Inc. X-ray illuminators with high flux and high flux density
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
US9570265B1 (en) 2013-12-05 2017-02-14 Sigray, Inc. X-ray fluorescence system with high flux and high flux density
US9448190B2 (en) 2014-06-06 2016-09-20 Sigray, Inc. High brightness X-ray absorption spectroscopy system
US9390881B2 (en) 2013-09-19 2016-07-12 Sigray, Inc. X-ray sources using linear accumulation
US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US9823203B2 (en) 2014-02-28 2017-11-21 Sigray, Inc. X-ray surface analysis and measurement apparatus
US9594036B2 (en) 2014-02-28 2017-03-14 Sigray, Inc. X-ray surface analysis and measurement apparatus
US9305344B2 (en) 2014-04-22 2016-04-05 The Boeing Company Method for improving linear feature detectability in digital images
US9398676B2 (en) 2014-05-05 2016-07-19 The Boeing Company System and method for quantifying X-ray backscatter system performance
US9851312B2 (en) 2014-05-07 2017-12-26 The Boeing Company Backscatter inspection systems, and related methods
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
US9658173B2 (en) 2014-07-30 2017-05-23 The Boeing Company Portable x-ray backscattering imaging system including a radioactive source
MX2017009342A (es) 2015-01-20 2017-11-17 American Science & Eng Inc Punto focal dinamicamente ajustable.
US9739727B2 (en) 2015-01-21 2017-08-22 The Boeing Company Systems and methods for aligning an aperture
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
US9501838B1 (en) 2015-08-24 2016-11-22 The Boeing Company Systems and methods for determining boundaries of features in digital images
US10317349B2 (en) 2015-11-30 2019-06-11 The Boeing Company X-ray scatter systems and methods for detecting structural variations
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
JP6937380B2 (ja) 2017-03-22 2021-09-22 シグレイ、インコーポレイテッド Ｘ線分光を実施するための方法およびｘ線吸収分光システム
US10983074B2 (en) 2017-05-11 2021-04-20 The Boeing Company Visual light calibrator for an x-ray backscattering imaging system
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
CN108419356B (zh) * 2018-05-16 2023-09-22 中国工程物理研究院流体物理研究所 用于提升回旋加速器内离子源寿命的方法及离子源设备
DE112019002822T5 (de) 2018-06-04 2021-02-18 Sigray, Inc. Wellenlängendispersives röntgenspektrometer
JP7117452B2 (ja) 2018-07-26 2022-08-12 シグレイ、インコーポレイテッド 高輝度反射型ｘ線源
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
WO2020051061A1 (en) 2018-09-04 2020-03-12 Sigray, Inc. System and method for x-ray fluorescence with filtering
WO2020051221A2 (en) 2018-09-07 2020-03-12 Sigray, Inc. System and method for depth-selectable x-ray analysis
US11315751B2 (en) * 2019-04-25 2022-04-26 The Boeing Company Electromagnetic X-ray control
US11152183B2 (en) 2019-07-15 2021-10-19 Sigray, Inc. X-ray source with rotating anode at atmospheric pressure
US11554544B2 (en) * 2019-09-20 2023-01-17 The Boeing Company Additive manufacturing system with x-ray backscatter imaging system and method of inspecting a structure during additive manufacturing of the structure
US11293884B2 (en) 2020-01-07 2022-04-05 The Boeing Company Multi source backscattering
US11257653B2 (en) * 2020-03-27 2022-02-22 The Boeing Company Integrated aperture shield for x-ray tubes
US11169098B2 (en) 2020-04-02 2021-11-09 The Boeing Company System, method, and apparatus for x-ray backscatter inspection of parts
US20220365006A1 (en) * 2021-05-12 2022-11-17 The Boeing Company System, method, and apparatus for x-ray backscatter inspection of parts

Family Cites Families (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1579341A (en) * 1976-04-28 1980-11-19 Emi Ltd X-ray generating tubes
JPS53105994A (en) * 1977-02-28 1978-09-14 Shimadzu Corp Tomograph device
DE3142349A1 (de) 1981-10-26 1983-05-05 Siemens AG, 1000 Berlin und 8000 München Roentgendiagnostikeinrichtung zur untersuchung mehrerer schichten eines aufnahmeobjektes
US4577337A (en) * 1984-05-21 1986-03-18 Southwest Research Institute X-Ray fluorescence testing of laminate structures
US5243665A (en) * 1990-03-07 1993-09-07 Fmc Corporation Component surface distortion evaluation apparatus and method
US5181234B1 (en) * 1990-08-06 2000-01-04 Rapiscan Security Products Inc X-ray backscatter detection system
JPH04309187A (ja) 1991-04-08 1992-10-30 Japan Small Corp 立体モデルのマッピング方法
JPH04353792A (ja) * 1991-05-31 1992-12-08 Toshiba Corp 散乱線映像装置及びそれに用いる散乱線検出器
US5438605A (en) * 1992-01-06 1995-08-01 Picker International, Inc. Ring tube x-ray source with active vacuum pumping
US5729620A (en) * 1993-09-29 1998-03-17 Wang; Shih-Ping Computer-aided diagnosis system and method
US5764683B1 (en) * 1996-02-12 2000-11-21 American Science & Eng Inc Mobile x-ray inspection system for large objects
JP3241266B2 (ja) * 1996-06-03 2001-12-25 本田技研工業株式会社 ３次元ｃａｄシステム
US5763886A (en) * 1996-08-07 1998-06-09 Northrop Grumman Corporation Two-dimensional imaging backscatter probe
US6094472A (en) * 1998-04-14 2000-07-25 Rapiscan Security Products, Inc. X-ray backscatter imaging system including moving body tracking assembly
US6320933B1 (en) 1998-11-30 2001-11-20 American Science And Engineering, Inc. Multiple scatter system for threat identification
US6282260B1 (en) * 1998-12-14 2001-08-28 American Science & Engineering, Inc. Unilateral hand-held x-ray inspection apparatus
EP1147406A1 (de) * 1998-12-22 2001-10-24 American Science & Engineering, Inc. Einseitig in der hand gehaltene röntgenstrahlungsuntersuchungsvorrichtung
AU2382300A (en) * 1998-12-23 2000-07-12 National Institute Of Standards And Technology ("Nist") Method and system for a virtual assembly design environment
US6370222B1 (en) * 1999-02-17 2002-04-09 Ccvs, Llc Container contents verification
US6546072B1 (en) * 1999-07-30 2003-04-08 American Science And Engineering, Inc. Transmission enhanced scatter imaging
DE19959617A1 (de) * 1999-12-10 2001-06-21 Volkswagen Ag Konstruktionssystem und Verfahren zum Konstruieren oder Entwerfen neuer Bauteile
US6888640B2 (en) * 2000-02-04 2005-05-03 Mario J. Spina Body spatial dimension mapper
US7069192B1 (en) * 2000-08-25 2006-06-27 Hewlett-Packard Company CAD system
US6378387B1 (en) * 2000-08-25 2002-04-30 Aerobotics, Inc. Non-destructive inspection, testing and evaluation system for intact aircraft and components and method therefore
US6373917B1 (en) * 2000-08-30 2002-04-16 Agilent Technologies, Inc. Z-axis elimination in an X-ray laminography system using image magnification for Z plane adjustment
US6614872B2 (en) 2001-01-26 2003-09-02 General Electric Company Method and apparatus for localized digital radiographic inspection
US7280990B2 (en) * 2001-08-07 2007-10-09 Ugs Corp. Method and system for designing and modeling a product in a knowledge based engineering environment
US6636581B2 (en) * 2001-08-31 2003-10-21 Michael R. Sorenson Inspection system and method
US6618465B2 (en) * 2001-11-12 2003-09-09 General Electric Company X-ray shielding system and shielded digital radiographic inspection system and method
US7024272B2 (en) * 2002-04-26 2006-04-04 Delphi Technologies, Inc. Virtual design, inspect and grind optimization process
US6560315B1 (en) * 2002-05-10 2003-05-06 Ge Medical Systems Global Technology Company, Llc Thin rotating plate target for X-ray tube
US6757353B2 (en) * 2002-08-28 2004-06-29 Acushnet Company Golf ball inspection using metal markers
US7099434B2 (en) * 2002-11-06 2006-08-29 American Science And Engineering, Inc. X-ray backscatter mobile inspection van
US6735279B1 (en) * 2003-01-21 2004-05-11 University Of Florida Snapshot backscatter radiography system and protocol
US6950719B2 (en) * 2003-01-31 2005-09-27 Delphi Technologies, Inc. Horizontally structured manufacturing process modeling: across file feature operability
US7086028B1 (en) * 2003-04-09 2006-08-01 Autodesk, Inc. Simplified generation of design change information on a drawing in a computer aided design (CAD) environment
US6950493B2 (en) * 2003-06-25 2005-09-27 Besson Guy M Dynamic multi-spectral CT imaging
WO2005008716A2 (en) * 2003-07-18 2005-01-27 Koninklijke Philips Electronics N.V. Cylindrical x-ray tube for computed tomography imaging
US7103434B2 (en) * 2003-10-14 2006-09-05 Chernyak Alex H PLM-supportive CAD-CAM tool for interoperative electrical and mechanical design for hardware electrical systems
US6950495B2 (en) * 2003-12-01 2005-09-27 The Boeing Company Backscatter imaging using Hadamard transform masking
US7224772B2 (en) * 2004-07-20 2007-05-29 University Of Florida Research Foundation, Inc. Radiography by selective detection of scatter field velocity components
JP2006040053A (ja) 2004-07-28 2006-02-09 Taisei Corp 画像処理方法及びプログラム
US7203276B2 (en) * 2004-08-27 2007-04-10 University Of New Brunswick X-ray scatter image reconstruction by balancing of discrepancies between detector responses, and apparatus therefor
US7649976B2 (en) * 2006-02-10 2010-01-19 The Boeing Company System and method for determining dimensions of structures/systems for designing modifications to the structures/systems
WO2007129249A2 (en) 2006-05-08 2007-11-15 Philips Intellectual Property & Standards Gmbh Rotating anode x-ray tube with a saddle shaped anode

Also Published As

Publication number Publication date
WO2007130576A2 (en) 2007-11-15
AU2007248520A1 (en) 2007-11-15
ES2374316T3 (es) 2012-02-15
CA2650479A1 (en) 2007-11-15
EP2013643B2 (de) 2015-08-26
JP2009535788A (ja) 2009-10-01
ES2374316T5 (es) 2015-10-22
US7529343B2 (en) 2009-05-05
WO2007130576A3 (en) 2008-02-07
CA2650479C (en) 2017-01-10
EP2013643B1 (de) 2011-11-23
AU2007248520B2 (en) 2013-08-29
US20070269014A1 (en) 2007-11-22
JP5175841B2 (ja) 2013-04-03
EP2013643A2 (de) 2009-01-14

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